We give the first subexponential time deterministic polynomial identity testing algorithm for depth-4 multilinear circuits with a small top fan-in.
We give the first sub-exponential time deterministic polynomial identity testing algorithm for depth-4 multilinear circuits with a small top fan-in.
Jun 5, 2010 · We give the first sub-exponential time deterministic polynomial identity testing algorithm for depth-4 multilinear circuits with a small top ...
Nov 15, 2009 · Abstract. We give the first sub-exponential time deterministic polynomial identity testing algorithm for depth-4 multilinear circuits with a ...
We give the first sub-exponential time deterministic polynomial identity testing algorithm for depth-4 multilinear circuits with a small top fan-in.
For depth-4 multilinear circuits with bounded fan in top gate, our result provided the first efficient identity testing algorithm. This result was improved ...
Request PDF | On Jan 1, 2009, Zohar Shay Karnin and others published Deterministic identity testing of depth 4 multilinear circuits with bounded top fan-in.
We give the first subexponential time deterministic polynomial identity testing algorithm for depth-4 multilinear circuits with a small top fan-in.
Apr 22, 2023 · Title:Deterministic identity testing paradigms for bounded top-fanin depth-4 circuits. Authors:Pranjal Dutta, Prateek Dwivedi, Nitin Saxena.
Missing: Multilinear | Show results with:Multilinear
Jul 8, 2021 · Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in. SIAM Journal on Computing, 42(6):2114-2131, 2013 ...