Abstract
We present a detailed study of an electric-field-induced phase transition of a single layer of Fe on a Ni(111) substrate. Scanning tunneling microscopy at 4 K substrate temperature is used to provide the necessary electric field and to follow the transition from face-centered cubic to hexagonal close-packed stacking with atomic resolution.
- Received 26 February 2015
- Revised 30 April 2015
DOI:https://doi.org/10.1103/PhysRevB.91.184107
©2015 American Physical Society