This paper analyzes the normal response and the sensitivity to Single Event Transients (SETs) of a CMOS pulse stretching circuit used for the SET pulse width ...
Oct 2, 2022 · Bibliographic details on Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp.
An experimental evaluation of the sensitivity to Analog Single Events of a full-custom CMOS Operational Amplifier is reported. The output voltage waveform ...
An experimental evaluation of the sensitivity to Analog Single Events of a full-custom CMOS Operational Amplifier is reported. The output voltage waveform ...
Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp. A. Fontana, S. Pazos, F. Aguirre, F. Palumbo, N. Vega, N. Müller, ...
Mar 28, 2019 · In this paper, charge-sharing effects on analog single-event transients are experimentally observed in a fully custom designed, ...
Missing: Study | Show results with:Study
In this work, charge sharing effects on Analog Single Event Transients are experimentally observed in a fully-custom designed, 180nm CMOS Operational ...
Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp. ... German National Research Data Infrastructure (NFDI). NFDI4DataScience · ORKG ...
Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp. A. Fontana, S. Pazos, F. Aguirre, F. Palumbo, N. Vega, N. Müller, E. de la ...
Diagnose of radiation induced single event effects in a PLL using a heavy ion microbeam · Evolution of the gate current in 32 nm MOSFETs under irradiation.