Abstract
Nanoelectromechanical systems1 can be operated as ultrasensitive mass sensors2,3 and ultrahigh-frequency resonators4, and can also be used to explore fundamental physical phenomena such as nonlinear damping5 and quantum effects in macroscopic objects6. Various dissipation mechanisms are known to limit the mechanical quality factors of nanoelectromechanical systems and to induce aging due to material degradation, so there is a need for methods that can probe the motion of these systems, and the stresses within them, at the nanoscale. Here, we report a non-invasive local optical probe for the quantitative measurement of motion and stress within a nanoelectromechanical system, based on Fizeau interferometry and Raman spectroscopy. The system consists of a multilayer graphene resonator that is clamped to a gold film on an oxidized silicon surface. The resonator and the surface both act as mirrors and therefore define an optical cavity. Fizeau interferometry provides a calibrated measurement of the motion of the resonator, while Raman spectroscopy can probe the strain within the system and allows a purely spectral detection of mechanical resonance at the nanoscale.
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Acknowledgements
This work was partially supported by the ANR (MolNanoSpin, Supergraph, Allucinan), ERC (advanced grant no. 226558), and the Nanosciences Foundation of Grenoble. Samples were fabricated in the NANOFAB facility of the Néel Institute. The authors thank A. Allain, D. Basko, C. Blanc, E. Bonet, O. Bourgeois, E. Collin, T. Crozes, L. Del-Rey, M. Deshmukh, E. Eyraud, C. Girit, R. Haettel, C. Hoarau, D. Jeguso, D. Lepoittevin, R. Maurand, J-F. Motte, R. Piquerel, Ph. Poncharal, V. Reita, A. Siria, C. Thirion, P. Vincent, R. Vincent and W. Wernsdorfer for help and discussions.
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A.R.P., N.B. and V.B conceived and designed the experiments. A.R.P., L.M., N.B. and V.B. performed the experiments: A.R.P., O.A., N.B. and V.B. analysed the data. All authors contributed materials/analysis tools. All authors discussed the results and commented on the manuscript.
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Reserbat-Plantey, A., Marty, L., Arcizet, O. et al. A local optical probe for measuring motion and stress in a nanoelectromechanical system. Nature Nanotech 7, 151â155 (2012). https://doi.org/10.1038/nnano.2011.250
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DOI: https://doi.org/10.1038/nnano.2011.250
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