Abstract
Electrochemical impedance spectroscopy was performed on copper interconnect plating baths during deposition to study their degradation (ageing). A kinetic-based model was used to simulate the impedance scans by taking into account the organic additives in the reaction mechanism. Also, an equivalent circuit analysis was performed to characterize the deposition process in terms of resistive and capacitive components. Experimental results for two chemistries indicate that the low-frequency impedance relaxations change as the plating bath ages. Impedance diagrams calculated from the kinetic model resulted in a reasonable fit with the experimental impedance scans. In addition, the low-frequency capacitive and inductive impedance loop diameters are proposed as parameters to follow bath ageing. From these results, a monitoring method is proposed which could be applied to an industrial production line.
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References
Moffat TP, Wheeler D, Huber WH, Josell D (2001) Electrochem Solid State Lett 4:C26
Koh LT, You GZ, Lim SY, Lim CY, Foo PD (2001) Microelectronics J 32:973
Epelboin I, Lenoir F, Wiart R (1972) J Cryst Growth 13:417
Burrows IR, Harrison JA, Thomson J (1975) J Electroanal Chem 58:241
Razumney G, O’M Bockris J (1973) J Electroanal Chem 46:185
Harrison JA, Thirsk HR (1971) In: Bard AJ (ed) Electroanalytical chemistry, vol 5. Marcel Dekker, New York, p 67
Chassaing E, Wiart R (1984) Electrochim Acta 29:649
Soares DM, Wasle S, Weil KG, Doblhofer K (2002) J Electroanal Chem 532:353
Healy JP, Pletcher D, Goodenough M (1992) J Electronal Chem 338:155
Gabrielli C, Moçotéguy Ph, Perrot H, Wiart R (2004) J Electroanal Chem 572:367
Gabrielli C, Moçotéguy Ph, Perrot H, Nieto-Senz D, Zdunek A (2006) Electrochim Acta 51:1462
Gabrielli C, Moçotéguy Ph, Perrot H, Nieto-Sanz D, Zdunek A (2007) J Electrochem Soc 154:D13
(a) Moffat TP, Bonevich JE, Huber WH, Stanishevsky A, Kelly DR, Stafford GR, Josell D (2000) J Electrochem Soc 147:4524. (b) Mattson E, O’M Bockris J (1959) Trans Faraday Soc 55:1586
O’M Bockris J, Enyo M (1962) Trans Faraday Soc 58:11
Brown OR, Thirsk HR (1965) Electrochim Acta 10:3
Chao F, Costa M (1968) Bull Soc Chim Fr 10:4015
Rashkov ST, Vuchkov L (1981) Surf Technol 14:309
Gabrielli C, Moçotéguy Ph, Perrot H, Zdunek A, Nieto-Sanz D, Clech MC (2003) Electrochem Soc Proc 2003:121
Gabrielli C, Moçotéguy PC, Perrot H, Zdunek A, Bouard P, Haddix M (2004) Electrochem Solid State Lett 7:C31
Acknowledgement
The authors acknowledge the support of Altis Semiconductor, Corbeil-Essones, France on this project. In particular, special thanks to Christelle Mace, Eric Chabal and Anne Quennoy of the Cu ECD team at Altis for their help during the impedance measurements.
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Gabrielli, C., Moçotéguy, P., Perrot, H. et al. An investigation of copper interconnect deposition bath ageing by electrochemical impedance spectroscopy. J Appl Electrochem 38, 457–468 (2008). https://doi.org/10.1007/s10800-007-9459-1
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DOI: https://doi.org/10.1007/s10800-007-9459-1