Abstract
This chapter aims to:
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1.
Explain the physical origins of the major reliability issues affecting CMOS technology.
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2.
Discuss how these issues can affect the usability of PUF technology.
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3.
Present a case study on the evaluation of the impact of CMOS aging on the quality metrics of PUF designs.
It is hoped that this chapter will give the reader an in-depth understanding of the reliability challenges in nano-scale CMOS technologies and their effects on the usability of silicon-based PUF designs.
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Halak, B. (2018). Reliability Challenges of Silicon-Based Physically Unclonable Functions. In: Physically Unclonable Functions . Springer, Cham. https://doi.org/10.1007/978-3-319-76804-5_3
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DOI: https://doi.org/10.1007/978-3-319-76804-5_3
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