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We introduce a methodology to predict degradation in an SoC device undergoing a thermally accelerated aging process. SoCs are usually stressed at high ...
We introduce a methodology to predict degradation in an SoC device undergoing a thermally accelerated aging process. SoCs are usually stressed at high ...
Abstract—— We introduce a methodology to predict degra- dation in an SoC device undergoing a thermally accelerated aging process. SoCs are usually stressed ...
This paper provides a kind of prediction method of thermal cycling life for electrical connectors. First, the accelerated thermal cycling tests were carried ...
Parvez Anwar Chanawala, Ian Hill , S. Arash Sheikholeslam, André Ivanov: Prediction of Thermally Accelerated Aging Process at 28nm. ETS 2022: 1-2.
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To improve the robustness of aging modeling, this work proposes a new approach to adaptively stress the device to. EOL in an accelerated and controllable manner ...
In this work, we studied the main aging mechanisms of 28-nm FPGAs. Different stress signals and LUT configurations were applied in aging tests. The results ...
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Chanawala, I. Hill, S. A. Sheikholeslam and A. Ivanov, “Prediction of Thermally Accelerated Aging Process at 28nm,” 2022 IEEE European Test Symposium (ETS), ...