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Phase object microscopy using moire deflectometry
Appl Opt
.
1985 Sep 15;24(18):3032.
doi: 10.1364/ao.24.003032.
Authors
J Krasinski
,
D F Heller
,
O Kafri
PMID:
18223998
DOI:
10.1364/ao.24.003032
No abstract available