We present the optical designs, modeling, bender design and test results of x-ray micro- focusing optics used to micro-focus monochromatic undulator x-rays at the Advanced Photon Source (APS). The system uses two 100mm long, actively bent mirrors in a Kirkpatrick Baez arrangement. A detailed analytical model of the system's performance is described along with ray tracing result. A description of the integration of the benders into a compete micro- focusing system is provided. The system is easy to setup and use and is presently used in earth science research coupled to techniques such as micro-spectroscopy, fluorescence microprobe, and energy dispersive diffraction. The optics' performance is measured on the GeoSoilEnviroCARS microprobe experimental station at APS sector 13. Focusing tests using 10keV undulator x-rays result in a double focused beam with a horizontal and vertical full width at half maximum of 0.80micrometers X 0.85micrometers , and flux density gain greater than 105.
|