膜物性の英語

プラスチック容器の物性を改善するための薄膜成膜方法を提供する。例文帳に追加

To provide a thin film-forming process for improving physical properties of plastic vessels. - 特許庁

さらに、形成される塗膜は、伸び率が大きく、耐チッピング性等の塗膜物性が良好なものとなる。例文帳に追加

A coating film formed from the sol exhibits high elongation and excellent physical properties such as chipping resistance. - 特許庁

薄膜の膜応力評価方法と機械的・熱的物性値同定方法とその装置例文帳に追加

MEMBRANE STRESS EVALUATION METHOD, METHOD FOR IDENTIFYING MECHANICAL/THERMAL MATERIAL PROPERTY VALUE, AND ITS SYSTEM - 特許庁

基材に金属被膜を形成した金属被膜見本材と、前記金属被膜見本材における金属被膜の物性を記録した物性記録媒体とを備えることを特徴とする金属被膜見本キット。例文帳に追加

The metal coating specimen kit includes: a metal coating specimen material in which a metal coating is formed on a base material; and a physical properties recording medium in which a physical property of the metal coating in the metal coating specimen material is recorded. - 特許庁

校正試験片と物性の異なる材料の絶縁膜の膜厚測定を可能とする絶縁膜の膜厚測定方法を提供する。例文帳に追加

To provide a method of measuring a film thickness of an insulating film which enables film thickness measurement of an insulating film made of a material having different properties from a calibration test piece. - 特許庁

基材の表面への透光性膜の成膜、又は基材の表面に成膜された透光性膜の膜処理を行う基材処理装置において、透光性膜の膜物性のリアルタイム測定を実施し、高精度な膜物性制御を行う。例文帳に追加

To control film properties at high accuracy by a base material processing apparatus, which is provided for forming a translucent film on the surface of a base material or for performing film processing to the translucent film formed on the surface of the base material, and to perform a real-time measurement of the film properties of the translucent film. - 特許庁

基板表面に形成した薄膜の物性を非破壊かつ高精度で測定することができる物性測定装置、物性測定方法、薄膜基板製造システム及びプログラムを提供する。例文帳に追加

To provide a physical property measuring device, a method of measuring physical properties, a thin-film substrate manufacturing system, and a program for nondestructively and precisely measuring physical properties of a thin film formed on the surface of a substrate. - 特許庁

数十〜数百ナノメートルオーダーの金属膜あるいは有機膜の薄膜の熱物性測定を容易にかつ簡便に行うことができるナノ薄膜熱物性測定方法および測定装置を提供する。例文帳に追加

To provide a nano-thin film thermophysical property measuring method and a measuring device capable of performing easily and simply thermophysical measurement of a thin film of a metal film or an organic film in the several-ten to several-hundred nanometer order. - 特許庁