This paper shows an efficient flow, consistent with the proposed IEEE P2427 Standard for Analog Defect Modeling and Coverage.

This paper shows an efficient flow, consistent with the proposed IEEE P2427 Standard for Analog Defect Modeling and. Coverage. The flow describes development of ...

AC and DC mode simulations assume that a circuit is linear and they are very efficient for simulating open, short, and variation defects. But, these simulations ...

This paper proposes a multi-tier approach relying on the power of abstraction to limit the overall number of fault- injection simulations to realize and to ...

Building efficient analog defect injection and simulation techniques became strategic for manufacturers [2] . In this context, the maturity of the techniques ...

Tessent DefectSim is a transistor-level defect simulator for analog, mixed-signal (AMS), and non-scan digital circuits.

Oct 22, 2024 · Efficient dc fault simulation of nonlinear analog circuits is addressed in this paper. Two techniques, one-step relaxation and adaptive ...

Sep 10, 2024 · P2427 formalizes these processes, providing a clear methodology for calculating defect coverage and improving the overall accountability of AMS chip testing.

Jul 13, 2023 · In this work, we present a simple and time-efficient defect simulation framework for pre-silicon testing of AMS circuits.

Fault Sensitivity Analysis (FSA) is a technique for the efficient simulation of analog defects without affecting the simulation accuracy of non-linear circuits ...