Correcting scan-positional errors is critical in achieving electron ptychography with both high
resolution and high precision. This is a demanding and challenging task due to the sheer
number of parameters that need to be optimized. For atomic-resolution ptychographic
reconstructions, we found classical refining methods for scan positions not satisfactory due
to the inherent entanglement between the object and scan positions, which can produce
systematic errors in the results. Here, we propose a new protocol consisting of a series of …