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New evolutionary techniques for test-program generation for complex microprocessor cores

Published: 25 June 2005 Publication History

Abstract

Checking if microprocessor cores are fully functional at the end of the productive process has become a major issue. Traditional functional approaches are not sufficient when considering modern designs. This paper describes new improvements for an existing evolutionary algorithm, called µGP, able to generate Turing-complete programs; these are exploited, along with hardware acceleration techniques, to add content to a qualifying test campaign by automatically generating assembly programs. The approach is suitable for medium-sized processor cores. The experimental evaluation performed on a SPARCv8 clearly shows the potentiality of the approach, and the effectiveness of the enhancements to the evolutionary core.

References

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International Technology Roadmap for Semiconductors, 2003 edition
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K. Batcher, C. Papachristou, "Instruction Randomization Self Test For Processor Cores", IEEE VLSI Test Symposium, 1999, pp. 34--40
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L. Chen, S. Dey, "DEFUSE: A Deterministic Functional Self-Test Methodology for Processors", IEEE VLSI Test Symposium, 2000, pp. 255--262
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P. Parvathala, K. Maneparambil, W. Lindsay, "FRITS - a Microprocessor Functional Bist Method", International Test Conference, 2002, pp. 590--598
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F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero, "Fully Automatic Test Program Generation for Microprocessor Cores", IEEE Design, Automation and Test in Europe, 2003, pp. 1006--1011
[6]
G. Squillero, "MicroGP - An Evolutionary Assembly Program Generator", to appear on: Genetic Programming and Evolvable Machines, 2005
[7]
Jin-Hua Hong, Shih-Arn Hwang, Cheng-Wen Wu, "An FPGA-based hardware emulator for fast fault emulation", IEEE 39th Midwest Symposium on, Volume: 1, 18-21 Aug. 1996, pp. 345--348 val.1
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SPARC International, The SPARC Architecture Manual
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N. Kranitis, G. Xenoulis, A. Paschalis, D. Gizopoulos, Y. Zorian, "Application and Analysis of RT-Level Software-Based Self-Testing for Embedded Processor Cores", International Test Conference, 2003, pp. 431--440

Cited By

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  • (2024)Optimizing System-Level Test Program Generation via Genetic Programming2024 IEEE European Test Symposium (ETS)10.1109/ETS61313.2024.10567817(1-4)Online publication date: 20-May-2024
  • (2020)Exploring the Mysteries of System-Level Test2020 IEEE 29th Asian Test Symposium (ATS)10.1109/ATS49688.2020.9301557(1-6)Online publication date: 23-Nov-2020
  • (2009)A framework for finding minimal test vectors for stuck-at-faults2009 International Conference on Information and Communication Technologies10.1109/ICICT.2009.5267180(259-262)Online publication date: Aug-2009
  • Show More Cited By

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  1. New evolutionary techniques for test-program generation for complex microprocessor cores

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    cover image ACM Conferences
    GECCO '05: Proceedings of the 7th annual conference on Genetic and evolutionary computation
    June 2005
    2272 pages
    ISBN:1595930108
    DOI:10.1145/1068009
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Publication History

    Published: 25 June 2005

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    Author Tags

    1. automatic test program generation
    2. evolutionary algorithms

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    Overall Acceptance Rate 1,669 of 4,410 submissions, 38%

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    Cited By

    View all
    • (2024)Optimizing System-Level Test Program Generation via Genetic Programming2024 IEEE European Test Symposium (ETS)10.1109/ETS61313.2024.10567817(1-4)Online publication date: 20-May-2024
    • (2020)Exploring the Mysteries of System-Level Test2020 IEEE 29th Asian Test Symposium (ATS)10.1109/ATS49688.2020.9301557(1-6)Online publication date: 23-Nov-2020
    • (2009)A framework for finding minimal test vectors for stuck-at-faults2009 International Conference on Information and Communication Technologies10.1109/ICICT.2009.5267180(259-262)Online publication date: Aug-2009
    • (2006)A brief survey of μGPACM SIGEVOlution10.1145/1147192.11471951:2(17-21)Online publication date: 1-Jun-2006
    • (2006)Evolving Warriors for the Nano Core2006 IEEE Symposium on Computational Intelligence and Games10.1109/CIG.2006.311712(272-278)Online publication date: May-2006
    • (2006)An Evolutionary Methodology to Enhance Processor Software-Based Diagnosis2006 IEEE International Conference on Evolutionary Computation10.1109/CEC.2006.1688401(859-864)Online publication date: 2006

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