Parameterized study of the test cover problem

R Crowston, G Gutin, M Jones, S Saurabh… - … Foundations of Computer …, 2012 - Springer
International Symposium on Mathematical Foundations of Computer Science, 2012Springer
In this paper we carry out a systematic study of a natural covering problem, used for
identification across several areas, in the realm of parameterized complexity. In the Test
Cover problem we are given a set n= 1,…, n of items together with a collection, \calT, of
distinct subsets of these items called tests. We assume that \calT is a test cover, ie, for each
pair of items there is a test in \calT containing exactly one of these items. The objective is to
find a minimum size subcollection of \calT, which is still a test cover. The generic …
Abstract
In this paper we carry out a systematic study of a natural covering problem, used for identification across several areas, in the realm of parameterized complexity. In the Test Cover problem we are given a set [n] = {1,…,n} of items together with a collection, , of distinct subsets of these items called tests. We assume that is a test cover, i.e., for each pair of items there is a test in containing exactly one of these items. The objective is to find a minimum size subcollection of , which is still a test cover. The generic parameterized version of Test Cover is denoted by -Test Cover. Here, we are given and a positive integer parameter k as input and the objective is to decide whether there is a test cover of size at most . We study four parameterizations for Test Cover and obtain the following:
(a) k-Test Cover, and (n − k)-Test Cover are fixed-parameter tractable (FPT), i.e., these problems can be solved by algorithms of runtime , where f(k) is a function of k only.
(b) -Test Cover and (logn + k)-Test Cover are W[1]-hard. Thus, it is unlikely that these problems are FPT.
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