Abstract
Three-dimensional integrated circuit (3D-IC) has emerged as a savior of failing Moore’s law, where reduced length of interconnects is guaranteed with some added advantages like heterogeneous integration, higher computation per volume, etc. These benefits are also exhibited in 3D SoCs (3D System on Chips) to use the already built cores. However, testing these large complex SoCs in lesser time has become a challenge. In this work, we propose a simulated annealing-based wrapper chain design algorithm that will balance the length of the wrapper chain. The number of TSVs (Through Silicon Vias) is also kept as a constraint so that the number of TSVs could also be reduced. Rigorous experiments were conducted on several ITC’02 SoC benchmark and the results when compared with a recent work which showed that our proposed approach recorded better test lengths in more than 90% cases with an average reduction of 6.42% in test length. Our algorithms also used less number of TSVs in approximately 90% of the cases with an average reduction of 23.82% in the number of TSVs, in comparable CPU time.
Similar content being viewed by others
Explore related subjects
Discover the latest articles, news and stories from top researchers in related subjects.References
da Silva Francisco, McLaurin Teresa, Waayers Tom (2006) The core test wrapper handbook, vol 35. Frontiers in electronic testing. Springer, Berlin
Noia B, Chakrabarty K, Xie Y (2009) Test-wrapper optimization for embedded cores in TSV-based three-dimensional SOCs. In: 2009 IEEE International conference on computer design, Lake Tahoe, CA, pp. 70–77
Noia B, Chakrabarty K (2011) Test-wrapper optimisation for embedded cores in through-silicon via-based three-dimensional system on chips. IET Computers Digit Tech 5(3):186–197
Wu, Yu-Yi, Huang, Shih-Hsu (2018) Tsv-aware 3D test wrapper chain optimization. In: 2018 International symposium on VLSI design, automation and test (VLSI-DAT), pp. 1–4
Kaibartta Tanusree, Biswas GP, Das Debesh Kumar (2020) Co-optimization of test wrapper length and TSV for TSV based 3D SOCs. J Electron Test 36:239–253
V Iyengar EJ Marinissen, K Chakrabarty. (2008) Itc 2002 SoC benchmarking initiative.. http://itc02socbenchm.pratt.duke.edu/
Vikram I, Chakrabarty K, Marinissen EJ (2002) Test wrapper and test access mechanism co-optimization for system-on-chip. J Electron Test 18:213–230
Goel SK, Marinissen EJ (2003) Soc test architecture design for efficient utilization of test bandwidth. ACM Trans Des Autom Electr Syst 8:399–429
Li-bao, D, Xiaolong, B, Chengyu, J, Yunchao, L (2015) Re-optimization algorithm for wrapper scan chains balance based on twice-assigned method using dynamic adjustment and mean value. In: 2015 Fifth international conference on instrumentation and measurement, computer, communication and control (IMCCC), pp. 609–614
Wu X, Chen Y, Chakrabarty K, Xie Y (2010) Test-access mechanism optimization for core-based three-dimensional SoCs. Microelectron J 41:601–615
Banerjee, S, Majumder, S, Bhattacharya, BB (2018) Test-time reduction for power-aware 3d-soc. In: 31st International conference on VLSI design and 17th international conference on embedded systems, VLSID 2018, Pune, India, January 6-10, 2018, pp. 103–108
Iyengar V, Chakrabarty K, Marinissen EJ (2002) On using rectangle packing for SoC wrapper/TAM Co-Optimization. In: Proc. 20th IEEE VLSI test symp., pp. 253–258
Huang, Y., Reddy SM, Cheng, WT, Reuter P, Mukherjee N, Tsai CC, Samman O, Zaidan Y (2002) Optimal core wrapper width selection and SoC test scheduling based on 3-D bin packing algorithm. In: Proc. international test conf., pp. 74–82
SenGupta Breeta, Nikolov Dimitar, Ingelsson Urban, Larsson Erik (2017) Test planning for core-based integrated circuits under power constraints. J Electron Test 33(1):7–23
Cheng WT, Dong Y, Gilles G, Huang Y, Janicki J, Kassab M, Mrugalski G, Mukherjee N, Rajski J, Tyszer J (2015) Scan test bandwidth management for ultralarge-scale system-on-chip architectures. IEEE Trans Very Large Scale Integr (VLSI) Syst 23(6):1050–1061
Cheng Y, Zhang L, Han Y, Liu J, Li X (2011) Wrapper chain design for testing TSVs minimization in circuit-partitioned 3D SoC. In: 2011 Asian test symposium, pp. 181–186
Cheng Yuan-Qing, Zhang Lei, Han Yin-He, Li Xiao-Wei (2013) TSV Minimization for circuit - partitioned 3D SoC test wrapper design. J Computer Sci Technol 28(1):119–128
Marinissen EJ, Goel SK, Lousberg M (2000) Wrapper design for embedded core test. In: Proc international test conf, pp. 911–920
Tang, F-H, Kao, H-Y, Huang, S-H, Li, J-F (2019) 3D Test wrapper chain optimization with I/O cells binding considered. In: 2019 International 3D systems integration conference (3DIC), pp. 1–4
Shannon CE (2001) A mathematical theory of communication. SIGMOBILE Mob Comput Commun Rev 5(1):3–55
Russell SJ, Norvig P (1995) Artificial intelligence a modern approach. Prentice Hall, Englewood Cliffs, New Jersey
Author information
Authors and Affiliations
Corresponding author
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
About this article
Cite this article
Banerjee, S., Ghorui, S. & Majumder, S. Designing balanced wrapper chains in 3D SoC under constrained TSVs. Innovations Syst Softw Eng 17, 219–230 (2021). https://doi.org/10.1007/s11334-021-00402-w
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11334-021-00402-w