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Ordered Magnetic Nanostructures: Fabrication and Properties: Martin J.I., Nogues J., Liu K., Vicent J.L., Schuller I.K

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Ordered magnetic nanostructures: Fabrication and

properties
Martin J.I., Nogues J., Liu K., Vicent J.L., Schuller I.K.
Depto. Fsica, Facultad de Ciencias, Universidad de Oviedo, 33007 Oviedo, Spain; ICREA, Department de
Fsica, Univ. Autnoma de Barcelona, 08193 Bellaterra, Spain; Physics Department, University of
California-San Diego, 9500 Gilman Dr., San Diego, CA 92093-0319, United States; Physics Department,
University of California-Davis, Davis, CA 95616, United States; Depto. Fsica de Materiales, C.C. Fsicas,
Universidad Complutense, 28040 Madrid, Spain
Abstract: The fabrication methods and physical properties of ordered magnetic nanostructures with
dimensions on the submicron to nanometer scale are reviewed. First, various types of nanofabrication
techniques are described, and their capabilities and limitations in achieving magnetic nanostructures are
discussed. Specifically, we address electron beam lithography, X-ray lithography, laser interference
lithography, scanning probe lithography, step growth methods, nanoimprint, shadow masks, radiation
damage, self-assembled structures, and the use of nanotemplates. Then the magnetic properties of these
nanostructures are reviewed, including properties of single dots, magnetic interactions in arrays, dynamic
effects, magnetic behavior of nanostructured lines and wires, giant magnetoresistance effect, and properties
of films with arrays of holes. Finally, the physical properties in hybrid systems, where the magnetic arrays
interact with superconducting and semiconducting layers, are summarized. 2002 Elsevier Science B.V.
All rights reserved.
Index Keywords: Electron beam lithography; Magnetization; Magnetoresistance; Masks; Self assembly;
Superconducting films; X ray lithography; Magnetic nanostructures; Nanostructured materials
Year: 2003
Source title: Journal of Magnetism and Magnetic Materials
Volume: 256
Issue: 3-Jan
Page : 449-501
Cited by: 494
Link: Scorpus Link
Authors with affiliations:
1. Martn, J.I., Depto. Fsica, Facultad de Ciencias, Universidad de Oviedo, 33007 Oviedo, Spain
2. Nogus, J., ICREA, Department de Fsica, Univ. Autnoma de Barcelona, 08193 Bellaterra, Spain
3. Liu, K., Physics Department, University of California-San Diego, 9500 Gilman Dr., San Diego, CA 92093-0319, United
States, Physics Department, University of California-Davis, Davis, CA 95616, United States
4. Vicent, J.L., Depto. Fsica de Materiales, C.C. Fsicas, Universidad Complutense, 28040 Madrid, Spain
5. Schuller, I.K., Physics Department, University of California-San Diego, 9500 Gilman Dr., San Diego, CA 92093-0319, United
States

References:

1.

Prinz, G., Hathaway, K., (1995) Magnetoelectronics, Phys. Today, 48 (4 SPEC. ISSUE)

2.

Grnberg, P., Schreiber, R., Pang, Y., Brodsky, M.B., Sowers, H., (1986) Phys. Rev. Lett., 57, p. 2442

3.

Baibich, M.N., Broto, J.M., Fert, A., Nguyen Van Dau, F., Petroff, F., Etienne, P., Creuzet, G., Chazelas, J., (1988) Phys.
Rev. Lett., 61, p. 2472

4.

Levy, P.M., Zhang, S., Fert, A., (1990) Phys. Rev. Lett., 65, p. 1643

5.

Parkin, S.S.P., Bhadra, R., Roche, K.P., (1991) Phys. Rev. Lett., 66, p. 2152

6.

Dieny, B., Speriosu, V.S., Parkin, S.S.P., Gurney, B.A., Wilhoit, D.R., Mauri, D., (1991) Phys. Rev. B, 43, p. 1297

7.

Berkowitz, A.E., Mitchell, J.R., Carey, M.J., Young, A.P., Zhang, S., Spada, F.E., Parker, F.T., Thomas, G., (1992) Phys.
Rev. Lett., 68, p. 3745

8.

Hernando, A., (1999) J. Phys.: Condens. Matter, 11, p. 9455

9.

Xiao, J.Q., Jiang, J.S., Chien, C.L., (1992) Phys. Rev. Lett., 68, p. 3749

10.

Bland, J.A.C., Heinrich, B., (1994) Ultrathin Magnetic Structures, , Springer, Berlin

11.

Kusters, R.M., Singleton, J., Keen, D.A., McGreevy, R., Hayes, W., (1989) Physica B, 155, p. 362

12.

Von Helmolt, R., Wecker, J., Holzapfel, B., Schultz, L., Samwer, K., (1993) Phys. Rev. Lett., 71, p. 2331

13.

Jin, S., Tiefel, T.H., McCormack, M., Fastnacht, R.A., Ramesh, R., Chen, L.H., (1994) Science, 264, p. 413

14.

Moodera, J.S., Kinder, L.R., Wong, T.M., Meservey, R., (1995) Phys. Rev. Lett., 74, p. 3273

15.

Daughton, J.M., (1997) J. Appl. Phys., 81, p. 3758

16.

Tehrani, S., Slaughter, J.M., Chen, E., Durlam, M., Shi, J., DeHerrera, M., (1999) IEEE Trans. Magn., 35, p. 2814

17.

Meiklejohn, W.H., Bean, C.P., (1956) Phys. Rev., 102, p. 1413

18.

Meiklejohn, W.H., Bean, C.P., (1957) Phys. Rev., 105, p. 904

19.

Nogus, J., Schuller, I.K., (1999) J. Magn. Magn. Mater., 192, p. 203

20.

Berkowitz, A.E., Takano, K., (1999) J. Magn. Magn. Mater., 200, p. 552

21.

Stamps, R.L., (2000) J. Phys. D, 33, pp. R247

22.

Kiwi, M., (2001) J. Magn. Magn. Mater., 234, p. 584

23.

De Groot, R.A., Mueller, F.M., Van Engen, P.G., Buschow, K.H.J., (1983) Phys. Rev. Lett., 50, p. 2024

24.

Lewis, S.P., Allen, P.B., Sasaki, T., (1997) Phys. Rev. B, 55, p. 10253

25.

Hwang, H.Y., Cheong, S.-W., (1997) Science, 278, p. 1607

26.

Coey, J.M.D., Berkowitz, A.E., Balcells, Ll., Putris, F.F., Barry, A., (1998) Phys. Rev. Lett., 80, p. 3815

27.

Pickett, W.E., Moodera, J.S., (2001) Phys. Today, 54 (5), p. 39. , and references therein

28.

Johnson, M., Silsbee, R.H., (1985) Phys. Rev. Lett., 55, p. 1790

29.

Kikkawa, J.M., Awschalom, D.D., (1998) Phys. Rev. Lett., 80, p. 4313

30.

Kikkawa, J.M., Awschalom, D.D., (1999) Nature, 397, p. 139

31.

Ohno, Y., Young, D.K., Beschoten, B., Matsukura, F., Ohno, H., Awschalom, D.D., (1999) Nature, 402, p. 790

32.

Ohno, H., (1999) J. Magn. Magn. Mater., 200, p. 110

33.

Awschalom, D.D., Samarth, N., (1999) J. Magn. Magn. Mater., 200, p. 130

34.

Slonczewski, J., (1996) J. Magn. Magn. Mater., 159, pp. L1

35.

Katine, J.A., Albert, F.J., Buhrman, R.A., Myers, E.B., Ralph, D.C., (2000) Phys. Rev. Lett., 84, p. 3149

36.

Rippard, W.H., Perrella, A.C., Chalsani, P., Albert, F.J., Katine, J.A., Buhrman, R.A., (2000) Appl. Phys. Lett., 77, p. 1357

37.

Albert, F.J., Katine, J.A., Buhrman, R.A., Ralph, D.C., (2000) Appl. Phys. Lett., 77, p. 3809

38.

Jansen, R., Anil Kumar, P.S., Van't Erve, O.M.J., Vlutters, R., De Haan, P., Lodder, J.C., (2000) Phys. Rev. Lett., 85, p.
3277

39.

Prinz, G.A., (1995) Phys. Today, 48 (4), p. 58

40.

Prinz, G.A., (1998) Science, 282, p. 1660

41.

De Boeck, J., Borghs, G., (1999) Phys. World, 12 (4), p. 27

42.

Wolf, S.A., Treger, T., (2000) IEEE Trans. Magn., 36, p. 2748

43.

Wolf, S.A., Awschalom, D.D., Burham, R.A., Daughton, J.M., Von Molnr, S., Roukes, M.L., Chtchelkanova, A.Y.,
Treger, D.M., (2001) Science, 294, p. 1488

44.

Grochowski, E., Thompson, D., (1994) IEEE Trans. Magn., 30, p. 3797

45.

Grochowski, E., Hoyt, R.F., (1996) IEEE Trans. Magn., 32, p. 1850

46.

O'Grady, K., Laidler, H., (1999) J. Magn. Magn. Mater., 200, p. 616

47.

Thompson, L.F., Wilson, C.G., Bowden, M., (1994) Introduction to Microlithography, 2nd Edition, , American Chemical
Society, Washington DC, and references therein

48.

Canning, J., (1997) J. Vac. Sci. Technol. B, 15, p. 2109

49.

Lerner, E.J., (1999) The Ind. Phys., 5 (3), p. 18

50.

Nordquist, K., Pandharkar, S., Durlam, M., Resnick, D., Teherani, S., Mancini, D., Zhu, T., Shi, J., (1997) J. Vac. Sci.
Technol. B, 15, p. 2274

51.

Chou, S.Y., (1997) J. Magn. Soc. Japan, 21, p. 1023

52.

White, R.L., New, R.M.H., Pease, R.F.W., (1997) IEEE Trans. Magn., 33, p. 990

53.

Cowburn, R.P., (2000) Science, 287, p. 1466

54.

Barbara, B., (1996) J. Magn. Magn. Mater., 156, p. 123

55.

Krishnan, K.M., Magnetism on a microscopic scale (1995) MRS Bull., 20 (10)

56.

Awschalom, D.D., Von Molnr, S., Physical properties of nanometer-scale magnets (1998) Nanotechnology, , G. Timp.
New York: Springer. (Chapter 12)

57.

Ounadjela, K., Stamps, R.L., Mesoscopic magnetism in metals (2000) Handbook of Nanostructured Materials and
Nanotechnology, 2. , Nalwa H.S. San Diego: Academic Press. (Chapter 9)

58.

Cowburn, R.P., (2000) Philos. Trans. R. Soc. Lond. A, 358, p. 281

59.

Cowburn, R.P., (2000) J. Phys. D, 33, p. 1

60.

Chou, S.Y., (1997) Proc. IEEE, 85, p. 652

61.

Kirk, K.J., (2000) Contemp. Phys., 41, p. 63

62.

Demokritov, S.O., Hillebrands, B., (1999) J. Magn. Magn. Mater., 200, p. 706

63.

Moshchalkov, V.V., Bruyndoncx, V., Van Look, L., Van Bael, M.J., Bruynseraede, Y., Tonomura, A., Quantization and
confinement phenomena in nanostructured superconductors (2000) Handbook of Nanostructured Materials and
Nanotechnology, 3. , Nalwa H.S. San Diego: Academic Press. (Chapter)

64.

Peeters, F.M., De Boeck, J., Hybrid magnetic-semiconductor nanostructures (2000) Handbook of Nanostructured Materials
and Nanotechnology, 3. , Nalwa H.S. San Diego: Academic Press. (Chapter 7)

65.

Ross, C.A., (2001) Ann. Rev. Mater. Sci., 31, p. 203

66.

Elliott, D., (1986) Microlithography: Process Technology for IC Fabrication, , McGraw-Hill, New York, and references
therein

67.

Sheats, J.R., Smith, B.W., (1998) Microlithography Science and Technology, , Marcel Dekker, New York, and references
therein

68.

Vossen, J.L., Kern, W., (1978) Thin Film Processes, , Academic Press, New York, and references therein

69.

Park, Y.D., Caballero, J.A., Cabbibo, A., Childress, J.R., Hudspeth, H.D., Schultz, T.J., Sharifi, F., (1997) J. Appl. Phys.,

81, p. 4717
70.

Sharifi, F., Herzog, A.V., Dynes, R.C., (1993) Phys. Rev. Lett., 71, p. 428

71.

Herzog, A.V., Xiong, P., Sharifi, F., Dynes, R.C., (1996) Phys. Rev. Lett., 76, p. 668

72.

Searson, P.C., Moffat, T.P., (1994) Crit. Rev. Surf. Chem., 3, p. 171. , and references therein

73.

Ross, C.A., (1994) Ann. Rev. Mater. Sci., 24, p. 159. , and references therein

74.

Williams, W.D., Giordano, N., (1986) Phys. Rev. B, 33, p. 8146

75.

Schwarzacher, W., Attenborough, K., Michel, A., Nabiyouni, G., Meier, J.P., (1997) J. Magn. Magn. Mater., 165, p. 23

76.

Heydon, G.P., Hoon, S.R., Farley, A.N., Tomlinson, S.L., Valera, M.S., Attenborough, K., Schwarzacher, W., (1997) J.
Phys. D, 30, p. 1083

77.

Piraux, L., George, J.M., Despres, J.F., Leroy, C., Ferain, E., Legras, R., Ounadjela, K., Fert, A., (1994) Appl. Phys. Lett.,
65, p. 2484

78.

Blondel, A., Meier, J.P., Doudin, B., Ansermet, J.-Ph., (1994) Appl. Phys. Lett., 65, p. 3019

79.

Liu, K., Nagodawithana, K., Searson, P.C., Chien, C.L., (1995) Phys. Rev. B, 51, p. 7381

80.

Doudin, B., Redmond, G., Gilbert, S.E., Ansermet, J.-Ph., (1997) Phys. Rev. Lett., 79, p. 933

81.

Rogers, J.A., Paul, K.E., Jackman, R.J., Whitesides, G.M., (1997) Appl. Phys. Lett., 70, p. 2658

82.

Aizenberg, J., Roger, J.A., Paul, K.E., Whitesides, G.M., (1997) Appl. Phys. Lett., 71, p. 3773

83.

Tominaga, J., Nakano, T., Atoda, N., (1998) Appl. Phys. Lett., 73, p. 2078

84.

Alkaisi, M.M., Blaikie, R.J., McNab, S.J., (2000) Microelectron. Eng., 53, p. 237

85.

Kuwahara, M., Nakano, T., Tominaga, J., Lee, M.B., Atoda, N., (2000) Microelectron. Eng., 53, p. 535

86.

Pokhil, T., Song, D., Nowak, J., (2000) J. Appl. Phys., 87, p. 6319

87.

Smyth, J.F., Schultz, S., Kern, D., Schmid, H., Yee, D., (1988) J. Appl. Phys., 63, p. 4237

88.

Fischer, P.B., Chou, S.Y., (1993) Appl. Phys. Lett., 62, p. 2989

89.

New, R.M.H., Pease, R.F.W., White, R.L., (1994) J. Vac. Sci. Technol. B, 12, p. 3196

90.

Xu, W., Wong, J., Cheng, C.C., Johnson, R., Scherer, A., (1995) J. Vac. Sci. Technol. B, 13, p. 2372

91.

Streblechenko, D., Scheinfein, M.R., (1998) J. Vac. Sci. Technol. A, 16, p. 1374

92.

Chou, S.Y., Krauss, P.R., Kong, L., (1996) J. Appl. Phys., 79, p. 6101

93.

Chrif, S.M., Hennequin, J.F., (1997) J. Magn. Magn. Mater., 165, p. 504

94.

Martn, J.I., Jaccard, Y., Hoffmann, A., Nogus, J., George, J.M., Vicent, J.L., Schuller, I.K., (1998) J. Appl. Phys., 84, p.
411

95.

Devolder, T., Chappert, C., Chen, Y., Cambril, E., Bernas, H., Jamet, J.P., Ferre, J., (1999) Appl. Phys. Lett., 74, p. 3383

96.

Martn, J.I., Vicent, J.L., Anguita, J.V., Briones, F., (1999) J. Magn. Magn. Mater., 203, p. 156

97.

Ono, T., Miyajima, H., Shigeto, K., Shinjo, T., (1999) J. Magn. Magn. Mater, 198-199, p. 225

98.

Wong, J., Scherer, A., Todorovic, M., Schultz, S., (1999) J. Appl. Phys., 85, p. 5489

99.

Park, Y.D., Jung, K.B., Overberg, M., Temple, D., Pearton, S.J., Holloway, P.H., (2000) J. Vac. Sci. Technol. B, 18, p. 16

100. Khamsehpour, B., Wilkinson, C.D.W., Chapman, J.N., Johnston, A.B., (1996) J. Vac. Sci. Technol. B, 14, p. 3361
101. Smith, D.J., Dunin-Borkowski, R.E., McCartney, M.R., Kardynal, B., Scheinfein, M.R., (2000) J. Appl. Phys., 87, p. 7400
102. Taniyama, T., Nakatani, I., Namikawa, T., Yamazaki, Y., (1999) Phys. Rev. Lett., 82, p. 2780
103. Rothman, J., Klui, M., Lopez-Diaz, L., Vaz, C.A.F., Bleloch, A., Bland, J.A.C., Cui, Z., Speaks, R., (2001) Phys. Rev.
Lett., 86, p. 1098
104. Yao, C.C., Hasko, D.G., Xu, Y.B., Lee, W.Y., Bland, J.A.C., (1999) J. Appl. Phys., 85, p. 1689
105. Yokoyama, Y., Suzuki, Y., Yuasa, S., Ando, K., Shigeto, K., Shinjo, T., Gogol, P., Kawagoe, T., (2000) J. Appl. Phys., 87,

p. 5618
106. Vavassori, P., Metlushko, V., Grimsditch, M., Ilic, B., Neuzil, P., Kumar, R., (2000) Phys. Rev. B, 61, p. 5895
107. Kirk, K.J., Chapman, J.N., Wilkinson, C.D., (1997) Appl. Phys. Lett., 71, p. 539
108. Yu, J., Rdiger, U., Thomas, L., Parkin, S.S.P., Kent, A.D., (1999) J. Appl. Phys., 85, p. 5501
109. Herrmann, M., McVitie, S., Chapman, J.N., (2000) J. Appl. Phys., 87, p. 2994
110. Chou, S.Y., Krauss, P.R., (1996) J. Magn. Magn. Mater., 155, p. 151
111. Haginoya, C., Koike, K., Hirayama, Y., Yamamoto, J., Ishibashi, M., Kitakami, O., Shimada, Y., (1999) Appl. Phys. Lett.,
75, p. 3159
112. Schrefl, T., Fidler, J., Kirk, K.J., Chapman, J.N., (1997) J. Magn. Magn. Mater., 175, p. 193
113. Otani, Y., Kim, S.G., Kohda, T., Fukamichi, K., (1998) IEEE Trans. Magn., 34, p. 1090
114. Raabe, J., Pulwey, R., Sattler, R., Schweinbck, T., Zweck, J., Weiss, D., (2000) J. Appl. Phys., 88, p. 4437
115. Kirk, K.J., Chapman, J.N., McVitie, S., Aitchison, P.R., Wilkinson, C.D.W., (2000) J. Appl. Phys., 87, p. 5105
116. Adeyeye, A.O., Cowburn, R.P., Welland, M.E., (2000) J. Magn. Magn. Mater., 213, pp. L1
117. Schneider, M., Hoffmann, H., Zweck, J., (2000) Appl. Phys. Lett., 77, p. 2909
118. Cowburn, R.P., Koltsov, D.K., Adeyeye, A.O., Welland, M.E., (1998) Appl. Phys. Lett., 73, p. 3947
119. Cowburn, R.P., Koltsov, D.K., Adeyeye, A.O., Welland, M.E., (1999) Phys. Rev. Lett., 83, p. 1042
120. Moreau, C.E., Caballero, J.A., Loloee, R., Pratt W.P., Jr., Birge, N.O., (2000) J. Appl. Phys., 87, p. 6316
121. Kirk, K.J., Chapman, J.N., (1997) J. Magn. Soc. Japan, 21, p. 1005
122. King, J.G., Williams, W., Wilkinson, C.D., McVitie, S., Chapman, J.N., (1996) Geophys. Res. Lett., 23, p. 2847
123. Kubota, H., Ikari, T., Ando, Y., Kato, H., Miyazaki, T., (2000) J. Appl. Phys., 87, p. 6325
124. Vlez, M., Morales, R., Alameda, J.M., Martn, J.I., Vicent, J.L., Briones, F., (2000) J. Appl. Phys., 87, p. 5654
125. Wei, M.S., Chou, S.Y., (1994) J. Appl. Phys., 76, p. 6679
126. Maeda, A., Kume, M., Ogura, T., Kuroki, K., Yamada, T., Nishikawa, M., Harada, Y., (1994) J. Appl. Phys., 76, p. 6667
127. Van Bael, M.J., Temst, K., Moshchalkov, V.V., Bruynseraede, Y., (1999) Phys. Rev. B, 59, p. 14674
128. New, R.M.H., Pease, R.F.W., White, R.L., (1996) J. Magn. Magn. Mater., 155, p. 140
129. Nakatani, I., (1996) IEEE Trans. Magn., 32, p. 4448
130. Adeyeye, A.O., Bland, J.A.C., Daboo, C., Lee, J., Ebels, U., Ahmed, H., (1996) J. Appl. Phys., 79, p. 6120
131. Haginoya, C., Heike, S., Ishibashi, M., Nakamura, K., Koike, K., Yoshimura, T., Yamamoto, J., Hirayama, Y., (1999) J.
Appl. Phys., 85, p. 8327
132. Yu, J., Kent, A.D., Parkin, S.S.P., (2000) J. Appl. Phys., 87, p. 5049
133. Fraune, M., Rdiger, U., Gntherodt, G., Cardoso, S., Freitas, P., (2000) Appl. Phys. Lett., 77, p. 3815
134. Devolder, T., Chappert, C., Chen, Y., Cambril, E., Launois, H., Bernas, H., Ferr, J., Jamet, J.P., (1999) J. Vac. Sci.
Technol. B, 17, p. 3177
135. Devolder, T., Chappert, C., Mathet, V., Bernas, H., Chen, Y., Jamet, J.P., Ferr, J., (2000) J. Appl. Phys., 87, p. 8671
136. Russek, S.E., Bailey, W.E., (2000) IEEE Trans. Magn., 36, p. 2990
137. Matsuyama, K., Matsuo, K., Nozaki, Y., (1999) J. Appl. Phys., 85, p. 5474
138. Katine, J.A., Albert, F.J., Buhrman, R.A., (2000) Appl. Phys. Lett., 76, p. 354
139. Shearwood, C., Blundell, S.J., Baird, M.J., Bland, J.A.C., Gester, M., Ahmed, H., Hughes, H.P., (1994) J. Appl. Phys., 75,
p. 5249
140. Hanson, M., Johansson, C., Nilsson, B., Isberg, P., Wppling, R., (1999) J. Appl. Phys., 85, p. 2793
141. Xu, Y.B., Hirohata, A., Lopez-Diaz, L., Leung, H.T., Tselepi, M., Gardiner, S.M., Lee, W.Y., Launois, H., (2000) J. Appl.

Phys., 87, p. 7019


142. Martn, J.I., Vicent, J.L., Costa-Krmer, J.L., Menndez, J.L., Cebollada, A., Anguita, J.V., Briones, F., (2000) IEEE Trans.
Magn., 36, p. 3002
143. Demand, H., Hehn, M., Ounadjela, K., Stamps, R.L., Cambril, E., Cornette, A., Rousseaux, F., (2000) J. Appl. Phys., 87, p.
5111
144. Ganesan, S., Park, C.M., Hattori, K., Park, H.C., White, R.L., Koo, H., Gomez, R.D., (2000) IEEE Trans. Magn., 36, p.
2987
145. Farhoud, M., Smith, H.I., Hwang, M., Ross, C.A., (2000) J. Appl. Phys., 87, p. 5120
146. Jung, K.B., Cho, H., Lee, K.P., Marburger, J., Sharifi, F., Singh, R.K., Kumar, D., Pearton, S.J., (1999) J. Vac. Sci.
Technol. B, 17, p. 3186
147. Jung, K.B., Hong, J., Childress, J.R., Pearton, S.J., Sharifi, F., Jenson, M., Hurst, A.T., (1999) J. Magn. Magn. Mater., 198199, p. 204
148. Krauss, P.R., Fischer, P.B., Chou, S.Y., (1994) J. Vac. Sci. Technol. B, 12, p. 3639
149. Chou, S.Y., Wei, M.S., Krauss, P.R., Fischer, P.B., (1994) J. Appl. Phys., 76, p. 6673
150. O'Barr, R., Yamamoto, S.Y., Schultz, S., Xu, W., Scherer, A., (1997) J. Appl. Phys., 81, p. 4730
151. Bae, J., Kim, S., Mondol, M., Farhoud, M., Hwang, M., Youcef-Toumi, K., (2000) J. Appl. Phys., 87, p. 5123
152. Welipitiya, D., Borca, C.N., Dowben, P.A., Gobulukoglu, I., Jiang, H., Robertson, B.W., Zhang, J., (1997) Mat. Res. Soc.
Symp. Proc., 475, p. 257
153. McCord, M.A., (1997) J. Vac. Sci. Technol. B, 15, p. 2125
154. Silverman, J.P., (1997) J. Vac. Sci. Technol. B, 15, p. 2117
155. Chen, Y., Kupka, R.K., Rousseaux, F., Carcenac, F., Decanini, D., Ravet, M.F., Launois, H., (1994) J. Vac. Sci. Technol.
B, 12, p. 3959
156. Rousseaux, F., Decanini, D., Carcenac, F., Cambril, E., Ravet, M.F., Chappert, C., Bardou, N., Veillet, P., (1995) J. Vac.
Sci. Technol. B, 13, p. 2787
157. Hehn, M., Ounadjela, K., Bucher, J.-P., Rousseaux, F., Decanini, D., Bartenlian, B., Chappert, C., (1996) Science, 272, p.
1782
158. Bardou, N., Bartenlian, B., Rousseaux, F., Decanini, D., Carcenac, F., Cambril, E., Ravet, M.F., Ferr, J., (1996) J. Magn.
Magn. Mater., 156, p. 139
159. Miramond, C., Fermon, C., Rousseaux, F., Decanini, D., Carcenac, F., (1997) J. Magn. Magn. Mater., 165, p. 500
160. Hillebrands, B., Mathieu, C., Hartmann, C., Bauer, M., Bttner, O., Riedling, S., Roos, B., Hartmann, U., (1997) J. Magn.
Magn. Mater., 175, p. 10
161. Schwarzacher, W., Kasyutich, O.I., Evans, P.R., Darbyshire, M.G., Yi, G., Fedosyuk, V.M., Rousseaux, F., Decanini, D.,
(1999) J. Magn. Magn. Mater., 198-199, p. 185
162. Jorzick, J., Demokritov, S.O., Hillebrands, B., Bartenlian, B., Chappert, C., Decanini, D., Rousseaux, F., Cambril, E.,
(1999) Appl. Phys. Lett., 75, p. 3859
163. Hehn, M., Ferr, R., Ounadjela, K., Bucher, J.-P., Rousseaux, F., (1997) J. Magn. Magn. Mater., 165, p. 5
164. Fruchart, O., Nozires, J.-P., Wernsdorfer, W., Givord, D., Rousseaux, F., Decanini, D., (1999) Phys. Rev. Lett., 82, p.
1305
165. Fruchart, O., Wernsdorfer, W., Nozires, J.-P., Givord, D., Rousseaux, F., Mailly, D., Decanini, D., Carcenac, F., (1999) J.
Magn. Magn. Mater., 198-199, p. 228
166. Wegrowe, J.-E., Fruchart, O., Nozires, J.-P., Givord, D., Rousseaux, F., Decanini, D., Ansermet, J.Ph., (1999) J. Appl.

Phys., 86, p. 1028


167. Jamet, J.-P., Lemerle, S., Meyer, P., Ferr, J., Bartenlian, B., Bardou, N., Chappert, C., Launois, H., (1998) Phys. Rev. B,
57, p. 14320
168. Farhoud, M., Hwang, M., Smith, H.I., Schattenburg, M.L., Bae, J.M., Youcef-Toumi, K., Ross, C.A., (1998) IEEE Trans.
Magn., 34, p. 1087
169. Farhoud, M., Ferrera, J., Lochtefeld, A.J., Murphy, T.E., Schattenburg, M., Carter, J., Ross, C.A., Smith, H.I., (1999) J.
Vac. Sci. Technol. B, 17, p. 3182
170. Kreuzer, S., Prgl, K., Bayreuther, G., Weiss, D., (1998) Thin Solid Films, 318, p. 219
171. Savas, T.A., Farhoud, M., Smith, H.I., Hwang, M., Ross, C.A., (1999) J. Appl. Phys., 85, p. 6160
172. Ross, C.A., Chantrell, R., Hwang, M., Farhoud, M., Savas, T., Hao, Y., Smith, H.J., Humphrey, F.B., (2000) Phys. Rev. B,
62, p. 14252
173. Haast, M.A.M., Heskamp, I.R., Abelmann, L., Lodder, J.C., Popma, T.J.A., (1999) J. Magn. Magn. Mater., 193, p. 511
174. Haast, M.A.M., Schuurhuis, J.R., Abelmann, L., Lodder, J.C., Popma, T.J., (1998) IEEE Trans. Magn., 34, p. 1006
175. Hwang, M., Abraham, M.C., Savas, T.A., Smith, H.I., Ram, R.J., Ross, C.A., (2000) J. Appl. Phys., 87, p. 5108
176. Hao, Y., Walsh, M., Farhoud, M., Ross, C.A., Smith, H.I., Wang, J.Q., Malkinski, L., (2000) IEEE Trans. Magn., 36, p.
2996
177. Pike, C., Fernandez, A., (1999) J. Appl. Phys., 85, p. 6668
178. Schneider, M., Hoffmann, H., (1999) J. Appl. Phys., 86, p. 4539
179. Zlfl, M., Kreuzer, S., Weiss, D., Bayreuther, G., (2000) J. Appl. Phys., 87, p. 7016
180. Fernandez, A., Gibbons, M.R., Wall, M.A., Cerjan, C.J., (1998) J. Magn. Magn. Mater., 190, p. 71
181. Fernandez, A., Cerjan, C.J., (2000) J. Appl. Phys., 87, p. 1395
182. Ross, C.A., Savas, T.A., Smith, H.I., Hwang, M., Chantrell, R., (1999) IEEE Trans. Magn., 35, p. 3781
183. Ross, C.A., Smith, H.I., Savas, T., Schattenburg, M., Farhoud, M., Hwang, M., Walsh, M., Ram, R.J., (1999) J. Vac. Sci.
Technol. B, 17, p. 3168
184. Lohau, J., Kirsch, S., Carl, A., Wassermann, E.F., (2000) Appl. Phys. Lett., 76, p. 3094
185. Thielen, M., Kirsch, S., Weinforth, H., Carl, A., Wassermann, E.F., (1998) IEEE Trans. Magn., 34, p. 1099
186. Carl, A., Kirsch, S., Lohau, J., Weinforth, H., Wassermann, E.F., (1999) IEEE Trans. Magn., 35, p. 3106
187. Fernandez, A., Bedrossian, P.J., Baker, S.L., Vernon, S.P., Kania, D.R., (1996) IEEE Trans. Magn., 32, p. 4472
188. Meier, G., Kleber, M., Grundler, D., Heitmann, D., Wiesendanger, R., (1998) Appl. Phys. Lett., 72, p. 2168
189. Wassermann, E.F., Thielen, M., Kirsch, S., Pollmann, A., Weinforth, H., Carl, A., (1998) J. Appl. Phys., 83, p. 1753
190. Van Roy, W., Carpi, E.L., Van Hove, M., Van Esch, A., Bogaerts, R., De Boeck, J., Borghs, G., (1993) J. Magn. Magn.
Mater., 121, p. 197
191. Ross, C., Smith, H., (1998) Data Storage, 5 (10), p. 41
192. Bessho, K., Iwasaki, Y., Hashimoto, S., (1996) J. Appl. Phys., 79, p. 5057
193. Bessho, K., Iwasaki, Y., Hashimoto, S., (1996) IEEE Trans. Magn., 32, p. 4443
194. Schaub, T., Wiesendanger, R., Gntherodt, H.J., (1992) Nanotechnology, 3, p. 77
195. Guo, C.X., Thomson, D.J., (1992) Ultramicroscopy, 42-44, p. 1452
196. Wirth, S., Heremans, J.J., Von Molnr, S., Field, M., Campman, K.L., Gossard, A.C., Awschalom, D.D., (1998) IEEE
Trans. Magn., 34, p. 1105
197. Wirth, S., Von Molnr, S., (2000) Appl. Phys. Lett., 76, p. 3283
198. Wirth, S., Von Molnr, S., Field, M., Awschalom, D.D., (1999) J. Appl. Phys., 85, p. 5249

199. Wirth, S., Von Molnr, S., (2000) J. Appl. Phys., 87, p. 7010
200. Kent, A.D., Von Molnr, S., Gider, S., Awschalom, D.D., (1994) J. Appl. Phys., 76, p. 6656
201. Gider, S., Shi, J., Awschalom, D.D., Hopkins, P.F., Campman, K.L., Gossard, A.C., Kent, A.D., Von Molnr, S., (1996)
Appl. Phys. Lett., 69, p. 3269
202. Awschalom, D.D., Di Vincenzo, D.P., (1995) Phys. Today, 48 (4), p. 43
203. Wirth, S., Field, M., Awschalom, D.D., Von Molnr, S., (1998) Phys. Rev. B, 57, pp. R14028
204. McCord, M.A., Awschalom, D.D., (1990) Appl. Phys. Lett., 57, p. 2153
205. Kent, A.D., Shaw, T.M., Von Molnr, S., Awschalom, D.D., (1993) Science, 262, p. 1249
206. Awschalom, D.D., McCord, M.A., Grinstein, G., (1990) Phys. Rev. Lett., 65, p. 783
207. Schindler, W., Hofmann, D., Kirshner, J., (2000) J. Appl. Phys., 87, p. 7007
208. Hofmann, D., Schindler, W., Kirshner, J., (1998) Appl. Phys. Lett., 73, p. 3279
209. Gadetsky, S., Suzuki, T., Erwin, J.K., Mansuripur, M., (1994) IEEE Trans. Magn., 30, p. 4404
210. Gadetsky, S., Suzuki, T., Erwin, J.K., Mansuripur, M., (1995) IEEE Trans. Magn., 31, p. 3253
211. Gadetsky, S., Erwin, J.K., Mansuripur, M., Suzuki, T., (1996) J. Appl. Phys., 79, p. 5687
212. Iwanaga, T., Nakada, M., Katayama, R., (1995) IEEE Trans. Magn., 31, p. 3221
213. Wu, T.H., Wu, J.C., Chen, B.M., Shieh, H.P., (1998) IEEE Trans. Magn., 34, p. 1994
214. Wu, T.H., Wu, J.C., Chen, B.M., Shieh, H.P., (1999) J. Magn. Magn. Mater., 202, p. 62
215. Wu, T.H., Wu, J.C., Huang, Y.W., Chen, B.M., Shieh, H.P., (1999) J. Appl. Phys., 85, p. 5980
216. Ishikawa, A., Ohno, T., Sakano, S., Shiroishi, Y., (1993) J. Magn. Magn. Mater., 120, p. 357
217. Iwanaga, T., Honma, H., Kayanuma, K., Segawa, S., Nakada, M., Katayama, R., Inada, H., (1993) Jpn. J. Appl. Phys., 32,
p. 5449
218. Katayama, K., Iwanaga, T., Inada, H., Okanoue, K., Katayama, R., Yoshihara, K., Yamanaka, Y., Okada, O., (1990) Proc.
SPIE, 1316, p. 35
219. Twisselmann, D.J., Adekor, B.T., Farhoud, M., Smith, H.I., Dorsey, P.C., Ross, C.A., (1998) Mater. Res. Soc. Symp. Proc.,
517, p. 193
220. Twisselmann, D.J., Farhoud, M., Smith, H.I., Ross, C.A., (1999) J. Appl. Phys., 85, p. 4292
221. Landis, S., Rodmacq, B., Dieny, B., Dal'Zotto, B., Tedesco, S., Heitsmann, M., (1999) Appl. Phys. Lett., 75, p. 2473
222. Landis, S., Rodmacq, B., Dieny, B., (2000) Phys. Rev. B, 62, p. 12271
223. Jander, A., Indeck, R.S., Muller, M.W., (1999) IEEE Trans. Magn., 35, p. 3995
224. Matsuyama, K., Komatsu, S., Nozaki, Y., (2000) J. Appl. Phys., 87, p. 4724
225. Huang, J.C.A., Wu, L.C., Chen, M.M., Wu, T.H., Wu, J.C., Huang, Y.W., Lee, C.H., Fu, C.M., (2000) J. Magn. Magn.
Mater., 209, p. 90
226. McClelland, J.J., Anderson, W.R., Celotta, R.J., (1997) Proc. SPIE, 2995, p. 90
227. Tulshinsky, D.A., Kelley, M.H., McClelland, J.J., Gupta, R., Celotta, R.J., (1998) J. Vac. Sci. Technol. A, 16, p. 1817
228. Shinjo, T., Ono, T., (1998) J. Magn. Magn. Mater., 177-181, p. 31
229. Ono, T., Sugita, Y., Shinjo, T., (1996) J. Phys. Soc. Japan, 65, p. 3021
230. Shinjo, T., Ono, T., Shigeto, K., Suguita, Y., (1997) Acta Phys. Polonica A, 91, p. 27
231. Gijs, M.A.M., Johnson, M.T., Reinders, A., Huisman, P.E., Van de Veerdonk, P.J.M., Lenczowski, S.K.J., Van
Gansewinkel, R.M.J., (1995) Appl. Phys. Lett., 66, p. 1839
232. Jorritsma, J., Gijs, M.A.M., Kerkhof, J.M., Stienen, J.G.H., (1996) Nanotechnol., 7, p. 263
233. Gijs, M.A.M., Lenczowski, S.K.J., Giesbers, J.B., Van der Veerdonk, R.J.M., Johnson, M.T., Jungblut, R.M., Reinders, A.,

Van Gansewinkel, R.M.J., (1995) J. Magn. Magn. Mater., 151, p. 333


234. Oepts, W., Gijs, M.A.M., Reinders, A., Jungblut, R.M., Van Gansewinkel, R.M.J., De Jonge, W.J.M., (1996) Phys. Rev. B,
53, p. 14024
235. Gijs, M.A.M., Reinders, A., Jungblut, R.M., Oepts, W., De Jonge, W.J.M., (1997) J. Magn. Magn. Mater., 165, p. 17
236. Jorritsma, J., Mydosh, J.A., (1998) J. Appl. Phys., 84, p. 901
237. Krams, R., Lauks, F., Stamps, R.L., Hillebrands, B., Gntherodt, G., Oepen, H.P., (1993) J. Magn. Magn. Mater., 121, p.
483
238. Hauschild, J., Gradmann, U., Elmers, H.J., (1998) Appl. Phys. Lett., 72, p. 3211
239. Shen, J., Skomski, R., Klaua, M., Jenniches, H., Sundar Manoharan, S., Krischner, J., (1997) J. Appl. Phys., 81, p. 3901
240. Dellmeyer, A., Carbone, C., Eberhardt, W., Pampuch, C., Rader, O., Gudat, W., Gambardella, P., Kern, K., (2000) Phys.
Rev. B, 61, pp. R5133
241. Chen, J., Erskine, J.L., (1992) Phys. Rev. Lett., 68, p. 1212
242. Sussiau, M., Nguyen Van Dau, F., Galtier, P., Schuhl, A., (1996) Appl. Phys. Lett., 69, p. 857
243. Nguyen Van Dau, F., Sussiau, M., Schuhl, A., Galtier, P., (1997) J. Appl. Phys., 81, p. 4482
244. Sussiau, M., Encinas, A., Nguyen Van Dau, F., Vaurs, A., Schuhl, A., Galtier, P., (1997) Mat. Res. Soc. Symp. Proc., 475,
p. 195
245. Teichert, C., Barthel, J., Oepen, H.P., Krischner, J., (1999) Appl. Phys. Lett., 74, p. 588
246. Sugawara, A., Coyle, T., Hembree, G.G., Scheinfein, M.R., (1997) Appl. Phys. Lett., 70, p. 1043
247. Sugawara, A., Hembree, G.G., Scheinfein, M.R., (1997) J. Appl. Phys., 82, p. 5662
248. Sugawara, A., Scheinfein, M.R., (1997) Phys. Rev. B, 56, pp. R8499
249. Sugawara, A., Streblechenko, D., McCartney, M., Scheinfein, M.R., (1998) IEEE Trans. Magn., 34, p. 1081
250. Ressier, L., Schuhl, A., Nguyen Van Dau, F., Postava, K., Goiranm, M., Peyerade, J.P., Fert, A.R., (1997) J. Appl. Phys.,
81, p. 5464
251. Jaffrs, H., Ressier, L., Peyrade, J.P., Fert, A.R., Gogol, P., Thiaville, A., Schuhl, A., Nguyen Van Dau, F., (1998) J. Appl.
Phys., 84, p. 4375
252. Jaffrs, H., Ressier, L., Postava, K., Schuhl, A., Nguyen Van Dau, F., Goiran, M., Redouls, J.P., Fert, A.R., (1998) J.
Magn. Magn. Mater., 184, p. 19
253. Ressier, L., Jaffrs, H., Snoeck, E., Bertrand, D., Fert, A.R., Peyrade, J.P., Schuhl, A., Nguyen Van Dau, F., (1998) Mat.
Sci. Forum, 269-272, p. 955
254. Ressier, L., Jaffrs, H., Schuhl, A., Nguyen Van Dau, F., Goiran, M., Redouls, J.P., Peyrade, J.P., Fert, A.R., (1997) Mat.
Res. Soc. Symp. Proc., 475, p. 239
255. Krauss, P.R., Chou, S.Y., (1995) J. Vac. Sci. Technol. B, 13, p. 2850
256. Kong, L., Zhuang, L., Chou, S.Y., (1997) IEEE Trans. Magn., 33, p. 3019
257. Wu, W., Cui, B., Sun, X.Y., Zhang, W., Zhuang, L., Kong, L., Chou, S.Y., (1998) J. Vac. Sci. Technol. B, 16, p. 3825
258. Cui, B., Kong, L., Sun, X., Chou, S.Y., (1999) J. Appl. Phys., 85, p. 5534
259. Kong, L., Zhuang, L., Li, M., Cui, B., Chou, S.Y., (1998) Jpn. J. Appl. Phys., 37, p. 5973
260. Chou, S.Y., Kraus, P.R., Zhang, W., Guo, L., Zhuang, L., (1997) J. Vac. Sci. Technol. B, 15, p. 2897
261. Li, S.P., Lebib, A., Peyrade, D., Natali, M., Chen, Y., (2000) Appl. Phys. Lett., 77, p. 2743
262. Palacin, S., Hidber, P.C., Bourgoin, J.P., Miramond, C., Ferman, C., Whitesides, G.M., (1996) Chem. Mater., 8, p. 1316
263. Zhong, Z., Gates, B., Xia, Y., Qin, B., (2000) Langmuir, 16, p. 10369
264. Stamm, C., Marty, F., Vaterlaus, A., Weich, V., Egger, S., Maier, U., Ramsperger, U., Pescia, D., (1998) Science, 282, p.

449
265. Marty, F., Vaterlaus, A., Weich, V., Stamm, C., Maier, U., Pescia, D., (1999) J. Appl. Phys., 85, p. 6166
266. Carter, G., (2001) J. Phys. D, 34, pp. R1
267. Koike, K., Matsuyama, H., Hirayama, Y., Tanahashi, K., Kanemura, T., Kitakami, O., Shimada, Y., (2001) Appl. Phys.
Lett., 78, p. 784
268. Lohau, J., Moser, A., Rettner, C.T., Best, M.E., Terris, B.D., (2001) Appl. Phys. Lett., 78, p. 990
269. Yakushiji, Y., Mitani, S., Takahashi, N., Fujimori, H., (2000) J. Magn. Soc. Japan, 24, p. 567
270. Toporov, A.Y., Langford, R.M., Petford-Long, A.K., (2000) Appl. Phys. Lett., 77, p. 3063
271. Lin, X., Zhu, J.G., Messner, W., (2000) IEEE Trans. Magn., 36, p. 2999
272. Polushkin, N.I., Gusev, S.A., Drozdov, M.N., Verevkin, Y.K., Petryakov, V.N., (1997) J. Appl. Phys., 81, p. 5478
273. Wittborn, J., Canalias, C., Rao, K.V., Polushkin, N.I., (2000) Modern Trends in Magnetostriction Study and Application, p.
263. , M.R.J. Gibbs. Amsterdam: Kluwer Academic Press
274. Chappert, C., Bernas, H., Ferr, J., Kottler, V., Jamet, J.P., Chen, Y., Cambril, E., Launois, H., (1998) Science, 280, p. 1919
275. Aign, T., Meyer, P., Lemerle, S., Jamet, J.P., Ferr, J., Mathet, V., Chappert, C., Bernas, H., (1998) Phys. Rev. Lett., 81, p.
5656
276. Devolder, T., Vieu, C., Bernas, H., Ferr, J., Chappert, C., Gierak, J., Jamet, J.P., Kaitasov, O., (1999) C.R. Acad. Sci.
Paris, 327 (SERIE II), p. 915
277. Bernas, H., Devolder, T., Chappert, C., Ferr, J., Kottler, V., Chen, Y., Vieu, C., Launois, H., (1999) Nucl. Instrum.
Methods B, 148, p. 872
278. Vieu, C., Gierak, J., Launois, H., Aign, T., Meyer, P., Jamet, J.P., Ferr, J., Bernas, H., (2000) Microelectron. Eng., 53, p.
191
279. Terris, B.D., Folks, L., Weller, D., Baglin, J.E.E., Kellock, J., Rothuizen, H., Vettiger, P., (1999) Appl. Phys. Lett., 75, p.
403
280. Terris, B.D., Weller, D., Folks, L., Baglin, J.E.E., Kellock, A.J., Rothuizen, H., Vetrtiger, P., (2000) J. Appl. Phys., 87, p.
7004
281. Bruenger, W.H., Torkler, M., Dzionk, C., Terris, B.D., Folks, L., Weller, D., Rothuizen, H., Fallmann, W., (2000)
Microelectron. Eng., 53, p. 605
282. Takeshita, H., Suzuki, Y., Akinaga, H., Mizutani, W., Tanaka, K., Katayama, T., Itoh, A., (1996) Appl. Phys. Lett., 68, p.
3040
283. Takeshita, H., Suzuki, Y., Akinaga, H., Mizutani, W., Katayama, T., Itoh, A., Tanaka, K., (1997) J. Magn. Magn. Mater.,
165, p. 38
284. Fruchart, O., Klaua, M., Barthel, J., Krischner, J., (2000) Appl. Surf. Sci., 162-163, p. 529
285. Padovani, S., Molins-Mata, P., Scheurer, F., Bucher, J.P., (1998) Appl. Phys. A, 66, pp. S1199
286. Fruchart, O., Klaua, M., Barthel, J., Kirschner, J., (1999) Phys. Rev. Lett., 83, p. 2769
287. Chambliss, D.D., Wilson, R.J., Chiang, S., (1991) Phys. Rev. Lett., 66, p. 1721
288. Shen, J., Skomski, R., Klaua, M., Jenniches, H., Sundar Manoharan, S., Kirschner, J., (1997) Phys. Rev. B, 56, p. 2340
289. Burne, H., Giovannini, M., Bromann, K., Kern, K., (1998) Nature, 394, p. 451
290. Ohresser, P., Ghiringhelli, G., Tjernberg, O., Brookes, N.B., Finazzi, M., (2000) Phys. Rev. B, 62, p. 5803
291. De la Figuera, J., Huerta-Garnica, M.A., Prieto, J.E., Ocal, C., Miranda, R., (1995) Appl. Phys. Lett., 66, p. 1006
292. Silva, S.L., Jenkins, C.R., York, S.M., Leibsle, F.M., (2000) Appl. Phys. Lett., 76, p. 1128
293. Parker, T.M., Wilson, L.K., Condon, N.G., Leibsle, F.M., (1997) Phys. Rev. B, 56, p. 6458

294. Lin, J.-L., Petrovykh, D.Y., Kirakosian, A., Rauscher, H., Himpsel, F.J., Dowben, P.A., (2001) Appl. Phys. Lett., 78, p. 829
295. Dallmeyer, A., Carbone, C., Eberhardt, W., Pampuch, C., Rader, O., Gudat, W., Gambarella, P., Kern, K., (2000) Phys.
Rev. B, 61, pp. R5133
296. Tober, Marks, R.F., Chambliss, D.D., Roche, K.P., Toney, M.F., Kellock, A.J., Farrow, R.F.C., (2000) Appl. Phys. Lett.,
77, p. 2728
297. Lee, K.L., Thomas, R.R., Viehbeck, A., O'Sullivan, E.J.M., (1993) J. Vac. Sci. Technol. B, 11, p. 2204
298. Malac, M., Egerton, R.F., Brett, M.J., Dick, B., (1999) J. Vac. Sci. Technol. B, 17, p. 2671
299. Dick, B., Brett, M.J., Smy, T.J., Freeman, M.R., Malac, M., Egerton, R.F., (2000) J. Vac. Sci. Technol. A, 18, p. 1838
300. Seip, C.T., O'Connor, C.J., (1999) Nanostruct. Mater., 12, p. 183
301. Petit, C., Taleb, A., Pileni, M.P., (1999) J. Phys. Chem. B, 103, p. 1805
302. Sun, S., Murray, C.B., Wller, D., Folks, L., Moser, A., (2000) Science, 287, p. 1989
303. Black, C.T., Murray, C.B., Sandstrom, R.L., Sun, S., (2000) Science, 290, p. 1131
304. Sun, S., Murray, C.B., (1999) J. Appl. Phys., 85, p. 4325
305. Sun, S., Murray, C.B., Doyle, H., (1999) Mat. Res. Soc. Symp. Proc., 577, p. 385
306. Oppegard, A.L., Darnell, F.J., Miller, H.C., (1961) J. Appl. Phys., 32 (SUPPL.), pp. 184S
307. Zhang, L., Manthiram, A., (1996) Phys. Rev. B, 54, p. 3462
308. Giersig, M., Hilgendorff, M., (1999) J. Phys. D, 32, pp. L111
309. Park, M., Harrison, C., Chaikin, P., Register, R.A., Adamson, D.H., (1997) Science, 276, p. 1401
310. Mansky, P., Liu, Y., Huang, E., Russell, T.P., Hawker, C., (1997) Science, 275, p. 1458
311. Huang, E., Rockford, L., Russell, T.P., Hawker, C.J., (1998) Nature, 395, p. 757
312. Huang, E., Pruzinsky, S., Russell, T.P., Mays, J., Hawker, C.J., (1999) Macromolecules, 32, p. 5299
313. Liu, K., Baker, S.M., Tuominen, M., Russell, T.P., Schuller, I.K., (2001) Phys. Rev. B, 63, p. 060403
314. Thurn-Albercht, T., Schotter, J., Kstle, G.A., Emley, N., Shibauchi, T., Krusin-Elbaum, L., Guarini, K., Russell, T.P.,
(2000) Science, 290, p. 2126
315. Hulteen, J.C., Van Duyne, P., (1995) J. Vac. Sci. Technol. A, 13, p. 1553
316. Winzer, M., Kleiber, M., Dix, N., Wiesendanger, R., (1996) Appl. Phys. A, 63, p. 617
317. Wiesendanger, R., Bode, M., Kleiber, M., Lhndorf, M., Pascal, R., Wadas, A., Weiss, D., (1997) J. Vac. Sci. Technol. B,
15, p. 1330
318. Li, S.P., Lew, W.S., Xu, Y.B., Hirohata, A., Samad, A., Baker, F., Bland, J.A.C., (2000) Appl. Phys. Lett., 76, p. 748
319. Haginoya, C., Ishibashi, M., Koike, K., (1997) Appl. Phys. Lett., 71, p. 2934
320. Velev, O.D., Tessier, P.M., Lenhoff, A.M., Kaler, E.W., (1999) Nature, 401, p. 548
321. Keller, F., Hunter, M.S., Robinson, D.L., (1953) J. Electrochem. Soc., 100, p. 411
322. Thompson, G.E., Furneaux, R.C., Wood, G.C., Richardson, J.A., Gode, J.S., (1978) Nature, 272, p. 433
323. Furneaux, R.C., Rigby, W.R., Davidson, A.P., United States Patent 4,687,551, 1987Moskovits, M., Xu, J.M., United States
Patent 5,581,091, 1996Kawai, S., Ueda, R., (1975) J. Electrochem. Soc., 122, p. 32
324. Saito

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