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Tricritical behavior of the two-dimensional intrinsically ferromagnetic semiconductor CrGeTe3

G. T. Lin, H. L. Zhuang, X. Luo, B. J. Liu, F. C. Chen, J. Yan, Y. Sun, J. Zhou, W. J. Lu, P. Tong, Z. G. Sheng, Z. Qu, W. H. Song, X. B. Zhu, and Y. P. Sun
Phys. Rev. B 95, 245212 – Published 30 June 2017
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Abstract

CrGeTe3 recently emerges as a new two-dimensional (2D) ferromagnetic semiconductor that is promising for spintronic device applications. Unlike CrSiTe3 whose magnetism can be understood using the 2D-Ising model, CrGeTe3 exhibits a smaller van der Waals gap and larger cleavage energy, which could lead to a transition of magnetic mechanism from 2D to 3D. To confirm this speculation, we investigate the critical behavior of CrGeTe3 around the second-order paramagnetic-ferromagnetic phase transition. We obtain the critical exponents estimated by several common experimental techniques including the modified Arrott plot, Kouvel-Fisher method, and critical isotherm analysis, which show that the magnetism of CrGeTe3 follows the tricritical mean-field model with the critical exponents β, γ, and δ of 0.240±0.006, 1.000±0.005, and 5.070±0.006, respectively, at the Curie temperature of 67.9 K. We therefore suggest that the magnetic phase transition from 2D to 3D for CrGeTe3 should locate near a tricritical point. Our experiment provides a direct demonstration of the applicability of the tricritical mean-field model to a 2D ferromagnetic semiconductor.

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  • Received 6 April 2017

DOI:https://doi.org/10.1103/PhysRevB.95.245212

©2017 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

G. T. Lin1,2, H. L. Zhuang3, X. Luo1,*, B. J. Liu2,4, F. C. Chen1,2, J. Yan1,2, Y. Sun2,4, J. Zhou5, W. J. Lu1, P. Tong1, Z. G. Sheng4,6, Z. Qu4, W. H. Song1, X. B. Zhu1, and Y. P. Sun1,4,6,†

  • 1Key Laboratory of Materials Physics, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei 230031, China
  • 2University of Science and Technology of China, Hefei 230026, China
  • 3Department of Mechanical and Aerospace Engineering, Princeton University, Princeton, New Jersey 08544, USA
  • 4High Magnetic Field Laboratory, Chinese Academy of Sciences, Hefei 230031, China
  • 5MIIT Key Laboratory of Critical Materials Technology for New Energy Conversion and Storage, School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin 150001, China
  • 6Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China

  • *xluo@issp.ac.cn
  • ypsun@issp.ac.cn

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Issue

Vol. 95, Iss. 24 — 15 June 2017

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Images

  • Figure 1
    Figure 1

    (a) and (b) Temperature-dependent inverse susceptibility 1/χ(T) of CrGeTe3 under field cooled cooling with an applied magnetic field H of 100 Oe, parallel to the ab plane and c axis, respectively. The red solid lines are the fitted results according to the Curie-Weiss law. The insets show the isothermal magnetization curves M(H) at 5 K. (c) Specific heat Cp as a function of T for CrGeTe3 and the fitted CVDebye(T) using Eqs. (1) and (2); temperature-dependent magnetic (d) specific heat Cmag(T) and (e) entropy Smag(T). The blue dashed line refers to Smag(T) calculated with the magnetic moment S of Cr3+ being 3/2.

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  • Figure 2
    Figure 2

    (a) Initial magnetization of CrGeTe3 around TC. (b) Arrott plots of M2 versus H/M [the M(H) curves are measured at temperature intervals of 1 and 0.5 K approaching TC]. (c) Normalized slopes as a function of temperature. (d) Modified Arrott plot [M1/β versus (H/M)1/γ] of isotherms with β=0.24 and γ=1 for CrGeTe3. The red dashed line is the linear fit of isotherm at 67.9 K. (e) Temperature dependence of MS and χ01. The TC and critical exponents are obtained from the fitting of Eqs. (S1) and (S2). (f) The Kouvel-Fisher plot. The TC and critical exponents are obtained from the linear fit.

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  • Figure 3
    Figure 3

    (a) Isothermal M(H) at TC. The inset shows the alternative plot on a log-log scale and the straight line is the linear fit following Eq. (S3). (b) Renormalized magnetization m versus renormalized field h at several typical temperatures around the TC. The inset shows an alternative plot on a log-log scale; the effective exponents (c) below TC and (d) above TC as a function of the reduced temperature ɛ.

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  • Figure 4
    Figure 4

    (a) Formation energy of single-layer CrXTe3. The formation energy of single-layer CrSiTe3 is adopted from Ref. [55]. (b), (c), and (d) Charge density of bulk CrXTe3 with an isosurface value of 0.05e/rBohr3.

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