Optical properties of Graphene have recently attracted enormous attention from investigators [1-5... more Optical properties of Graphene have recently attracted enormous attention from investigators [1-5]. A significant amount of work is devoted to the calculation of optical conductivity σ(ω) with the aim of probing the interaction of light with this material. These calculations take the ...
Data set for: Hillier, J. W. et al. (2021). Investigating stability and tunability of quantum dot... more Data set for: Hillier, J. W. et al. (2021). Investigating stability and tunability of quantum dot transport in silicon MOSFETs via the application of electrical stress in IOP Journal of Physics D: Applied Physics
Dataset supports: Liu, F. et al (2018). Manipulation of random telegraph signals in a silicon nan... more Dataset supports: Liu, F. et al (2018). Manipulation of random telegraph signals in a silicon nanowire transistor with a triple gate. Nanotechnology. DOI:10.1088/1361-6528/aadfa6
Zinc sulfide (ZnS) waveguides with the thickness of 0.5 μm have been deposited onto oxidized sili... more Zinc sulfide (ZnS) waveguides with the thickness of 0.5 μm have been deposited onto oxidized silicon wafer substrates at cold temperature (Tcold = –50°C) and ambient temperature (Tambient = 25°C) by thermal evaporation technique. The propagation losses of ZnS waveguides were determined by a scattering detection method. The propagation losses of cold deposited ZnS waveguide were 20.41, 11.35, 3.51 and 2.30 dB/cm measured the wavelengths of 633, 986, 1305 and 1540 nm, respectively. Where as, the propagation losses of ambient deposited ZnS waveguide were 131.50, 47.99, 4.43 and 2.74 dB/cm measured the wavelengths of 633, 986, 1305 and 1540 nm, respectively. The propagation loss of the cold deposited ZnS waveguide was dominated by surface scattering whereas the propagation loss of the ambient deposited ZnS waveguide was dominated by bulk scattering.
ABSTRACTGallium - lanthanum sulphide glasses (GLS) show wide range transparency and low non radia... more ABSTRACTGallium - lanthanum sulphide glasses (GLS) show wide range transparency and low non radiative relaxation rates for dopant ions such as Ho3+, Er3+ etc. They also show permanent photomodification of the refractive index under visible illumination. We report laser ablation deposition of these glasses and preliminary results on film stoichiometry and deposition rate as a function of excimer laser fluence. The sulphur to metal and Ga/La ratios are found to have marked fluence dependencies. The films show considerably more Urbach tail absorption than bulk material. A novel method has been developed for mapping the permanent photomodified index.
Data set for paper: AUTHORS: K. Ibukuro, F. Liu, M. K. Husain, M. Sotto, J. Hillier, Z, Li, I. To... more Data set for paper: AUTHORS: K. Ibukuro, F. Liu, M. K. Husain, M. Sotto, J. Hillier, Z, Li, I. Tomita, Y. Tsuchiya, H. Rutt, and S. Saito. TITLE: Silicon single-electron random number generator based on random telegraph signals at room temperature JOURNAL: AIP Advances
Dataset supports: Ibukuro, K. et al (2018). Random-telegraph-noise and wave-particle duality foun... more Dataset supports: Ibukuro, K. et al (2018). Random-telegraph-noise and wave-particle duality found in a silicon nano-wire. Paper presented at International conference on solid state devices and materials 2018, Tokyo, Japan
Zinc sulfide thin films with the thickness of about 0.5 µm were deposited using a thermal evapora... more Zinc sulfide thin films with the thickness of about 0.5 µm were deposited using a thermal evaporation system onto oxidized silicon substrates at cold temperature (Tcold = -50°C) and at ambient temperature (Tambient = 25°C). A special substrate holder with a thermoelectric cooler was used to cool the substrates. The crystalline structure and the morphology of the films were investigated by X-Ray Diffraction and atomic force microscopy, respectively. XRD results show that the structure of the cold deposited ZnS thin film was completely amorphous. The ambient deposited ZnS thin film has a mixture of amorphous structure and polycrystalline structure with the preference orientation of (111) plane. The crystallite size of ambient deposited ZnS thin film was about 10 nm as calculated using the Scherrer formula. The AFM analysis revealed that the estimated grain size of cold deposited and ambient deposited ZnS were about 360 nm and 1220 nm, respectively. The surface roughness of the cold de...
Laser action in Neodymium doped inorganic aprotic solvents POC13 and Se0C12 has been known forman... more Laser action in Neodymium doped inorganic aprotic solvents POC13 and Se0C12 has been known formany years, but there has been little work in this field recently. Very little work has been reportedon ions other than Nd3+. The ability to readily change the dopant, vary concentrations, add co-dopantsetc at low cost is attractive, and using modern laser techniques it is possible that these materialsmight again be useful. In particular there are a variety of possible solvents which have not beenexploited to date which offer the possibility of tailoring the non-radiative rates of the various levelsfor the particular transition required.
IEEE Transactions on Geoscience and Remote Sensing
Passive millimeter-wave (PMMW) imaging has been used for several close-range applications such as... more Passive millimeter-wave (PMMW) imaging has been used for several close-range applications such as personal security checks, scene monitoring, and so on. PMMW images contain a variety of types of image edges which represent intensity discontinuities. As a special edge, an object contour edge is an important feature for object detection and recognition, which denotes the external shape of the object. In this article, a physically based contour edge display method using adjustable linear polarization ratio (ALPR) by multipolarization imaging is proposed. Polarization brightness temperature (TB) models of the object and radiometer observation are built. According to the physical principle of edge generation, the ALPR properties of the contour edge are investigated. By fusing multipolarization information, the simple feature parameter ALPR is sensitive to the object contour edge. Then, the specific operation process of the proposed method based on multipolarization images is presented. Simulations and measurements of polarimetric imaging for personal security inspection scenes were conducted to verify the contour edge display performance. Finally, the applicability of the method is discussed and summarized.
Optical properties of Graphene have recently attracted enormous attention from investigators [1-5... more Optical properties of Graphene have recently attracted enormous attention from investigators [1-5]. A significant amount of work is devoted to the calculation of optical conductivity σ(ω) with the aim of probing the interaction of light with this material. These calculations take the ...
Data set for: Hillier, J. W. et al. (2021). Investigating stability and tunability of quantum dot... more Data set for: Hillier, J. W. et al. (2021). Investigating stability and tunability of quantum dot transport in silicon MOSFETs via the application of electrical stress in IOP Journal of Physics D: Applied Physics
Dataset supports: Liu, F. et al (2018). Manipulation of random telegraph signals in a silicon nan... more Dataset supports: Liu, F. et al (2018). Manipulation of random telegraph signals in a silicon nanowire transistor with a triple gate. Nanotechnology. DOI:10.1088/1361-6528/aadfa6
Zinc sulfide (ZnS) waveguides with the thickness of 0.5 μm have been deposited onto oxidized sili... more Zinc sulfide (ZnS) waveguides with the thickness of 0.5 μm have been deposited onto oxidized silicon wafer substrates at cold temperature (Tcold = –50°C) and ambient temperature (Tambient = 25°C) by thermal evaporation technique. The propagation losses of ZnS waveguides were determined by a scattering detection method. The propagation losses of cold deposited ZnS waveguide were 20.41, 11.35, 3.51 and 2.30 dB/cm measured the wavelengths of 633, 986, 1305 and 1540 nm, respectively. Where as, the propagation losses of ambient deposited ZnS waveguide were 131.50, 47.99, 4.43 and 2.74 dB/cm measured the wavelengths of 633, 986, 1305 and 1540 nm, respectively. The propagation loss of the cold deposited ZnS waveguide was dominated by surface scattering whereas the propagation loss of the ambient deposited ZnS waveguide was dominated by bulk scattering.
ABSTRACTGallium - lanthanum sulphide glasses (GLS) show wide range transparency and low non radia... more ABSTRACTGallium - lanthanum sulphide glasses (GLS) show wide range transparency and low non radiative relaxation rates for dopant ions such as Ho3+, Er3+ etc. They also show permanent photomodification of the refractive index under visible illumination. We report laser ablation deposition of these glasses and preliminary results on film stoichiometry and deposition rate as a function of excimer laser fluence. The sulphur to metal and Ga/La ratios are found to have marked fluence dependencies. The films show considerably more Urbach tail absorption than bulk material. A novel method has been developed for mapping the permanent photomodified index.
Data set for paper: AUTHORS: K. Ibukuro, F. Liu, M. K. Husain, M. Sotto, J. Hillier, Z, Li, I. To... more Data set for paper: AUTHORS: K. Ibukuro, F. Liu, M. K. Husain, M. Sotto, J. Hillier, Z, Li, I. Tomita, Y. Tsuchiya, H. Rutt, and S. Saito. TITLE: Silicon single-electron random number generator based on random telegraph signals at room temperature JOURNAL: AIP Advances
Dataset supports: Ibukuro, K. et al (2018). Random-telegraph-noise and wave-particle duality foun... more Dataset supports: Ibukuro, K. et al (2018). Random-telegraph-noise and wave-particle duality found in a silicon nano-wire. Paper presented at International conference on solid state devices and materials 2018, Tokyo, Japan
Zinc sulfide thin films with the thickness of about 0.5 µm were deposited using a thermal evapora... more Zinc sulfide thin films with the thickness of about 0.5 µm were deposited using a thermal evaporation system onto oxidized silicon substrates at cold temperature (Tcold = -50°C) and at ambient temperature (Tambient = 25°C). A special substrate holder with a thermoelectric cooler was used to cool the substrates. The crystalline structure and the morphology of the films were investigated by X-Ray Diffraction and atomic force microscopy, respectively. XRD results show that the structure of the cold deposited ZnS thin film was completely amorphous. The ambient deposited ZnS thin film has a mixture of amorphous structure and polycrystalline structure with the preference orientation of (111) plane. The crystallite size of ambient deposited ZnS thin film was about 10 nm as calculated using the Scherrer formula. The AFM analysis revealed that the estimated grain size of cold deposited and ambient deposited ZnS were about 360 nm and 1220 nm, respectively. The surface roughness of the cold de...
Laser action in Neodymium doped inorganic aprotic solvents POC13 and Se0C12 has been known forman... more Laser action in Neodymium doped inorganic aprotic solvents POC13 and Se0C12 has been known formany years, but there has been little work in this field recently. Very little work has been reportedon ions other than Nd3+. The ability to readily change the dopant, vary concentrations, add co-dopantsetc at low cost is attractive, and using modern laser techniques it is possible that these materialsmight again be useful. In particular there are a variety of possible solvents which have not beenexploited to date which offer the possibility of tailoring the non-radiative rates of the various levelsfor the particular transition required.
IEEE Transactions on Geoscience and Remote Sensing
Passive millimeter-wave (PMMW) imaging has been used for several close-range applications such as... more Passive millimeter-wave (PMMW) imaging has been used for several close-range applications such as personal security checks, scene monitoring, and so on. PMMW images contain a variety of types of image edges which represent intensity discontinuities. As a special edge, an object contour edge is an important feature for object detection and recognition, which denotes the external shape of the object. In this article, a physically based contour edge display method using adjustable linear polarization ratio (ALPR) by multipolarization imaging is proposed. Polarization brightness temperature (TB) models of the object and radiometer observation are built. According to the physical principle of edge generation, the ALPR properties of the contour edge are investigated. By fusing multipolarization information, the simple feature parameter ALPR is sensitive to the object contour edge. Then, the specific operation process of the proposed method based on multipolarization images is presented. Simulations and measurements of polarimetric imaging for personal security inspection scenes were conducted to verify the contour edge display performance. Finally, the applicability of the method is discussed and summarized.
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Papers by Harvey Rutt