Abstract

We propose a new type of scanning fluorescence microscope capable of resolving 35 nm in the far field. We overcome the diffraction resolution limit by employing stimulated emission to inhibit the fluorescence process in the outer regions of the excitation point-spread function. In contrast to near-field scanning optical microscopy, this method can produce three-dimensional images of translucent specimens.

© 1994 Optical Society of America

Stimulated emission depletion microscopy with a supercontinuum source and fluorescence lifetime imaging

Egidijus Auksorius, Bosanta R. Boruah, Christopher Dunsby, Peter M. P. Lanigan, Gordon Kennedy, Mark A. A. Neil, and Paul M. W. French
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Effects of coherence and vector properties of the light on the resolution limit in stimulated emission depletion fluorescence microscopy

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The noise-limited-resolution for stimulated emission depletion microscopy of diffusing particles

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Saturated Förster resonance energy transfer microscopy with a stimulated emission depletion beam: a pathway toward single-molecule resolution in far-field bioimaging

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Subdiffraction resolution in far-field fluorescence microscopy

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