We propose a method of correction for distance-dependent blurring, which is one of the limiting factors to achieving higher resolution in 3D reconstructions ...
ABSTRACT. We propose a method of correction for distance-dependent blurring, which is one of the limiting factors to achieving higher resolution in 3D ...
We propose a method of correction for distance-dependent blurring, which is one of the limiting factors to achieving higher resolution in 3D reconstructions ...
We propose a method of correction for distance-dependent blurring, which is one of the limiting factors to achieving higher resolution in 3D reconstructions of ...
Bibliographic details on Correction of distance-dependent blurring in projection data for fully three-dimensional electron microscopic reconstruction.
People also ask
Which is an electron microscopy approach to generating a three-dimensional reconstruction of a specimen?
Electron tomography is a method of generating 3D images from multiple 2D projection images of a 3D object, obtained over a wide range of viewing directions.
How does the scanning electron microscope provide a 3 dimensional view of the object?
Scanning Electron Microscopes (SEM)
The beam is sent onto the sample, bounces off and creates a three-dimensional image of the surface. The wavelength of the electrons is much smaller than the wavelength of light from a bulb or a laser, resulting in higher resolution.
Apr 18, 2010 · ... blurring during projection data ... An approach to the correction of distance-dependent defocus in electron microscopic reconstruction.
We propose a method of correction for distance-dependent blurring, which is one of the limiting factors to achieving higher resolution in 3D reconstructions of ...
The approach is general enough to be applicable for correcting for any distance-dependent blurring during projection data collection. We present a new ...
This paper presents a simulation of image formation with variable blur, together with a Fourier-based correction of the blur in a distance-dependent fashion.
Missing: fully three- dimensional
Correction of distance-dependent blurring in projection data for fully three-dimensional electron microscopic reconstruction. J Klukowska, GT Herman, IG ...