Drift reliability optimization in IC design: generalized formulation and practical examples
Authors: 
M. A. Styblinski and M. HuangAuthors Info & Claims
M. A. Styblinski and M. HuangAuthors Info & ClaimsPages 1242 - 1252
Abstract
A generalized formulation of the drift reliability optimization problem is presented. Algorithmic solutions are also proposed. They can be implemented readily in the existing circuit optimization environments and applied to integrated circuit design. Such applications are demonstrated, considering degradations due to hot electron effects. The results show that the proposed approach can significantly increase long-term circuit reliability and increase its robustness
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Copyright © 2006.
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IEEE Press
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Published: 01 November 2006
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