In this work, we present a new cell-aware delay diagnosis algorithm, based on accurate delay fault models derived by analog simulation, which can pinpoint the ...
Abstract — The semiconductor industry is encountering an increasing number of front-end-of-line defects in the advanced. FinFET technology nodes due to ...
A new cell-aware delay diagnosis algorithm, based on accurate delay fault models derived by analog simulation, which can pinpoint the defect location within ...
A new and powerful scan diagnosis technology is now available that uses analog simulation-based fault models to diagnose timing-related cell internal defects in ...
Jul 25, 2017 · Cell-aware diagnosis works for any scan ATPG pattern type, such as stuck-at, transition delay, and cell-aware. Timing-related defect-specific ...
Diagnosing timing related cell internal defects for FinFET technology, VLSI Design. Automation and Test(VLSI-DAT). (2015). W. Howell et al. DPPM reduction ...
Diagnosing timing related cell internal defects for FinFET technology ... Diagnosing timing related cell internal defects for FinFET technology. Citing ...
Apr 19, 2017 · Cell-aware diagnosis results result on timing-related FinFET test failures ... Tang, H., et al., “Diagnosing Cell Internal Defects Using ...
level of a FinFET 6T SRAM cell designed on a 14 nm technology. Page 56. 2.3 ... Dynamic faults in the peripheral circuitry faults are timing-related faults in the ...
