Location via proxy:   [ UP ]  
[Report a bug]   [Manage cookies]                
Skip to main content

Editorial

  • Editorial Board
  • Published:
Journal of Electronic Testing Aims and scope Submit manuscript

This is a preview of subscription content, log in via an institution to check access.

Access this article

Subscribe and save

Springer+ Basic
$34.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Authors

Rights and permissions

Reprints and permissions

About this article

Cite this article

Agrawal, V.D. Editorial. Journal of Electronic Testing 19, 607 (2003). https://doi.org/10.1023/A:1027481219963

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1023/A:1027481219963