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HFMV: hybridizing formal methods and machine learning for verification of analog and mixed-signal circuits

Published: 24 June 2018 Publication History

Abstract

With increasing design complexity and robustness requirement, analog and mixed-signal (AMS) verification manifests itself as a key bottleneck. While formal methods and machine learning have been proposed for AMS verification, these two techniques suffer from their own limitations, with the former being specifically limited by scalability and the latter by the inherent uncertainty in learning-based models. We present a new direction in AMS verification by proposing a hybrid formal/machine-learning verification technique (HFMV) to combine the best of the two worlds. HFMV adds formalism on the top of a probabilistic learning model while providing a sense of coverage for extremely rare failure detection. HFMV intelligently and iteratively reduces uncertainty of the learning model by a proposed formally-guided active learning strategy and discovers potential rare failure regions in complex high-dimensional parameter spaces. It leads to reliable failure prediction in the case of a failing circuit, or a high-confidence pass decision in the case of a good circuit. We demonstrate that HFMV is able to employ a modest amount of data to identify hard-to-find rare failures which are completely missed by state-of-the-art sampling methods even with high volume sampling data.

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  • (2024)Synthetic Benchmark for Data-Driven Pre-Si Analogue Circuit VerificationElectronics10.3390/electronics1313260013:13(2600)Online publication date: 2-Jul-2024
  • (2022)Combining informetrics and trend analysis to understand past and current directions in electronic design automationScientometrics10.1007/s11192-022-04481-9127:10(5661-5689)Online publication date: 17-Aug-2022
  • (2021)Machine Learning for Electronic Design Automation: A SurveyACM Transactions on Design Automation of Electronic Systems10.1145/345117926:5(1-46)Online publication date: 5-Jun-2021
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cover image ACM Conferences
DAC '18: Proceedings of the 55th Annual Design Automation Conference
June 2018
1089 pages
ISBN:9781450357005
DOI:10.1145/3195970
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 24 June 2018

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DAC '18: The 55th Annual Design Automation Conference 2018
June 24 - 29, 2018
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Cited By

View all
  • (2024)Synthetic Benchmark for Data-Driven Pre-Si Analogue Circuit VerificationElectronics10.3390/electronics1313260013:13(2600)Online publication date: 2-Jul-2024
  • (2022)Combining informetrics and trend analysis to understand past and current directions in electronic design automationScientometrics10.1007/s11192-022-04481-9127:10(5661-5689)Online publication date: 17-Aug-2022
  • (2021)Machine Learning for Electronic Design Automation: A SurveyACM Transactions on Design Automation of Electronic Systems10.1145/345117926:5(1-46)Online publication date: 5-Jun-2021
  • (2021)Automatic Surrogate Model Generation and Debugging of Analog/Mixed-Signal Designs Via Collaborative Stimulus Generation and Machine LearningProceedings of the 26th Asia and South Pacific Design Automation Conference10.1145/3394885.3431544(140-145)Online publication date: 18-Jan-2021
  • (2019)Mixed Signal Design Validation Using Reinforcement Learning Guided Stimulus Generation for Behavior Discovery2019 IEEE 37th VLSI Test Symposium (VTS)10.1109/VTS.2019.8758673(1-6)Online publication date: Apr-2019

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