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This paper addresses the problem of testing the RAM mode of the LUT/RAM modules of configurable SRAM-based Field Programmable Gate Arrays (FPGAs) using a m.
This paper presents a unique scheme for testing and locating multiple stuck at faults in the embedded RAM modules of SRAM-based FPGAs. The RAM modules are ...
This paper addresses the problem of testing the RAM mode of the LUT/RAM modules of configurable SRAM-based Field Programmable Gate Arrays (FPGAs) using a ...
Abstract. This paper addresses the problem of testing the RAM mode of the LUT/RAM modules of configurable. SRAM-based Field Programmable Gate Arrays (FPGAs) ...
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This paper presents a unique scheme for testing and locating multiple stuck at faults in the embedded RAM modules of SRAM-based FPGAs. The RAM modules are ...
This paper presents a unique scheme for testing and locating multiple stuck at faults in the embedded RAM modules of SRAM-based FPGAs. The RAM modules are ...
I do measurement-tests directly on the SRAM, so it's not a wiring-problem. I have 80MHz sampling frequency on a 50MHz FPGA clock (I could not get 100MHz).
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This paper presents a unique scheme for testing and locating multiple stuck at faults in the embedded RAM modules of SRAM-based FPGAs. The RAM modules are ...
Missing: Testing | Show results with:Testing
The issues involved in testing memory modules (configured as LUTs and RAMs) in FPGAs are studied and new algorithms are proposed as this scenario is ...
Abstract. The objective of this paper is to define a minimum number of configurations for testing the configurable modules that.