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Paper
6 November 1998 Dynamically figured Kirkpatrick Baez x-ray microfocusing optics
Peter J. Eng, Matthew Newville, Mark L. Rivers, Stephen R. Sutton
Author Affiliations +
Abstract
We present the optical designs, modeling, bender design and test results of x-ray micro- focusing optics used to micro-focus monochromatic undulator x-rays at the Advanced Photon Source (APS). The system uses two 100mm long, actively bent mirrors in a Kirkpatrick Baez arrangement. A detailed analytical model of the system's performance is described along with ray tracing result. A description of the integration of the benders into a compete micro- focusing system is provided. The system is easy to setup and use and is presently used in earth science research coupled to techniques such as micro-spectroscopy, fluorescence microprobe, and energy dispersive diffraction. The optics' performance is measured on the GeoSoilEnviroCARS microprobe experimental station at APS sector 13. Focusing tests using 10keV undulator x-rays result in a double focused beam with a horizontal and vertical full width at half maximum of 0.80micrometers X 0.85micrometers , and flux density gain greater than 105.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter J. Eng, Matthew Newville, Mark L. Rivers, and Stephen R. Sutton "Dynamically figured Kirkpatrick Baez x-ray microfocusing optics", Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, (6 November 1998); https://doi.org/10.1117/12.330342
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Cited by 93 scholarly publications.
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KEYWORDS
Mirrors

X-rays

X-ray optics

Reflectivity

Luminescence

Sensors

Silicon

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