Fault diagnosis in synchronous sequential circuits based on an effect–cause analysis
Abramovici, Breuer - IEEE Transactions on Computers, 1982 - ieeexplore.ieee.org
Abramovici, Breuer
IEEE Transactions on Computers, 1982•ieeexplore.ieee.orgIn this paper we present a new approach to fault diagnosis in sequential circuits based on
an effect–cause analysis. This represents an extension of our previous work dealing with
combinational circuits [1]. The main tool of our approach is the Deduction Algorithm, which
deduces internal values in the circuit under test based upon the test results. The deduced
values are used for fault diagnosis, which encompasses both fault detection and location.
an effect–cause analysis. This represents an extension of our previous work dealing with
combinational circuits [1]. The main tool of our approach is the Deduction Algorithm, which
deduces internal values in the circuit under test based upon the test results. The deduced
values are used for fault diagnosis, which encompasses both fault detection and location.
In this paper we present a new approach to fault diagnosis in sequential circuits based on an effect–cause analysis. This represents an extension of our previous work dealing with combinational circuits [1]. The main tool of our approach is the Deduction Algorithm, which deduces internal values in the circuit under test based upon the test results. The deduced values are used for fault diagnosis, which encompasses both fault detection and location.
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