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Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications

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Abstract

To meet the requirements of both cost-effectiveness and high reliability for low-orbit aerospace applications, this paper first presents a radiation hardened latch design, namely HLCRT. The latch mainly consists of a single-node-upset self-recoverable cell, a 3-input C-element, and an inverter. If any two inputs of the C-element suffer from a double-node-upset (DNU), or if one node inside the cell together with another node outside the cell suffer from a DNU, the latch still has a correct value on its output node, i.e., the latch is effectively DNU hardened. Based on the latch, this paper also presents a flip-flop, namely HLCRT-FF that can tolerate SNUs and DNUs. Simulation results demonstrate the SNU/DNU tolerance capability of the proposed HLCRT latch and HLCRT-FF. Moreover, due to the use of a few transistors, clock gating technologies, and high-speed paths, the proposed HLCRT latch and HLCRT-FF approximately save 61% and 92% of delay, 45% and 55% of power, 28% and 28% of area, and 84% and 97% of delay-power-area product on average, compared to state-of-the-art DNU hardened latch/flip-flop designs, respectively.

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Acknowledgements

The corresponding author is Tianming Ni. This work was supported in part by the National Natural Science Foundation of China under Grants 61974001, 61874156, and 61904001, and Anhui University Doctor Startup Fund (Y040435009). This research was also supported in part by the NSFC-JSPS Exchange Program under Grant 6201101398.

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Authors and Affiliations

  1. School of Computer Science and Technology, Anhui University, Hefei, 230601, China

    Aibin Yan, Aoran Cao, Zhelong Xu & Jie Cui

  2. College of Electrical Engineering, Anhui Polytechnic University, Wuhu, 241000, China

    Tianming Ni

  3. Laboratory of Informatics, Robotics and Microelectronics of Montpellier, UMR 5506, University of Montpellier / CNRS, 34095, Montpellier, France

    Patrick Girard

  4. School of Computer Science and Systems Engineering, Kyushu Institute of Technology, 820-8502, Fukuoka, Japan

    Xiaoqing Wen

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  1. Aibin Yan
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Correspondence to Tianming Ni.

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Yan, A., Cao, A., Xu, Z. et al. Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications. J Electron Test 37, 489–502 (2021). https://doi.org/10.1007/s10836-021-05962-0

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