Location via proxy:   [ UP ]  
[Report a bug]   [Manage cookies]                
Skip to main content

A Three-Level Training Data Filter for Cross-project Defect Prediction

  • Conference paper
  • First Online:
Wireless and Satellite Systems (WiSATS 2020)

Abstract

The purpose of cross-project defect prediction is to predict whether there are defects in this project module by using a prediction model trained by the data of other projects. For the divergence of the data distribution between different projects, the performance of cross-project defect prediction is not as good as within-project defect prediction. To reduce the difference as much as possible, researchers have proposed a variety of methods to filter training data from the perspective of transfer learning. In this paper, we introduce a “project-instance-metric" hierarchical filtering strategy to select training data for the defect prediction model. Using the three-level filtering method, the candidate projects that are most similar to the target project, the instances that are most similar to the target instance, and the metrics with the highest correlation to the prediction result are filtered out respectively. We compared three-level filtering with project-level filtering, instance-level filtering, and the combination of project-level and instance-level filtering methods in four classification algorithms using NASA open source data sets. Our experiments show that the three-level filtering method achieves more significant f-measure and AUC values than the single level training data filtering method.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Subscribe and save

Springer+ Basic
$34.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Similar content being viewed by others

References

  1. Zhou, Y., et al.: How far we have progressed in the journey? an examination of cross-project defect prediction. ACM Trans. Softw. Eng. Methodol. 27, 1–51 (2018)

    Article  Google Scholar 

  2. Xu, Z., Yuan, P., Zhang, T., Tang, Y., Li, S., Xia, Z.: HDA: cross-project defect prediction via heterogeneous domain adaptation with dictionary learning. IEEE Access 6, 57597–57613 (2018)

    Article  Google Scholar 

  3. Hosseini, S., Turhan, B., Gunarathna, D.: A systematic literature review and meta-analysis on cross project defect prediction. IEEE Trans. Softw. Eng. 99, 1–40 (2017)

    Google Scholar 

  4. Turhan, B.: On the dataset shift problem in software engineering prediction models. Empir. Softw. Eng. 17, 62–74 (2012). https://doi.org/10.1007/s10664-011-9182-8

    Article  Google Scholar 

  5. Turhan, B., et al.: On the relative value of cross-company and within-company data for defect prediction. Empir. Softw. Eng. 14, 540–578 (2009). https://doi.org/10.1007/s10664-008-9103-7

    Article  Google Scholar 

  6. Peters, F., et al.: Better cross company defect prediction. In: 10th Working Conference on Mining Software Repositories (MSR) (2013)

    Google Scholar 

  7. He P., et al.: Simplification of training data for cross-project defect prediction. Computer Science (2014)

    Google Scholar 

  8. Yu, Q., Qian, J., Jiang, S., Wu, Z., Zhang, G.: An empirical study on the effectiveness of feature selection for cross-project defect prediction. IEEE Access 7, 35710–35718 (2019). https://doi.org/10.1109/ACCESS.2019.2895614

    Article  Google Scholar 

  9. Briand, L.C., et al.: Assessing the applicability of fault-proneness models across object-oriented software projects. IEEE Trans. Softw. Eng. 28(7), 706–720 (2002)

    Article  Google Scholar 

  10. Herbold, S.: Training data selection for cross-project defect prediction. In: Proceedings of the 9th International Conference on Predictive Models in Software Engineering (2013)

    Google Scholar 

  11. Kawata, K., Amasaki, S., Yokogawa, T.: Improving relevancy filter methods for cross-project defect prediction. In: Software Engineering & Advanced Applications, vol. 619. IEEE (2015)

    Google Scholar 

  12. Cui, C., Liu, B., Wang, S.: Isolation forest filter to simplify training data for cross-project defect prediction. In: 2019 Prognostics and System Health Management Conference (2019)

    Google Scholar 

  13. He, P., Li, B., Liu, X., Chen, J., Ma, Y.T.: An empirical study on software defect prediction with a simplificd metric set. Inf. Soft. Technol. 59, 170–190 (2015)

    Article  Google Scholar 

  14. Amasaki, S., Kawata, K., Yokogawa, T.: Improving cross-project defect prediction methods with data simplification. In: Proceedings of the Euromicro Conference on Software Engineering and Advanced Applications (2015)

    Google Scholar 

  15. He, Z., Shu, F., Yang, Y., Li, M., Wang, Q.: An investigation on the feasibility of cross-project defect prediction. In: Proceedings Eighth IEEE Symposium on Software Metrics (2012)

    Google Scholar 

  16. Gray, D., et al.: Reflections on the NASA MDP data sets. IET Softw. 6, 549–558 (2012)

    Article  Google Scholar 

  17. Lewis, D.D: Naive (Bayes) at forty: the independence assumption in information retrieval. In: European Conference on Machine Learning (1998)

    Google Scholar 

  18. Witten, I.H., et al.: Data mining: practical machine learning tools and techniques. ACM Sigmod Rec. 31, 76–77 (1999)

    Article  Google Scholar 

  19. Fawcett, T.: An introduction to ROC analysis. Pattern Recogn. Lett. 27(8), 861–874 (2006)

    Article  MathSciNet  Google Scholar 

  20. Buckland, M., Fredric, G.: The relationship between recall and precision. J. Am. Soc. Inf. Sci. 45, 12–19 (1994)

    Article  Google Scholar 

  21. Rahman, F., et al.: Recalling the ‘Imprecision’ of cross-project defect prediction. In: Proceedings of the ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering (2012)

    Google Scholar 

  22. Nam, Ja., et al.: Transfer defect learning. In: Proceedings of the 2013 International Conference on Software Engineering (2013)

    Google Scholar 

  23. Kim, S., Whitehead, E.J., Zhang, Y.: Classifying software changes: clean or buggy? IEEE Trans. Softw. Eng. 34(2), 181–196 (2008)

    Article  Google Scholar 

  24. Shull, F., et al.: What we have learned about fighting defects. In: Proceedings 8th IEEE Symposium on Software Metrics (2002)

    Google Scholar 

Download references

Acknowledgements

This paper is partly supported by the Pre-research of Civil Spacecraft Technology (No. B0204).

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Cangzhou Yuan .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2021 ICST Institute for Computer Sciences, Social Informatics and Telecommunications Engineering

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Yuan, C., Wang, X., Ke, X., Zhan, P. (2021). A Three-Level Training Data Filter for Cross-project Defect Prediction. In: Wu, Q., Zhao, K., Ding, X. (eds) Wireless and Satellite Systems. WiSATS 2020. Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, vol 357. Springer, Cham. https://doi.org/10.1007/978-3-030-69069-4_10

Download citation

  • DOI: https://doi.org/10.1007/978-3-030-69069-4_10

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-69068-7

  • Online ISBN: 978-3-030-69069-4

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics