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Noise Insights into Electronic Transport

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Abstract

Typical experimental measurement is set up as a study of the system’s response to a stationary external excitation. This approach considers any random fluctuation of the signal as spurious contribution, which is to be eliminated via time-averaging, or, equivalently, bandwidth reduction. Beyond that lies a conceptually different paradigm—the measurement of the system’s spontaneous fluctuations. The goal of this overview article is to demonstrate how current noise measurements bring insight into hidden features of electronic transport in various mesoscopic conductors, ranging from 2D topological insulators to individual carbon nanotubes.

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Authors and Affiliations

  1. Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow region, 142432, Russia

    S. U. Piatrusha, L. V. Ginzburg, E. S. Tikhonov, D. V. Shovkun, A. V. Bubis & V. S. Khrapai

  2. Moscow Institute of Physics and Technology (State University), Dolgoprudnyi, Moscow region, 141700, Russia

    S. U. Piatrusha, L. V. Ginzburg, E. S. Tikhonov, D. V. Shovkun, A. V. Bubis & A. K. Grebenko

  3. Walter Schottky Institut, Physik Department, and Center for Nanotechnology and Nanomaterials, Technische Universität München, Garching, 85748, Germany

    G. Koblmüller

  4. Skolkovo Institute of Science and Technology, Moscow, Russia

    A. V. Bubis, A. K. Grebenko & A. G. Nasibulin

  5. Department of Applied Physics, School of Science, Aalto University, Aalto, FI-00076, Finland

    A. G. Nasibulin

  6. Department of Physics, Moscow State University of Education, Moscow, 119435, Russia

    V. S. Khrapai

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  1. S. U. Piatrusha
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Piatrusha, S.U., Ginzburg, L.V., Tikhonov, E.S. et al. Noise Insights into Electronic Transport. Jetp Lett. 108, 71–83 (2018). https://doi.org/10.1134/S0021364018130039

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