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In this paper we propose a new concept called Consistency which provides a data-driven objective way to assess an outlier model. We study the development of ...
In this paper we propose a new concept called Consistency which provides a data-driven objective way to assess an outlier model. We study the development of ...
The consistency is based on the following assumption: Outlier decisions on one wafer should be consistent with outlier decisions on other similar wafers. This ...
This paper proposes a new concept called Consistency which provides a data-driven objective way to assess an outlier model and studies the development of ...
Consistency in wafer based outlier screening | Request PDF
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This article is concerned with feature screening for varying coefficient models with ultrahigh-dimensional predictors. We propose a new sure independence ...
Consistency in wafer based outlier screening IEEE VLSI Test Symposium, 2016. [12] F. Grubbs. Procedures for detecting outlying observations in samples.
yieldWerx uses advanced analytics algorithms to analyze wafer maps and identify outliers that may indicate systematic errors in the manufacturing process.
Missing: Consistency based
We define the estimated yield of each outlier detection method as one minus the percentage of normal chips we will reject together with the customer failure ...
Wafer Map Pattern Recognition is crucial in the semiconductor industry. It is a sophisticated approach to detecting outliers and anomalies in wafer data.
Jun 5, 2020 · This is based on the observation that die near the edge of a wafer are more likely to be defective and can be discarded even prior to probe ...