Micron-scale inkjet-assisted digital lithography
for large-area flexible electronics
R. A. Sporea1, A. S. Alshammari1,2, S. Georgakopoulos1, J. Underwood1, M. Shkunov1, S. R. P. Silva1
1
Advanced Technology Institute, University of Surrey, Guildford, Surrey, GU2 7XH, United Kingdom
2
Department of Physics, College of Science, University of Hail, P.O. Box 2440, Hail, Saudi Arabia
r.a.sporea@surrey.ac.uk
Abstract— Large-area electronics require cost-effective yet
precise patterning of electrodes. We demonstrate a simple
electrode patterning technique capable of micron-scale gap
formation, that allows the patterning of a larger variety of
metals than the current portfolio of jettable metallic ink
comprises and does not require a high-temperature sintering
step. However, this method can produce large variations in gap
size resulting in inconsistent and irreproducible transistor drain
current. We propose that source-gated transistors (SGTs) are
well suited to this technique, as they have a saturated drain
current independent of source-drain separation, thus leading to
improved current uniformity despite inconsistencies in gap size.
I.
INTRODUCTION
The principal advantages of large-area electronic circuits
made by solution processing [1] are cost-effectiveness and
production volume. Inexpensive materials and low
temperature processing allow for significant cost savings
when compared to conventional techniques, while the use of
a flexible substrate enables economic roll-to-roll production.
Device-to-device current uniformity over a large area is
still difficult to attain due to factors such as the randomness
inherent in material crystallization [2], bias- and temperaturedependent mobility [3], contact effects [4,5] and moisture- or
oxygen-related instability [6]. Of great consequence to
applications are also the resolution and repeatability of
patterning by large-area techniques.
In this paper we show how an augmented version of digital
lithography by inkjet printing [7] can be used to realize small
gaps between electrodes such as micron-scales source-drain
gaps for source-gated transistors which have a uniform
current regardless of the source-drain separation [8]. Owing
to their operation and with proper design, these transistors
could be used in solution-processed large-area circuits where
matching of current between devices, low voltage operation
and, high intrinsic gain, are required. The method applies
equally to patterning micron-scale gaps between conductive
traces for other large-area applications such as large area
photovoltaics and light sources.
II.
FABRICATION OF ELECTRODES AND TRANSISTORS
A. Electrode patterning by inkjet printing and etching
Inkjet printing represents a promising technique for fieldeffect transistor (FET) fabrication [5]. Metallic nanoparticle
inks allow patterning of high-conductivity traces as electrodes
for transistors. However, high-temperature ink sintering, poor
repeatability and the necessity to pre-treat the substrate for
improving resolution are aspects which complicate the
fabrication of short-channel, integrated transistor arrays on
large substrates.
Here we extend the method of patterning electrodes by
digital lithography [7] through the addition of several lowtemperature steps. Figure 1 shows the process flowchart.
Figure 1. Flowchart of fabrication steps for conductive (here metallic)
electrodes with micron-scale gaps by inkjet printing.
The pattern is drawn on the metal-coated substrate by
inkjet printing a material which serves as an etch barrier. The
metal is subsequently etched for a period of time which
allows for etch-back to occur. With the barrier layer still in
place, the second metallic layer is deposited to form the
second electrode. Finally, the gap between the two metals is
revealed by lifting off the barrier layer.
We have found poly (methyl methacrylate) (PMMA) to be
an excellent barrier material for etching Au and adequate for
etching Cr, Cu and Ag. To print PMMA patterns, an ink was
created by dissolving PMMA in 1-Methyl-2-pyrrolidinone
(NMP) stirred for several hours at 50ºC. We chose NMP for
its high boiling point (202ºC) and suitable surface tension for
piezoelectric jetting. Possible substitute inks (which were not
investigated) are PMMA in anisole or y-butrolacetone,
polystyrene (PS) in toluene or diethyl phthalate, or
conventional photoresists diluted to allow jetting.
Unlike photoresist, our PMMA ink does not require UV
curing or a high-temperature bake. The best results are
obtained with the DMP-2800 printer and DMC-11610
cartridge using: 2-5% PMMA concentration in NMP, nozzles
held at room temperature, platen temperature of 50ºC, jetting
voltage of 25-35V, drop spacing of 35µm and printing with
one to three adjacent nozzles in one to six layers. Fabrication
and characterization using a Keithley 2400-based system
have been performed in air at room temperature.
The main advantages of the technique are: a larger range of
conductors can be patterned by this method, as the choice of
conductive inks for printing is limited; potentially, no
requirement for a high-temperature sintering step; the ability
to create gaps which are far less than the minimum line width
achievable by conventional inkjet printing.
Figure 2 represents images of the printed PMMA trace on
gold (a) and the gaps (b, black lines) which can be obtained
by the technique described. Figure 2 (c) shows that poor
jetting quality or imperfections of the substrate can greatly
reduce the edge quality of the inkjet-printed line, yet the gap
(in black) is present, with no short circuits. Sub-micron gaps
can be obtained with this technique, as shown by Figure 2 (e).
Increasing the etching time (Figure 1) changes the average
width of the gap (Figure 2 (f)). This experiment simulates
effects most likely obtained on a large substrate, for which
both first-metal thickness and etch rate may vary from the
center to the edge and could result in gap size variations. It is
unlikely that field-effect transistors (FETs) with reproducible
current can be made on a large substrate with this technique.
However, source-gated transistors (SGTs) are ideal
structures for this process, as their current is independent of
gross fluctuations in their source-drain gap. Source-gated
transistors (SGTs) [8] are field-effect transistors which differ
from standard FETs in two aspects. Firstly, the source contact
comprises a potential barrier and the semiconductor can be
depleted by this reverse-biased barrier; secondly, the gate
electrode overlaps the source and is located on the opposite
side of the semiconductor.
Figure 2. Micrographs of: a) inkjet printed PMMA line on gold, showing
the minimum line witdth attainable (approx. 40µm); b) micron-scale gaps
obtained by etch-back, significantly smaller than the minimum printed line
width; c) poor-quality printed line with irregular edges but reliable gap with
no short-circuits; d) ragged edge of a ~5µm gap at high magnification;
e) AFM image of a sub-micron gap between gold and silver electrodes;
f) Etching time affects the size of the gap (black lines) between electrodes.
In a sense, the SGT is an FET with parasitic elements, and
it is very likely that a great proportion of staggered-electrode
organic TFTs are in fact SGTs. As we have shown in the past
[9], SGT properties which appear to be downsides (sourcegate overlap and current limited by the source barrier) lead to
behavior which can be exploited to create devices with
improved gain, large-area uniformity and power efficiency.
With proper design, the current is exclusively controlled by
the reverse-biased source barrier. The role of the overlapping
gate is to control the magnitude of the current either by
modulating the barrier height [8] or by restricting the current
under the reverse-biased barrier depletion layer [5, 10].
In practice, owing to common metal work functions and
organic semiconductor ionization potentials (IPs), a Schottky
barrier is almost always present at the contacts [4]. Moreover,
staggered structures are seldom self-aligned, so an overlap
between source and gate exists [5]. For these reasons, the
fabrication of organic source-gated transistors (OSGTs) is to
some extent an even simpler process than that of ohmiccontact FETs.
SGTs could be used as building-blocks for inexpensive yet
high-uniformity, solution-processed analog and mixed signal
circuits. To illustrate the insensitivity of SGT drain current to
source-drain gap we plot output current versus source-drain
gap in polysilicon devices (Figure 3(a), technology described
in [9]) and bottom-contact top-gate organic transistors made
with ADS250BE and Cr electrodes (Figure 3(b)).
As can be seen, the current is practically independent of
large variations in source-drain gap. Devices of this type are
expected to function well and with the same “on” drain
current for a given gate bias if fabricated with the etch-back /
lift-off technique we present here. The alignment or definition
of the gate electrode is not critical [11] and inkjet printed
gates can be used even when the quality of the printed lines is
sub-optimal.
B. Organic transistor fabrication
Using the technique presented we have fabricated a first
batch of transistors on flexible, transparent Teonex®
polyethylene naphthalate (PEN) substrates 125µm thick, to
serve a proof of concept. Figure 4 shows schematically the
structure of the transistors, while Figure 5 illustrates the
flexible substrate during processing and the finished devices.
Optical microscope images in Figure 6 show the position of
electrodes, the suboptimal quality of the printed gate
electrode and the size of the gap between source and drain
electrodes.
Au bottom contact thickness was 90nm for the first metal
layer and 35nm for the second, both deposited by sputtering
over 2nm Ti for improved adhesion. A thicker first metal was
used to aid the lift-off process.
Figure 5. Photo- and micrograph of flexible substrate containing an array of
structures; top: view of substrate with electrodes; bottom: finished devices.
Figure 6. Optical micrographs of the transistor structures, showing relative
position of electrodes, the rough patterning of the inkjet printed gate
electrode and size of source-drain gap obtained by etch-back and lift-off.
Figure 3. Measured relative drain current against source drain gaps for
several polysilicon SGTs with W = 50µm and biased around ID = 2µA (a)
and OSGTs made with ADS250BE and Cr bottom contacts (b); the FET
model predicts a 1/L dependence of drain current, while the SGT drain
current is insensitive to large changes of source-drain gap.
Etching of the first metal was done at room temperature by
immersion in a solution of KI:I2:H2O in 4:1:80 proportion for
150 seconds. The electrodes were oxygen-plasma cleaned at
100W for 5 minutes, then treated with perfluorobenzenethiol
(PFBT) (Aldrich, 5×10-3 mol•L-1 solution in ethanol) for 15
min and washed with ethanol. 35nm of small molecule
semiconductor (µ=0.03) was spun from solution at room
temperature to form the semiconductor as per [12] and baked
at 90ºC for 10 minutes. A top layer of Cytop CTL-809M (9%,
as received) ~2µm thick was used as the gate dielectric.
Poly(3,4-ethylendioxythiophene)-poly(styrenesulfonate)
(PEDOT:PSS) gates were inkjet-printed on Fujifilm Dimatix
DMP-2800 (CLEVIOS™ P Jet HC commercial ink, 24 V, 15
µm drop spacing, 3 layers for 170 nm thickness, room
temperature) after oxygen-plasma treating the Cytop at 70W
for 2 minutes in order to reduce surface hydrophobicity.
III.
Figure 4. Schematic cross-section and b) top view of the fabricated devices,
showing source-gate overlap (S), source-drain gap (d) and device width (W).
ELECTRICAL MEASUREMENTS AND DISCUSSION
We have performed initial electrical measurements on
several structures. With the exception of a few short-circuited
bottom electrodes due to stray satellite droplets during
printing, the reliability is very high.
Figure 7 shows the output characteristics of a typical
device in which the source was the first (thicker) metal,
together with the output conductance calculated from the
same data. Transistor width was approximately W = 300µm.
While gate leakage, on-off ratio and saturation are
comparatively poor, these initial measurements show that the
technique can be successfully applied for making transistor
electrodes. In principle, there is no reason why the technique
could not produce, with optimization, state-of-the art devices.
In SGTs the voltage at which saturation occurs through
source pinch-off (VSAT1) according to the dielectric model [8].
Given our process parameters, we calculate the change in
VSAT1 with VG is roughly 0.03 – 0.05, significantly smaller
than 1, which is the case for conventional ohmic-contact
FETs and in accordance to what is observed form Figure 7.
Because of the very poor saturation behavior of this test
device which can hardly be appreciated from the output
curves, we use the output conductance (gd) as a convenient
graphical means of roughly estimating VSAT1. gd clearly
shows a minimum in the region of VD where saturation is
expected to happen, yielding dVSAT1 / dVG of approx. 0.04.
We explain the poor saturation of this particular device by the
fact that the source-drain gap (~2.5µm) is small compared to
the gate insulator thickness (2µm) and so the effect of drain
electric field on the edge of the source [5, 9] is as pronounced
as that of gate-induced field. Certainly with thinner insulators
and geometry optimization the characteristics can be made to
resemble typical SGT output curves with high output
impedance above VSAT1 and low saturation voltage for
improved power efficiency and amplification ability when
compared to conventional TFT structures of the same
geometry [9].
The test device also has high leakage current so the transfer
characteristic (not shown) is poor. Usually, the off current is
dominated by the FET channel and SGT operation does not
bring any detriments to the subthreshold region, particularly
as short channel effects can be reduced through choosing the
correct operating mode by design [10].
Figure 7. Measured output characteristics and output conductance, showing
the early saturation (here VSAT1 < 2V) expected of source-gated transistors
according to Shannon and Gerstner’s dielectric model [8]. W ≈ 300µm.
IV.
CONCLUSIONS
We have presented a variation of the inkjet-assisted digital
lithography technique for patterning electrodes with a wider
choice of metals than is possible by direct jet printing of
metallic inks. Additionally, the process does not require
sintering at high temperature and permits realizing reliably
smaller gaps than the minimum line spacing of the printer.
The electrode gap obtained is prone to variations which are
not negligible and make the method, in principle, difficult to
apply to uniform FET fabrication over a large surface area.
Source-gated transistors (SGTs) have a different current
control mechanism to regular FETs and are very tolerant to
gap variations and well suited to our patterning method.
We believe that source-gated transistors (SGTs) are robust
building blocks for large-area electronic circuits which
require good uniformity of drain current, low saturation
voltage [5, 8] and potentially high intrinsic gain [9]. Analog
and mixed signal applications on large flexible substrates
could benefit from integrating this type of device.
ACKNOWLEDGMENT
The work of R. A. Sporea is supported through the Royal
Academy of Engineering Academic Research Fellowship
Programme.
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