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Epitaxial growth of perovskite SrBiO3 film on SrTiO3 by oxide molecular beam epitaxy

Fengmiao Li, Bruce A. Davidson, Ronny Sutarto, Hyungki Shin, Chong Liu, Ilya Elfimov, Kateryna Foyevtsova, Feizhou He, George A. Sawatzky, and Ke Zou
Phys. Rev. Materials 3, 100802(R) – Published 14 October 2019
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Abstract

Hole-doped perovskite bismuthates such as Ba1xKxBiO3 and Sr1xKxBiO3 are well-known bismuth-based oxide high-transition-temperature superconductors. Reported thin bismuthate films show relatively low quality, likely due to their large lattice mismatch with the substrate and a low sticking coefficient of Bi at high temperatures. Here, we report the successful epitaxial thin film growth of the parent compound strontium bismuthate SrBiO3 on SrO-terminated SrTiO3 (001) substrates by molecular beam epitaxy. Two different growth methods, high-temperature codeposition or recrystallization cycles of low-temperature deposition plus high-temperature annealing, are developed to improve the epitaxial growth. SrBiO3 has a pseudocubic lattice constant 4.25 Å and an 8.8% lattice mismatch on SrTiO3 substrate, leading to a large strain in the first few unit cells. Films thicker than 6 unit cells prepared by both methods are fully relaxed to bulk lattice constant and have similar quality. Compared to high-temperature codeposition, the recrystallization method can produce higher quality 1- to 6-unit cell films that are coherently or partially strained. Photoemission experiments reveal the bonding and antibonding states close to the Fermi level due to Bi and O hybridization, in good agreement with density functional theory calculations. This work provides general guidance to the synthesis of high-quality perovskite bismuthate films.

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  • Received 31 July 2019

DOI:https://doi.org/10.1103/PhysRevMaterials.3.100802

©2019 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Fengmiao Li1,2,*, Bruce A. Davidson1,2, Ronny Sutarto3, Hyungki Shin1,2, Chong Liu1,2, Ilya Elfimov1,2, Kateryna Foyevtsova1,2, Feizhou He3, George A. Sawatzky1,2, and Ke Zou1,2

  • 1Department of Physics and Astronomy, University of British Columbia, Vancouver, British Columbia V6T 1Z1, Canada
  • 2Stewart Blusson Quantum Matter Institute, University of British Columbia, Vancouver, British Columbia V6T 1Z4, Canada
  • 3Canadian Light Source, Saskatoon, Saskatchewan S7N 2V3, Canada

  • *fengmiao.li@qmi.ubc.ca

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Issue

Vol. 3, Iss. 10 — October 2019

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Images

  • Figure 1
    Figure 1

    [(a)–(d)] [100] direction RHEED pattern of 2 AL SrO (a), 2 UC SBO (b), 4 UC SBO (c), and 20 UC SBO (d) grown by high-temperature codeposition; (e) RHEED intensity oscillations of the specular and (01) diffraction spot after 6 UC SBO film growth on SrO-terminated STO. (f) AFM image of 20 UC SBO film surface; (g) XRD of the 20 UC SBO film grown on STO substrate. * and label SBO (001) and STO (001) diffractions, respectively.

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  • Figure 2
    Figure 2

    [(a)–(d)] [100] direction RHEED pattern of 2 AL SrO (a), 1 UC SBO (b), 4 UC SBO (c) and 6 UC SBO (d) by the recrystallization method; (e) top panel: substrate temperature cycle during film growth; bottom panel: Sr and Bi shutter open-close status; (f) AFM image of 28 UC SBO film surface; and (g) XRD of the 28 UC SBO film grown on STO substrate. * and label SBO (001) and STO (001) diffraction, respectively.

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  • Figure 3
    Figure 3

    XPS of O1s (a), Bi4f (b), and Sr3d (c) measured on the 20 UC SBO film grown on Nb-doped STO using the high-temperature codeposition method.

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  • Figure 4
    Figure 4

    (a) Valence band information collected by XPS on the 20 UC SBO film grown on Nb-doped STO using the high-temperature codeposition method. (b) Total DOS and partial DOS for Bi 6s and O 2p calculated with HSE hybrid functional DFT [8] and the 1.4 eV indirect band gap was obtained. Since the Fermi level position located in SBO band gap is uncertain in DFT calculation, peaks at 2 eV in theory and 4 eV in experiment are aligned for comparison.

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