Location via proxy:   [ UP ]  
[Report a bug]   [Manage cookies]                
×
Past year
  • Any time
  • Past hour
  • Past 24 hours
  • Past week
  • Past month
  • Past year
All results
6 days ago · This paper reviews earlier studies focusing on thickness measurements of thin films less than one micrometer thick. Thin films are a widely used structure.
May 14, 2024 · A tangencypoint method (TPM) is presented to derive the thickness and optical constants of chalcogenide thin films from their transmission spectra.
Missing: Rapid | Show results with:Rapid
Mar 27, 2024 · In this study, a multichannel spectral interference sensor for large-area thickness measurement of transparent films was proposed. In the optical configuration, ...
Missing: Rapid | Show results with:Rapid
Feb 25, 2024 · Correction for 'Tackling data scarcity with transfer learning: a case study of thickness characterization from optical spectra of perovskite thin films' by Siyu ...
May 15, 2024 · Read research published in the ACS Photonics Vol. 11 Issue 5 on ACS Publications, a trusted source for peer-reviewed journals.
Apr 23, 2024 · In this study, we investigate the epitaxy and characteristics of STO and BTO thin films on Silicon by hMBE approach. A novel precursor delivery system ...
May 24, 2024 · As presented in Fig. 2d, the optical bandgaps of TeSeO thin films were extracted from the absorption spectra by using the Tauc plot method. With increasing Se ...
Missing: Rapid | Show results with:Rapid
Apr 9, 2024 · The present work is based on dedicated in situ temperature-based characterizations of amorphous V2O5 thin films. In situ ellipsometry is used to investigate the ...
May 29, 2024 · The polymer-assisted transfer technique relies on the adhesion and interaction between the material and polymer. This polymer is fully coated onto the surface ...
Feb 21, 2024 · Identifying optical microscope images of CVD-grown two-dimensional MoS2 by convolutional neural networks and transfer learning. Research article.