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This study proposes a domain-specific automated machine learning (AutoML) method to self-learn the optimal models for defect diagnosis and prognosis. Firstly, a ...
Feb 21, 2024 · Request PDF | On Jun 9, 2023, Qing Han and others published AutoML with Focal Loss for Defect Diagnosis and Prognosis in Smart Manufacturing ...
Abstract—Reliable defect diagnosis and prognosis for pro- duction lines are of great benefit in a range of advanced solutions towards smart manufacturing ...
AutoML with Focal Loss for Defect Diagnosis and Prognosis in Smart Manufacturing. スマート製造における欠陥診断および予後のための焦点損失を伴うAutoML【JST・京 ...
Mar 20, 2024 · Zeng, Adaptive modelling for anomaly detection and defect diagnosis in semiconductor smart manufacturing: A domain- specific automl, in ...
Mar 19, 2024 · This study proposes a domain-specific explainable automated machine learning technique (termed xAutoML), which autonomously self-learns the optimal models for ...
Adaptive Modelling for Anomaly Detection and Defect Diagnosis in Semiconductor Smart Manufacturing: A Domain-specific AutoML ... Focal Loss for Dense Object ...
Missing: Prognosis | Show results with:Prognosis
-- AutoML with Focal Loss for Defect Diagnosis and Prognosis in Smart Manufacturing,"Q. -- Wafer Map Defect Recognition and Accurate Localization Based on ...
AutoML with Focal Loss for Defect Diagnosis and Prognosis in Smart Manufacturing. ... Diagnosis in Semiconductor Smart Manufacturing: A Domain-specific AutoML ...
AutoML with Focal Loss for Defect Diagnosis and Prognosis in Smart Manufacturing · Qing HanYu XiaXiupeng ShiZeng Zeng. Engineering, Computer Science. 2023 IEEE ...