Contents. VTS '97: Proceedings of the 15th IEEE VLSI Test Symposium. Will 0.1um Digital Circuits Require Mixed-Signal Testing. Page 186. PREVIOUS CHAPTER.
Will digital testing become mixed-signal testing when we reach 0.1 urn gate lengths in five years? For digital circuits, what analog (non-deterministic) tests ...
Will 0.1um Digital Circuits Require Mixed-Signal Testing - researchr ...
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Will 0.1um Digital Circuits Require Mixed-Signal Testing. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages ...
Design, Fabrications and Use of Mixed-Signal IC Testability Structures. ... Will 0.1um Digital Circuits Require Mixed-Signal Testing. VTS 1997: 186-187 ...
In this paper an efficient low-cost built-in self test (BIST) scheme is proposed for analog circuits. The key idea is to use rectangular pulses of random widths ...
Will 0.1um Digital Circuits Require Mixed-Signal Testing pp. 186. Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors pp. 188. Diagnostic ...
Will 0.1um Digital Circuits Require Mixed-Signal Testing Moderator: S. Sunter-- Coordinator: M. Soma Panelists: M. Breuer, B. Kaminska, J. McDermid, V ...
Will 0.1um Digital Circuits Require Mixed-Signal Testing. 186-187. Electronic Edition (link) BibTeX. Sequential Circuits Test 1. Michael S. Hsiao, Elizabeth M ...
Will 0.1um Digital Circuits Require Mixed-Signal Testing. 186-187. Sequential Circuits Test 1. view. electronic edition via DOI · electronic edition ...
This paper describes a new built-in self test (BIST) technique suitable for both functional and structural testing of analog and mixed-signal circuits based on ...