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Electronic Degeneracy and Intrinsic Magnetic Properties of EpitaxialNb:SrTiO3 Thin Films Controlled by Defects

A. Sarantopoulos, E. Ferreiro-Vila, V. Pardo, C. Magén, M. H. Aguirre, and F. Rivadulla
Phys. Rev. Lett. 115, 166801 – Published 14 October 2015
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Abstract

We report thermoelectric power experiments in e-doped thin films of SrTiO3 (STO) which demonstrate that the electronic band degeneracy can be lifted through defect management during growth. We show that even small amounts of cationic vacancies, combined with epitaxial stress, produce a homogeneous tetragonal distortion of the films, resulting in a Kondo-like resistance upturn at low temperature, large anisotropic magnetoresistance, and nonlinear Hall effect. Ab initio calculations confirm a different occupation of each band depending on the degree of tetragonal distortion. The phenomenology reported in this Letter for tetragonally distorted e-doped STO thin films, is similar to that observed in LaAlO3/STO interfaces and magnetic STO quantum wells.

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  • Received 8 April 2015

DOI:https://doi.org/10.1103/PhysRevLett.115.166801

© 2015 American Physical Society

Authors & Affiliations

A. Sarantopoulos1, E. Ferreiro-Vila1, V. Pardo2,3, C. Magén4,5,6, M. H. Aguirre4,5, and F. Rivadulla1,*

  • 1Centro de Investigación en Química Biológica y Materiales Moleculares (CIQUS), Universidad de Santiago de Compostela, 15782-Santiago de Compostela, Spain
  • 2Departamento de Física Aplicada, Universidade de Santiago de Compostela, Santiago de Compostela, Spain
  • 3Instituto de Investigacións Tecnolóxicas, Universidade de Santiago de Compostela, Santiago de Compostela, Spain
  • 4Laboratorio de Microscopás Avanzadas, Instituto de Nanociencia de Aragón, Universidad de Zaragoza, 50018 Zaragoza, Spain
  • 5Departamento de Física de la Materia Condensada, Universidad de Zaragoza, 50009 Zaragoza, Spain
  • 6Fundación ARAID, 50018 Zaragoza, Spain

  • *f.rivadulla@usc.es

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Issue

Vol. 115, Iss. 16 — 16 October 2015

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Images

  • Figure 1
    Figure 1

    (a) XRD patterns of 25(1) nm thick Nb:STO films grown on (001) STO, at different oxygen pressures. Numbers indicate the percentage of tetragonal distortion Δt. (b) High resolution reciprocal space map around the (103) reflection, for one film deposited at 1 mTorr. (c) Pressure dependence of the tetragonal distortion for thin films deposited on STO and LSAT. (d) Room temperature carrier density as a function of the tetragonal distortion, determined from Hall effect for samples deposited on STO. The cross corresponds to the theoretical value expected for the nominal Nb doping.

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  • Figure 2
    Figure 2

    HAADF-STEM image of Nb:STO thin films deposited on STO (e) and LSAT (a). GPA analysis showing the in-plane ϵxx (b, f) and out of plane ϵzz (c, g) elongation, with respect to the substrate. A profile along the film thickness is shown in panels (d) and (h). The analysis indicates a homogeneous tetragonal distortion Δt1.5% for STO and 2.5% for LSAT.

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  • Figure 3
    Figure 3

    (a) Band structure of bulk STO under a tetragonal distortion Δt=2% with the upper band split by spin-orbit coupling. The low-lying doublet is split as a result of the tetragonal distortion. (b) Total number of electrons with dxy symmetry as a function of the total number of d electrons, which decreases as the tetragonal distortion increases. (c) Temperature dependence of the Seebeck coefficient for thin films deposited on STO and (d) LSAT, for different Δt. The lines are calculations from Eq. (1).

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  • Figure 4
    Figure 4

    (a) Hall resistivity at different temperatures. The nonlinear behavior at high field disappears above T*. (b) The resistivity for two samples grown at the same oxygen pressure on different substrates, indicating the T* and the corresponding Δt. The solid line represents the fitting to the Kondo equation (see Supplemental Material [19]). (c) Temperature dependence of the resistivity for Nb:STO thin films deposited on STO substrates at different oxygen pressures (resulting in a different tetragonal distortion). (d) Variation of T*, as a function of the tetragonal distortion Δt.

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  • Figure 5
    Figure 5

    (a) Anisotropic magnetoresistance, for a 50 nm thick film deposited on STO at 10 mTorr (Δt0.68%). The magnetic field is applied in the plane of the film, perpendicular to the current. (b) Magnetoresistance of the same film measured at 2 K, with the magnetic field applied perpendicular to the surface of the film.

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