Jan 21, 2018 · The sequential single input change (SSIC) sequence used in deterministic BIST is presented in this paper for decreasing the dynamic power, ...
The SSIC sequence generator is designed. The simulation results using benchmark circuits show that the SSIC sequences can increase fault coverage and decrease ...
Algorithm and Hardware Implementation for Generation of ...
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In this paper, generation of sequential SIC (SSIC) test sequences based on deterministic built-in self-test (BIST) is proposed for decreasing the test power ...
In this paper, sequential SIC (SSIC) test sequence based on deterministic BIST is proposed for decreasing the test power consumption and test application time ...
In our current work, we focus on the low power analysis and verification challenges and the methodology used to verify low power design.
In this paper, generation of sequential SIC (SSIC) test sequences based on deterministic built-in self-test (BIST) is proposed for decreasing the test power ...
Generation of Low Power SSIC Sequences ... Single input change (SIC) sequence for VLSI testing has been researched because of effectiveness to more test fault m..
The way a specific low-discrepancy sequence interacts with a transformation method seems to be an interesting problem to explore. Based on these results, we ...
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We compiled >200 nuclear export signal (NES)–containing CRM1 cargoes in a database named NESdb. We analyzed the sequences and three-dimensional structures of ...