Abstract: Capitalizing on the larger capacity of today's ICs, designers are using yesterday's chips as modules in today's chips.

This article presents a systematic way of designing the second-level compression logic. This method preserves the same X and multiple-error tolerance as the ...

This article presents a systematic way of designing the second-level compression logic. This method preserves the same X and multiple-error tolerance as the ...

This article shows how the X-compact compression technique in a hierarchical environment can be used to reuse yesterday's chips as modules in today's chips.

Mar 1, 2008 · This article presents a systematic way of designing the second-level compression logic. This method preserves the same X and multiple-error ...

Sep 9, 2013 · Synopsys automates standards-based hierarchical test insertion and improves test compression for SoCs; Mentor teams with ScanWorks for ...

A hierarchical test scheme for SOC designs has been proposed, which is ... compression. In Proc. Design, Automation and Test in Eu- rope (DATE), pages ...

Jan 11, 2022 · Hierarchical test enables faster DFT sign-off and maximizes reuse; however, the DFT architecture of the design still needs to be established ...

Sep 24, 2019 · So, it is no wonder that test engineers employ a hierarchical DFT methodology for SoCs. Why? Because the SoC is already hierarchical and they do ...

This work presents a multilevel scan compression architecture that combines a flexible test compression core with an efficient dynamic broadcast structure ...