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Surface melting of electronic order in La0.5Sr1.5MnO4

S. B. Wilkins, X. Liu, Y. Wakabayashi, J.-W. Kim, P. J. Ryan, H. Zheng, J. F. Mitchell, and J. P. Hill
Phys. Rev. B 84, 165103 – Published 7 October 2011

Abstract

We report temperature-dependent surface x-ray scattering studies of the orbital ordered surface in La0.5Sr1.5MnO4. We find that as the bulk ordering temperature is approached from below the thickness of the interface between the electronically ordered and electronically disordered regions at the surface grows, though the bulk correlation length remains unchanged. Close to the transition, the surface is so rough that there is no well-defined electronic surface, despite the presence of bulk electronic order. That is, the electronic ordering at the surface has melted. Above the bulk transition, long-range ordering in the bulk is destroyed but finite-sized isotropic fluctuations persist, with a correlation length roughly equal to that of the low-temperature in-plane surface correlation length.

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  • Received 8 September 2011

DOI:https://doi.org/10.1103/PhysRevB.84.165103

©2011 American Physical Society

Authors & Affiliations

S. B. Wilkins1, X. Liu1, Y. Wakabayashi2, J.-W. Kim3, P. J. Ryan3, H. Zheng4, J. F. Mitchell4, and J. P. Hill1

  • 1Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, New York 11973-5000, USA
  • 2Division of Materials Physics, Graduate School of Engineering Science, Osaka University, Toyonaka 560-8531, Japan
  • 3Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439, USA
  • 4Division of Materials Science, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439, USA

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Issue

Vol. 84, Iss. 16 — 15 October 2011

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Images

  • Figure 1
    Figure 1
    (Top left) Simulated x-ray scattering in the (Qx,Qz) plane for a two-dimensional (2D) Lorentzian-squared function, with widths equal to those of the bulk orbital order reflection. (Bottom left) Line cuts at Qz = 0 (blue) and 0.28 Å1 (red) through the simulated x-ray scattering intensity. (Top right) 2D intensity plot of the measured intensity for the orbital truncation rod in La0.5Sr1.5MnO4 at 170 K obtained at Qz=0.101,0.127,0.202, and 0.278 Å1. The streak of scattering, elongated along L due to the truncation of the orbital order by its surface, can clearly be seen. (Bottom right) Line cut at Qz = 0.28 Å1 through the orbital truncation rod.Reuse & Permissions
  • Figure 2
    Figure 2
    (Top panel) Qx scans through the orbital truncation rod at 170 and 223.5 K (red circles and blue squares, respectively). Data taken at Qz = 0.1 Å1 (top panel) and Qz = 0.28 Å1 (bottom panel). The results of the fits to Eq. (1) are shown as solid lines.Reuse & Permissions
  • Figure 3
    Figure 3
    (Top panel) Calculation of the Qz dependence of the integrated intensity of the broad component for various values of the surface roughness σ. (Bottom panel) Integrated intensity of the broad component as measured at several values of Qz along the orbital truncation rod and for several temperatures. In each case, the integrated intensity is scaled by Qz2 to emphasize the high Qz behavior. At temperatures approaching the bulk ordering temperature the measured integrated intensity increases faster with Qz, indicative of an increased surface roughness.Reuse & Permissions
  • Figure 4
    Figure 4
    (Top panel) Temperature dependence of the integrated intensity of the bulk orbital order superlattice reflection (red squares) measured at L=2, the integrated intensity of the sharp component of the orbital truncation rod measured at Qz = 0.13 Å1 (blue circles), and the broad component measured at Qz = 0.2 Å1 (magenta diamonds). (Middle panel) Temperature dependence of the correlation length as measured on the broad component of the orbital truncation rod at Qz = 0.2 Å1. (Bottom panel) Temperature dependence of the correlation lengths of the bulk orbital order superlattice reflection measured along the Qz and Qx directions (green circles and red squares, respectively) and the correlation length as measured on the broad component of the orbital truncation rod at Qz = 0.2 Å1.Reuse & Permissions
  • Figure 5
    Figure 5
    Schematic representation of the crystallographic surface, the orbital surface, and the orbitally ordered bulk for (a) TToo, (b) TToo, and (c) TToo. The size of the blue and yellow regions in the orbitally ordered bulk represents schematically the correlation length of the orbital order in the bulk. The roughness of the orbital surface is shown as the height variation of the shaded (blue and yellow) surface and the in-place correlation length by the size of the shaded surface regions. The relative size of the colored regions is physically correct, both within each temperature snapshot and from temperature to temperature, as determined from the x-ray scattering data analysis.Reuse & Permissions
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