Abstract
In deep submicron (DSM) integrated circuits (IC), coupling capacitors between interconnects become dominant over grounded capacitors. As a result, the dynamic power dissipation of one node is no longer only in relation to the signal on that node, and it also depends on signals on its neighbor nodes through coupling capacitors. Thus, for their limitation in dealing with capacitively coupled nets, past jobs on power estimation are facing rigorous challenges and need to be ameliorated. This paper proposes and proves a simple and fast approach to predicting dynamic power dissipation of coupled interconnect networks: a coupling capacitor in dynamic CMOS logic circuits is decoupled and mapped into an equivalent cell containing an XOR gate and a grounded capacitor, and the whole circuit after mapping, consuming the same power as the original one, could be easily managed by generally-used gate-level power estimation tools. This paper also investigates the correlation coefficient method (CCM). Given the signal probabilities and the correlation coefficients between signals, the dynamic power of interconnect networks can be calculated by using CCM. It can be proved that the decoupling method and CCM draw identical results, that is to say, the decoupling method implicitly preserves correlation properties between signals and there is no accuracy loss in the decoupling process. Moreover, it is addressed that the coupling capacitors in static CMOS circuits could be decoupled and mapped into an equivalent cell containing a more complicated logic block, and the power can be obtained by the probability method for dynamic CMOS logic circuits.
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References
Freund, R. W., Feldmann, P., The SyMPVL algorithm and its applications to interconnect simulation, in Numer. Anal. Manuscript, Murray Hill, NJ: Bell Labs., June 1997.
Odabasioglu, A., Celik, M., Pileggi, L. T., PRIMA: Passive reducedorder interconnect macromodeling algorithm, IEEE Trans. Computer- Aided Design, Aug. 1998, 17: 645–654.
Cai Xia, Yang Huazhong, Jia Yaowei et al., RSPICE: a fast and robust timing simulator for digital MOS VLSI, IEICE Trans. Fundamentals, Nov. 1999, E82-A(11): 2492–2498.
Yang Huazhong, Cai Xia, Jia Yaowei, MOS transistor model and fast timing simulator, Electronics Letters, April, 1999, 35(7): 561–563.
Kayssi, A. I., Sakallah, K. A., Mudge, T. N., The impact of signal transition time on path delay computation, IEEE Transaction on Circuit and System-II: Analog and Digital Signal Processing, May 1993, 40(5): 302–309.
Franzini, B., Forzan, C., Pandini, D. et al., Crosstalk aware static timing analysis: A two step approach, Proc. IEEE Int. Sym. Quality Electr. Design, San Jose, CA, March 2000, 499–503.
Gao, D. S., Yang, A. T., Kang, S., Modelling and simulation of interconnection delays and crosstalk in high-speed intergrated circuits, IEEE Trans. Circuits Syst., Jan. 1990, SC-37(1): 1–9.
Chen Bin, Yang Huazhong, Wang Hui, Noise estimation of deep sub-micron integrated circuits, Science in China, Ser. F, 2001, 44(5): 396–400.
Chen, P., Keutzer, K., Towards true crosstalk noise analysis, IEEE/ACM Int. Conf. Comp-Aided Design, San Jose, CA, Nov.1999, 132–137.
Ercolani, S., Favalli, M., Damiani, M. et al., Estimate of signal probability in combinational logic networks, 1989 IEEE European Test Conf., Paris, April, 1989, 132–138.
Najm, F., A survey of power estimation in VLSI circuits, IEEE Tran. On VLSI Systems, Nov. 1994, 2(4): 446–455.
Pedram, M., Power simulation and estimation in VLSI circuits, in The VLSI Handbook (ed. Chen, W.-K.), Boca Raton: CRC Press and New York: IEEE Press, 1999, 18-1–18-23.
Najm, F., Transition density, a new measure of activity in digital circuit, IEEE Trans. Computer-Aided Design, Feb. 1993. 12: 310–323.
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Huang, G., Yang, H., Luo, R. et al. An approach to predicting dynamic power dissipation of coupled interconnect network in dynamic CMOS logic circuits. Sci China Ser F 45, 286–298 (2002). https://doi.org/10.1360/02yf9025
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DOI: https://doi.org/10.1360/02yf9025