Abstract
Independently of the work described in this book, other x-ray-diffraction-based approaches to three-dimensionally-resolved (or at least depth-resolved) studies have been developed. In this chapter, such work is summarized, with the focus on methods that either have been used or have the potential to be used on the grain or subgrain scale. ...
This is a preview of subscription content, log in via an institution to check access.
Preview
Unable to display preview. Download preview PDF.
Author information
Authors and Affiliations
Rights and permissions
About this chapter
Cite this chapter
F. Poulsen, H. Alternative Approaches. In: Three-Dimensional X-Ray Diffraction Microscopy. Springer Tracts in Modern Physics, vol 205. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-44483-1_10
Download citation
DOI: https://doi.org/10.1007/978-3-540-44483-1_10
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-22330-6
Online ISBN: 978-3-540-44483-1
eBook Packages: Springer Book Archive