Abstract: This paper presents a method to address state explosion in timed-circuit verification by using abstraction directed by the failure model.

This paper presents a method to address state explo- sion in timed circuit verification by using abstraction di- rected by the failure model.

Abstract—This paper presents a method to address state ex- plosion in timed circuit verification by using abstraction directed by the failure model.

We present a method to address state explosion in timed circuit verification by using abstraction directed by the failure model.

Abstract: We present a method to address state explosion in timed circuit verification by using abstraction directed by the failure model.

This paper presents a method to address state explosion in timed-circuit verification by using abstraction directed by the failure model.

Verification of timed circuits with failure-directed abstractions Journal Article ... published in. IEEE Transactions on Computer - Aided Design of Integrated ...

Hao Zheng, Chris J. Myers, David Walter , Scott Little, Tomohiro Yoneda: Verification of Timed Circuits with Failure Directed Abstractions. ICCD 2003: 28-35.

Verification of timed circuits with failure directed abstractions. Hao Zheng, Chris Myers, David Walter, Scott Little, Tomohiro Yoneda. October 2003.

Overview ; CU Boulder Authors. Myers, Christopher ; publication date. October 13, 2003 ; has restriction. closed ; Date in CU Experts. October 28, 2020 2:58 AM ...