Introduction Surgical Site Infections contribute significantly to increased health care costs in ... more Introduction Surgical Site Infections contribute significantly to increased health care costs in terms of prolonged hospital stay and lost work days. The problem was largely unexplored in an apex medical institute in Goa. Aims and Objectives To estimate the incidence, and study the bacteriology and the factors associated with SSI in the study setting. Settings and Design Prospective study in the surgical wards of an apex medical teaching hospital in Goa. Materials and Methods Clinico-bacterilogical follow-up of 114 post-operative cases to the development of SSI, as per the CDC criteria (1991). Incidence was expressed as the infection rate per 100 operations. Antibiotic sensitivity testing was done using the disc diffusion method. Statistical Analysis Association was tested by applying the Student t-test and the Chi-square test of significance, and the strength of association expressed as the Odd’s Ratio. Results The overall SSI rate was estimated to be 30.7%; 5.4% for clean, 35.5% for clean-contaminated, and 77.8% for contaminated operations. Seventy-nine per cent of the isolates were gram-negative and almost 64% demonstrated polyantimicrobial resistance. Conclusions The study emphasizes the need for the evidence-based infection control and antibiotic prescription policies in the hospital.
Several very large scale integrated (VLSI) devices which are not available in radiation hardened ... more Several very large scale integrated (VLSI) devices which are not available in radiation hardened version are still required to be used in spacecraft systems. Thus these components need to be tested for highenergy heavy ion irradiation to find out their tolerance and suitability in specific space applications. This paper describes the high-energy heavy ion radiation testing of VLSI devices for single event upset (SEU) and single event latch up (SEL). The experimental set up employed to produce low flux of heavy ions viz. silicon (Si), and silver (Ag), for studying single event effects (SEE) is briefly described. The heavy ion testing of a few VLSI devices is performed in the general purpose scattering chamber of the Pelletron facility, available at Nuclear Science Centre, New Delhi. The test results with respect to SEU and SEL are discussed.
Introduction Surgical Site Infections contribute significantly to increased health care costs in ... more Introduction Surgical Site Infections contribute significantly to increased health care costs in terms of prolonged hospital stay and lost work days. The problem was largely unexplored in an apex medical institute in Goa. Aims and Objectives To estimate the incidence, and study the bacteriology and the factors associated with SSI in the study setting. Settings and Design Prospective study in the surgical wards of an apex medical teaching hospital in Goa. Materials and Methods Clinico-bacterilogical follow-up of 114 post-operative cases to the development of SSI, as per the CDC criteria (1991). Incidence was expressed as the infection rate per 100 operations. Antibiotic sensitivity testing was done using the disc diffusion method. Statistical Analysis Association was tested by applying the Student t-test and the Chi-square test of significance, and the strength of association expressed as the Odd’s Ratio. Results The overall SSI rate was estimated to be 30.7%; 5.4% for clean, 35.5% for clean-contaminated, and 77.8% for contaminated operations. Seventy-nine per cent of the isolates were gram-negative and almost 64% demonstrated polyantimicrobial resistance. Conclusions The study emphasizes the need for the evidence-based infection control and antibiotic prescription policies in the hospital.
Several very large scale integrated (VLSI) devices which are not available in radiation hardened ... more Several very large scale integrated (VLSI) devices which are not available in radiation hardened version are still required to be used in spacecraft systems. Thus these components need to be tested for highenergy heavy ion irradiation to find out their tolerance and suitability in specific space applications. This paper describes the high-energy heavy ion radiation testing of VLSI devices for single event upset (SEU) and single event latch up (SEL). The experimental set up employed to produce low flux of heavy ions viz. silicon (Si), and silver (Ag), for studying single event effects (SEE) is briefly described. The heavy ion testing of a few VLSI devices is performed in the general purpose scattering chamber of the Pelletron facility, available at Nuclear Science Centre, New Delhi. The test results with respect to SEU and SEL are discussed.
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Papers by Umesh Kulkarni