Charge collection characterisation with the Transient Current Technique of the ams H35DEMO CMOS detector after proton irradiation

Author affiliations

¹ Albert Einstein Center for Fundamental Physics and Laboratory for High Energy Physics, University of Bern, Siedlerstrasse 5, CH-3012 Bern, Switzerland

² Département de Physique Nucléaire et Corpusculaire (DPNC), Université de Genève, 24 quai Ernest Ansermet 1211 Genève 4, Switzerland

³ Institut de Física d'Altes Energies (IFAE), The Barcelona Institute of Science and Technology, Edifici CN, UAB campus, 08193 Bellaterra (Barcelona), Spain

⁴ Brookhaven National Laboratory (BNL), P.O. Box 5000, Upton, NY 11973-5000, U.S.A.

⁵ Dept. of Modern Physics, University of Science and Technology of China, Hefei, Anhui 230026, China

⁶ Department of Physics, University of Liverpool, The Oliver Lodge Laboratory, Liverpool L69 7ZE, U.K.

⁷ European Organization for Nuclear Research (CERN), 385 route de Meyrin, 1217 Meyrin, Switzerland

⁸ Karlsruhe Institute of Technology (KIT), IPE, 76021 Karlsruhe, Germany