2017 IEEE International Reliability Physics Symposium (IRPS), 2017
This paper deals with assessing the reliability of integrated capacitive polymer humidity sensors... more This paper deals with assessing the reliability of integrated capacitive polymer humidity sensors. We propose Relative Humidity CycLing (RHCL) test as a methodology to evaluate, qualify and benchmark relative humidity sensors. Two types of sensor drifts are reviewed and methods to measure them are explained. The sensor drifts are experimentally determined. The new test methodology, RHCL is validated with field experiments where comparable drifts are found.
An efficient method for modelling the electronic structure and optical properties of quantum wire... more An efficient method for modelling the electronic structure and optical properties of quantum wires (QWRs) is proposed. The optical properties of an InGaAs/InP QWR laser are calculated in the framework of the k.p method, with the conduction- band nonparabolicity included for the first time. We show that high material gain can be achieved (8000 cm -1 ) at room temperatures for X polarization. However, due to a small confinement factor lasing can be achieved only at low temperatures (T=15K) which is verified by experiment.
Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)
ABSTRACT A novel analytical formulation for the biasing condition leading to thermal instability ... more ABSTRACT A novel analytical formulation for the biasing condition leading to thermal instability in a two-finger bipolar transistor is derived. The temperature dependence of the current gain as well as the mutual thermal coupling is accounted for. Different technologies are compared by varying the model parameters. It is demonstrated that SiGe devices are more thermally stable than comparable Si devices. Finally, the influence of the substrate modification on thermal instability is investigated. It is shown that thermally conducting substrates are needed to electro-thermally stabilize bipolar transistors.
2017 IEEE International Reliability Physics Symposium (IRPS), 2017
This paper deals with assessing the reliability of integrated capacitive polymer humidity sensors... more This paper deals with assessing the reliability of integrated capacitive polymer humidity sensors. We propose Relative Humidity CycLing (RHCL) test as a methodology to evaluate, qualify and benchmark relative humidity sensors. Two types of sensor drifts are reviewed and methods to measure them are explained. The sensor drifts are experimentally determined. The new test methodology, RHCL is validated with field experiments where comparable drifts are found.
An efficient method for modelling the electronic structure and optical properties of quantum wire... more An efficient method for modelling the electronic structure and optical properties of quantum wires (QWRs) is proposed. The optical properties of an InGaAs/InP QWR laser are calculated in the framework of the k.p method, with the conduction- band nonparabolicity included for the first time. We show that high material gain can be achieved (8000 cm -1 ) at room temperatures for X polarization. However, due to a small confinement factor lasing can be achieved only at low temperatures (T=15K) which is verified by experiment.
Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)
ABSTRACT A novel analytical formulation for the biasing condition leading to thermal instability ... more ABSTRACT A novel analytical formulation for the biasing condition leading to thermal instability in a two-finger bipolar transistor is derived. The temperature dependence of the current gain as well as the mutual thermal coupling is accounted for. Different technologies are compared by varying the model parameters. It is demonstrated that SiGe devices are more thermally stable than comparable Si devices. Finally, the influence of the substrate modification on thermal instability is investigated. It is shown that thermally conducting substrates are needed to electro-thermally stabilize bipolar transistors.
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Papers by Nebojsa Nenadovic