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Effect of localization on photoluminescence and zero-field splitting of silicon color centers

Vsevolod Ivanov, Jacopo Simoni, Yeonghun Lee, Wei Liu, Kaushalya Jhuria, Walid Redjem, Yertay Zhiyenbayev, Christos Papapanos, Wayesh Qarony, Boubacar Kanté, Arun Persaud, Thomas Schenkel, and Liang Z. Tan
Phys. Rev. B 106, 134107 – Published 17 October 2022
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Abstract

The study of defect centers in silicon has been recently reinvigorated by their potential applications in optical quantum information processing. A number of silicon defect centers emit single photons in the telecommunication O-band, making them promising building blocks for quantum networks between computing nodes. The two-carbon G-center, self-interstitial W-center, and spin-1/2 T-center are the most intensively studied silicon defect centers, yet despite this, there is no consensus on the precise configurations of defect atoms in these centers, and their electronic structures remain ambiguous. Here we employ ab initio density functional theory to characterize these defect centers, providing insight into the relaxed structures, band structures, and photoluminescence spectra, which are compared to experimental results. Motivation is provided for how these properties are intimately related to the localization of electronic states in the defect centers. In particular, we present the calculation of the zero-field splitting for the excited triplet state of the G-center defect as the structure is linearly interpolated from the A-configuration to the B-configuration, showing a sudden increase in the magnitude of the Dzz component of the zero-field-splitting tensor. By performing projections onto the local orbital states of the defect, we analyze this transition in terms of the symmetry and bonding character of the G-center defect, which sheds light on its potential application as a spin-photon interface.

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  • Received 17 June 2022
  • Revised 23 September 2022
  • Accepted 3 October 2022

DOI:https://doi.org/10.1103/PhysRevB.106.134107

©2022 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Vsevolod Ivanov1,2, Jacopo Simoni1, Yeonghun Lee1,3, Wei Liu2, Kaushalya Jhuria2, Walid Redjem4, Yertay Zhiyenbayev4, Christos Papapanos4, Wayesh Qarony4, Boubacar Kanté4,2, Arun Persaud2, Thomas Schenkel2, and Liang Z. Tan1

  • 1Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
  • 2Accelerator Technology and Applied Physics Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
  • 3Department of Electronics Engineering, Incheon National University, Incheon 22012, Republic of Korea
  • 4Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, California 94720, USA

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Issue

Vol. 106, Iss. 13 — 1 October 2022

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Images

  • Figure 1
    Figure 1

    Defect structure within the silicon unit cell for (a) G-center type A, (b) G-center type B, (c) W-center type V, and (d) T-center. Silicon atoms are colored white, carbon atoms black, hydrogen atoms dark gray, and silicon atoms part of the defect cluster in pink.

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  • Figure 2
    Figure 2

    Band structures of the (a) ground state and (b) excited state of the T-center, with spin-up/down defect states highlighted in red/blue. The orbitals of the localized defect levels are shown on the right.

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  • Figure 3
    Figure 3

    Atom-projected band structure of the silicon G-center type A (a) and type B (b) configurations. Contributions to the bands from the interstitial carbon atom (red) and interstitial silicon atom (blue) are highlighted.

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  • Figure 4
    Figure 4

    Computed photoluminescence spectra for (a) G-center type B, (b) T-center, and (c) W-center type V, adjusted to the experimental ZPL. Arrows indicate peaks in the sideband arising from the bulk silicon structure and local defect modes. Inset plots compare the computed (black) and experimental (red) PL spectra, with arrows indicating features of interest in the sideband.

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  • Figure 5
    Figure 5

    Zero-field splitting (above) and defect energy (below) of the G-center for defect configurations that linearly interpolate between GCA and GCB in steps of 0.1 (10%). Values of the diagonalized ZFS tensor are shown, with Dzz in black, Dyy in blue, and Dxx in red. Dashed lines indicate the experimentally measured ZFS values.

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  • Figure 6
    Figure 6

    Orbital projections of G-center lower (blue) and higher (red) energy defect levels for structures linearly interpolating between GCA and GCB in steps of 0.2. Arrows centered on the Si(i) of the G-center defect indicate the direction of the ZFS tensor components.

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