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Quantitative Disentanglement of the Spin Seebeck, Proximity-Induced, and Ferromagnetic-Induced Anomalous Nernst Effect in Normal-Metal–Ferromagnet Bilayers

Panagiota Bougiatioti, Christoph Klewe, Daniel Meier, Orestis Manos, Olga Kuschel, Joachim Wollschläger, Laurence Bouchenoire, Simon D. Brown, Jan-Michael Schmalhorst, Günter Reiss, and Timo Kuschel
Phys. Rev. Lett. 119, 227205 – Published 29 November 2017
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Abstract

We identify and investigate thermal spin transport phenomena in sputter-deposited Pt/NiFe2Ox (4x0) bilayers. We separate the voltage generated by the spin Seebeck effect from the anomalous Nernst effect (ANE) contributions and even disentangle the ANE in the ferromagnet (FM) from the ANE produced by the Pt that is spin polarized due to its proximity to the FM. Further, we probe the dependence of these effects on the electrical conductivity and the band gap energy of the FM film varying from nearly insulating NiFe2O4 to metallic Ni33Fe67. A proximity-induced ANE could only be identified in the metallic Pt/Ni33Fe67 bilayer in contrast to Pt/NiFe2Ox (x>0) samples. This is verified by the investigation of static magnetic proximity effects via x-ray resonant magnetic reflectivity.

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  • Received 17 February 2017

DOI:https://doi.org/10.1103/PhysRevLett.119.227205

© 2017 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Panagiota Bougiatioti1, Christoph Klewe1,2, Daniel Meier1, Orestis Manos1, Olga Kuschel3, Joachim Wollschläger3, Laurence Bouchenoire4,5, Simon D. Brown4,5, Jan-Michael Schmalhorst1, Günter Reiss1, and Timo Kuschel1,6

  • 1Center for Spinelectronic Materials and Devices, Department of Physics, Bielefeld University, Universitätsstraße 25, 33615 Bielefeld, Germany
  • 2Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
  • 3Department of Physics and Center of Physics and Chemistry of New Materials, Osnabrück University, Barbarastrasse 7, 49076 Osnabrück, Germany
  • 4XMaS, European Synchrotron Radiation Facility, Grenoble 38043, France
  • 5Department of Physics, University of Liverpool, Liverpool L69 7ZE, United Kingdom
  • 6Physics of Nanodevices, Zernike Institue for Advanced Materials, University of Groningen, Nijenborgh 4, 9747 AG Groningen, Netherlands

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Issue

Vol. 119, Iss. 22 — 1 December 2017

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Images

  • Figure 1
    Figure 1

    Schematic illustration of (a),(c) in-plane magnetized and (b) out-of-plane magnetized geometries, introducing the temperature gradient T, the magnetization vector M, the distance between the contacts LV, and the total length of the sample LT, respectively. (d) Flow chart for the quantitative separation of both ANE contributions from the LSSE voltage. The light green and grey areas correspond to the intermediate steps determining the correction factors A and B, respectively, taking into account the reduction of the ANE signal due to the additional Pt layer (spin polarized and/or nonmagnetic).

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  • Figure 2
    Figure 2

    Normalized voltage plotted against the magnetic field strength for (a),(b) Pt/NiFe2Ox2 and (c),(d) Pt/Ni33Fe67 bilayers measured in (a),(c) IPM and (b),(d) OPM geometries with the corresponding separation of the ANE contribution (FM induced and proximity induced) from the LSSE voltage. ANEFM+ANEprox (purple) represents the calculated ANE signal after the implementation of the correction factors A and B, which correct the reduction of the measured ANE from the OPM-Pt configuration due to the additional Pt layer (spin polarized and/or nonmagnetic).

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  • Figure 3
    Figure 3

    Normalized voltage in saturation against the heat flux for (a) Pt/NFO, (b),(c) Pt/NiFe2Ox1/x2, and (d) Pt/Ni33Fe67 samples with the corresponding separation of the ANE contribution (FM induced and proximity induced) from the LSSE voltage.

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  • Figure 4
    Figure 4

    SSE and ANEFM coefficients as a function of (a) the electrical conductivity σ for NiFe2Ox1/x2 (blue area), NFO (orange area), and Ni33Fe67 (green area) samples and (b) the optical band gap for NiFe2Ox1/x2 and NFO samples.

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