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Dielectric Measurements On Printed-Wiring And Circuit Boards, Thin Films, And Substrates: An Overview

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Abstract

A review of the most common methods of permittivity measurements on thin films, printed-wiring and circuit boards, and substrates is presented. Transmission-line techniques, coaxial apertures, open resonators, surface-wave modes, and dielectric resonators methods are examined. The frequency range of applicability and typical uncertainties associated with the methods are summarized.

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  1. Electromagnetic Fields Division, National Institute of Standards and Technology, MS 813.08, Boulder, CO, 80303-3328, USA

    James Baker-Jarvis & Chriss A. Jones

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Baker-Jarvis, J., Jones, C.A. Dielectric Measurements On Printed-Wiring And Circuit Boards, Thin Films, And Substrates: An Overview. MRS Online Proceedings Library 381, 153–164 (1995). https://doi.org/10.1557/PROC-381-153

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