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This work was supported by Preliminary Research Program of National University of Defense Technology of China (Grant No. 0100066314001).
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Xie, C., Chen, Y., Chen, J. et al. Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM. Sci. China Inf. Sci. 62, 69402 (2019). https://doi.org/10.1007/s11432-017-9549-8
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DOI: https://doi.org/10.1007/s11432-017-9549-8