Six Sigma Green Belt Handbook PDF

Statistical Quality
Control for the Six

Sigma Green Belt
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Also available from ASQ Quality Press:

Applied Statistics for the Six Sigma Green Belt
Bhisham C. Gupta and H. Fred Walker
The Certified Six Sigma Green Belt Handbook
Roderick A. Munro, Matthew J. Maio, Mohamed B. Nawaz,
Govindarajan Ramu, and Daniel J. Zrymiak
Transactional Six Sigma for Green Belts: Maximizing Service and
Manufacturing Processes
Samuel E. Windsor
The Executive Guide to Understanding and Implementing Lean Six Sigma:
The Financial Impact
Robert M. Meisel, Steven J. Babb, Steven F. Marsh, & James P. Schlichting
Applying the Science of Six Sigma to the Art of Sales and Marketing
Michael J. Pestorius
Six Sigma Project Management: A Pocket Guide
Jeffrey N. Lowenthal
Six Sigma for the Next Millennium: A CSSBB Guidebook
Kim H. Pries
The Certified Quality Engineer Handbook, Second Edition
Roger W. Berger, Donald W. Benbow, Ahmad K. Elshennawy,
and H. Fred Walker, editors
The Certified Quality Technician Handbook
Donald W. Benbow, Ahmad K. Elshennawy, and H. Fred Walker
The Certified Manager of Quality/Organizational Excellence Handbook:
Third Edition
Russell T. Westcott, editor
Business Performance through Lean Six Sigma: Linking the Knowledge
Worker, the Twelve Pillars, and Baldrige
James T. Schutta
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Statistical Quality
Control for the Six
Sigma Green Belt
Bhisham C. Gupta
H. Fred Walker
ASQ Quality Press

Milwaukee, Wisconsin
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American Society for Quality, Quality Press, Milwaukee 53203

2007 by American Society for Quality
All rights reserved. Published 2007
Printed in the United States of America
12 11 10 09 08 07 06
5 4 3 2 1
Library of Congress Cataloging-in-Publication Data
Gupta, Bhisham C., 1942
Statistical quality control for the Six sigma green belt / Bhisham C.
Gupta and H. Fred Walker.
p. cm.
Includes index.
ISBN 978-0-87389-686-3 (hard cover : alk. paper)
1. Six sigma (Quality control standard) 2. Quality controlStatistical
methods. I. Walker, H. Fred, 1963
II. Title.
TS156.G8674 2007
658.562dc22
2007000315
No part of this book may be reproduced in any form or by any means, electronic,
mechanical, photocopying, recording, or otherwise, without the prior written permission of
the publisher.
Publisher: William A. Tony
Acquisitions Editor: Matt Meinholz
Project Editor: Paul OMara
Production Administrator: Randall Benson
ASQ Mission: The American Society for Quality advances individual, organizational, and
community excellence worldwide through learning, quality improvement, and knowledge
exchange.
Attention Bookstores, Wholesalers, Schools, and Corporations: ASQ Quality Press books,
videotapes, audiotapes, and software are available at quantity discounts with bulk purchases
for business, educational, or instructional use. For information, please contact ASQ Quality
Press at 800-248-1946, or write to ASQ Quality Press, P.O. Box 3005, Milwaukee, WI
53201-3005.
To place orders or to request a free copy of the ASQ Quality Press Publications Catalog,
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org or http://qualitypress.asq.org.
Printed on acid-free paper
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In loving memory of my parents, Roshan Lal and Sodhan Devi.

Bhisham
In loving memory of my father, Carl Ellsworth Walker.
Fred
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Contents
List of Figures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xiii
List of Tables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xix
Preface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xxi
Acknowledgments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xxiii
Chapter 1 Introduction to Statistical Quality Control . . . . . . . . . .
1.1 Identifying the Tools of SQC. . . . . . . . . . . . . . . . . . . . . . . . . . .
1.2 Relating SQC to Applied Statistics and to DOE . . . . . . . . . . . .
1.3 Understanding the Role of Statistics in SQC . . . . . . . . . . . . . .
1.4 Making Decisions Based on Quantitative Data . . . . . . . . . . . . .
1.5 Practical versus Theoretical or Statistical Significance . . . . . . .
1.6 Why We Cannot Measure Everything . . . . . . . . . . . . . . . . . . . .
1.7 A Word on the Risks Associated with Making Bad
Decisions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Chapter 2 Elements of a Sample Survey . . . . . . . . . . . . . . . . . . . . .
2.1 Basic Concepts of Sampling . . . . . . . . . . . . . . . . . . . . . . . . . . .
Sampling Designs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2.2 Simple Random Sampling . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2.2.1 Estimation of a Population Mean and Population Total
2.2.2 Confidence Interval for a Population Mean and
Population Total . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2.2.3 Determination of Sample Size . . . . . . . . . . . . . . . . . . .
2.3 Stratified Random Sampling . . . . . . . . . . . . . . . . . . . . . . . . . . .
2.3.1 Estimation of a Population Mean and
2.4 Systematic Random Sampling. . . . . . . . . . . . . . . . . . . . . . . . . .
1
2
2
4
5
5
7
7
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2.5
2.4.2 Confidence Interval for a Population Mean

and Population Total . . . . . . . . . . . . . . . . . . . . . . . . . . .
Cluster Random Sampling. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
33
34
37
Chapter 3
3.1
3.2
3.3
3.4
Phase I (Detecting Large Shifts)SPC: Control

Charts for Variables. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Basic Definition of Quality and Its Benefits . . . . . . . . . . . . . . .
SPC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Check Sheet . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Pareto Chart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Cause-and-Effect (Fishbone or Ishikawa) Diagram . . . . . . . . .
Defect Concentration Diagram. . . . . . . . . . . . . . . . . . . . . . . . .
Run Chart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Control Charts for Variables . . . . . . . . . . . . . . . . . . . . . . . . . . .
Process Evaluation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Action on Process . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Action on Output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Variation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Common Causes or Random Causes . . . . . . . . . . . . . . . . . . . .
Special Causes or Assignable Causes. . . . . . . . . . . . . . . . . . . .
Local Actions and Actions on the System . . . . . . . . . . . . . . . .
Preparation for Use of Control Charts . . . . . . . . . . . . . . . . . . .
Benefits of Control Charts . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Rational Samples for a Control Chart . . . . . . . . . . . . . . . . . . .
ARL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
OC Curve . . . . . .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3.3.1 Shewhart X and R Control Charts . . . . . . . . . . . . . . . . .
3.3.2 Shewhart X and R Control Charts When Process
Mean and Process Standard Deviation Are
Known. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3.3.3 Shewhart Control Chart for Individual
Observations
.................................
3.3.4 Shewhart X and S Control Charts . . . . . . . . . . . . . . . . .
Process Capability . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
30
30
32
68
69
72
79
Chapter 4
4.1
4.2
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Phase I (Detecting Large Shifts)SPC: Control

Charts for Attributes . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Control Charts for Attributes . . . . . . . . . . . . . . . . . . . . . . . . . . .
The p Chart: Control Chart for Fraction of Nonconforming
Units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Control Limits for the p Chart . . . . . . . . . . . . . . . . . . . . . . . . .
39
40
41
43
45
47
48
50
51
51
51
51
52
52
52
53
55
56
57
57
59
60
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4.3
4.4
4.5
4.2.1 The p Chart: Control Chart for Fraction

Nonconforming with Variable Samples . . . . . . . . . . . .
The np Chart: Control Chart for Number of Nonconforming
Units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Control Limits for the np Control Chart. . . . . . . . . . . . . . . . . .
The c Chart (Nonconformities versus Nonconforming
Units) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
The u Chart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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92
93
96
Chapter 5
5.1
5.2
5.3
5.4
Phase II (Detecting Small Shifts)SPC:

Cumulative Sum, Moving Average, and
Exponentially Weighted Moving Average
Control Charts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Basic Concepts of the CUSUM Control Chart
.............
CUSUM Control Chart versus Shewhart X-R Control

Chart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Designing a CUSUM Control Chart . . . . . . . . . . . . . . . . . . . . .
5.2.1 Two-Sided CUSUM Control Chart Using Numerical
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
5.2.2 The Fast Initial Response Feature for the CUSUM
Control Chart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
5.2.3 Combined Shewhart-CUSUM Control Chart . . . . . . . .
5.2.4 CUSUM Control Chart for Controlling Process
Variability . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
The MA Control Chart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
The EWMA Control Chart . . . . . . . . . . . . . . . . . . . . . . . . . . . .
89
101
102
102
104
106
112
115
116
117
120
Chapter 6 Process Capability Indices . . . . . . . . . . . . . . . . . . . . . . .

6.1 Development of Process Capability Indices . . . . . . . . . . . . . . .
6.2 PCI Cp . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
6.3 PCI Cpk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
6.4 PCI Cpm . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
6.5 PCI Cpmk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
6.6 PCI Cpnst . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Examples Comparing Cpnst with PCIs Cpk and Cpm . . . . . . . . . .
6.6.1 Certain Features of the Capability Index Cpnst . . . . . . .
6.7 PCIs Pp and Ppk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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127
130
135
136
138
139
141
142
144
Chapter 7 Measurement Systems Analysis . . . . . . . . . . . . . . . . . . .

7.1 Using SQC to Understand Variability . . . . . . . . . . . . . . . . . . . .
Variability in the Production or Service Delivery Process . . . .
Variability in the Measurement Process . . . . . . . . . . . . . . . . . .
7.2 Evaluating Measurement System Performance . . . . . . . . . . . . .
7.2.1 MSA Based on Range. . . . . . . . . . . . . . . . . . . . . . . . . .
7.2.2 MSA Based on ANOVA . . . . . . . . . . . . . . . . . . . . . . . .
7.3 MCIs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
MCI as a Percentage of Process Variation (MCIpv) . . . . . . . . .
MCI as a Percentage of Process Specification (MCIps) . . . . . .
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149
150
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Contents
Chapter 8 PRE-control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
8.1 PRE-control Background. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
8.1.1 What Are We Trying to Accomplish with
PRE-control?. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
8.1.2 The Conditions Necessary for PRE-control
to Be Valid. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
8.2 Global Perspective on the Use of PRE-control
(Understanding the Color-Coding Scheme) . . . . . . . . . . . . . . .
8.3 The Mechanics of PRE-control . . . . . . . . . . . . . . . . . . . . . . . . .
Step 1: Ensure the Process Is Sufficiently Capable . . . . . . . . .
Step 2: Establish the PRE-control Zones . . . . . . . . . . . . . . . . .
Step 3: Verify That the Process Is Ready to Begin
PRE-control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Step 4: Begin Sampling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Step 5: Apply the PRE-control Rules . . . . . . . . . . . . . . . . . . . .
8.4 The Statistical Basis for PRE-control . . . . . . . . . . . . . . . . . . . .
8.5 Advantages and Disadvantages of PRE-control . . . . . . . . . . . .
8.5.1 Advantages of PRE-control . . . . . . . . . . . . . . . . . . . . .
8.5.2 Disadvantages of PRE-control . . . . . . . . . . . . . . . . . . .
8.6 What Comes After PRE-control? . . . . . . . . . . . . . . . . . . . . . . .
Chapter 9 Acceptance Sampling . . . . . . . . . . . . . . . . . . . . . . . . . . . .
9.1 The Intent of Acceptance Sampling . . . . . . . . . . . . . . . . . . . . .
9.2 Sampling Inspection versus 100 Percent Inspection . . . . . . . . .
9.3 Sampling Concepts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
9.3.1 Lot-by-Lot versus Average Quality Protection. . . . . .
9.3.2 The OC Curve. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
9.3.3 Plotting the OC Curve . . . . . . . . . . . . . . . . . . . . . . . .
9.3.4 Acceptance Sampling by Attributes . . . . . . . . . . . . . .
9.3.5 Acceptable Quality Limit . . . . . . . . . . . . . . . . . . . . . .
9.3.6 Lot Tolerance Percent Defective. . . . . . . . . . . . . . . . .
9.3.7 Producers and Consumers Risks . . . . . . . . . . . . . . .
9.3.8 Average Outgoing Quality . . . . . . . . . . . . . . . . . . . . .
9.3.9 Average Outgoing Quality Limit . . . . . . . . . . . . . . . .
9.3.10 Lot Size, Sample Size, and Acceptance Number . . . .
9.4 Types of Attribute Sampling Plans . . . . . . . . . . . . . . . . . . . . . .
9.4.1 Single Sampling Plans . . . . . . . . . . . . . . . . . . . . . . . . .
9.4.2 Double Sampling Plans. . . . . . . . . . . . . . . . . . . . . . . . .
9.4.3 OC Curve for a Double Sampling Plan. . . . . . . . . . . . .
9.4.4 Multiple Sampling Plans. . . . . . . . . . . . . . . . . . . . . . . .
9.4.5 AOQ and AOQL for Double and Multiple Plans . . . . .
9.4.6 Average Sample Number . . . . . . . . . . . . . . . . . . . . . . .
9.5 Sampling Standards and Plans. . . . . . . . . . . . . . . . . . . . . . . . . .
9.5.1 ANSI/ASQ Z1.4-2003 . . . . . . . . . . . . . . . . . . . . . . . . .
9.5.2 Levels of Inspection . . . . . . . . . . . . . . . . . . . . . . . . . . .
9.5.3 Types of Sampling . . . . . . . . . . . . . . . . . . . . . . . . . . . .
9.5.4 Dodge-Romig Tables . . . . . . . . . . . . . . . . . . . . . . . . . .
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172
173
173
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175
175
176
177
178
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186
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9.6
Variables Sampling Plans . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

9.6.1 ANSI/ASQ Z1.9-2003 . . . . . . . . . . . . . . . . . . . . . . . . .
Sequential Sampling Plans . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous Sampling Plans. . . . . . . . . . . . . . . . . . . . . . . . . . . .
9.8.1 Types of Continuous Sampling Plans . . . . . . . . . . . . . .
Variables Plan When the Standard Deviation Is Known . . . . . .
193
194
199
201
201
203
Chapter 10 Computer Resources to Support SQC: MINITAB . . .

10.1
Using MINITABVersion 14 . . . . . . . . . . . . . . . . . . . . . . . .
Getting Started with MINITAB . . . . . . . . . . . . . . . . . . . . . .
Creating a New Worksheet . . . . . . . . . . . . . . . . . . . . . . . . . .
Saving a Data File. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Retrieving a Saved MINITAB Data File. . . . . . . . . . . . . . . .
Saving a MINITAB Project. . . . . . . . . . . . . . . . . . . . . . . . . .
Print Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
10.2
The Shewhart Xbar-R Control Chart . . . . . . . . . . . . . . . . . . .
10.3
The Shewhart Xbar-R Control Chart When Process
Mean and Process Standard Deviation Are Known. . . . .
10.4
The Shewhart Control Chart for Individual Observations . . .
10.5
The Shewhart Xbar-S Control ChartEqual Sample
Size. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
10.6
The Shewhart Xbar-S Control ChartSample Size
Variable . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
10.7
Process Capability Analysis . . . . . . . . . . . . . . . . . . . . . . . . . .
10.8
The p Chart: Control Chart for Fraction Nonconforming
Units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
10.9
Units with Variable Sample Size . . . . . . . . . . . . . . . . . . . . . .
10.10 The np Chart: Control Chart for Nonconforming Units . . . .
10.11 The c Chart. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
10.12 The u Chart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
10.13 The u Chart: Variable Sample Size . . . . . . . . . . . . . . . . . . . .
10.14 Designing a CUSUM Control Chart . . . . . . . . . . . . . . . . . . .
10.15 The FIR Feature for a CUSUM Control Chart . . . . . . . . . . .
10.16 The MA Control Chart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
10.17 The EWMA Control Chart . . . . . . . . . . . . . . . . . . . . . . . . . .
10.18 Measurement System Capability Analysis . . . . . . . . . . . . . .
10.18.1 Measurement System Capability Analysis
(Using Crossed Designs). . . . . . . . . . . . . . . . . . . .
225
225
226
226
227
227
227
228
228
9.7
9.8
9.9
Chapter 11 Computer Resources to Support SQC: JMP . . . . . . .

11.1
Using JMPVersion 6.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Getting Started with JMP . . . . . . . . . . . . . . . . . . . . . . . . . . .
Creating a New Data Table . . . . . . . . . . . . . . . . . . . . . . . . . .
Opening an Existing JMP File . . . . . . . . . . . . . . . . . . . . . . .
Saving JMP Files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Print Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Using JMP Images for Reporting . . . . . . . . . . . . . . . . . . . . .
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233
235
238
239
239
240
241
242
243
245
245
247
249
250
261
261
263
264
265
265
266
267
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xii
Contents
11.2
11.3
11.4
11.5
11.6
11.7
11.8
11.9
11.10
11.11
11.12
11.13
11.14
11.15
11.16
Appendix
The Shewhart XBar and R Control Chart . . . . . . . . . . . . . . .

The Shewhart XBar and S Control ChartEqual
Sample Size . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
The Shewhart XBar and S Control ChartSample Size
Variable . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
The Shewhart Control Chart for Individual
Observations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Process Capability Analysis . . . . . . . . . . . . . . . . . . . . . . . . . .
Units with Constant Sample Size. . . . . . . . . . . . . . . . . . . . . .
Units with Sample Size Varying . . . . . . . . . . . . . . . . . . . . . .
The np Chart: Control Chart for Nonconforming Units . . . .
The c Chart. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
The u Chart with Constant Sample Size . . . . . . . . . . . . . . . .
The u Chart: Control Chart for Fraction Nonconforming
Units with Sample Size Varying . . . . . . . . . . . . . . . . . . . . . .
The CUSUM Chart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
The Uniformly Weighted Moving Average Chart . . . . . . . . .
The EWMA Control Chart . . . . . . . . . . . . . . . . . . . . . . . . . .
Measurement System Capability Analysis . . . . . . . . . . . . . .
11.16.1 Measurement System Capability Analysis
(Using Crossed Designs). . . . . . . . . . . . . . . . . . . .
268
270
272
273
275
277
281
281
282
284
286
286
288
290
292
293
Statistical Factors and Tables . . . . . . . . . . . . . . . . . . . . . 299
Bibliography . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 327
Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 331
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List of Figures
Figure 1.1
Figure 1.2
Figure 1.3
Figure 1.4
Figure 1.5
Figure 1.6
Figure 3.1
Figure 3.2
Figure 3.3
Figure 3.4
Figure 3.5
Figure 3.6
Figure 3.7
Figure 3.8
Figure 3.9
Figure 3.10
Figure 3.11
Figure 3.12
Figure 3.13
Figure 3.14
Figure 4.1
Figure 4.2
The five tool types of SQC. . . . . . . . . . . . . . . . . . . . . . . . . . . .

Relationship among applied statistics, SQC, and DOE. . . . . .
Order of SQC topics in process or transactional Six Sigma. . .
Detecting statistical differences. . . . . . . . . . . . . . . . . . . . . . . .
Detecting practical and statistical differences. . . . . . . . . . . . .
Sample versus population. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Flowchart of a process. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Pareto chart for data in Example 3.1.. . . . . . . . . . . . . . . . . . . .
Pareto chart when weighted frequencies are used. . . . . . . . . .
An initial form of a cause-and-effect diagram. . . . . . . . . . . . .
A complete cause-and-effect diagram. . . . . . . . . . . . . . . . . . .
A rectangular prism-shaped product that has been
damaged. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A run chart. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A control chart with a UCL and an LCL. . . . . . . . . . . . . . . . .
OC curves for the x chart with 3 limits for different
sample sizes n. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
The X and R control charts, constructed using MINITAB,

for the ball bearing data in Table 3.4. . . . . . . . . . . . . . . . . . . . . .
The MR control chart, constructed using MINITAB, for
the ball
bearing data in Table 3.5. . . . . . . . . . . . . . . . . . . . . . .
The X and S control charts, constructed using MINITAB,
for the
ball bearing data in Table 3.4. . . . . . . . . . . . . . . . . . . . .
The X and S control charts for variable sample sizes,
constructed using MINITAB, for the piston ring data in
Table 3.6. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Three illustrations of the concept of process capability,
where (a) shows a process that is stable but not capable,
(b) shows a process that is stable and barely capable, and
(c) shows a process that is stable and capable. . . . . . . . . . . . .
MINITAB printout of the p chart for nonconforming
computer chips, using trial control limits from the data
in Table 4.2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
MINITAB printout of the p chart for nonconforming
chips with variable sample sizes, using trial control limits
for the data in Table 4.3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2
3
4
6
6
7
41
45
47
48
49
49
50
54
59
65
71
75
77
80
89
91
xiii
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xiv
List of Figures
Figure 4.3
Figure 4.4
Figure 4.5
Figure 4.6
Figure 5.1
Figure 5.2
Figure 5.3
Figure 5.4
Figure 5.5
Figure 5.6
Figure 5.7
Figure 5.8
Figure 6.1
Figure 7.1
Figure 7.2
Figure 7.3
Figure 7.4
Figure 7.5
Figure 7.6
Figure 7.7
Figure 7.8
Figure 7.9
Figure 8.1
Figure 8.2
Figure 8.3
Figure 8.4
Figure 9.1
Figure 9.2
Figure 9.3
Figure 9.4
Figure 9.5
H1277 CH00_FM.indd xiv
MINITAB printout of the np chart for nonconforming

computer chips, using trial control limits for the data
in Table 4.2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
The c control chart of nonconformities for the data
in Table 4.4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
The u chart of nonconformities for the data in Table 4.5,
constructed using MINITAB. . . . . . . . . . . . . . . . . . . . . . . . . .
The u chart of nonconformities for the data in Table 4.6,
constructed using MINITAB. . . . . . . . . . . . . . . . . . . . . . . . . .
X-R control chart for the data in Table 5.1. . . . . . . . . . . . . . . .

CUSUM chart for the data in Table 5.1. . . . . . . . . . . . . . . . . .
MINITAB printout of a two-sided CUSUM control chart
for the data in Table 5.1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
MINITAB printout of the X control chart for individual

values in Table 5.4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
MINITAB printout of the CUSUM control chart for
individual values in Table 5.4. . . . . . . . . . . . . . . . . . . . . . . . . .
MINITAB printout of the two-sided CUSUM control
chart for the data in Table 5.5 using FIR. . . . . . . . . . . . . . . . .
MINITAB printout of the MA control chart for the data
in Table 5.4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
MINITAB printout of the EWMA control chart for the
data in Table 5.4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Flowchart of a process. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Approximate
sampling distribution of sample statistics
X with sample size five. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Components of total variation.. . . . . . . . . . . . . . . . . . . . . . . . .
The distinction between accurate and precise, where (a) is
accurate and precise, (b) is accurate but not precise, (c) is
not accurate but precise, and (d) is neither accurate nor
precise. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
The linear relationship between the actual and the
observed values. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Percent contribution of variance components for the data
in
Example 7.1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
X and R charts for the data in Example 7.1.. . . . . . . . . . . . . . .
Interaction between operators and parts for the data in
Example 7.1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Scatter plot for measurements versus operators. . . . . . . . . . . .
Scatter plot for measurements versus parts (bolts). . . . . . . . . .
Relationships among the SQC tools. . . . . . . . . . . . . . . . . . . . .
A barely capable process. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PRE-control zones. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A process with process capability equal to one.. . . . . . . . . . . .
An OC curve. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AOQ curve for N = , n = 50, c = 3. . . . . . . . . . . . . . . . . . . . .
Effect on an OC curve of changing sample size (n) when
acceptance number (c) is held constant. . . . . . . . . . . . . . . . . .
Effect of changing acceptance number (c) when sample
size (n) is held constant.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Effect of changing lot size (N) when acceptance number
(c) and sample size (n) are held constant. . . . . . . . . . . . . . . . .
93
95
99
100
105
105
109
111
111
113
120
125
128
148
149
151
152
159
160
161
161
162
165
167
168
170
176
180
181
181
183
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List of Figures
Figure 9.6
Figure 9.7
Figure 9.8
Figure 9.9
Figure 9.10
Figure 9.11
Figure 9.12
Figure 9.13
Figure 9.14
Figure 9.15
Figure 9.16
Figure 9.17
Figure 9.18
Figure 9.19
Figure 9.20
Figure 9.21
Figure 10.1
Figure 10.2
Figure 10.3
Figure 10.4
Figure 10.5
Figure 10.6
Figure 10.7
Figure 10.8
Figure 10.9
Figure 10.10
Figure 10.11
Figure 10.12
Figure 10.13
H1277 CH00_FM.indd xv
OC curves for sampling plans having the sample size equal

to 10 percent of the lot size. . . . . . . . . . . . . . . . . . . . . . . . . . . .
OC curve for double sampling plan where n1 = 75, c1 = 0,
r1 = 3, n2 = 75, c2 = 3, and r2 = 4. . . . . . . . . . . . . . . . . . . . . . .
AOQ curve for double sampling plan. . . . . . . . . . . . . . . . . . . .
ASN curve for double sampling plan. . . . . . . . . . . . . . . . . . . .
Switching rules for normal, tightened, and reduced
inspection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Structure and organization of ANSI/ASQ Z1.9-2003. . . . . . . .
Decision areas for a sequential sampling plan. . . . . . . . . . . . .
ANSI/ASQ Z1.4-2003 Table VIII: Limit numbers for
reduced inspection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
ANSI/ASQ Z1.4-2003 Table I: Sample size code letters. . . . .
ANSI/ASQ Z1.4-2003 Table II-A: Single sampling plans
for normal inspection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
ANSI/ASQ Z1.4-2003 Table III-A: Double sampling
plans for normal inspection. . . . . . . . . . . . . . . . . . . . . . . . . . .
ANSI/ASQ Z1.4-2003 Table IV-A: Multiple sampling
plans for normal inspection. . . . . . . . . . . . . . . . . . . . . . . . . . .
4.20 ANSI/ASQ Z1.9-2003 Table A-2: Sample size
code letters. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
ANSI/ASQ Z1.9-2003 Table C-1: Master table for normal
and tightened inspection for plans based on variability
unknown (single specification limitForm 1). . . . . . . . . . . . .
ANSI/ASQ Z1.9-2003 Table B-5: Table for estimating
the lot percent nonconforming using standard deviation
method. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
ANSI/ASQ Z1.9-2003 Table B-3: Master table for normal
and tightened inspection for plans based on variability
unknown (double specification limit and Form 2single
specification limit). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
The welcome screen in MINITAB. . . . . . . . . . . . . . . . . . . . . .
Showing the menu command options. . . . . . . . . . . . . . . . . . . .
MINITAB window showing the Xbar-R Chart dialog
box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
MINITAB window showing the Xbar-R Chart - Options
dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
MINITAB window showing the Individuals-Moving
Range Chart dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
MINITAB window showing the Xbar-S Chart dialog
box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
MINITAB windows showing the Xbar-S Chart and
Xbar-S Chart - Options dialog boxes. . . . . . . . . . . . . . . . . . .
MINITAB window showing the Capability Analysis
(Normal Distribution) dialog box. . . . . . . . . . . . . . . . . . . . . . .
MINITAB windows showing the process capability
analysis. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
MINITAB window showing the P Chart dialog box. . . . . . . .
MINITAB window showing the C Chart dialog box. . . . . . . .
MINITAB window showing the U Chart dialog box. . . . . . . .
MINITAB window showing the CUSUM Chart dialog
box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
xv
183
185
186
188
190
195
199
205
206
207
208
209
211
212
213
222
226
227
229
230
231
232
234
237
237
238
241
242
244
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List of Figures
Figure 10.14 MINITAB window showing the CUSUM Chart - Options

dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 10.15 MINITAB window showing the Moving Average Chart
dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 10.16 MINITAB window showing the EWMA Chart dialog
box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 10.17 Screen showing the selections Stat > Quality Tools >
Gage Study > Gage R&R Study (Crossed). . .. . . . . . . . . . . . .
Figure 10.18 Gage R&R Study (Crossed) dialog box. . . . . . . . . . . . . . . . . .
Figure 10.19 Gage R&R Study (Crossed) - Options dialog box. . . . . . . . . .
Figure 10.20 Percent contribution of variance components for the
data in Example 10.12. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 10.21 X and R charts for the data in Example 10.12.. . . . . . . . . . . . .
Figure 10.22 Interaction between operators and parts for the data in
Example 10.12. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 10.23 Scatter plot for measurements versus operators. . . . . . . . . . . .
Figure 10.24 Scatter plot for measurements versus parts (bolts). . . . . . . . . .
Figure 11.1 JMP Starter display. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.2 JMP drop-down menus. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.3 JMP file processing commands. . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.4 JMP statistical analysis commands. . . . . . . . . . . . . . . . . . . . . .
Figure 11.5 Creating a new data table. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.6 A new data table. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.7 Opening an existing JMP file. . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.8 Saving a newly created JMP file. . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.9 Saving an existing JMP file. . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.10 Printing JMP output. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.11 Generating an XBar and R chart. . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.12 XBar chart dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.13 Generating an XBar and S chart. . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.14 XBar chart dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.15 XBar and S chart dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.16 Generating a control chart for individual observations.. . . . . .
Figure 11.17 IR chart dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.18 Capability analysis based on an XBar and S chart
for Example 11.5. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.19 Process capability analysis dialog box. . . . . . . . . . . . . . . . . . .
Figure 11.20 Process capability analysis output. . . . . . . . . . . . . . . . . . . . . .
Figure 11.21 Generating a p chart. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.22 p chart dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.23 Generating a c chart. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.24 c chart dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.25 Generating a u chart. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.26 u chart dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.27 Generating a CUSUM chart. . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.28 CUSUM chart dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.29 Specify Stats dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.30 Generating a UWMA chart. . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.31 UWMA chart dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.32 Generating an EWMA chart. . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.33 EWMA chart dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.34 Initiating a Gage R&R. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11.35 Gage R&R dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
H1277 CH00_FM.indd xvi
245
246
248
252
252
253
257
258
258
259
259
262
262
263
264
264
265
266
266
267
267
268
269
271
271
273
274
275
277
278
279
280
280
282
283
284
285
287
287
288
289
290
291
292
295
295
3/8/07 6:12:28 PM
List of Figures
Figure 11.36
Figure 11.37
Figure 11.38
Figure 11.39
Figure 11.40
Figure 11.41
H1277 CH00_FM.indd xvii
Completed Gage R&R dialog box. . . . . . . . . . . . . . . . . . . . . .

Y, Response variability charts. . . . . . . . . . . . . . . . . . . . . . . . . .
Continuing the Gage R&R. . . . . . . . . . . . . . . . . . . . . . . . . . . .
Variance components. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Gage R&R dialog box. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Gage R&R output. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
xvii
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296
297
297
297
298
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List of Tables
Table 3.1
Table 3.2
Table 3.3
Table 3.4
Table 3.5
Table 3.6
Table 4.1
Table 4.2
Table 4.3
Table 4.4
Table 4.5
Table 4.6
Table 5.1
Table 5.2
Table 5.3
Table 5.4
Table 5.5
Table 5.6
Check sheet summarizing the data of a study over a period

of four weeks. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Frequencies and weighted frequencies when different types
of defects are not equally important. . . . . . . . . . . . . . . . . . . . .
Percentage of nonconforming units in different shifts over
a period of 30 shifts. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Diameter measurements (in mm) of ball bearings used in
the wheels of heavy construction equipment. . . . . . . . . . . . . .
Diameter measurements (in mm) of ball bearings used in
the wheels of heavy construction equipment. . . . . . . . . . . . . .
The finished inside diameter measurements (in cm) of
piston ring. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
The four control charts for attributes. . . . . . . . . . . . . . . . . . . .
Number of nonconforming computer chips out of 1000
inspected each day during the study period. . . . . . . . . . . . . . .
Number of nonconforming computer chips with different
size samples inspected each day during the study period. . . . .
Total number of nonconformities in samples of five rolls
of paper. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Number of nonconformities on printed boards for laptops
per sample, each sample consisting of five inspection
units.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Number of nonconformities on printed boards for laptops
per sample with varying sample size. . . . . . . . . . . . . . . . . . . .
Data from a manufacturing process of auto parts before
and after its mean experienced a shift of 1 (sample
size four). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Values of h for a given value of k when ARL0 = 370. . . . . . . .
Tabular CUSUM control chart for the data given in
Table 5.1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Data from a manufacturing process of auto parts before
and after its mean experienced a shift of 1 (sample
size one). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Tabular CUSUM control chart using FIR for data in
Table 5.4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Tabular CUSUM control chart using FIR for the process in
Table 5.4, after it had experienced an upward shift of 1. . . . .
44
46
50
63
70
78
85
88
91
95
98
99
103
107
108
110
113
114
xix
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xx
List of Tables
Table 5.7
Table 5.8
Table 5.9
Table 6.1
Table 6.2
Table 6.3
Table 6.4
Table 6.5
Table 7.1
Table 8.1
Table 10.1
Table 10.2
Table 11.1
Table 11.2
Table A.1
Table A.2
Table A.3
Table A.4
Table A.5
Table A.6
Table A.7
Table A.8
Table A.9
Table A.10
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MA chart (Mis) for data in Table 5.4 with = 20, = 2. . . . .

~ 500. . . . . . . . . . . .
A selection of EWMA charts with ARL0 =
EWMA control chart (zis) for data in Table 5.4 with
= 0.20, L = 2.962. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Different processes with the same value of Cpk. . . . . . . . . . . .
Parts per million of nonconforming units for different values
of Cpk. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
The values of Cpk and Cpm as deviates from the target. . . . .
Values of Cp, Cpk, Cpm, Cpmk, and Cpnst for
= 20, 22, 24, 26, 28; T = 24; LSL = 12; and
USL = 36 ( = 2).. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Values of Cp, Cpk, Cpm, Cpmk, and Cpnst for
= 2, 2.5, 3.0, 3.5, 4.0, 4.5; T = 24, LSL = 12, and
USL = 36 ( = 20). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Data on an experiment involving three operators, 10 bolts,
and three measurements (in millimeters) on each bolt by
each operator. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PRE-control rules. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Data of 25 samples, each of size five, from a given
process. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
and three measurements (in mm) on each bolt by each
operator. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Data of 25 samples, each of size five, from a given
process. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
and three measurements (in mm) on each bolt by each
operator. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Random numbers. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Factors helpful in constructing control charts for
variables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Values of K1 for computing repeatability using the range
method. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Values of K2 for computing reproducibility using the
range method. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Binomial probabilities. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Poisson probabilities. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Standard normal distribution. . . . . . . . . . . . . . . . . . . . . . . . . .
2
Critical values of with degrees of freedom. . . . . . . . . . . .
Critical values of t with degrees of freedom. . . . . . . . . . . . .
Critical values of F with numerator and denominator
degrees of freedom 1,2, respectively ( = 0.10). . . . . . . . . . .
119
123
124
135
136
137
143
144
154
169
236
251
276
294
300
302
303
304
304
309
313
314
316
318
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Preface
tatistical Quality Control for the Six Sigma Green Belt was written as
a desk reference and instructional aid for those individuals currently
involved with, or preparing for involvement with, Six Sigma project
teams. As Six Sigma team members, Green Belts help select, collect data for,
and assist with the interpretation of a variety of statistical or quantitative tools
within the context of the Six Sigma methodology.
Composed of steps or phases titled Define, Measure, Analyze, Improve,
and Control (DMAIC), the Six Sigma methodology calls for the use of many
more statistical tools than is reasonable to address in one book. Accordingly,
the intent of this book is to provide for Green Belts and Six Sigma team members a thorough discussion of the statistical quality control tools addressing
both the underlying statistical concepts and the application. More advanced
topics of a statistical or quantitative nature will be discussed in two additional
books that, together with the first book in this series, Applied Statistics for the
Six Sigma Green Belt, and this book, will comprise a four-book series.
While it is beyond the scope of this book and series to cover the DMAIC
methodology specifically, this book and series focus on concepts, applications, and interpretations of the statistical tools used during, and as part of,
the DMAIC methodology. Of particular interest in the books in this series is
an applied approach to the topics covered while providing a detailed discussion of the underlying concepts.
In fact, one very controversial aspect of Six Sigma training is that, in
many cases, this training is targeted at the Six Sigma Black Belt and is all
too commonly delivered to large groups of people with the assumption that
all trainees have a fluent command of the statistically based tools and techniques. In practice this commonly leads to a good deal of concern and discomfort on behalf of trainees, as it quickly becomes difficult to keep up with
and successfully complete Black Beltlevel training without the benefit of
truly understanding these tools and techniques.
So let us take a look together at Statistical Quality Control for the Six
Sigma Green Belt. What you will learn is that these statistically based tools
and techniques arent mysterious, they arent scary, and they arent overly
difficult to understand. As in learning any topic, once you learn the basics, it
is easy to build on that knowledgetrying to start without a knowledge of the
basics, however, is generally the beginning of a difficult situation.
xxi
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Acknowledgments
e would like to thank Professors John Brunette, Cheng Peng, Merle

Guay, and Peggy Moore of the University of Southern Maine for
reading the final draft line by line. Their comments and suggestions have proven to be invaluable. We also thank Laurie McDermott, administrative associate of the Department of Mathematics and Statistics of the
University of Southern Maine, for help in typing the various drafts of the
manuscript. In addition, we are grateful to the several anonymous reviewers,
whose constructive suggestions greatly improved the presentations, and to
our students, whose input was invaluable. We also want to thank Matt Meinholz and Paul OMara of ASQ Quality Press for their patience and cooperation throughout the preparation of this project.
We acknowledge MINITAB for permitting us to reprint screen shots in
this book. MINITAB and the MINITAB logo are registered trademarks of
MINITAB. We also thank the SAS Institute for permitting us to reprint screen
shots of JMP v. 6.0 ( 2006 SAS Institute). SAS, JMP, and all other SAS
Institute product or service names are registered trademarks or trademarks
of the SAS Institute in the United States and other countries. We would like
to thank IBM for granting us permission to reproduce excerpts from Quality
Institute manual entitled, Process Control, Capability and Improvement (
1984 IBM Corporation and the IBM Quality Institute).
The authors would also like to thank their families. Bhisham is indebted
to his wife, Swarn; his daughters, Anita and Anjali; his son, Shiva; his sonsin-law, Prajay and Mark; and his granddaughter, Priya, for their deep love
and devotion. Fred would like to acknowledge the patience and support provided by his wife, Julie, and sons, Carl and George, as he worked on this
book. Without the encouragement of both their families, such projects would
not be possible or meaningful.
Bhisham C. Gupta
H. Fred Walker
xxiii
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1
Introduction to Statistical
Quality Control
tatistical quality control (SQC) refers to a set of interrelated tools used

to monitor and improve process performance.
Definition 1.1 A process, for the purposes of this book, is a set of

tasks or activities that change the form, fit, or function of one or more
input(s) by adding value as is required or requested by a customer.
Defined in this manner, a process is associated with production and service delivery operations. Because Six Sigma applies to both production and
service delivery/transactional operations, understanding and mastering the
topics related to SQC is important to the Six Sigma Green Belt.
In this book, SQC tools are introduced and discussed from the perspective of application rather than theoretical development. From this perspective,
you can consider the SQC tools as statistical alarm bells that send signals
when there are one or more problems with a particular process. As you learn
more about the application of SQC tools, it will be helpful to understand that
these tools have general guidelines and rules of thumb for both design and
interpretation; however, these tools are intended to be tailored to each company for use in a specific application. This means that when preparing to use
SQC tools, choices must be made that impact how certain parameters within
the tools are calculated, as well as how individual stakeholders involved with
these tools actually interpret statistical data and results. Accordingly, choices
related to the types of tools used, sample size and frequency, rules of interpretation, and acceptable levels of risk have a substantial impact on what comes
out of these tools as far as usable information.
Critical to your understanding of SQC as a Six Sigma Green Belt is that
SQC and statistical process control (SPC) are different. As noted earlier, SQC
refers to a set of interrelated tools. SPC is but one of the tools that make up
SQC. Many quality professionals continue to use the term SPC incorrectly
by implying that SPC is used for process monitoring as a stand-alone tool.
Prior to using SPC, we need to ensure that our process is set up correctly and,
as much as possible, is in a state of statistical control. Likewise, once the
process is in a state of statistical control, we need valid SPC data to facilitate
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Chapter One
our understanding of process capability and to enable the use of acceptance

sampling.
1.1 Identifying the Tools of SQC

Figure 1.1 identifies the five basic tool types that make up SQC.
As can be seen in Figure 1.1, SQC consists of SPC (phase I and II), capability analysis (process and measurement systems), PRE-control, acceptance
sampling (variables and attributes), and design of experiments (DOE). Within
these five basic tool types are specific tools designed to provide information
useful in a specific context or application. The remainder of this book will
focus on the first four SQC tools, identified in Figure 1.1. DOE, as identified
in Figure 1.1, is a component of SQC. However, DOE is also treated as a set
of tools outside the context of SQC, and for this reason we will address DOE
in the next two books in this series.
1.2 Relating SQC to Applied Statistics and to DOE

There is a distinct relationship among applied statistics, SQC, and DOE, as
is seen in Figure 1.2.
Figure 1.2 shows that each of the SQC tools, as well as DOE, is based
on applied statistics. The first book in this four-book series, Applied Statistics for the Six Sigma Green Belt, provides the foundational skills needed to
learn the content presented here. Note that in Figure 1.2, with the possible
exception of PRE-control, the level of statistical complexity increases with
the use of the SQC tools moving from left to right. The level of statistical
complexity is the greatest in DOE, and, in fact, there is an increasing level of
statistical complexity within DOE, as you will see in the next two books in
this series: Introductory Design of Experiments for the Six Sigma Green Belt
and Advanced Design of Experiments for the Six Sigma Green Belt.
In understanding the relationship among applied statistics, SQC, and
DOE, you should note the order in which they are presentedapplied statistics, SQC, and then DOE. These topics are presented in this order in this
SPC
Capability
analysis
Process
Phase I
Large shifts
Figure 1.1
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PREcontrol
Measurement
systems
Acceptance
sampling
Variables
DOE
Attributes
Phase II
Small shifts
The five tool types of SQC.
3/8/07 12:33:05 PM
Introduction to Statistical Quality Control 3
SPC
Capability
analysis
Process
Phase I
Large shifts
PREcontrol
Measurement
systems
Acceptance
sampling
Variables
DOE
Attributes
Phase II
Small shifts
Applied statistics
Figure 1.2
Relationship among applied statistics, SQC, and DOE.
book, and in most statistical and engineering texts and literature, to reflect
the increasing level of computational difficulty. You should also know that
in practice these tools would be used in a different order, which is applied
statistics, DOE, and then SQC. There are three reasons, all quite logical, for
changing the order of presentation: (1) moving from applied statistics to DOE
is generally considered to be too rapid an increase in computational complexity for many people to easily grasp, (2) moving from applied statistics to
DOE removes the opportunity for development of process knowledge, which
provides the context for a study of experimental factors that come from product and process designs, and (3) it is generally necessary for us to determine
which process parameters need to be monitored with DOE prior to using the
process monitoring tools of SQC.
Figure 1.1 and Figure 1.2, then, represent maps of the topics addressed
in SQC and provide the order of presentation of those topics in this book as
well as in the greater statistical and engineering communities. Figure 1.3
represents an order in which those topics would be applied in process or
transactional Six Sigma, assuming all the tools were to be applied.
The intent of Figure 1.3 is to illustrate that Six Sigma Green Belts would,
where applicable, begin with DOE followed by the SQC tools. Further, Figure 1.3 illustrates that there is a cycle of iteration wherein DOE leads us to
identify appropriate process parameters to monitor. We then use SQC tools
to monitor those parameters, which may lead us to continue with additional
experimentation and process monitoring as we refine our processes to better
meet customer expectations.
Figure 1.3 also shows that once we identify with DOE the characteristics
to monitor in our process, we then use SPC and capability analysis simultaneously to ensure that our process is in a state of statistical control and that our
process variability and mean are consistent with our specifications. Another
important point shown in Figure 1.3 is that we may or may not use a tool
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Chapter One
DOE
Capability
analysis
SPC
Acceptance
sampling
PRE-control
Applied statistics
Figure 1.3
Order of SQC topics in process or transactional Six Sigma.
type called PRE-control. The very name PRE-control counterintuitively and

incorrectly implies its use prior to SPC. If used at all, PRE-control is used
after SPC, wherein processes are properly centered on target, are in a state of
statistical control, are determined to be capable, and exhibit very low defect
rates. Use of PRE-control as a means of reduced sampling and inspection
continues to be controversial, and it is applicable only in a very small set
of circumstances, as will be discussed more fully in Chapter 8. Whether or
not PRE-control is used, the next tool type used, as identified in Figure 1.3,
is acceptance sampling. What all these tools have in common is a statistical
basis for analysis and decision making.
1.3 Understanding the Role of Statistics in SQC

As noted in section 1.2, the first book in this series focusing on the Six Sigma
Green Belt is Applied Statistics for the Six Sigma Green Belt. Developing a
working knowledge of basic statistics and how they apply to production and
service delivery operations was an important step in enabling us to discuss
SQC. Each SQC tool is based on statistical theory and application. The value
and amount of information you are able to obtain from SQC tools are directly
related to your level of understanding of basic statistical concepts. Because
SQC is based on the application of statistics, much of what you read in this
book assumes you have mastery of the prerequisite knowledge.
In practice, two groups of people use SQC tools:
1. Shop-floor operators and service delivery/transaction-focused
people
2. Technicians, engineers, Six Sigma team members, and
management team members
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Each group using SQC tools has different roles and responsibilities relative to the use and implementation of the tools. For example, people in group
1 are commonly expected to collect data for, generate, and react to SQC
tools. People in group 2 are commonly expected to design and implement
SQC tools. They are also expected to critically analyze data from these tools
and make decisions based on information gained from them.
1.4 Making Decisions Based on Quantitative Data

In practice, we are asked to make decisions based on quantitative and qualitative data on a regular basis.
Definition 1.2 Quantitative data are numerical data obtained from
direct measurement or tally/count. Direct measurement uses a scale
for measurement and reference, and tally/count uses direct observation as a basis for summarizing occurrences of some phenomenon.
Definition 1.3 Qualitative data are nonnumerical data obtained
from direct observation, survey, personal experience, beliefs, perceptions, and perhaps historical records.
It is important to acknowledge that application of both quantitative and
qualitative data has value and can be entirely appropriate in a professional
work environment depending on the types of decisions we need to make.
It is also important to acknowledge the difficulty in defending the use of
qualitative data to make decisions in the design and process improvement
efforts most commonly encountered by the Six Sigma Green Belt. Key, then,
to obtaining the maximum value of information from SQC tools is realizing
the power of quantitative data, because what can be directly measured can be
validated and verified.
1.5 Practical versus Theoretical

or Statistical Significance
As a Six Sigma Green Belt you will use applied statistics to make decisions.
We emphasize the words applied statistics to note that applied statistics will
be the basis for business decisions. When making decisions, we simply must
temper our ability to detect statistical differences with our ability to act on
designs and processes in a cost-effective manner. Figure 1.4 helps us visualize what we are trying to accomplish in detecting statistical differences.
In Figure 1.4 we see a normal distribution with a level of test significance
() defined by the shaded regions in the tails of the distribution. The identifies the region of the distribution wherein we would not expect to see evidence
of process behavior if the process is behaving as intended. As a Six Sigma
Green Belt you have the ability to set the level of , which means you are actually making choices about the amount of area for the shaded regionthe higher
the level of selected, the bigger the shaded region, the more discriminating the
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Chapter One
A
Figure 1.4
A
Detecting statistical differences.
test, and the more expensive it will be to make process improvement changes.
While making any decisions related to has financial implications, to understand practical differences we need to look at Figure 1.5.
In Figure 1.5 our comparison point changes from the shaded regions
under the distribution tails of Figure 1.4 to the center of the distribution.
Practical decisions then require that we consider how far off the intended
target the observed process behavior is as compared with the statistical difference identified in Figure 1.4. It should be noted that differentiating between a
practical and a statistical difference is a business or financial decision. When
making a practical versus a statistical decision, we may very well be able to
detect a statistical difference; however, it may not be cost effective or financially worth making the process improvements being considered.
Statistically not different
Statistically different
A
Statistically different
A
A
Practical difference
Observed
Figure 1.5
H1277 ch01.indd 6
Practical difference
Target
Observed
Detecting practical and statistical differences.
3/8/07 12:33:06 PM
1.6 Why We Cannot Measure Everything

Whether in process-oriented industries such as manufacturing or in
transactional-oriented industries, the volume of operations is sufficiently
large to prohibit measurement of all the important characteristics in all units
of production or all transactions. And even if we could measure some selected
quality characteristic in all units of production or in all transactions, it is well
known that we simply would not identify every discrepancy or mistake. So
managing a balance between the volume of measurement and the probability
of making errors during the measurement process requires us to rely on the
power of statistics.
The power of statistics, in this case, refers to conclusions drawn from
samples of data about a larger population, as shown in Figure 1.6.
Because we cannot afford the time or cost of measuring 100 percent of
our products or transactions, sampling, along with appropriate descriptive or
inferential statistics, is used to help us understand our processes. The important point contained in Figure 1.6 is that samples, by definition, are subsets of
data drawn from a larger population. Because samples do not contain all the
data from a population, there is a risk that we will draw incorrect conclusions
about the larger population.
1.7 A Word on the Risks Associated

with Making Bad Decisions
When relying on inferential or descriptive statistics based on samples of data,
we risk making bad decisions. Bad decisions in practice lead to difficulties
and problems for producers as well as consumers, and we refer to this as producer risk and consumer risk. The same bad decisions in statistical terms are
referred to as Type I and Type II error, as well as alpha () and beta ( ) risk,
respectively. It is important for Six Sigma Green Belts to realize that these
Population
Sample
Figure 1.6
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Sample versus population.
3/8/07 12:33:06 PM
Chapter One
risks exist and that people from different functional areas within an organization may use different terms to describe the same thing. Lastly, we must
realize that choices made during the design of SQC tools, choices related to
selection of consumer and producer risk levels, quite dramatically impact
performance of the tools and the subsequent information they produce for
decision making.
It is not enough to simply identify the risks associated with making
bad decisions; the Six Sigma Green Belt must also know the following key
points:
Sooner or later, a bad decision will be made
The risks associated with making bad decisions are quantified in
probabilistic terms
and risks added together do not equal one
Even though and go in opposite directions (that is, if increases,
decreases), there is no direct relationship between and
The values of and can be kept as low as we want by increasing
the sample size
Definition 1.4 Probability is the chance that an event or outcome
will or will not occur. Probability is quantified as a number between
zero and one where the chance that an event or outcome will not
occur in perfect certainty is zero and the chance that it will occur
with perfect certainty is one. The chance that an event or outcome
will not occur added to the chance that it will occur add up to one.
Definition 1.5 Producer risk is the risk of failing to pass a product or service delivery transaction on to a customer when, in fact,
the product or service delivery transaction meets the customer quality expectations. The probability of making a producer risk error is
quantified in terms of .
Definition 1.6 Consumer risk is the risk of passing a product or
service delivery transaction on to a customer under the assumption that the product or service delivery transaction meets customer
quality expectations when, in fact, the product or service delivery is
defective or unsatisfactory. The probability of making a consumer
risk error is quantified in terms of .
A critically important point, and a point that many people struggle to understand, is the difference between the probability that an event will or will not
occur and the probabilities associated with consumer and producer risk
they simply are not the same thing. As noted earlier, probability is the percent
chance that an event will or will not occur, wherein the percent chances of
an event occurring or not occurring add up to one. The probability associated
with making an error for the consumer, quantified as , is a value ranging
H1277 ch01.indd 8
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between zero and one. The probability associated with making an error for
the producer, quantified as , is also a value between zero and one. The key
here is that and do not add up to one. In practice, one sets an acceptable
level of and then applies some form of test procedure (some application of an
SQC tool in this case) so that the probability of committing a error is acceptably small. So defining a level of does not automatically set the level of .
In closing, the chapters that follow discuss the collection of data and the
design, application, and interpretation of each of the various SQC tools. You
should have the following two goals while learning about SQC: (1) to master
these tools at a conceptual level, and (2) to keep in perspective that the use of
these tools requires tailoring them to your specific application while balancing practical and statistical differences.
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H1277 ch01.indd 10
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2
Elements of a
Sample Survey
he science of sampling is as old as our civilization. When trying new

cuisine, for example, we take only a small bite to decide whether the
taste is to our likingan idea that goes back to when civilization
began. However, modern advances in sampling techniques have taken place
only in the twentieth century. Now, sampling is a matter of routine, and the
effects of the outcomes can be felt in our daily lives. Most of the decisions
regarding government policies, marketing (including trade), and manufacturing are based on the outcomes of various samplings conducted in different
fields. The particular type of sampling used for a given situation depends on
factors such as the composition of the population and the objectives of the
sampling as well as time and budget availability. Because sampling is an
integral part of SQC, this chapter focuses on the various types of sampling,
estimation problems, and sources of error.
2.1 Basic Concepts of Sampling

The primary objective of sampling is to make inferences about population
parameters (population mean, population total, population proportion, and
population variance) using information contained in a sample taken from
the population. To make such inferences, which are usually in the form of
estimates of parameters and which are otherwise unknown, we collect data
from the population under investigation. The aggregate of these data constitutes a sample. Each data point in the sample provides us information about
the population parameter. Collecting each data point costs time and money,
so it is important that some balance is kept while taking a sample. Too small
a sample may not provide enough information to obtain proper estimates,
and too large a sample may result in a waste of resources. This is why it is
very important to remember that in any sampling procedure an appropriate
sampling schemenormally known as the sample designis put in place.
The sample size is usually determined by the degree of precision desired
in the estimates and the budgetary restrictions. If is the population parameter of interest, is an estimator of , and E is the desired margin of error of
estimation (absolute value of the difference between and ), then the sample
11
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12
Chapter Two
size is usually determined by specifying the value of E and the probability

with which we will indeed achieve that value of E.
In this chapter we will briefly study four different sample designs: simple
random sampling, stratified random sampling, systematic random sampling, and
cluster random sampling from a finite population. But before we study these sample designs, some common terms used in sampling theory must be introduced.
Definition 2.1 A population is a collection of all conceivable individuals, elements, numbers, or entities that possess a characteristic
of interest.
For example, if we are interested in the ability of employees with a specific job title or classification to perform specific job functions, the population
may be defined as all employees with a specific job title working at the company of interest across all sites of the company. If, however, we are interested
in the ability of employees with a specific job title or classification to perform
specific job functions at a particular location, the population may be defined
as all employees with the specific job title working only at the selected site or
location. Populations, therefore, are shaped by the point or level of interest.
Populations can be finite or infinite. A population where all the elements
are easily identifiable is considered finite, and a population where all the elements are not easily identifiable is considered infinite. For example, a batch
or lot of production is normally considered a finite population, whereas all
the production that may be produced from a certain manufacturing line would
normally be considered infinite.
It is important to note that in statistical applications, the term infinite is
used in the relative sense. For instance, if we are interested in studying the
products produced or the service delivery iterations occurring over a given
period of time, the population may be considered as finite or infinite, depending on ones frame of reference. It is important to note that the frame of reference (finite or infinite) directly impacts the selection of formulae used to
calculate some statistics of interest.
In most statistical applications, studying each and every element of a
population is not only time consuming and expensive but also potentially
impossible. For example, if we want to study the average lifespan of a particular kind of electric bulb manufactured by a company, we cannot study the
whole population without testing each and every bulb. Simply put, in almost
all studies we end up studying only a small portion, called a sample, of the
population.
Definition 2.2 A portion of a population selected for study is called
a sample.
Definition 2.3 The target population is the population about which
we want to make inferences based on the information contained in
a sample.
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Elements of a Sample Survey 13
Definition 2.4 The population from which a sample is selected is

called a sampled population.
Normally, the sampled population and the target population coincide
with each other because every effort is made to ensure that the sampled population is the same as the target population. However, situations arise when
the sampled population does not cover the whole target population. In such
cases, conclusions made about the sampled population are usually not applicable for the target population.
Before taking a sample, it is important that the target population be
divided into nonoverlapping units, usually known as sampling units. Note
that the sampling units in a given population may not always be the same. In
fact, sampling units are determined by the sample design chosen. For example, in sampling voters in a metropolitan area, the sampling units might be an
individual voter, the voters in a family, or all voters in a city block. Similarly,
in sampling parts from a manufacturing plant, sampling units might be each
individual part or a box containing several parts.
Definition 2.5
frame.
A list of all sampling units is called the sampling
Before selecting a sample, one must decide the method of measurement.

Commonly used methods in survey sampling are personal interviews, telephone
interviews, physical measurements, direct observations, and mailed questionnaires. No matter what method of measurement is used, it is very important
that the person taking the sample know what measurements are to be taken.
Individuals who collect samples are usually called fieldworkers. This is
true regardless of their locationwhether they are collecting the samples in a
house, in a manufacturing plant, or in a city or town. All fieldworkers should
be well acquainted with what measurements to take and how to take them.
Good training of all fieldworkers is an important aspect of any sampling procedure. The accuracy of the measurements, which affects the final results,
depends on how well the fieldworkers are trained.
It is quite common to select a small sample and examine it very carefully. This practice in sample surveying is usually called a pretest. The pretest allows us to make any necessary improvements in the questionnaire or
method of measurement and to eliminate any difficulties in taking the measurements. It also allows a review of the quality of the measurements, or in
the case of questionnaires, the quality of the returns.
Once the data are collected, the next step is to determine how to organize,
summarize, and analyze them. This goal can easily be achieved by using
methods of descriptive statistics discussed in Chapters 3 and 4 of Applied
Statistics for the Six Sigma Green Belt, the first book of this series.
Brief descriptions of various sample designsimple random sampling,
stratified random sampling, systematic random sampling, and cluster random
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14
Chapter Two
samplingare given in the following text. Later in this chapter we will see
some results pertaining to these sample designs.
Sampling Designs
The most commonly used sample design is simple random sampling. This
design consists of selecting n (sample size) sampling units in such a way that
each unit has the same chance of being selected. If the population is finite of
size N, however, then the simple random sampling design may be defined as
selecting n (sample size) sampling units in such a way that each sample of

size n, out of N possible samples, has the same chance of being selected.

n
Example 2.1 Suppose a Six Sigma Green Belt wants to take a sample of
some machine parts manufactured during a shift at a given plant. Because
the parts from which the Six Sigma Green Belt wants to take the sample
are manufactured during the same shift at the same plant, it is quite safe
to assume that all parts are similar. Therefore, a simple random sampling
design is the most appropriate.
The second sampling design is stratified random sampling, which at the
same cost as simple random sampling may give improved results. However,
the stratified random sampling design is most appropriate when a population
can be divided into various nonoverlapping groups, called strata, such that
the sampling units in each stratum are similar but may vary stratum to stratum. Each stratum is treated as a population by itself, and a simple random
sample is taken from each of these subpopulations or strata.
In the manufacturing world, this type of situation can arise often. For
instance, in Example 2.1, if the sample is taken from a population of parts
that were manufactured either in different plants or in different shifts, then
stratified random sampling would be more appropriate than simple random
sampling across all the shifts or plants. In addition, there is the advantage of
administrative convenience. For example, if the machine parts in the example are manufactured in plants located in different parts of the country, then
stratified random sampling would be beneficial. Each plant may have a quality department, which can conduct the sampling within each plant. To obtain
better results in this case, the quality departments in all the plants should
communicate with each other before sampling to ensure that the same sampling norms will be followed. Another example of stratified random sampling
in manufacturing is when samples are taken of products manufactured in
different batches. In this case, products manufactured in different batches
constitute different strata.
A third kind of sampling design is systematic random sampling. This
procedure is the easiest one, and it is particularly useful in manufacturing
processes where the sampling is done on line. Under this scheme, the first
item is randomly selected, and thereafter every mth item manufactured is
selected until we have a sample of desired size. Systematic random sampling
is not only easy to select, but under certain conditions it is also more precise
than simple random sampling.
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The fourth and last sampling design we will consider here is cluster random sampling. In cluster random sampling, each sampling unit is a group
or cluster of smaller units. In the manufacturing environment, this sampling
scheme is particularly useful because it is not very easy to prepare a list of
each part that constitutes a frame. On the other hand, it may be much easier to
prepare a list of boxes, where each box contains many parts. Hence, a cluster
random sample is merely a simple random sample of these boxes. Another
advantage of cluster random sampling is that by selecting a simple random
sample of only a few clusters, we can, in fact, have quite a large sample of
smaller units, which clearly has been achieved at a minimum cost.
As mentioned earlier, the primary objective of sampling is to make inferences about population parameters using information contained in a sample
taken from such a population. In the rest of this chapter, certain results pertaining to each sample design discussed earlier will be presented. However,
some basic definitions, which will be useful in studying the estimation problems, will first be given.
Definition 2.6 The value assigned to a population parameter based
on the information contained in a sample is called a point estimate or
simply an estimate of the population parameter. The sample statistic
used to calculate such an estimate is called an estimator.
Definition 2.7 An interval formed by a pair of values obtained by
using the information contained in a sample such that the interval
contains the true value of an unknown population parameter with
certain probability is called a confidence interval. The probability
with which it contains the true value of the unknown parameter is
called the confidence coefficient.
Definition 2.8 The difference between an estimate and the true
value of the estimated parameter is called the error of estimation.
The maximum value of the error of estimation with a given probability is called the margin of error.
2.2 Simple Random Sampling

Simple random sampling is the most basic form of sampling design. A simple
random sample can be drawn from an infinite or finite population. There are
two techniques for taking a simple random sample from a finite population:
sampling with replacement and sampling without replacement. Simple random sampling with replacement from a finite population and simple random
sampling from an infinite population have the same statistical properties.
Definition 2.9 When sampling without replacement from a finite
population, a random sample is called a simple random sample if

each sample of size n, out of N possible samples, has the same

chance of being selected.
n
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16
Chapter Two
Definition 2.10 When sampling from an infinite population or

sampling with replacement from a finite population, a random sample is called a simple random sample if each sampling unit has the
same chance of being included in the sample.
A simple random sample can be taken by using tables of random numbers, which consist of digits 0, 1, 2, . . . , 9 such that each digit has the same
chance of being selected. A table of random numbers, Table A.1, is given
in the appendix. The first step in selecting a simple random sample using
a table of random numbers is to label all the sampling units 0 to (N 1). If
N is a four-digit number, for example, the labels will look like 0000, 0001,
. . . , 9999. (Note that Table A.1 can be used for selecting a random sample
from a population up to one million subjects.) Once all the sampling units are
labeled, the second step is to select the same number of digits (columns) from
the table of random numbers that matches the number of digits in N. Third,
one must read down n ( N) numbers from the selected columns, starting
from any arbitrary point and ignoring any repeated numbers. Note that if the
sampling is done with replacement, we do not ignore the repeated numbers.
The fourth and last step for taking a simple random sample of size n is to
select the n sampling units with labels matching these numbers.
This method of selecting simple random samples is not as easy as it
appears. In manufacturing, it may not even be possible to label all the parts.
For example, suppose we want to select a simple random sample of 50 ball
bearings from a big lot or a container full of such ball bearings. Now the
question is whether it is economical or even possible to label all these ball
bearings every time we want to select a sample. The answer is no. The method
described earlier is more to develop statistical theory. In practice, to select
simple random samples, we use some convenient methods so that no particular sampling unit is given any preferential treatment. For instance, to select a
simple random sample of 50 units from a container, we first mix all the ball
bearings and then select 50 of them from several spots in the container. This
sampling technique is sometimes called convenience sampling.
Let y1, y2, . . . , yN be the sampling units of a population under consideration,
and let y1, y2, . . . , yn be a simple random sample from this population. Define
the population parameters as follows:
= population mean
2 = population variance
T = population total
N = population size
and the sample statistics
y = sample mean
s2 = sample variance
n = sample size
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For a simple random sample, the sample mean y and the sample variance s2
are defined as
n
yi
y1 + y2 + ... + yn
y=
= i ,
n
n
(2.1)
1 n
1
2
2
s =
(
y
y
)
n 1 yi
n 1 i i
1
2
( y )
i
(2.2)
respectively. For estimating the population mean we use the sample mean
defined in equation (2.1), that is,
(2.3)
= y.
In simple random sampling, the sample mean y is an unbiased estimator of

the population mean , that is,
E ( y ) = .
(2.4)
In order to assess the accuracy of the estimator of , it is important to find the

variance of y , which will allow us to find the margin of error.
The variance of y for a simple random sampling without replacement is
given by
V (y) =
n
2 N n 2
1 .
n N 1 n N
(2.5)
In practice we usually do not know the population variance 2; therefore, it

becomes necessary to find an estimator of V(y ), which is given by
2
s
V ( y ) =
n
n
1 N .
(2.6)
For a simple random sample taken from either an infinite population or a

finite population sampled with replacement, the variance V(y) becomes
V (y) =
2
,
n
(2.7)
and its estimator is given by

2
s
V ( y ) = .
n
(2.8)
If either the population is normal or the sample size is large (n 30), then
the margin of error for the estimation of the population mean with probability
(1 ) is given by
z / 2 V ( y ).
(2.9)
If the population variance 2 is unknown, then in equation (2.9) we replace

).
V(y) by its estimator V(y
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18
Chapter Two
Example 2.2 Suppose we are interested in estimating the mean yield point
of steel castings produced by a large manufacturer. The following data give
the yield point in units of 1000 pounds per square inch (psi) of a simple random sample of size 10.
83.37 86.21 83.44 86.29 82.80 85.29 84.86 84.20 86.04 89.60
Solution: The sample mean for the data given in this example is
y=
=
1
83.37 + 86.21 + 83.44 + 86.29 + 82.80 + 85.29 + 84.86 + 84.20 + 86.04 + 89.60
10
1
(852.1) = 85.21.
10
The sample variance for these data is

s2 =
1
(83.37 + 86.21 + ... + 89.60)2
2
2
2
83
37
+
86
21
+
+
89
60
.
.
...
.
10
(10 1)
1
= (35.595) = 3.955.
9
Thus, an estimate for the population mean is
= 85.21.
Because the population under investigation consists of all steel castings

produced by the large manufacturer, it can be considered infinite. Thus, the
margin of error for estimating the population mean with, say, 95 percent
probability, using equations (2.8) and (2.9), is given by
z0.025
1.989
= 1.96
= 1.233.
10
n
An unbiased estimator of the finite population total T is given by

T = Ny .
(2.10)
The variance of estimator T is given by

N 2V ( y ).
(2.11)
The standard error of T is given by

N V ( y ).
(2.12)
If the population variance 2 is unknown, then in equations (2.11) and (2.12)

) by its estimator V(y
). Assuming the sample size is large (n
we replace V(y
30), it can be shown that the margin of error for the estimation of the population
total with probability (1 ) is
N (margin of error for estimating mean) = N z / 2 V ( y ). (2.13)
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Example 2.3 A manufacturing company has developed a new device for

the army. The company got a defense contract to supply 25,000 devices to the
army. In order to meet the contractual obligations, the department of human
resources wants to estimate the number of workers the company will need to
hire. This can be accomplished by estimating the number of workforce hours
needed to manufacture 25,000 devices. The following data show the number
of hours spent by randomly selected workers to manufacture 15 devices.
8.90 8.25 6.50 7.25 8.00 7.80 9.90 8.30
9.30 6.95 8.25 7.30 8.55 7.55 7.70
Estimate the total workforce hours needed to manufacture 25,000 devices
and determine the margin of error with 95 percent probability.
Solution: In this example, we first estimate the mean workforce hours
needed to manufacture one device and then determine the margin of error
with 95 percent probability.
The sample mean for the data given in this example is
1
(8.90 + 8.25 + 6.50 + ... + 8.55 + 7.55 + 7.70)
15
1
= (120.50) = 8.033.
15
y=
The sample variance for these data is

1
(8.90 + 8.25 + .... + 7.70)2
2
2
2
s=
+
+
+
.
.
...
.
8
90
8
25
7
70
(15 1)
15
1/ 2
= 0.900.
Thus, an estimate for the population mean is

= 8.033.
Using equation (2.9) we can see that the margin of error for estimating the
population mean with 95 percent probability is
z0.025
s
0.900
= 1.96
= 0.455.
15
n
Now suppose that T is the total workforce hours needed to manufacture

25,000 devices. Using equations (2.10) and (2.13), the estimate for T is
T = N y = 25, 000 8.033 = 200,825,
and the margin of error for estimating the total workforce hours is
25,000 0.455 = 11,375.
Note: If the population is normal with standard deviation unknown and
the sample size small (n < 30), then in the earlier results, z is replaced by t,
where the value of t is found in Students t-table (Table A.9 in the appendix)
with (n 1) degrees of freedom.
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20
Chapter Two
2.2.2 Confidence Interval for a Population

Mean and Population Total
Once we have found estimates for the population mean, the population total,
and the corresponding margins of error with probability (1 ), finding a
confidence interval with confidence coefficient (1 ) for the population
mean and population total is very simple.
A confidence interval with confidence coefficient (1 ) for the population mean is
p margin of error for estimating y
y
or
p z / 2 V ( y ).
y
(2.14)
And a confidence interval with confidence coefficient (1 ) for the population total is
T p margin of error for estimating T
or
T p N s z / 2 V ( y ).
(2.15)
Example 2.4 Reconsider the problem in Example 2.3 and find a 95 percent
confidence interval for the population mean and the population total T.
Solution: Using the results of Example 2.3 and equations (2.14) and (2.15),
we get the following:
A 95 percent confidence for population mean is
p margin of error for estimating y 8.033 p 0.455 (7.578, 8.488),
y
and a 95 percent confidence interval for the population total T is
T p margin of error for estimating T 200, 8255 p 11, 375 (189, 459, 212, 200).
2.2.3 Determination of Sample Size
The sample size needed to estimate the population mean with margin of error
E with probability (1 ) is given by
n=
z 2 / 2 N 2
( N 1) E 2 + 2 z 2 / 2
(2.16)
In practice, the population variance 2 is usually unknown. Thus, to find the

sample size n we need to find an estimate s2 of the population variance 2. This
can be achieved by using the data from a pilot study or previous surveys. In
this case, the sample size needed to estimate the population mean with margin
of error E with probability (1 ) is given by
n=
H1277 ch02.indd 20
z 2 / 2 Ns 2
( N 1) E 2 + s 2 z 2 / 2
(2.17)
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If the population size N is large, then the factor (N 1) in equation (2.17) is

usually replaced by N.
Note: The sample size needed to estimate the population total with margin of error E with probability (1 ) can be found by using equation (2.16)
or (2.17) depending on whether the population variance 2 is known and
replacing E with (E/N).
Example 2.5 Suppose in Example 2.3 we would like the margin of error for
estimating the population mean to be 0.25 with probability 0.99. Determine
the appropriate sample size to achieve this goal.
Solution: From the information provided to us, we have
E = 0.25, z / 2 = 2.575,
and from Example 2.3, we have
N = 25,000 and s = 0.900.
Plugging these values into equation (2.17) and replacing the factor (N 1) in
the denominator by N, we get
n=
(2.575)2 (25, 000) (0.900)2

25, 000(0.25)2 + (0.900)2 (2.575)2
86.
Note that the sample size for estimating the population total with margin
of error 6250 (= 25,000 0.25) is again equal to 86. To attain a sample of
size 86, we take another simple random sample of size 71, which is usually
known as a supplemental sample, and then combine this sample with the one
that we had already taken, which was of size 15.
2.3 Stratified Random Sampling

It is not uncommon in a manufacturing process for a characteristic of interest to vary from country to country, region to region, plant to plant, or
machine to machine. For example, a Six Sigma Green Belt might be interested in finding the longevity of parts manufactured in different regions of
the United States. Clearly, the longevity of such parts may vary from region
to region depending on where the parts are manufactured. This could be
due to differences in raw materials, training of the workers, or differences
in machines. In such cases where the population is heterogeneous, we get
more precise estimates by using a sample design known as stratified random sampling. In stratified random sampling, the population is divided
into different nonoverlapping groups, called strata, such that they constitute the whole population; the population is as homogeneous as possible
within each stratum but varies between strata. Then a stratified random
sample is taken by selecting a simple random sample from each stratum.
Some of the advantages of stratified random sampling over simple random sampling are as follows:
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22
Chapter Two
1. It provides more precise estimates for population parameters

than simple random sampling would provide with the same
sample size.
2. A stratified sample is more convenient to administer, which
may result in a lower cost for sampling.
3. It provides a simple random sample for each subgroup or
stratum, which are homogeneous. Therefore, these samples can
prove to be very useful for studying each individual subgroup
separately without incurring any extra cost.
Before we look into how to use the information obtained from a stratified
random sample to estimate population parameters, we will briefly discuss the
process of generating a stratified random sample:
Divide the sampling population of N units into nonoverlapping subpopulations or strata of N1, N2, . . . , NK units, respectively. These
strata constitute the whole population of N units. That is, N = N1 +
N2 + . . . +NK.
Select independently from each stratum a simple random sample of
size n1, n2, . . . , nK so that n = n1 + n2 + . . . + nK is the total sample
size.
To make full use of stratification, the strata sizes N1, N2, . . . , NK must
be known.
Let y11 , y12 , . . . , y1N1 ; y21 , y22 , ..., y2 N 2 ;...; yK 1, yK 2,..., yKNK be the sampling units
in 1, 2, . . . , Kth stratum, respectively, and let y11 , y12 , . . . , y1n1 ; y21 , y22 , . . . , y2 n2 ;
...; yK 1 , yK 2 , ..., yKnK be the simple random samples of sizes n1, n2, . . . , nK
from them, respectively. Let and T be the population mean and population
total, respectively, and let i, Ti, i2 be the population mean, total, and variance of the ith stratum, respectively. Then, we have
K
i =1
i =1
T = Ti = N i i ,
=T N =
1 K
N .
N i =1 i i
(2.18)
(2.19)
Let yi be the sample mean of the simple random sample from the ith stratum.
From the previous section we know that yi is an unbiased estimator of the
mean i of the ith stratum. An unbiased estimator of the population mean ,
which we denote as yst, is given by
= yst =
H1277 ch02.indd 22
1 K
N y ,
N i =1 i i
(2.20)
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where
n
1 i
y .
ni j =1 ij
yi =
(2.21)
An estimator of the population total T is given by

K
i =1
i =1
i =1
i = N i yi = N yst .
T = Ti = N i
(2.22)
Recall that from equation (2.5) we have

i2 N i ni
.
ni N i 1
V ( yi ) =
(2.23)
From equations (2.20) and (2.23), it follows that the variance of the estimator
y of the population mean is given by
st
V ( yst ) =
=
N 2V ( yi )
2 i
N
i =1
2
1
2 i
N
i
ni
N 2 i =1
K
(2.24)
N i ni
N 1 .
i
An estimator of the variance in equation (2.24) is given by

s2
n
1 K
V ( y st ) = 2 N i2 i 1 i .
ni N i
N i =1
(2.25)
From equations (2.22) and (2.25), it follows that the variance of the estimator
of the population total T is given by
V (T ) = N 2V ( yst )
K
=
i =1
N i2
i2 N i ni
.
ni N i 1
(2.26)
An estimator of the variance in equation (2.26) is given by

V (T ) = N 2V ( yst )
K
= N i2
i =1
si2
n
1 i .
ni N i
(2.27)
If either the population is normal or the sample size is large (n 30), then
the margin of error for the estimation of the population mean with probability
(1 ) is given by
z / 2 V ( yst ) = z / 2
H1277 ch02.indd 23
1
N
Ni2
i =1
i2 N i ni
.
ni N i 1
(2.28)
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24
Chapter Two
When the strata variances are unknown, which is usually the case, the stratum variance i2 in equation (2.28) is replaced by its estimator si2 . Then the
margin of error for the estimation of the population mean with probability
(1 ) is given by
z / 2
1
N
Ni2
i =1
si2
ni
1
.
ni N i
(2.29)
The margin of error for the estimation of the population total with probability
(1 ) is given by
K
Ni2
z /2
i =1
i2 N i ni
.
ni N i 1
(2.30)
Again, when the strata variances are unknown, the stratum variance i2 in
equation (2.30) is replaced by its estimator si2 . Then the margin of error for
the estimation of the population total with probability (1 ) is given by
s2
ni
1 N
Ni2 ni
z / 2
i =1
(2.31)

From equations (2.29) and (2.31) we have the margins of error for estimating
the population mean and population total with probability (1 ). A confidence interval with confidence coefficient (1 ) for the population mean
and population total is given by
z /2
1
N
s2
ni
1 N
i
i
Ni2 ni
i =1
(2.32)
and
T z / 2
s2
ni
1 N
Ni2 ni
i =1
(2.33)
respectively.
Notes
1. An estimate y of the population mean obtained from a simple
random sample coincides with estimate y st obtained from a
stratified random sample if in every stratum ni /Ni is equal to n/N.
2. If the sample size in every stratum relative to the stratum size
is small (ni /Ni < 5%), then the factor ni /Ni in equations (2.25)
through (2.33) is usually ignored.
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Example 2.6 Suppose a manufacturing company is producing parts in its

facilities, which are located in three different countries, including the United
States. The labor costs, raw material costs, and other overhead expenses vary
tremendously from country to country. In order to meet the target value, the
company is interested in estimating the average cost of a part it will produce
during a certain period. The number of parts expected to be produced during
that period in its three facilities is N1 = 8900, N2 = 10,600, and N3 = 15,500.
The total number of parts expected to be produced during that period in all
facilities is N = 8900 + 10,600 + 15,500 = 35,000. To achieve its goal, the
company calculated the cost of 12 randomly selected parts from facility one,
12 parts from facility two, and 16 parts from facility three, which is in the
United States. These efforts produced the following data (in dollars):
Sample from facility one
6.48, 6.69, 7.11, 6.15, 7.09, 7.27, 7.58, 6.49, 6.32, 6.47, 6.63, 6.90
Sample from facility two
10.06, 10.25, 11.03, 11.18, 10.29, 9.33, 10.42, 9.34, 11.06, 9.78, 10.54,
11.45
Sample from facility three
24.72, 24.77, 25.64, 25.65, 26.09, 24.70, 25.05, 23.21, 24.00, 26.00,
26.21, 26.00, 24.21, 26.11, 24.63, 26.38
Use these data to determine the following:
1. An estimate of the population mean and population total
2. The margin of error for the estimation of the population mean
and population total with probability 95 percent
3. A confidence interval for the population mean and population
total with confidence coefficient 95 percent
Solution: In the example, each facility constitutes a stratum. So first we determine the sample mean and the sample standard deviation for each stratum.
1
( 6.48 + 6.69 + 7.11 + ... + 6.63 + 6.90 ) = 6.765,
12
1
y2 = (10.06 + 10.25 + 11.03 + ... + 10.54 + 11.45) = 10.311,
12
1
y3 = ( 24.72 + 24.77 + 25.64 + ... + 24.63 + 26.38 ) = 25.211,
16
y1 =
s12 =
(6.48 + 6.69 + ... + 6.90)2

1
2
2
2
9
0
)
(
6
.
48
+
6
.
69
+
...
+
6
.
= 0.1823,
12
12 1
s1 = 0.1823 = 0.427,
H1277 ch02.indd 25
3/8/07 5:31:12 PM
26
Chapter Two
s22 =
(10.06 + 10.25 + ... + 11.45)2

1
2
2
2
.
+
.
)
(
10
.
06
+
10
.
25
+
...
11
45
= 0.4277,
12 1
12
s2 = 0.4277 = 0.654,
s32 =
(24.72 + 24.77 + ... + 26.38)2

1
2
2
2
.
+
...
+
.
)
(
.
+
4
77
26
38
24
72
2
= 0.874,
16
16 1
s3 = 0.874 = 0.935.
Using equations (2.20) and (2.22), the estimates of the population mean and
population total are
1
= yst =
(8900 6.765 + 10, 600 10.311 + 15, 500 25.211)

35, 000
$16.00,
T = N yst = 35, 000 16 = $560, 000,
respectively.
Using equations (2.29) and (2.31) and noting that the sample sizes relative to the stratum sizes are small, the margins of error of estimation for the
population mean and population total with probability 95 percent are
1.96
1
0.1833
0.4277
0.874
8900 2
+ 10, 600 2
+ 15, 500 2
= $0.225
12
35, 000
12
16
and
1.96 8900 2
0.1833
0.4277
0.874
+ 10, 600 2
+ 15, 500 2
= $7895.07,
12
12
16
respectively.
Using equations (2.32) and (2.33), confidence intervals for the population mean and population total with confidence coefficient 95 percent are
16.00 0.225 = ($15.775, $16.22500)
and
560,000 7895.07 = ($552,104.93, $567,895.07),
respectively.
K
n=
z 2 / 2 N i2 i2 / wi
i =1
N E
H1277 ch02.indd 26
+ z 2 / 2
i =1
(2.34)
N i i2
3/8/07 5:31:12 PM
where wi is the fraction of the total sample size allocated to the ith stratum.
In the case of proportional allocation, wi = Ni /N. Also, note that if the stratum
population variance i2 is not known, then it is replaced with the corresponding
sample variance si2 , which can be found from either a pilot study or historical
data from a similar study.
Example 2.7 Extending our work in Example 2.6, determine an appropriate sample size if a Six Sigma Green Belt engineer of the company is interested in attaining a margin of error of $0.10 with probability 95 percent.
Solution: From Example 2.6, we have
w1 = 8900/35,000 = 0.254, w2 = 106,000/35,000 = 0.303, w3 =
15,500/35,000 = 0.443.
Because strata variances are unknown, plugging the values of E = 0.1, the
sample variance si2 , N, Ni, and wi; i = 1, 2, 3 into equation (2.34), we get
n 214.
In Example 2.6, in order to achieve the margin of error of 10 cents with probability 95 percent, the company must take samples of sizes 55, 65, and 95
from stratum one, two, and three, respectively (these sizes are obtained by
using the formula ni = n wi). This means we will need supplemental samples of sizes 43, 53, and 79 from stratum one, two, and three, respectively.
Notes
1. The sample size needed to estimate the population total with
margin of error E with probability (1 ) can be found by
using equation (2.34) simply by replacing E with (E/N).
2. An optimal allocation of sample size to each stratum depends
on three factors: the total number of sampling units in each
stratum, the variability of observations within each stratum, and
the cost of taking an observation from each stratum. The details
on this topic are beyond the scope of this book. For more
information, see Cochran (1977), Govindarajulu (1999), Lohr
(1999), and Scheaffer et al. (2006).
2.4 Systematic Random Sampling

Suppose the elements in the sampled population are numbered 1 to N. To
select a systematic random sample of size n, we select an element at random
from the first k ( N/n) elements and then every kth element until n elements
are selected. For example, if k = 20 and the first element selected is number
15, then the other elements, which will be included in the sample, are 35, 55,
75, 95, and so on. Because the first element is randomly selected and then
every kth element is selected, this determines a complete systematic random
sample and is usually known as every kth systematic sample.
A major advantage of the systematic sample over the simple random
sample is that a systematic sample design is easier to implement, particularly
H1277 ch02.indd 27
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28
Chapter Two
if the sampled population has some kind of natural ordering. Systematic sampling is very easy to implement when the sample is taken directly from the
production or assembly line. Another advantage of systematic sampling is
that the workers collecting the samples do not need any special training, and
sampled units are evenly spread over the population of interest.
If the population is in random order, a systematic random sample provides
results comparable with those of a simple random sample. Moreover, a systematic sample usually covers the whole sampled population uniformly, which may
provide more information about the population than that provided by a simple
random sample. However, if the sampling units of a population are in some kind
of periodic or cyclical order, the systematic sample may not be a representative
sample. For instance, if every fifth part produced by a machine is defective and
if k = 5, then the systematic random sample will contain either all defective or
all nondefective parts depending on whether the first part selected was defective. Therefore, a systematic sample in this case will not be a representative
sample. Similarly, suppose we want to estimate a workers productivity and
we decide to take samples of his or her productivity every Friday afternoon.
We might be underestimating the true productivity. On the other hand, if we
pick the same day in the middle of the week, we might be overestimating the
true productivity. So, to have better results using systematic sampling, we must
keep in mind that it includes the days when the productivity tends to be higher
as well as lower. If there is a linear trend, the systematic sample mean provides
a more precise estimate of the population mean than that of a simple random
sample but less precision than the stratified random sample.
If our sample is an every kth systematic random sample, then clearly there
are k possible systematic samples from a population of size N (kn = N), which
we write as
y11, y12, . . . , y1n; y21, y22, . . . , y2n; y31, y32, . . . , y3n; yk1, yk2, . . . , ykn,
where yij denotes the jth ( j = 1, 2, . . . , n) element of the ith (i = 1, 2, . . . , k)
systematic sample. We denote the mean of the ith sample described earlier by
y and the mean of a randomly selected systematic sample by y , where the
i
sy
subscript sy means that the systematic sample was used. The y sy is equal to y i
(i = 1, 2, . . . , k) with probability 1/k, where
n
yi =
yij
j =1
It can easily be shown that

= ysy
(2.35)
is an unbiased estimator of the population mean .

Note that the mean of a systematic sample is more precise than the mean
of a simple random sample if, and only if, the variance within the systematic
samples is greater than the population variance as a whole, that is,
H1277 ch02.indd 28
3/8/07 5:31:13 PM

2
Swsy
> S2,
(2.36)
where
2
Swsy
=
S2 =
k n
1
( y y ),
k (n 1) i =1 j =1 ij i
(2.37)
1 k n
( y Y ),
N 1 i =1 j =1 ij
(2.38)
1 k n
y .
N i =1 j =1 ij
(2.39)
and
Y=
Estimated variance of y sy is given by

V ( ysy ) =
ssy2
n
1 ,
n N
(2.40)
where
ssy2 =
1 n
( yi ysy )2 .
n 1 i =1
An estimator of the population total T is given by

T = N y ,
sy
(2.41)
(2.42)
and an estimated variance of T is given by

ssy2
n
2
2
V (T ) = N V ( ysy ) = N 1
n N
= N ( N n)
ssy2
n
(2.43)
Sometimes the manufacturing scenario may warrant first stratifying the population and then taking a systematic sample within each stratum. For example,
if there are several plants and we want to collect samples on line from each
of these plants, then clearly we are first stratifying the population and then
taking a systematic sample within each stratum. In such cases, the formulas
for estimating the population mean and total are the same as given in the
previous section except that y i is replaced by y sy.
The margins of error with probability (1 ) for estimating the population mean and total are given by
z / 2 V ( ysy ) = z / 2
ssy2
n
1
n N
(2.44)
and
H1277 ch02.indd 29
3/8/07 5:31:13 PM
30
Chapter Two
z / 2 V (T ) = z / 2 N ( N n)
ssy2
n
(2.45)
respectively.
Using equations (2.44) and (2.45), the confidence intervals for the population
mean and population total with confidence (1 ) are given by
z /2
ssy2
n
1
n N
(2.46)
and
T z / 2 N 2
ssy2
n
1 ,
n N
(2.47)
respectively.
n=
z 2 / 2 Nssy2
( N 1) E 2 + ssy2 z 2 / 2
(2.48)
The sample size needed to estimate the population total with margin of error
E with probability (1 ) can be found from equation (2.48) by replacing
E with (E/N).
Example 2.8 A pulp and paper mill plans to buy 1000 acres of timberland
for wood chips. However, before closing the deal, the company is interested
in determining the mean timber volume per lot of one-fourth an acre. To
achieve its goal, the company conducted an every 100th systematic random sample and obtained the data given in the following table. Estimate the
mean timber volume per lot and the total timber volume T in one thousand
acres. Determine the 95 percent margin of error of estimation for estimating
the mean and the total T and then find 95 percent confidence intervals for
the mean and the total T.
H1277 ch02.indd 30
3/8/07 5:31:13 PM
Lot Sampled
57
157
257
357
457
557
657
757
Volume
Cu. Feet
850
935
780
1150
940
898
956
865
Lot Sampled
857
957
1057
1157
1257
1357
1457
1557
Volume
Cu. Feet
1180
1240
1150
980
960
1470
950
860
Lot Sampled
1657
1757
1857
1957
2057
2157
2257
2357
Volume
Cu. Feet
1080
1186
1090
869
870
870
960
1058
Lot Sampled
2457
2557
2657
2757
2857
2957
3057
3157
Volume
Cu. Feet
1080
980
960
880
1030
1150
1200
1070
Lot Sampled
3257
3357
3457
3557
3657
3757
3857
3957
Volume
Cu. Feet
980
950
780
930
650
700
910
1300
Solution: From the given data, we have

= ysy =
1
1
(850 + 935 + 780 + ... + 1300) = (39, 697)) = 992.425 cubic feet
40
40
T = N ysy = 4000 992.425 = 3, 969, 700 cubic feet.

To find the margin of error with 95 percent probability for the estimation of
the mean and the total T, we need to determine the estimated variances of
We first need to find the sample variance.
and T.
ssy2 =
1
(850 + 935 + 780 + ... + 1300)2
2
2
2
2
(
850
+
935
+
780
+
...
+
1300
)
40 1
40
1
1
( 40, 446, 211.0 39, 396, 295.225) = (1, 049, 915.775) = 26, 920.9173
39
39
The estimated variances of and T are given by

ssy2
26, 920.9173
40
n
V ( ysy ) = 1 =
1
= 666.293,
40
40000
n
N
V (T ) = N 2V ( ysy ) = 4000 2 666.293 = 10,660,688,000.0.
Using equations (2.44) and (2.45), the margins of error of estimation for the
population mean and population total with probability 95 percent are
z / 2 V ( ysy ) = 1.96 666.293 = 50.59 cubic feet
and
z / 2 V (T ) = 1.96 10, 660, 688, 000 = 202, 360 cubiic feet,
respectively.
H1277 ch02.indd 31
3/8/07 5:31:13 PM
32
Chapter Two
Using equations (2.32) and (2.33), confidence intervals for the population mean and population total with confidence coefficient 95 percent are
992.425 50.59 = (941.835, 1043.015)
and
3,969,700 202,360 = (4,172,060, 3,767,340),
respectively.
Example 2.9 Extending our work in Example 2.8, determine an appropriate sample size if the manager of the pulp and paper company, estimating the
mean timber per lot, is interested in attaining the margin of error of 25 cubic
feet with probability 0.95.
2
Solution: Substituting the values of ssy , N, E, and z/2 in equation (2.48),
we get
n=
z 2 / 2 Nssy2
( N 1) E 2 + ssy2 z 2 / 2
1.962 4000 269920.9173

(4000 1) 252 + 26920.9173 1.962
159.
Note that in Example 2.8, the sample size was 40 and the margin of error for
estimating the mean timber per lot was 50.59 cubic feet with probability 95
percent. In order to attain the margin of error of 25 cubic feet, we will have to
take a sample of at least size 159.
Note: In systematic sampling it is normally not possible to take only a
supplemental sample to achieve a sample of full size, which in Example 2.8 is
159. However, it can be possible if we choose the values of n and k as n1 and
k1 such that N = n1k1 and k = rk1, where r is an integer. Furthermore, we must
keep the first randomly selected unit the same. For instance, in Example 2.8
we take a sample of size 160, k1 = 25 and keep the first randomly selected lot
as lot number 57. Our new sample will then consist of lot numbers 7, 32, 57,
82, 107, 132, 157, and so on. Obviously, the original sample is part of the new
sample, which means in this case we can take only a supplemental sample of
size 120 instead of taking a full sample of size 160.
2.5 Cluster Random Sampling

In all the sampling designs discussed so far, we have assumed that all the
sampling units in a sampled population are such that the sampling frame can
be prepared inexpensively, but this may not always be true. That is, to prepare
a good frame listing is very costly, or there are not enough funds to meet that
kind of cost, or all sampling units are not easily accessible. Another possible
scenario is that all the sampling units are scattered, so obtaining observations
on each sampling unit is not only very costly, but also very time consuming.
In such cases we prepare the sampling frame consisting of larger sampling
units, called clusters, such that each cluster consists of several original sampling units (subunits) of the sampled population. Then we take a simple random sample of the clusters and make observations on all the subunits in the
H1277 ch02.indd 32
3/8/07 5:31:14 PM
selected clusters. This technique of sampling is known as the cluster random

sampling design, or simply the cluster sampling design.
Cluster sampling is not only cost effective, but also a time saver because
collecting data from adjoining units is cheaper, easier, and quicker than if the
sampling units are far apart from each other. In manufacturing, for example,
it may be much easier and cheaper to randomly select boxes that contain
several parts rather than randomly selecting individual parts. However, while
conducting a cluster sampling may be cost effective, it also may be less efficient in terms of precision than a simple random sampling when the sample sizes are the same. Also, the efficiency of cluster sampling may further
decrease if we let the cluster sizes increase.
Cluster samplings are of two kinds: one-stage and two-stage. In one-stage
cluster sampling, we examine all the sampling subunits within the selected
clusters. In two-stage cluster sampling, we examine only a portion of sampling subunits, which are chosen from each selected cluster using simple
random sampling. Furthermore, in cluster sampling, the cluster sizes may
or may not be of the same size. Normally in field sampling it is not feasible
to have clusters of equal sizes. For example, in a sample survey of a large
metropolitan area, city blocks may be considered as clusters. If the sampling
subunits are households or persons, then obviously it will be almost impossible to have the same number of households or persons in every block. However, in industrial sampling, one can always have clusters of equal sizes; for
example, boxes containing the same number of parts may be considered as
clusters.
Let N be the number of clusters in the sampled population, with the ith cluster
having mi sampling subunits. We take a simple random sample of n clusters.
Let yij be the observed value of the characteristic of interest of the jth subunit
in the ith cluster, j = 1, 2, . . . , mi; i = 1, 2 . . . , n. We have the following:
mi
Total of all observations in the ith cluster = yi = yij

j =1
Total number of subunits in the sample = m = mi

i =1
Average cluster size in the sample = m =
1 n
m
mi =
n i =1
n
N
Total number of subunits in the population = M = mi

i =1
Average cluster size in the population = M =
H1277 ch02.indd 33
1 N
M
mi =
N i =1
N
3/8/07 5:31:14 PM
34
Chapter Two
Then, an estimator of the population mean (average value of the characteristic of interest per subunit) is given by
n
c = y =
yi
i =1
(2.49)
and its estimated variance is given by
N n 1 n
c ) = V ( y ) =
V (
( yi mi y )2 .
2
NnM n 1 i =1
(2.50)
, so that the estimated variance of is

If M is unknown, it is replaced by m
c
N n 1 n
2
c ) = V ( y ) =
V (
(
)
y
m
y
i
i
Nnm 2 n 1 i =1
(2.51)
An estimator of the population total T (total value of the characteristic of

interest for all subunits in the population) is given by
n
M
T = M y = yi ,
m i =1
(2.52)
and its estimated variance is given by

V (T ) = M 2V ( y ) = N 2 M 2V ( y ).
) from equation (2.50), we have
Substituting the value of V(y
N 1 n
V (T ) = N 1
( yi mi y )2 .
n n 1 i =1
(2.53)
The margins of error with probability (1 ) for estimating the population

mean and population total are given by
N n 1 n
2
z / 2 V ( y ) = z / 2
(
)
y
m
y
i
i
Nnm 2 n 1 i =1
(2.54)
N 1 n
z / 2 V (T ) = z / 2 N 1
( yi mi y )2 ,
n n 1 i =1
(2.55)
and
respectively.
Using equations (2.54) and (2.55), the confidence intervals for the population
mean and population total with confidence (1 ) are given by
H1277 ch02.indd 34
3/8/07 5:31:14 PM
N n 1 n
y z / 2
( yi mi y )2
2
Nnm n 1 i =1
(2.56)
N 1 n
M n
1
( yi mi y )2 ,
y
z
N
i
/ 2
m i =1
n n 1 i =1
(2.57)
and
respectively.
Example 2.10 The quality manager of a company that manufactures hydraulic pumps is investigating the cost of warranty claims per year for one specific
pump model. The pump model being investigated is typically installed in six
applications, which include food service operations (for example, pressurized
drink dispensers), dairy operations, soft-drink bottling operations, brewery
operations, wastewater treatment, and light commercial sump water removal.
The quality manager cannot determine the exact warranty repair cost for
each pump; however, through company warranty claims data, she can determine
the total repair cost and the number of pumps used by each industry in the six
applications. In this case, the quality manager decides to use cluster sampling,
using each industry as a cluster. She selects a random sample of n = 15 from the
N = 120 industries that use the pump. The data on total repair cost per industry
and the number of pumps owned by each industry are provided in the following
table. Estimate the average repair cost per pump and the total cost incurred by
the 120 industries over a period of one year. Determine a 95 percent confidence
interval for the population mean and population total.
H1277 ch02.indd 35
Sample #
Number of
Pumps
Total Repair Cost During One Year of

Warranty Period (in dollars)
250
338
290
160
390
11
460
275
358
285
10
215
11
220
12
10
310
13
320
14
275
15
280
3/8/07 5:31:14 PM
36
Chapter Two
Solution: To estimate the population mean , we proceed as follows:

m = total number of pumps in the sample = 5 + 7 + 8 + . . . + 5
= 103,
1
(103) = 6.867,
15
y = total repair cost for the selected clusters during one year = $4426.00.
m = average cluster size in the sample =
An estimate of the population mean is

=y=
4426.00
= $42.97.
103
Because we do not have information about the sizes of all the clusters, we
need to estimate the total number of subunits in the population, that is,
M = N M = N m = 120 6.867 = 824.
An estimate of the total number of pumps owned by the 120 industries is 824.
Therefore, an estimator of the population total T (total repair cost for the
manufacturer during one year of warranty period [in dollars]) is given by
= 824 42.97 = $35, 407.28.
T = M
To determine a 95 percent confidence interval for the population mean and
population total, we first need to evaluate s2, which is given by
2
1 n
yi mi y ,
n 1 i =1
that is,
1
( 250 5 42.97 )2 + ( 338 7 42.97 )2 + ... + ( 280 5 42.97 )2
15 1
1
= (38,185.3464) = 2727.5247.
14
s2 =
Using equation (2.56), a 95 percent confidence interval for the population

mean is
Similarly, using equation (2.56), a 95 percent confidence interval for the population total is
H1277 ch02.indd 36
3/8/07 6:22:09 PM

n
z 2 / 2 Ns 2
NM 2 E 2 + z 2 / 2 s 2
(2.58)
where
s2 =
1 n
( y mi y )2 .
n 1 i =1 i
The sample size needed to estimate the population total with margin of error
E with probability (1 ) can be found from equation (2.58) by replacing E
with (E/M).
Example 2.11 In Example 2.10, determine the sample size if the quality
manager wants to estimate the repair cost per pump with a margin of error
$2.00 with 95 percent probability.
Solution: Using equation (2.58), the desired sample size is
n
(1.96)2 (120)(2727.5247)
(120)(6.867)2 (2)2 + (1.96)2 (2727.5247)
= 37.97.
The sample size should be n = 38. Note that in order to determine the
, for which we need to have a sample and
sample size, we needed s2 and m
thus the sample size, which in fact we want to determine. The solution for
this problem, as discussed in details in Applied Statistics for the Six Sigma
Green Belt, is to evaluate these quantities either by using some similar data
if already available or by taking a smaller sample, as we did in this example.
H1277 ch02.indd 37
3/8/07 6:22:21 PM
H1277 ch02.indd 38
3/8/07 5:31:15 PM
3
Phase I (Detecting Large
Shifts)SPC: Control
Charts for Variables
he concept of quality is centuries old. However, the concept of SQC

is less than a century old. SQC is merely a set of interrelated tools
that includes SPC, DOE, acceptance sampling, and other tools used
to monitor and improve quality. SPC consists of several tools that are useful
for process monitoring. The quality control chart, which is the center of our
discussion in this chapter, is one of these tools. Walter A. Shewhart, from
Bell Telephone Laboratories, was the first person to apply statistical methods
to quality improvement when, in 1924, he presented the first quality control
chart. In 1931, Shewhart wrote a book on SQC titled Economic Control of
Quality of Manufactured Product (D. Van Nostrand Co.). The publication of
this book set the notion of SQC in full swing. In the initial stages, the acceptance of the notion of SQC in the United States was almost negligible. It was
only during World War II, when the armed services adopted the statistically
designed sampling inspection schemes, that the concept of SQC started to
gain acceptance in American industry.
The complete adoption of modern SQC was limited from the 1950s to
the late 1970s, however, because American manufacturers believed that quality
and productivity couldnt go hand in hand. American manufacturers argued
that producing goods of high quality would cost more because high quality would mean buying raw materials of higher grade, hiring more qualified
personnel, and providing more training to workers, all of which would translate into higher costs. American manufacturers also believed that producing
higher-quality goods would slow down productivity because better-qualified
and better-trained workers would not compromise quality to meet their daily
quotas, which would further add to the cost of their product. As a consequence,
they believed they would not be able to compete in the world market and would
therefore lose their market share. The industrial revolution in Japan, however,
proved that American manufacturers were wrong. This revolution followed the
visit of a famous American statistician, W. Edwards Deming, in 1950.
Deming (1986, 2) wrote, Improvement of quality transfers waste of manhours and of machine-time into the manufacture of good product and better
service. The result is a chain reactionlower costs, better competitive position,
39
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40
Chapter Three
and happier people on the job, jobs and more jobs. Deming describes this
chain reaction as follows:
Improve quality cost decreases because of less work, fewer mistakes,
fewer delays or snags, better use of machine time and materials productivity improves capture the market with better quality and lower
price stay in business provide jobs and more jobs. (3)
After Demings visit in 1950, this message of a chain reaction appeared on
blackboards in every meeting room of top management in the industrial world
of Japan. Once the management in Japan adopted the philosophy of this chain
reaction, everyone had one common goal of achieving quality.
3.1 Basic Definition of Quality and Its Benefits

Different authors have defined the concept of quality in different ways. We
define it as Deming did: a product is of good quality if it meets the needs of
a customer and the customer is glad that he or she bought that product. The
customer may be internal or external, an individual or a corporation. If a
product meets the needs of the customer, the customer is bound to buy that
product again and again. On the contrary, if a product does not meet the needs
of a customer, then he or she will not buy that product even if he or she is an
internal customer. Consequently, that product will be deemed of bad quality,
and eventually it is bound to go out of the market.
Other components of a products quality are its reliability, how much
maintenance it demands, and, when the need arises, how easily and how fast
one can get it serviced. In evaluating the quality of a product, its attractability
and rate of depreciation also play an important role.
As described by Deming in his telecast conferences, the benefits of better
quality are numerous. First and foremost is that it enhances the overall image
and reputation of the company by meeting the needs of its customers and thus
making them happy. A happy customer is bound to buy the product again and
again. Also, a happy customer is likely to share a good experience with the
product with friends, relatives, and neighbors. Therefore, the company gets
publicity without spending a dime, and this results in more sales and higher
profits. Higher profits lead to higher stock prices, which means higher net
worth of the company. Better quality provides workers satisfaction and pride
in their workmanship. A satisfied worker goes home happy, which makes his
or her family happy. A happy family boosts the morale of a worker, which
means greater dedication and loyalty to the company.
Another benefit of better quality is decreased cost. This is due to the need
for less rework, thus less scrap, fewer raw materials used, and fewer workforce
hours and machine hours wasted. Ultimately, this means increased productivity, a better competitive position, increased sales, and a higher market share.
On the other hand, losses due to poor quality are enormous. Poor quality not
only affects sales and the competitive position, but it also carries with it high
hidden costs that are usually not calculated and therefore not known with
precision. These costs include unusable product, product sold at a discounted
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Phase I (Detecting Large Shifts)SPC: Control Charts for Variables 41
price, and so on. In most companies, the accounting departments provide

only minimum information to quantify the actual losses incurred due to poor
quality. Lack of awareness concerning the cost of poor quality could lead
company managers to fail to take appropriate actions to improve quality.
3.2 SPC
What is a process? A process may be defined as a series of actions or operations performed in producing manufactured or nonmanufactured products. A
process may also be defined as a combination of workforce, equipment, raw
materials, methods, and environment that works together to produce output.
The flowchart in Figure 3.1 shows where each component of a process fits.
Figure 3.1
H1277 ch03.indd 41
Planning
department
Necessary changes for

further needs of
customers and to
stay competitive
Top
management
Testing in
service
Design
department
Shipped to
consumer
Management
Final product
Training of
workers
On-line
testing of
production
Procurement
of raw
materials
Start of
production
Flowchart of a process.
3/8/07 5:38:58 PM
42
Chapter Three
The quality of the final product depends on how the process is designed
and executed. However, no matter how perfectly a process is designed and
how well it is executed, no two items produced by the process are identical. The difference between two items is called the variation. Such variation
occurs because of two causes:
1. Common causes or random causes
2. Special causes or assignable causes
As mentioned earlier, the first attempt to understand and remove variation in
any scientific way was made by Walter A. Shewhart. Shewhart recognized
that special or assignable causes are due to identifiable sources, which can be
systematically identified and eliminated, whereas common or random causes
are not due to identifiable sources and therefore cannot be eliminated without
very expensive measures. These measures include redesigning the process,
replacing old machines with new machines, and renovating part of or the
whole system. A process is considered in statistical control when only common causes are present. Deming (1975, 5) states, But a state of statistical
control is not a natural state for a manufacturing process. It is instead an
achievement, arrived at by elimination, one by one, by determined efforts, of
special causes of excessive variation.
Because the process variation cannot be fully eliminated, controlling it
is key. If process variation is controlled, the process becomes predictable.
Otherwise the process is unpredictable. To achieve this goal, Shewhart introduced the quality control chart. Shewhart control charts are normally used in
phase I implementation of SPC, when a process is particularly susceptible to
the influence of special causes and, consequently, is experiencing excessive
variation or large shifts.
Quality control charts can be divided into two major categories: control
charts for variables and control charts for attributes. In this chapter we will
study control charts for variables.
Definition 3.1 A quality characteristic that can be expressed
numerically or measured on a numerical scale is called a variable.
Examples of a variable include the length of a tie-rod, the tread depth of
a tire, the compressive strength of a concrete block, the tensile strength of a
wire, the shearing strength of paper, the concentration of a chemical, the diameter of a ball bearing, and the amount of liquid in a 16-ounce can, and so on.
In general, in any process there are some quality characteristics that
define the quality of the process. If all such characteristics are behaving in
a desired manner, then the process is considered stable and it will produce
products of good quality. If, however, any of these characteristics are not
behaving in a desired manner, then the process is considered unstable and it is
not capable of producing products of good quality. A characteristic is usually
determined by two parameters: its mean and its standard deviation. In order
to verify whether a characteristic is behaving in a desired manner, one needs
to verify that these two parameters are in statistical control, which can be
done by using quality control charts. In addition, there are several other such
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tools that are valuable in achieving process stability. These tools, including
the control charts, constitute an integral part of SPC. SPC is very useful in
any process related to manufacturing, service, or retail industries. This set of
tools consists of the following:
1. Histogram
2. Stem-and-leaf diagram
3. Scatter diagram
4. Run chart (also known as a line graph or a time series graph)
5. Check sheet
6. Pareto chart
7. Cause-and-effect diagram (also known as a fishbone or
Ishikawa diagram)
8. Defect concentration diagram
9. Control charts
These tools of SPC form a simple but very powerful structure for quality
improvement. Once workers become fully familiar with these tools, management must get involved to implement SPC for an ongoing quality-improvement
process. Management must create an environment where these tools become
part of the day-to-day production or service process. The implementation of
SPC without managements involvement and cooperation is bound to fail. In
addition to discussing these tools, we will also explore here some of the questions that arise while implementing SPC.
Every job, whether in a manufacturing company or in a service company,
involves a process. As described earlier, each process consists of a certain
number of steps. No matter how well the process is planned, designed, and
executed, there is always some potential for variability. In some cases this
variability may be very little, while in other cases it may be very high. If the
variability is very little, it is usually due to some common causes that are
unavoidable and cannot be controlled. If the variability is too high, we expect
that in addition to the common causes there are some other causes, usually
known as assignable causes, present in the process. Any process working
under only common causes or chance causes is considered to be in statistical
control. If a process is working under both common and assignable causes, it
is considered unstable, or not in statistical control.
The first four tools in the SPC tools list are discussed in the first volume
of this series, Applied Statistics for the Six Sigma Green Belt. In this chapter
and the two that follow, we will discuss the rest of these tools.
Check Sheet
In order to improve the quality of a product, management must try to reduce the
variation of all the quality characteristics; that is, the process must be brought
to a stable condition. In any SPC procedure used to stabilize a process, it is
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H1277 ch03.indd 44
Other
Total
Blistering
Dirt
Pinholes
Corrugation
Streaks
Date
10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28
Table 3.1 Check sheet summarizing the data of a study over a period of four weeks.
Defect type
44
Chapter Three
3/8/07 5:38:58 PM
essential to know precisely what types of defects are affecting the quality of
the final product. The check sheet is an important tool to achieve this goal. We
discuss this tool using a real-life example.
Example 3.1 In a paper mill, a high percentage of paper rolls are discarded due to various types of defects. In order to identify these defects and
their frequency, a study is launched. This study is done over a period of four
weeks. The data are collected daily and summarized in the following form
(see Table 3.1), called the check sheet.
The summary data not only give the total number of different types of
defects but also provide a very meaningful source of trends and patterns of
defects. These trends and patterns can help find possible causes for any particular defect or defects. Note that the column totals in Table 3.1 show the
number of defects (rolls of paper rejected) occurring daily, whereas the row
totals (not shown in Table 3.1 but shown in Figure 3.2) show the number of
defects by type that occur over the total period (four weeks) of study. It is
important to remark here that these types of data become more meaningful
if a logbook of all changes, such as a change in raw materials, calibration of
machines, or training of workers or new workers hired, is well kept.
Pareto Chart
The Pareto chart is a useful tool for learning more about attribute data quickly
and visually. The Pareto chartnamed after its inventor, Vilfredo Pareto, an
Italian economist who died in 1923is simply a bar graph of attribute data in
a descending order of frequency by, say, defect type. For example, consider
the data on defective rolls in Example 3.1 and as shown in Figure 3.2, which
plots the frequency totals (row totals) of each defect, starting from highest to
lowest.
The chart allows the user to quickly identify those defects that occur more
frequently and those that occur less frequently. This allows the user to priori-
30
28
Frequency
25
20
15
11
10
10
9
7
5
5
0
Corrugation
Blistering
Streaks
Pinholes
Dirt
Other
Defect type
Figure 3.2
H1277 ch03.indd 45
Pareto chart for data in Example 3.1.
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46
Chapter Three
tize his or her resources to eliminate first those defects that have the greatest
effect on the quality of the product. For instance, the Pareto chart in Figure 3.2
indicates that 40 percent of the paper rolls are rejected because of corrugation. Corrugation and blistering together are responsible for 55.7 percent of
the rejected paper. Corrugation, blistering, and streaks are responsible for 70
percent. To reduce the overall rejection, one should first attempt to eliminate
or at least reduce the defects due to corrugation, then blistering, streaks, and
so on. By eliminating these three types of defects, one would dramatically
change the percentage of rejected paper and reduce the losses. It is important
to note that if one can eliminate more than one defect simultaneously, then
one should consider eliminating them even though some of them are occurring less frequently. Furthermore, after one or more defects are either eliminated or reduced, one should again collect the data and reconstruct the Pareto
chart to determine whether the priority has changed. If another defect is now
occurring more frequently, one may divert the resources to eliminate such
a defect first. Note that in this example, the category Other may include
several defects such as porosity, grainy edges, wrinkles, or brightness that are
not occurring very frequently. So, if one has limited resources, one should not
expend them on this category until all other defects are eliminated.
Sometimes the defects are not equally important. This is true particularly
when some defects are life threatening while other defects are merely a nuisance or an inconvenience. It is quite common to allocate weights to each
defect and then plot the weighted frequencies versus the defects to construct
the Pareto chart. For example, suppose a product has five types of defects,
which are denoted by A, B, C, D, and E, where A is life threatening, B is not
life threatening but very serious, C is serious, D is somewhat serious, and E
is not serious but merely a nuisance. Suppose we assign a weight of 100 to
A, 75 to B, 50 to C, 20 to D, and 5 to E. The data collected over a period of
study are shown in Table 3.2.
In Figure 3.3 the Pareto chart presents a completely different picture.
That is, by using weighted frequencies, the order of priority of removing the
defects is C, A, B, D, and E, whereas without using the weighted frequencies,
this order would have been E, C, D, B, and A.
Table 3.2
H1277 ch03.indd 46
Frequencies and weighted frequencies when different types of defects are

not equally important.
Defect Type
Frequency
Weighted Frequency
500
450
15
750
12
240
25
125
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750
Weighted frequency
800
700
600
500
450
500
400
240
300
200
125
100
0
Defect type
Figure 3.3
Pareto chart when weighted frequencies are used.
Cause-and-Effect (Fishbone or Ishikawa) Diagram

In an SPC-implementing scheme, identifying and isolating the causes of a
particular problem or problems is very important. An effective tool for identifying such causes is the cause-and-effect diagram. This diagram is also known
as a fishbone diagram because of its shape, and sometimes it is called an
Ishikawa diagram after its inventor. Japanese manufacturers have widely used
this diagram to improve the quality of their products. In preparing a causeand-effect diagram, it is quite common to use a brainstorming technique. The
brainstorming technique is a form of creative and collaborative thinking. This
technique is used in a team setting. The team usually includes personnel from
departments of production, inspection, purchasing, design, and management,
along with any other members associated with the product under discussion.
A brainstorming session is set up in the following manner:
1. Each team member makes a list of ideas.
2. The team members sit around a table and take turns reading one
idea at a time.
3. As the ideas are read, a facilitator displays them on a board so
that all team members can see them.
4. Steps 2 and 3 continue until all ideas have been exhausted and
displayed.
5. Cross-questioning concerning a team members idea is allowed
only for clarification.
6. When all ideas have been read and displayed, the facilitator asks
each team member if he or she has any new ideas. This procedure
continues until no team member can think of any new ideas.
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48
Chapter Three
Once all the ideas are presented using the brainstorming technique, the next
step is to analyze them. The cause-and-effect diagram is a graphical technique used to analyze these ideas. Figure 3.4 shows an initial structure of a
cause-and-effect diagram.
The five spines in Figure 3.4 indicate the five major factors or categories
that could be the cause, or causes, of defect(s). In most workplaces, whether
they are manufacturing or nonmanufacturing, the causes of all problems usually fall into one or more of these categories.
Using a brainstorming session, the team brings up all possible causes
under each category. For example, under the environment category, a cause
could be the managements attitude. Management might not be willing to
release any funds for research or to change suppliers; there might not be
much cooperation among middle and top management; or something similar.
Under the personnel category, a cause could be lack of proper training for
workers, supervisors who are not helpful in solving problems, lack of communication between workers and supervisors, and workers who are afraid
of asking their supervisors questions for fear of repercussions in their jobs,
promotions, or raises. Once all possible causes under each major category are
listed in the cause-and-effect diagram, the next step is to isolate one or more
common causes and eliminate them. A complete cause-and-effect diagram
may appear as shown in Figure 3.5.
Defect Concentration Diagram
A defect concentration diagram is a visual representation of the product under
study that depicts all the defects. This diagram helps the workers determine
if there are any patterns or particular locations where the defects occur and
what kinds of defects, minor or major, are occurring. The patterns or particuEnvironment
Personnel
Equipment
Defect(s) under investigation
Techniques or methods
Figure 3.4
H1277 ch03.indd 48
Materials
An initial form of a cause-and-effect diagram.
3/8/07 5:38:59 PM
Environment
Personnel
Workers underpaid
No funds for research
Not enough workers
Lack of management
cooperation
Equipment
Not enough training
No proper maintenance
Lack of proper
supervision
Machines are old
Supervisors are not

knowledgeable
Software not updated

Defect(s) under investigation
Lack of communication
Mishandling of shipment
Design not well planned
Lack of SPC on line
Techniques or methods
Figure 3.5
Improper inspection
Improper distribution
Mishandling of raw
materials
Too many suppliers
Materials
A complete cause-and-effect diagram.
lar locations may help the workers find the specific causes for such defects.
It is important that the diagram show the product from different angles. For
example, if the product is in the shape of a rectangular prism and defects are
found on the surface, then the diagram should show all six faces, very clearly
indicating the location of the defects. In Figure 3.6 the two diagonally opposite edges are damaged, which could have happened in transportation or in
moving this item from the production area to the storage area.
Top
Bottom
Front
Figure 3.6
Back
Left
Right
A rectangular prism-shaped product that has been damaged.
The defect concentration diagram was useful when the daughter of one of the authors
made a claim with a transportation company. In 2001, the author shipped a car from
Boston, Massachusetts, to his daughter in San Jose, California. After receiving the car,
she found that the front bumpers paint was damaged. She filed a claim with the transportation company for the damage, but the company turned it down, simply stating that
the damage was not caused by the company. Fortunately, a couple days later, she
found similar damage under the back bumper, symmetrically opposite the front bumper. She again called the company and explained that this damage had clearly been
done by the belts used to hold the car during transportation. This time the company
could not turn down her claim, because by using a defect concentration diagram, she
could prove that the damage was caused by the transportation company.
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50
Chapter Three
Run Chart
In any SPC procedure it is very important to detect any trends that may be
present in the data. Run charts help identify such trends by plotting data over
a certain period of time. For example, if the proportion of nonconforming
parts produced from shift to shift is perceived to be a problem, we may plot
the number of nonconforming parts against the shifts for a certain period of
time to determine whether there are any trends. Trends usually help us identify the causes of nonconformities. This chart is particularly useful when the
data are collected from a production process over a certain period of time.
A run chart for data in Table 3.3 is shown in Figure 3.7, in which we
have plotted the percentage of nonconforming units in different shifts over a
period of 10 days, starting with the morning shift.
From this run chart we can easily see that the percentage of nonconforming units is the lowest in the morning shift (shifts 1, 4, 7, . . . , 28) and the
highest in the night shift (shifts 3, 6, 9, . . . , 30). There are also some problems in the evening shift, but they are not as severe as those in the night shift.
Because such trends or patterns are usually created by special or assignable
Table 3.3
Percentage of nonconforming units in different shifts over a period of

30 shifts.
Shift Number
10
% Nonconforming
12
12
11
15
11
12
13
14
15
16
17
18
19
20
Shift Number
% Nonconforming
Shift Number
% Nonconforming
16
% nonconforming
15
15
22
23
24
25
26
27
28
29
30
10
15
10
13
14
15
14
12
12
15
15
15
10
10
14
13
11
12
5
21
7
5
10
8
6
7
6
5 5
2
3
12
15
18
21
24
27
30
Shift number
Figure 3.7
H1277 ch03.indd 50
A run chart.
3/8/07 5:38:59 PM
causes, the run chart will certainly prompt the management to explore how
the various shifts differ. Does the quality of the raw materials differ from
shift to shift? Is there inadequate training of workers in the later shifts? Are
evening- and late-shift workers more susceptible to fatigue? Are there environmental problems that increase in severity as the day wears on?
Deming (1986, 313) points out that sometimes the frequency distribution
of a set of data does not give a true picture of the data, whereas a run chart can
bring out the real problems of the data. The frequency distribution gives us
the overall picture of the data, but it does not show us any trends or patterns
that may be present in the process on a short-term basis.
Control charts make up perhaps the most important part of SPC. We will
study some of the basic concepts of control charts in the following section,
and then in the rest of this chapter and the next two chapters we will study the
various kinds of control charts.
3.3 Control Charts for Variables

A control chart is a simple but very powerful statistical device used to keep
a process predictable. As noted by Duncan (1986), a control chart is (1) a
device for describing in concrete terms what a state of statistical control is,
(2) a device for attaining control, and (3) a device for judging whether control
has been attained.
Before the control charts are implemented in any process, it is important
to understand the process and have a concrete plan for future actions that
would be needed to improve the process.
Process Evaluation
Process evaluation includes not only the study of the final product, but also
the study of all the intermediate steps or outputs that describes the actual
operating state of the process. For example, in the paper production process,
wood chips and pulp may be considered as intermediate outputs. If the data
on process evaluation are collected, analyzed, and interpreted correctly, they
can show where and when a corrective action is necessary to make the whole
process work more efficiently.
Action on Process
Action on process is important for any process because it prevents the production of an out-of-specification product. An action on process may include
changes in raw materials, operator training, equipment, design, or other measures. The effects of such actions on a process should be monitored closely,
and further action should be taken if necessary.
Action on Output
If the process evaluation indicates that no further action on the process is
necessary, the last action is to ship the final product to its destination. Note
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52
Chapter Three
that some people believe action on output consists of sampling plans and discarding the out-of-specification product, which has already been produced.
Obviously, such an action on the output is futile and expensive. We are interested in correcting the output before it is produced. This goal can be achieved
through the use of control charts.
Any process with a lot of variation is bad and is bound to produce products of inferior quality. Control charts can help detect variation in any process. As described earlier, in any process there are two causes of variation:
common causes or random causes, and special causes or assignable causes.
Variation
No process can produce two products that are exactly alike or possess exactly
the same characteristics. Any process is bound to contain some sources of
variation. The difference between two products may be very large, moderate,
very small, or even undetectable, depending on the source of variation, but
certainly there is always some difference. For example, the moisture content
in any two rolls of paper, the opacity in any two spools of paper, and the
brightness of two lots of pulp will always vary. Our aim is to trace back as far
as possible the sources of such variation and eliminate them. The first step is
to separate the common and special causes of such sources of variation.
Common Causes or Random Causes
Common causes or random causes are the sources of variation within a process that is in statistical control. The causes behave like a constant system of
chance. While individual measured values may all be different, as a group
they tend to form a pattern that can be explained by a statistical distribution
that can generally be characterized by:
1. Location parameter
2. Dispersion parameter
3. Shape (the pattern of variation, whether it is symmetrical, right
skewed, left skewed, and so on)
Special Causes or Assignable Causes
Special causes or assignable causes refer to any source of variation that cannot be adequately explained by any single distribution of the process output, as otherwise would be the case if the process were in statistical control.
Unless all the special causes of variation are identified and corrected, they
will continue to affect the process output in an unpredictable way. Any process with assignable causes is considered unstable and hence not in statistical
control. However, any process free of assignable causes is considered stable
and therefore in statistical control. Assignable causes can be corrected by
local actions, while common causes or random causes can be corrected only
by actions on the system.
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Local Actions and Actions on the System

Local Actions
1. Are usually required to eliminate special causes of variation
2. Can usually be taken by people close to the process
3. Can correct about 15 percent of process problems
Deming (1982) believed that as much as 6 percent of all system variations
is due to special or assignable causes, while no more than 94 percent of the
variations is due to common causes.
Actions on the System
1. Are usually required to reduce the variation due to common
causes
2. Almost always require management action for correction
3. Are needed to correct about 85 percent of process problems
Furthermore, Deming (1951) points out that there is an important relationship between the two types of variations and the two types of actions needed
to reduce such variations. We will discuss this point in more detail.
Special causes of variation can be detected by simple statistical techniques. These causes of variation are not the same in all the operations
involved. Detecting special causes of variation and removing them is usually
the responsibility of someone directly connected to the operation, although
management is sometimes in a better position to correct them. Resolving a
special cause of variation usually requires local action.
The extent of common causes of variation can be indicated by simple
statistical techniques, but the causes themselves need more exploration in
order to be isolated. It is usually managements responsibility to correct the
common causes of variation, although personnel directly involved with the
operation are sometimes in a better position to identify such causes and pass
them on to management for an appropriate action. Overall, resolving common causes of variation usually requires action on the system.
As we noted earlier, about 15 percent (or according to Deming, 6 percent) of industrial process troubles are correctable by the local action taken
by people directly involved with the operation, while 85 percent are correctable only by managements action on the system. Confusion about the type
of action required is very costly to the organization in terms of wasted efforts,
delayed resolution of trouble, and other aggravating problems. So, it would
be wrong to take local action (for example, changing an operator or calibrating a machine) when, in fact, management action on the system was required
(for example, selecting a supplier that can provide better and consistent raw
materials).
All of this reasoning shows that strong statistical analysis of any operation in any industrial production is necessary. Control charts are perhaps the
best tool to separate the special causes from the common causes.
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54
Chapter Three
Control Charts
1. Are used to describe in concrete terms what a state of statistical
control is
2. Are used to judge whether control has been attained and thus
detect whether assignable causes are present
3. Are used to attain a stable process
Suppose we take a sample of size n from a process at approximately
regular intervals, and for each sample we compute a sample statistic, say
X. This statistic may be the sample mean, a fraction of nonconforming
product, or any other appropriate measure. Now, because X is a statistic,
it is subject to some fluctuation or variation. If no special causes are
present, the variation in X will have characteristics that can be described
by some statistical distribution. By taking enough samples, we can estimate the desired characteristics of such a distribution. For instance, we
now suppose that the statistic X is distributed as normal, and we divide
the vertical scale of a graph in units of X, and the horizontal scale in units
of time or any other such characteristic. Then we draw horizontal lines
through the mean, called the center line (CL), and the extreme values
of X, called the upper control limit (UCL) and the lower control limit
(LCL). This results in the device shown in Figure 3.8, also known as a
control chart.
The main goal of using control charts is to reduce the variation in the
process and bring the process target value to the desired level. In other words,
the process should be brought into a state of statistical control.
If we plot data pertaining to a process on a control chart and the data
conform to a pattern of random variation that falls within the upper and lower
control limits, then we say that the process is in statistical control. If, however, the data fall outside these control limits and do not conform to a pattern
of random variation, then the process is considered to be out of control. In the
latter case, an investigation is launched to find and correct the special causes
responsible for the process being out of control.
If any special cause of variation is present, an effort is made to eliminate
it. In this manner, the process can eventually be brought into a state of statistical control.
Upper control limit

Center line
Lower control limit
Figure 3.8
H1277 ch03.indd 54
A control chart with a UCL and an LCL.
3/8/07 5:39:00 PM
Shewhart strongly recommended that a process should not be judged to

be in control unless the pattern of random variation has persisted for some
time and for a sizable volume of output.
Note: If a control chart shows a process in statistical control, it does not
mean that all special causes have been completely eliminated; rather, it simply means that for all practical purposes, it is reasonable to assume or adopt
a hypothesis of common causes only.
Preparation for Use of Control Charts
In order for control charts to serve their intended purpose, it is important
to take the following preparatory steps prior to implementing the control
charts:
1. Establish an environment suitable for action: Any statistical
method will fail unless management has prepared a responsive
environment.
2. Define the process and determine the characteristics to be
studied: The process must be understood in terms of its
relationship to the other operations and users and in terms
of the process elements (for example, people, equipment,
materials, methods, and environment) that affect it at each
stage. Some of the techniques discussed earlier, such as the
Pareto chart or the fishbone diagram, can help make these
relationships visible. Once the process is well understood, the
next step is to determine which characteristics are affecting the
process, which characteristics should be studied in depth, and
which characteristics should be controlled.
3. Determine the correlation between characteristics: For an
efficient and effective study, take advantage of the relationship
between characteristics. If several characteristics of an item
are positively correlated, it may be sufficient to chart only one
of them. If there are some characteristics that are negatively
correlated, a deeper study is required before any corrective
action on such characteristics can be taken.
4. Define the measurement system: The characteristic must be
operationally defined so that the findings can be communicated
to all concerned in ways that have the same meaning today as
they did yesterday. This includes specifying what information
is to be gathered, where it should be gathered, how it should be
gathered, and under what conditions it should be gathered. The
operational definition is very important for collecting data because
it can impact the control charts in many ways. Moreover, the
analysis of data depends on how the data are collected. This is
why it is extremely important that the data contain the pertinent
information and are valid (for example, appropriate sampling
H1277 ch03.indd 55
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56
Chapter Three
schemes are used) so that the analysis and the interpretation

of the results are done appropriately. Moreover, one should
always keep in mind that each measurement system has its own
inherent variability. Thus, the accuracy of any measurement
system is as important as the elimination of the special causes
affecting the process.
5. Minimize unnecessary variation: Unnecessary external causes
of variation should be reduced before the study begins. Methods
for reducing these causes include overcontrolling the process and
avoiding obvious problems that could and should be corrected
even without the use of control charts. Note that in all cases a
process log should be kept. It should include all relevant events
(big or small) such as procedural changes, new raw materials, or
change of operators. This will aid in the analysis of subsequent
problems.
6. Consider the customers needs: This includes any subsequent
processes that use the product or service as an input and the final
end-item customer. For example, a computer manufacturing
company is a customer of the semiconductor industry; a car
manufacturing company is a customer of tire manufacturing
companies; and in a paper mill, the papermaking unit is a
customer of the pulp-making unit.
Note that the most important quality characteristic is to produce what the customer wants. In other words, the company should deliver a product that meets
the needs of the customer. A company may produce excellent things, but if it
cant meet the needs of the customer, then the customer is not going to buy
that product. So, for example, the pulp-making mill should produce the kind
of pulp wanted by the papermaking mill. In this particular case, the pulp and
paper mills are part of the same company, but if the pulp-making mill cannot
deliver the kind of pulp the papermaking mill needs, the papermaking mill
will seek another supplier. Process innovation and customer satisfaction are
the most important factors in the success of any manufacturing process.
Benefits of Control Charts
Properly used control charts can:
1. Be used by operators for ongoing control of a process
2. Help the process perform consistently and predictably
3. Allow the process to achieve higher quality, higher effective
capacity (because there will be either no rejection or less
rejection), and hence a lower cost per unit
4. Provide a common language for discussing process performance
5. Help distinguish special causes from common causes for
variability and serve as a guide for management to take local
action or action on the system
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Rational Samples for a Control Chart

It is important to note that the samples used to prepare a control chart should
represent subgroups of output that are as homogeneous as possible. In other
words, the subgroups should be such that if special causes are present, they
will show up in differences between the subgroups rather than in differences
between the members of a subgroup. A natural subgroup, for example, would
be the output of a given shift. It is not correct to take the product of an arbitrary period of time as a subgroup, especially if the subgroup overlapped two
or more shifts. This is because if a sample comes from two or more shifts,
any differences between the shifts will be averaged out, and consequently,
the plotted point wont indicate the presence of any special causes due to
shifts. As another example, if the process used six machines, it would be better to take a sample from the output of each machine than to have a sample
that consists of items from all six machines. This is because the difference
between the machines may be the special cause of variation. It will be easier
to detect this special cause if a sample is taken from each machine. Thus,
it is true that careful selection of a subgroup or sample is perhaps the most
important item in setting up a control chart.
The next step in selecting a sample is to determine the sample size. Factors usually considered in determining the sample size and the frequency of
the samples are the average run length (ARL) and the operating characteristic
curve, also known as an OC curve. We will discuss both the ARL and the OC
curve.
ARL
Definition 3.2
control chart.
A run is a number of successive points plotted in a
Definition 3.3 An average run length is the average number of

points plotted before a point falls outside the control limits, indicating the process is out of control.
In Shewhart control charts, the ARL can be determined by using the
formula
1
ARL = ,
p
(3.1)
where p is the probability that any point will fall outside the control limits. It
is quite common to use ARL as a benchmark for checking the performance
of a control chart.
To illustrate, consider
a process quality characteristic that is normally
distributed. For an X control chart with 3 control limits, the probability that
a point will fall outside the control limits when the process is stable is p =
0.0027, which is the probability that a normal
random variable deviates from
the mean by at least 3. The ARL for the X control chart when the process
is stable is
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58
Chapter Three
ARL 0 =
1
= 370.
0.0027
In other words, when the process is stable, we should expect that, on the
average, an out-of-control signal or false alarm will occur once in every 370
samples. The ARL can also be used to determine how often a false alarm will
occur, simply by multiplying the ARL0 by the time t between the samples.
For example, if samples are taken every 30 minutes, a false alarm will occur
on the average once every 185 hours. On the other hand, ARL can be used
in the same manner to find out how long it will take before a given shift in
the process mean is detected. This concept, which we are going to discuss
in
depth in section 3.3, is illustrated in the following example using an X control

chart.
Example 3.2 Suppose a process quality characteristic that is normally
distributed is plotted in a Shewhart X control chart with 3 control limits.

Suppose that the process mean 0 experiences an upward shift of 1.5. Determine how long, on the average, it will take to detect this shift if a sample of
size four is taken every hour.
Solution: Because the process mean has experienced an upward shift of
1.5, the new process mean will be 0 + 1.5. Furthermore, because the sam
= 0 + 1.5 .
ple size is four, the UCL in this case is also 0 + 3 x = 0 + 3
4
In other words, the CL of the control chart will coincide with the UCL. The
probability p that a point will fall beyond the control limits is
p = P ( z 6) + P ( z 0)
0.00000 + 0.5
= 0.5.
Consequently, the ARL is given by
ARL =
1
= 2.
0.5
Therefore, it will take an average of two hours to detect a shift of 1.5 in the
process mean.
In practice, the decision of how large the samples should be and how
frequently they should be taken is based on the cost of taking samples and
how quickly one would like to detect the shift. Large samples taken more
frequently would certainly give better protection against shifts because it will
take less time to detect any given shift. For instance, in Example 3.2, if the
samples are taken every half hour instead of every hour, then it will take
only one hour instead of two to detect the shift of 1.5, and the process will
produce fewer nonconforming units. So, when calculating the cost of taking
samples, one must consider how much money will be saved by detecting the
shift more quickly and producing fewer nonconforming units.
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OC Curve
Definition 3.4 The operating characteristic curve is a graph of the
probability ( ) of a point falling within the control limits versus the
process shift.
A set of OC curves for the X chart with 3 limits for different sample
sizes n is shown in Figure 3.9. Note that the scale on the horizontal axis is in
process standard deviation .
By carefully studying the OC curves in Figure 3.9, we see that:
1. For a given sample size n and , where is the probability of a
point exceeding the control limits when the process is stable, a
larger shift corresponds to a smaller probability .
2. With a larger sample size, there is a smaller probability ( ) for
a given process shift.
For a detailed discussion of the construction of the OC curve, refer to the first
volume of this series, Applied Statistics for the Six Sigma Green Belt.
As mentioned earlier, OC curves are very helpful in determining the sample size needed to detect a shift of size d with a given probability (1 ). For
example, if we want to determine the sample size required to detect a shift of
1.0
0.9
0.8
n = 20
n = 10
0.7
0.6
n=5
n=4
n=3
n=2
n=1
0.5
0.4
0.3
0.2
0.1
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
Process shift
Figure 3.9
H1277 ch03.indd 59
OC curves for the x chart with 3 limits for different sample sizes n.
3/8/07 5:39:01 PM
60
Chapter Three
1 with probability 95 percent, from Figure 3.9, with d = 1 and = 0.05, we

find the size n will be slightly higher than 20.
Having studied some basic concepts of control charts, we now discuss
some special control charts that are very popular and useful in any industry,
manufacturing or nonmanufacturing.
3.3.1
Shewhart X and R Control Charts
Certain rules are widely followed in preparing Shewhart X and R control charts:
1. Take a series of samples from the process under investigation.
Samples consisting of four or five items taken frequently are
usually good, for the following reasons:
a. Samples of size four or five are more cost effective.
b. If samples are larger than 10, the estimate of process
standard deviation obtained using the range is not very
efficient. Moreover, the R chart is also not very effective.
c. With samples of size four or five, there are fewer chances
for any special causes occurring during the collection of a
sample. It is commonly known that if the type of variation
is changing (special cause vs. common cause variation), the
sample size should be as small as possible so that the average
of samples does not mask the changes.
2. Enough samples should be collected so that the major source
of variation has an opportunity to occur. Generally, at least 25
samples of size four or five is considered sufficient to give a
good test for process stability.
3. During the collection of data, a complete log of any changes
in the process, such as changes in raw materials, operators, or
tools or any calibration of tools, machines, and so on, must be
maintained. Keeping a log is important for finding the special
causes in a process.
Calculation of Sample Statistics
The
sample statistics that need to be determined in order to prepare Shewhart
X and R control charts are the sample mean (x) and the sample range (R). For
example, let x1, x2, . . . , xn be a random sample from a process that is under
investigation. We have
x1 + x 2 + ... + x n
,
n
(3.2)
R = max ( xi ) min ( xi ).
(3.3)
x=
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Example 3.3 Let 5, 6, 9, 7, 8, 6, 9, 7, 6, and 5 be a random sample from

a process under investigation. Find the sample mean and the sample range.
Solution: Using these data, we have
5+6+9+ 7+8+6+9+ 7+6+5
= 6.8,
10
R = max ( xi ) min ( xi ) = 9 5 = 4.
x=
Calculation of Control Limits

Step 1. First, calculate xi and Ri for the ith sample, for i = 1,
2, 3, . . . , m, where m is the number of samples collected
during the study period.
Step 2. Calculate
R=
R1 + R2 + ... + Rm
,
m
(3.4)
x1 + x 2 + ... + x m
.
m
(3.5)
x=
Step 3. Calculate the 3 control limits for the X control chart

UCL = x + 3 x
= x +3
= x +3
(3.6)
R
d2 n
= x + A2 R ,
(3.7)
CL = x ,
LCL = x 3 x
= x 3
= x 3
R
d2 n
(3.8)
= x A2 R ,
where the values of A2 and d2 for various sample sizes are given in Table A.2.
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62
Chapter Three
Note: Instead of calculating 3 limits (common in the United States), we

can also calculate the probability limits (common in Europe) at the desired
level of significance simply by replacing 3 with z/2 in equations (3.6) and
(3.8). Thus, the control limits will be
UCL = x + z / 2
= x + z/2
LCL = x z / 2
= x z/2
n
R
d2 n
(3.9)
,
n
R
d2 n
(3.10)
.
Step 4. Calculate the control limits for the R control chart

UCL = R + 3 R
= R + 3d3
= (1 + 3
R
d2
(3.11)
d3
)R
d2
= D4 R ,
(3.12)
CL = R,
LCL = R 3 R
= R 3d3
R
d2
(3.13)
d
= (1 3 3 ) R
d2
= D3 R ,
where the values of D3 and D4 for various sample sizes are given in Table A.2.
The first implementation of control charts is referred to as phase I. In phase I
it is important that we calculate the preliminary control limits, which allows us
to find the extent of variation in sample means and sample ranges if the process is stable. In other words, at this point only common causes would affect
the process. If all the plotted points fall within the control limits and there is
no evidence of any pattern, then the control limits are suitable for a current or
future process. However, if some points exceed the control limits, then such
points are ignored and every effort is made to eliminate any evident special
causes present in the process. Fresh control limits are then calculated by using
the remaining data, and the whole process is repeated again. Remember that
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ignoring the points that exceed the control limits without eliminating the special causes may result in unnecessarily narrow control limits, which may lead
to putting the points beyond the control limits when, in fact, they should not
be. Furthermore, it is highly recommended that for preliminary control limits,
25 samples of size four or five should be used. Otherwise, the control limits
may not be suitable for the current and future process.
Example 3.4 Table 3.4 provides data on the diameter measurements of
ball bearings used in the wheels of heavy construction equipment. Twentyfive samples, each of size four, are taken directly from the production line.
Samples come from all three shifts, and no sample contains data from more
than one shift. Use these data to construct X and R charts and to verify that
the process is stable.
Table 3.4 Diameter measurements (in mm) of ball bearings used in the wheels of
heavy construction equipment.
R
Sample
Observations
x
i
H1277 ch03.indd 63
15.155
15.195
15.145
15.125
15.155
0.070
15.095
15.162
15.168
15.163
15.147
0.073
15.115
15.126
15.176
15.183
15.150
0.068
15.122
15.135
15.148
15.155
15.140
0.033
15.148
15.152
15.192
15.148
15.160
0.044
15.169
15.159
15.173
15.175
15.169
0.016
15.163
15.147
15.137
15.145
15.148
0.026
15.150
15.164
15.156
15.170
15.160
0.020
15.148
15.162
15.163
15.147
15.155
0.016
10
15.152
15.138
15.167
15.155
15.153
0.029
11
15.147
15.158
15.175
15.160
15.160
0.028
12
15.158
15.172
15.142
15.120
15.148
0.052
13
15.133
15.177
15.145
15.165
15.155
0.044
14
15.148
15.174
15.155
15.175
15.155
0.027
15
15.143
15.137
15.164
15.156
15.150
0.027
16
15.142
15.150
15.168
15.152
15.153
0.026
17
15.132
15.168
15.154
15.146
15.150
0.036
18
15.172
15.188
15.178
15.194
15.183
0.022
19
15.174
15.166
15.186
15.194
15.180
0.028
20
15.166
15.178
15.192
15.184
15.180
0.026
21
15.172
15.187
15.193
15.180
15.183
0.021
22
15.182
15.198
15.185
15.195
15.190
0.016
23
15.170
15.150
15.192
15.180
15.173
0.042
24
15.186
15.194
15.175
15.185
15.185
0.019
25
15.178
15.192
15.168
15.182
15.180
x = 15.1628
0.024
R = 0.03479
3/8/07 5:39:02 PM
64
Chapter Three
Solution: From Table A.2 for a sample of size n = 4, we have D3 = 0 and D4

= 2.282. Thus, the control limits for the R chart are
LCL = D3 R = 0 0.03479 = 0,
UCL = D4 R = 2.282 0.03479 = 0.07936.
It is customary to prepare the R chart first and verify that all the plotted
points
fall within the control limits, and only then proceed to construct the X chart. In
fact, the concept of bringing the process variability under control first and then
proceeding to control the average does make a lot of sense. This is because it is
almost impossible to bring the process average under control without controlling the process variability.
The R chart for the preceding data is given in Figure 3.10, which shows
that all the plotted points fall within the control limits and that there is no
evidence of any special pattern. Therefore, we may conclude that the only
variation present in the process is due to common
causes. In this case, we can
proceed to calculate the control limits for the X chart. From Table A.2 for a
sample of size n = 4, we get A2 = 0.729. We have
LCL = x A2 R = 15.1628 0.729 0.03479 = 15.13746,
UCL = x + A2 R = 15.1628 + 0.729 0.03479 = 15.18814.
The X chart for these data is given in Figure 3.10, which shows that point 22
exceeds the UCL. Moreover, there are too many consecutive points that fall
below the CL. This indicates that the process is not under control and that
there are some special causes present that are affecting the process average.
A thorough investigation should be launched to find the special causes, and
appropriate action should be taken to eliminate them before recalculating the
control limits for an ongoing process.
A process is considered out of control not only when the points exceed
the control limits, but also when the points show patterns of nonrandomness.
The Western Electric Statistical Quality Control Handbook (1956, 27) gives
a set of decision rules for determining nonrandom patterns on control charts.
In particular, it suggests the patterns are nonrandom if:
1. Two out of three successive points exceed the 2 warning limits
2. Four out of five successive points fall at a distance of 1 or
beyond from the CL
3. Eight successive points fall on one side of the CL
4. Seven successive points run either upward or downward
3.3.1.1 Interpretation of Shewhart X and R Control Charts

We should investigate any out-of-control pointsthat is, points on or beyond
the 3 control limitsor
any patterns of nonrandomness on the R chart before
interpreting the X chart. As discussed earlier, the reason for doing this is simple. It is not possible to bring the average under control without first bringing
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Xbar Chart
UCL = 15.18814
Sample Mean
15.18
X = 15.1628
15.16
15.14
LCL = 15.13746
2
10
12
14
Sample
16
18
20
22
24
R Chart
UCL = 0.07936
Sample Range
0.08
0.06
0.04
R = 0.03479
0.02
LCL = 0
0.00
2
Figure 3.10
10
12
14
Sample
16
18
20
22
24
The X and R control charts, constructed using MINITAB, for the ball bearing data in Table 3.4.
the variability under control. Normally the X chart is placed above the R chart,
and they are aligned with each other in such a manner that the average and the
range for any sample are plotted on the same vertical line. Examine whether
one, both, or neither chart indicates that the process is out of control for any
given sample. If any point exceeds the control limits in either or both charts,
then the sample did not come from a stable process. In other words, there are
some special or assignable causes present in the system. More precisely, if
the plotted point exceeds the control limits in the R chart, it is evident that the
variability of the process has changed. But before a full-blown investigation
is launched, some preliminary checks should be made:
1. Check that all calculations are correct or that the data are
entered in the computer correctly.
2. Check whether there is any change in workers, machines, or the
supplier of raw materials.
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66
Chapter Three
If the points exceed the control limits in the X chart, then the process mean
has changed. Again, follow the preliminary checks before launching an
investigation.
If points exceed the limits in both the X chart and the R chart, this usually
indicates that a sudden shift has occurred in the lot from which the samples
were taken. In such cases, after making the preliminary checks, there should
be an investigation concentrating on the period during which that lot was
produced. Depending on the process, stopping production until the special
causes are detected should be considered.
In addition to points exceeding the control limits, nonrandom patterns
such as a run of seven points moving upward or downward, or a run of eight
successive points falling above or below the CL should be checked.
An upward run or a run above the CL in an R chart indicates:
1. A greater variability or a tendency of perpetuating a greater
variability in the output of the process is occurring. This may be
due to new material of undesirable low quality or a difference
between the shifts. Immediate attention to detect special causes
is warranted.
2. The measurement system has changed.
A downward run or a run below the CL in an R chart indicates:
1. A smaller variability or a tendency of perpetuating a smaller
variability in the output of the process is occurring. This is
usually a good sign for the process. A thorough investigation
should be made so that similar conditions are maintained as
long as possible. Similar conditions should be implemented
elsewhere in the process.
A run relative to an X chart indicates:

1. The process average has changed or is still changing.
3.3.1.2 Extending the Current Control Limits for Future Control
If current data from at least 25 sample periods are contained within the current control limits, we may use these limits to cover future periods. However,
these limits are used for future periods on the condition that immediate action
will be taken if any out-of-control indication appears or if the points consistently fall very close to the CL. The latter case indicates that the process has
improved and that new control limits should be recalculated. Again, note that
in any case, control limits for future use should be extended for only 25 to 30
sample periods at a time.
It is pertinent tonote that a change in sample size will affect the control
limits for both the X chart and the R chart; therefore, whenever there is a
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change in sample size, new control limits should be recalculated. This situation may arise if it is decided to take smaller samples more frequently, which
usually is the case when one wants to catch larger shifts (larger than 1.5)
without increasing the total number of parts sampled over the whole sampling period. Another scenario is when it is decided to increase the sample
size but sample less frequently, which usually is the case when one wants to
catch smaller shifts (shifts of 1.5 or smaller). To recalculate the new control
limits, proceed as follows:
1. Estimate the process standard deviation using the existing
sample size
=
R
,
d2
(3.14)
where R is the sample range average for the period with ranges
in control, and the value of d2 is found in Table A.2 for the
existing sample size.
2. Using the values for d2, D3, D4, and A2 from Table A.2 for the
new sample size, calculate the new range and control limits as
follows:
Estimate the new sample range average, that is,
Rnew = d 2 .
Then the new control limits for the X control chart are
(3.15)
LCL = x A2 Rnew ,
CL = x ,
(3.16)
UCL = x + A2 Rnew ,
and the new control limits for the R control chart are
LCL = D3 Rnew ,
CL = Rnew ,
(3.17)
UCL = D4 Rnew .
Example 3.5 To illustrate the technique of calculating the new control limits, consider the X and R control charts developed for the ball bearing data
in Example 3.4. The chartsin Figure 3.10 are based on a sample size of four.
Because one point in the X chart exceeded the control limit, there may be
a small shift in the process mean. Thus, the Six Sigma Green Belt wants to
increase the sample size to six. Determine
the control limits required for the
new samples of size six for both the X chart and the R chart.
Solution: From Table A.2 for n = 4, d2 = 2.059. From Example 3.4 and
using equation (3.14), we have
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68
Chapter Three
R 0.03479
=
= 0.0169.
2.059
d2
Again, from Table A.2 for n = 6, d2 = 2.534. Using equation (3.15), we have
Rnew = 2.534 0.0169 = 0.0428246.
The new control limits for the X control chart for samples of size six are
LCL = 15.1628 0.483 0.0428246 = 15.1421,
CL = 15.1628,
UCL = 15.1628 + 0.483 0.0428246 = 15.18348.
The new control limits for the R control chart for samples of size six are
LCL = 0 0.0428246 = 0,
CL = 0.0428246,
UCL = 2.004 0.00428246 = 0.08582.
Note that the net result of increasing the sample size is to narrow the control
limits for the X chart and to move the CL and the control limits for the R chart
higher. This is because the expected range value for the larger sample increases.
In this example, however, the LCL for the R chart remains the same because the
value of D3 for sample sizes four and six is zero.
3.3.2 Shewhart X and R Control Charts When Process

Mean and Process Standard Deviation Are Known
If the
process mean and the process standard deviation are known, then
the X chart and the R chart are developed as follows:
Step 1. Calculate xi and Ri for the ith sample for i = 1, 2, 3, . . . ,
m, where m is the number of samples collected during the
study period.
Step 2. Calculate the control limits for the X control chart

UCL = + 3
,
n
CL = ,
LCL = 3
(3.18)
(3.19)
.
n
(3.20)
Note: Instead of calculating 3 limits, we can also calculate

the probability limits at the desired level of significance
simply by replacing 3 with z/2 in equations (3.18) and (3.20).
H1277 ch03.indd 68
3/8/07 5:39:03 PM
Step 3. Calculate the control limits for the R control chart.

Recalling that = R/d2 and R = d3, we have
UCL = d 2 + 3 R
= d 2 + 3d3
= (d 2 + 3d3 )
(3.21)
= D2 ,
CL = ,
(3.22)
LCL = d 2 3 R
= d 2 3d3
= (d 2 3d3 )
(3.23)
= D1 ,
where the values of D1 and D2 for various sample sizes are given in Table A.2.
3.3.3 Shewhart Control Chart for Individual Observations
Sometimes it is necessary to study SPC using individual observations only
because it may not be feasible to form rational subgroups of size greater than
one. This scenario, for example, would arise when:
1. Sampling is very expensive and it is not economical to take
samples of size greater than one.
2. Observations are collected through experimentation and it may
take several days or weeks to take one observation.
3. The circumstances warrant that each unit must be inspected or
the process is completely automated, so that the measurement
on each observation can be taken without much extra expense.
4. Only a few units are produced each day and the difference is
between the units and not within the units, so one observation
from each unit is sufficient.
5. Sampling is destructive and the units are very expensive. For
example, certain bulbs for projectors are very expensive. If we
want to study the life of such bulbs, then collecting the data will
cause the bulbs to be destroyed.
The control charts for individual observations are very similar to X and R control charts. However, in the case of individual observations, because the sample contains only one observation, it is not possible to find the sample range in
the usual manner. Instead, we find the sample range as the absolute difference
between the two successive observations. This type of sample range is usually
known as the moving range (MR), that is,
H1277 ch03.indd 69
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70
Chapter Three
MR k = x k x k 1 ,
(3.24)
where k = 2, 3, . . . , n; n is the total number of observations. Instead of

using the sample means xi, the individual observations xi are used. Note that
sometimes the control chart for individual observations is also known as an
individual moving range control chart, or simply an IMR control chart. To
illustrate construction of an IMR control chart, we reproduce observations of
column 1 of Table 3.4 in Table 3.5.
Example 3.6 Use the ball bearing data in Table 3.5 to construct the X
(individual) and R control charts.
Table 3.5
H1277 ch03.indd 70
Diameter measurements (in mm) of ball bearings used in the wheels of

heavy construction equipment.
Sample
Observation
15.155
15.095
0.060
15.115
0.020
MRk
15.122
0.007
15.148
0.026
15.169
0.021
15.163
0.006
15.150
0.013
15.148
0.002
10
15.152
0.004
11
15.147
0.005
12
15.158
0.011
13
15.133
0.025
14
15.148
0.015
15
15.143
0.005
16
15.142
0.001
17
15.132
0.010
18
15.172
0.040
19
15.174
0.002
20
15.166
0.008
21
15.172
0.006
22
15.182
0.010
23
15.170
0.012
24
15.186
0.016
25
15.178
x = 15.1528
0.008
R = 0.01387
3/8/07 5:39:03 PM
Solution: Because the sample range is determined from two successive

observations, the sample size for estimating the process standard deviation and for constructing the R chart is considered to be equal to two. From
Table A.2 for n = 2, we have D3 = 0 and D4 = 3.269. The control limits for
the R chart are
LCL = D3 R = 0.01387 = 0,
UCL = D4 R = 3.269 0.01387 = 0.00453.
As in the case of the X and R charts, it is customary to prepare the R chart first
and verify that all the plotted points fall within the control limits, and only
then proceed to construct the X chart.
The R chart for the preceding data is given in Figure 3.11, which shows
that process variability is not under control, because the first point exceeds
the UCL, and point 16 is almost on the LCL. As a matter of principle, we
should investigate the special causes of this variability and eliminate such
causes before we construct the X chart. We assume here, for illustration, that
these special causes have been detected and eliminated, and therefore we proceed to calculate the control limits for the X chart. Note that in practice, these
MR-Control Chart
UCL = 15.1897
Individual Value
15.18
15.16
X = 15.1528
15.14
15.12
LCL = 15.1159
15.10
2
10
12
14
Observation
16
18
20
22
24
Moving Range
0.060
UCL = 0.04533
0.045
0.030
0.015
R = 0.01387
0.000
LCL = 0
2
Figure 3.11
H1277 ch03.indd 71
10
12
14
Observation
16
18
20
22
24
The MR control chart, constructed using MINITAB, for the ball bearing data in Table 3.5.
3/8/07 5:39:03 PM
72
Chapter Three
observations should be ignored after detecting and eliminating the special

causes, and the control limits should be recalculated. Again, from Table A.2
for a sample of size n = 2, we get d2 = 1.128. Thus, we have
LCL = x 3 = x 3
R
0.01387
= 15.1528 3
= 15.1159,
d2
1.128
UCL = x + 3 = x + 3
R
0.01387
= 15.1528 + 3
= 15.1897.
d2
1.128
Notice, however,
there is little difference in how we compute the control
limits for the X chart and the X chart. For calculating the control limits of the
X chart, we always use sample size n = 1. In other words, we do not use the
sample size n = 2 or the control limits as x 3 2 ; rather, we simply use
the control limits as x 3 because n = 2 is used only for determining the
control limits of the R chart and for estimating . The X chart for the preceding data is given in Figure 3.11, which shows that points 2 and 3 fall below
the LCL. Moreover, there are too many consecutive points that fall above
the CL. This indicates that the process is not under control and that there are
some special causes present that are affecting the process average. Therefore,
a thorough investigation should be launched to find the special causes, and
appropriate action should be taken to eliminate them.
Note: There are some limitations of using Shewhart charts for individual
observations.
If the process characteristic is nonnormal, the rules applicable
to the X chart may not hold for the X chart, because x usually behaves like normal as a result of the central limit theorem, even if the process distribution is
not normal. This would not be true for individual observations. Therefore, in
such cases the X charts may give signals of special causes when they are not
actually present. Also, note that the ranges are not independent, because the
two adjacent ranges have a common point. Hence a run of successive points
falling near or beyond the control limits does not have the same significance
as in an ordinary control chart. For more detailed discussion on this topic, we
recommend Montgomery (2005b), an excellent source.
3.3.4 Shewhart X and S Control Charts
The X and S control charts, similar to the X and R control

charts, are devel
oped from measured process output data, and both X and S charts are used
together. The standard deviation s is usually a more efficient indicator of process variability than the range, particularly when the sample sizes are large
(10 or greater). The sample standard deviation s for the S chart is calculated
using all the data points rather than just the maximum and minimum values
in a data set, as is done for the R chart. S charts are usually preferred over R
charts when:
The sample is of size 10 or larger
The sample size is variable
The process is automated so the s for each sample can be easily
calculated
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The sample standard deviation s is determined using the formula

2
n
1
1 n
2
x x .
s=
(3.25)
n 1 i =1 i n i =1 i
The control limits for the X and S control charts are determined as shown in
the following section.
Calculation of Control Limits

Step 1. First, calculate xi and si for the ith sample, for i = 1,
2, 3, . . . , m, where m is the number of samples collected
during the study period.
Step 2. Calculate
s=
s1 + s2 + ... + sm
,
m
x1 + x 2 + ... + x m
.
m
Step 3. Calculate the control limits for the X chart

x=
UCL = x + 3
= x +3
(3.26)
(3.27)
n
s
(3.28)
c4 n
= x + A3 s ,
(3.29)
CL = x ,
LCL = x 3
= x 3
n
s
(3.30)
c4 n
= x A3 s ,
where the values of A3 and c4 for various sample sizes are given in Table A.2.
Note: Instead of calculating 3 limits, we can also calculate the probability limits at the desired level of significance simply by replacing 3 with z/2
in equations (3.24) and (3.25). Thus, the control limits will be
UCL = x + z / 2
n
(3.31)
s
= x + z/2
,
c4 n
H1277 ch03.indd 73
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74
Chapter Three
(3.32)
CL = x ,
LCL = x z / 2
= x z/2
n
s
c4 n
(3.33)
.
Step 4. Calculate the control limits for the S chart

UCL = s + 3 s
= s +3
s
1 c42
c4
= 1 + 3
1 c42 s
c4
(3.34)
= B4 s ,
CL = s ,
(3.35)
LCL = s 3 s
= s 3
s
1 c42
c4
= 1 3
1 c42 s
c4
(3.36)
= B3 s .
The development of the X and S control charts is illustrated in the following

example.
Example 3.7 Use the ball bearing data in Table 3.4 to construct the X and
S control charts.
Solution: From Table A.2 for a sample of size n = 4, we have B3 = 0 and B4
= 2.266. Thus, the control limits for the S control chart are
LCL = B3 s = 0 0.01557 = 0,
UCL = B4 s = 2.266 0.01557 = 0.03527.
It is customary to prepare the S control chart first and verify that all the plotted
points fall within the control limits, and only then do we construct the
X control chart. As described earlier, the concept of first bringing the process variability under control and then proceeding to control the average does
make a lot of sense because without controlling the process variability, it is
impossible to bring the process average under control.
The S chart for the preceding data is given in Figure 3.12, which shows
that points 2 and 3 almost coincide with the UCL. Moreover, point 17 is
H1277 ch03.indd 74
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Xbar Chart
UCL = 15.18814
Sample Mean
15.18
X = 15.1628
15.16
15.14
LCL = 15.13746
2
10
12
14
Sample
16
18
20
22
24
S Chart
0.04
Sample StDev
UCL = 0.03572
0.03
0.02
S = 0.01557
0.01
LCL = 0
0.00
2
Figure 3.12
10
12
14
Sample
16
18
20
22
24
The X and S control charts, constructed using MINITAB, for the ball bearing data in Table 3.4.
almost on the CL. If this point were clearly below the CL, we would have
had a run of nine points below the CL. These observations indicate that the
process variability is marginally under control, and therefore, the process
should be carefully monitored. Because the process variability is under control,
albeit marginally, we can proceed to calculate the control limits for the
X chart. From Table A.2 for a sample of size n = 4, we get A3 = 1.628. Thus,
we have
LCL = x A3 s = 15.1628 1.628 0.01557 = 15.13746,
UCL = x + A3 s = 15.1628 + 1.628 0.01557 = 15.13746.
The X chart for the data in Table 3.4 is given in Figure 3.12, which shows
that point 22 exceeds the UCL. Moreover, there are too many consecutive
points that fall below the CL. This indicates that the process is not under
control and that there are some special causes present that are affecting the
process average. Thus, a thorough investigation should be launched to find
the special causes, and appropriate action should be taken to eliminate them
before we proceed to recalculate the control limits for an ongoing process.
H1277 ch03.indd 75
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76
Chapter Three
3.3.4.1 Shewhart X and S Control Charts

When Sample Size Is Variable
Sometimes it is not
cases
possible to select samples of the same size. In such
we construct the X and S control charts by using the weighted mean

x
and
the
square root of the pooled estimator s2 of 2 as the CLs for the X and S charts,
respectively. The upper and lower control limits are calculated for individual
samples. For example, if the sample sizes are n1, n2, n3, . . . , nm, then the
weighted mean x and the pooled estimator s2 are given by

m
ni xi
i =1
m
x=
ni
ni xi
i =1
(3.37)
i =1
s = s2 =
(ni 1)si2
i =1
m
(ni 1)
(ni 1)si2
i =1
N m
(3.38)
i =1
where N = n1 + n2 + n3 + . . . + nm; m is the number of samples selected during

the study period.
The control limits for the X and S charts are given by

UCL x = x + A3si ,
(3.39)
LCL x = x A3si ,
(3.40)
UCL s = s + B4 si ,
(3.41)
LCL s = s B3si ,
(3.42)
and
respectively. The values A3, B3, and B4 depend on the individual sample sizes.
To illustrate the development of these charts, we use the data presented in
Example 3.8.
Example 3.8 A manufacturing process produces piston rings with a finished inside diameter of 9 centimeters and a standard deviation of 0.03 centimeter. From this process, 30 samples of variable sizes are carefully selected
so that no sample comes from two machines or two shifts. In other words,
every effort is made to ensure that no sample
masks any special causes. The
data are shown in Table 3.6. Construct X and S control charts for these data
H1277 ch03.indd 76
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and plot all the points in the X and S charts to determine whether the process
is stable.
Solution: Using equations (3.37) and (3.38) and the data given in Table
3.6, we get
x = 9.0002, s = 0.02812.
Now using equations (3.39)(3.42), the control limits for both X and S control charts, shown in Figure 3.13, are calculated. From Figure 3.13
we see
that process variability is under control; however, point 19 in the X chart falls
below the LCL, which implies that some special causes affecting the process
mean are present in the process.
Xbar Chart
Sample Mean
9.050
UCL = 9.0276
9.025
9.000
X = 9.0002
8.975
LCL = 8.9728
8.950
2
10
12
14
Sample
16
18
20
22
24
S Chart
Sample StDev
0.060
0.045
UCL = 0.04826
0.030
S = 0.02812
0.015
LCL = 0.00798
0.000
2
Figure 3.13
H1277 ch03.indd 77
10
12
14
Sample
16
18
20
22
24
The X and S control charts for variable sample sizes, constructed using MINITAB, for the
piston ring data in Table 3.6.
3/8/07 5:39:05 PM
H1277 ch03.indd 78
9.01759
9.00974
8.97809
9.04504
9.04544
8.98229
9.02982
9.01322
8.99775
8.98140
8.94018
8.96117
9.02374
8.94363
8.99341
9.02781
8.96783
8.98993
8.95677
9.01965
8.97892
8.99523
9.05596
9.03412
9.00277
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
9.00651
8.97335
9.02182
9.00044
8.98553
9.00524
9.00000
8.97726
8.94662
9.02093
9.02318
9.00214
8.99673
9.00420
9.06380
8.99443
9.02773
8.99716
9.00707
9.02346
8.95615
8.99329
8.98972
8.95902
8.97730
9.02906
9.00136
8.94953
9.02239
9.01042
9.02506
8.98083
8.97231
9.02595
8.97963
8.96106
8.97526
8.96257
9.02410
8.97868
8.99374
8.99505
8.98482
9.00735
8.98103
9.00747
8.99112
8.97877
9.02650
9.02472
8.97863
9.08037
9.03914
8.93990
8.97291
8.99299
8.97502
8.93709
9.07156
8.98019
9.00023
8.98661
8.99945
9.06514
9.01246
9.05063
9.00820
8.92890
8.96042
8.97341
8.99861
9.01239
9.01464
8.97163
9.03616
8.99956
9.04301
8.97235
8.96644
9.01599
8.95167
8.93080
8.97035
9.02688
9.01428
9.01309
9.02040
9.01848
8.97921
8.96870
9.00155
9.03221
9.03727
8.97471
8.96475
8.99077
8.97850
9.00623
9.04754
9.05257
8.99291
8.97701
9.00869
8.99666
8.98578
8.94690
8.96499
8.96584
9.03871
8.95582
9.02238
9.02770
9.02223
8.99593
9.03501
8.94485
8.96801
8.94890
9.00518
9.03892
8.97543
8.98055
9.05096
9.00121
Observations
The finished inside diameter measurements (in cm) of piston rings.
Sample #
Table 3.6
8.97211
9.02727
9.01031
8.96103
9.03979
8.98951
8.99007
9.03058
8.96735
9.02901
8.98201
9.04670
8.98242
9.02173
8.99009
8.99561
8.98887
8.97958
9.00877
9.00361
9.02725
9.03449
9.01371
9.00742
8.96032
9.01304
8.99283
9.00383
9.02577
9.03164
8.98401
9.02050
8.98418
9.02115
9.03749
8.98826
8.97847
8.99326
8.99202
9.06247
9.02029
8.94999
9.04678
8.95438
9.01795
8.96140
9.05866
9.03710
9.03646
9.01492
9.00215
9.01754
9.00865
9.01016
9.00595
9.05982
78
Chapter Three
3/8/07 5:39:05 PM
Note: If the sample sizes do not vary too much, then it is quite common to
use the average sample size n ( n = (n1 + n2 + n3 + ... + nm ) / m) instead of using
the variable sample sizes. As a rule of thumb, if all the samples are within 20
percent of the average sample size n, then it is quite reasonable to use the average
sample size instead of variable sample sizes. However, if any point(s) in the
X or S charts fall on or very close to the control limits, then it is prudent to recalculate the control limits, at least for that sample using the actual sample size,
and determine whether that point falls within the control limits. If the point falls
on or exceeds the recalculated control limits using the actual sample size, then
the process is deemed unstable; otherwise, the process is considered stable.
3.4 Process Capability

In this section we will briefly study the concept of process capability, and in
Chapter 6 we will study how to quantify it. So far, our emphasis has been on
how to build a quality characteristic in a given product, and we have measured
everything in terms of the control limits. But it is a well-known fact that a
quality characteristic of a product is usually evaluated in terms of the specification limits, which are often determined by the customer. It is of paramount
importance to understand, however, that the control limits and the specification limits are two entirely different entities. The control limits, as we saw
earlier in this chapter, are determined by the natural variability of the process,
whereas specification limits are determined by the customer, by management,
or by the design department. Specification limits are usually defined in terms
of the expectations of how a product should perform, whereas control limits
are the means to achieve these expectations. A process that produces a product that meets the expectations is called a capable process.
The expected value of a quality characteristic is called the target value.
The largest and smallest acceptable values of a quality characteristic are
known as the upper specification limit (USL) and the lower specification
limit (LSL), respectively. The upper and lower control limits used in X and R
charts for individual values are usually known as the upper natural tolerance
limit (UNTL) and the lower natural tolerance limit (LNTL), respectively. It
is important to note that there is no direct relationship between the control
limits and the specification limits.
It is very common to examine the capability of a process only after it is
stable. However, it is also important to note that a stable process is not necessarily a capable process. A visual presentation of this scenario is given in
Figure 3.14.
To further illustrate the concept of process capability, we use the following example.
Example 3.9 Consider a quality characteristic of a process that is normally distributed, and suppose that the process is stable with respect to the
3 control limits. Furthermore, suppose that 30 samples of size five from this
process provide the following summary statistics:
x = 0.740, R = 0.175, n = 5.
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80
Chapter Three
(a)
LNTL
LSL
USL
UNTL
(b)
LNTL
LSL
UNTL
USL
(c)
LSL
LNTL
Figure 3.14
H1277 ch03.indd 80
UNTL
USL
Three illustrations of the concept of process capability, where (a) shows a

process that is stable but not capable, (b) shows a process that is stable
and barely capable, and (c) shows a process that is stable and capable.
3/8/07 5:39:05 PM
Also, we are given that LSL = 0.520 and USL = 0.950. Determine whether
the process is capable.
Solution: From the given information, we have
=
R 0.175
=
= 0.075,
d 2 2.326
0.520 0.740
= 2.93,
0.075
0.950 0.740
= 2.80.
zUSL =
0.075
Therefore, the percentage of nonconforming is
P ( z 2.93) + P ( z 2.80) = 0.0017 + 0.0026
zLSL =
= 0.0043.
That is, less than 0.5 percent of the product is outside the specification limits.
In other words, the process is almost capable.
From Example 3.9, it can be seen that if the specification limits are narrower, then the percentage of nonconforming will increase. On the other hand,
if the specification limits remain the same but the process standard deviation
becomes smaller, then the percentage of nonconforming will further reduce;
that is, the percentage of a conforming product will be higher. So, to make
the process more capable and continuously improve it, one should not only
eliminate the special causes but also make full effort to eliminate the common causes and consequently reduce the process standard deviation. In order
to eliminate the common causes, one must make use of the statistical techniques available in DOE, which we will discuss in our next volume.
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4
Phase I (Detecting Large
Shifts)SPC: Control
Charts for Attributes
s noted in the previous chapter, quality characteristics are usually of

two types: variables and attributes. In Chapter 3, we studied control
charts for variables for detecting large shifts. However, not all quality characteristics can be numerically measured. For example, we may be
interested in finding out whether the new-car paint meets the specifications in
terms of shine, uniformity, and scratches. In this example we cannot quantify
the shine, the blemishes, or the scratches. In other words, we cannot numerically measure the shine, the uniformity, or the scratches; consequently, to
study the quality of paint on new cars, we cannot use control charts for variables. This type of situation sometimes arises when a quality characteristic
is measurable, but because of cost, time, or both, we do not want to take the
measurements. Rather, we may prefer to use a more economical method,
such as a go or no-go gauge. Therefore, it is important that we study control charts appropriate for quality characteristics that cannot be numerically
measured. Such control charts are called control charts for attributes. In this
chapter, we will study various control charts for attributes for detecting large
shifts, which usually occur in phase I implementation of SPC.
4.1 Control Charts for Attributes

When a quality characteristic cannot be numerically measured, we classify
such product as defective or nondefective. In SPC it has become more common to use the terminology conforming or nonconforming instead of nondefective or defective. Throughout this book, we shall use conforming or
nonconforming.
Definition 4.1 A quality characteristic that classifies any product
as conforming or nonconforming is called an attribute.
83
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84
Chapter Four
For instance, quality characteristics such as the determination that a soda

can is not leaking, a stud has regular edges, a rod fits into a slot, a 100-watt
lightbulb meets the desired standard, and a steel rivet meets the manufacturers quality specifications are examples of attributes. Note that the data
collected on a quality characteristic that is an attribute are simply count data.
Moreover, the sample sizes when using control charts for attributes are normally much larger (usually in the hundreds) than a sample of size four or five
that we usually use in control charts for variables.
In general, variable control charts are more informative than attribute
control charts. They are very effective in detecting a defect even before
it occurs, whereas attribute control charts are used only after the defects
have occurred. There are cases, however, when variable control charts
have limitations. For example, consider a product that is nonconforming
due to any one of 10 quality characteristics that do not conform to specifications. In this case we cannot control all 10 quality characteristics by
using one variable control chart, because one variable control chart can
control only one quality characteristic at a time. Therefore, to control all
10 quality characteristics, we will have to use 10 different variable control charts. On the other hand, one attribute control chart can study all the
quality characteristics because a nonconforming unit is nonconforming
irrespective of the number of quality characteristics that do not conform
to specifications. We can conclude that both variable and attribute control
charts have pros and cons.
In some cases the quality characteristic is such that instead of classifying
a unit as conforming or nonconforming, it records the number of nonconformities per manufactured unitfor example, the number of holes in a roll of
paper, the number of irregularities per unit area of a spool of cloth, the number of blemishes on a painted surface, the number of loose ends in a circuit
board, the number of nonconformities per unit length of a cable, the number
of nonconformities of all types in an assembled unit, and so on. In such cases,
we use control charts that fall under the category of control charts for attributes. These control charts are used to reduce the number of nonconformities
per unit length, area, or volume of a single manufactured unit, or to reduce
the number of nonconformities per manufactured or assembled unit.
The control charts for attributes are quite similar to the control charts for
variables; that is, the CL and the control limits are set in the same manner
as in the control charts for variables. However, it is important to note that
the reasons for using control charts for variables and control charts for attributes are quite distinct. As noted in Chapter 3, the purpose of using control
charts for variables in any process is to reduce the variability due to special
or assignable causes, whereas control charts for attributes are used to monitor the number of nonconforming units, the number of nonconformities per
manufactured or assembled unit, or simply the number of nonconformities
per unit length, area, or volume of a single manufactured unit.
In this chapter, we will study four types of control charts for attributes:
the p chart, the np chart, the c chart, and the u chart. Table 4.1 gives a very
brief description of these charts, which can help determine the appropriate
type of control chart for the quality characteristic under investigation.
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Phase I (Detecting Large Shifts)SPC: Control Charts for Attributes 85
Table 4.1
The four control charts for attributes.
Control Chart Quality Characteristic under Investigation
Sample Size
p chart
Percentage or fraction of nonconforming units in a

subgroup or a sample, where sample size can be
variable
Varying or
constant
np chart
Number of nonconforming units in a sample
Constant
c chart
Number of nonconformities in a sample or in one or Constant

more inspection units
u chart
Number of nonconformities per unit, where sample

size can be variable
Varying or
constant
4.2 The p Chart: Control Chart for

Fraction of Nonconforming Units
The most frequently used attribute control chart is the p chart. It is used whenever we want to find the fraction or percentage of units that do not conform
to the specifications in a situation where the observed quality characteristic
is an attribute or a variable measured by a go or no-go gauge. A p chart can
be used to study one or more quality characteristics simultaneously. Because
each inspected unit is classified as conforming or nonconforming and it is
assumed that the conformity or nonconformity of each unit is defined independently, which is true only if the process is stable, the probability of occurrence of a nonconforming unit at any given time is the same. Then the basic
rules of the p chart are governed by the binomial probability distribution with
parameters n and p, where n is the sample size and p is the fraction of nonconforming units produced by the process under investigation.
The binomial probability distribution function of a random variable X
with parameters n and p is defined by
n
P ( X = x ) = p x (1 p)n x
x
x = 0,1, . . . , n.
(4.1)
The mean and the standard deviation of the random variable X are given by
np and np(1 p) , respectively. For more details on binomial distribution,
refer to Applied Statistics for the Six Sigma Green Belt.
Control Limits for the p Chart
The following steps detail how to develop a p control chart:
1. Select m (m 25) samples of size n (n 50) units from the
process under investigation. Note, however, that if we have
some prior information or any clue that the process is producing
a very small fraction of nonconforming units, then the sample
size should be large enough so that the probability that it
contains some nonconforming units is relatively high.
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86
Chapter Four
2. Find the number of nonconforming units in each sample.

3. Find the fraction pi of nonconforming units for each sample,
that is,
x
pi = ,
n
(4.2)
where x is the number of nonconforming units in the ith (i = 1,

2, . . . , m) sample.
4. Find the average nonconforming p over the m samples, that is,
p=
p1 + p2 + ... + pm
.
m
(4.3)
The value of p determines the CL for the p chart and is an

estimate of p, the process fraction of nonconforming units.
5. Using the well-known result that the binomial distribution with
parameters n and p for large n can be approximated by the
normal distribution with mean np and variance np(1p), it can
be seen that p will be approximately normally distributed
p(1 p)
. Hence the
n
upper and lower 3 control limits and the CL for the p chart are
with mean p and standard deviation
UCL = p + 3
p(1 p)
,
n
CL = p,
LCL = p 3
(4.4)
(4.5)
p(1 p)
.
n
(4.6)
p(1 p)
p(1 p)
is
an
estimator
of
In equations (4.4) and (4.5),
n
n , the standard deviation of p. Furthermore, if the control charts are being implemented
for the first time, then the control limits given by equations (4.4)(4.6) should
be treated as the trial limits. In other words, before using these control limits
any further, the points corresponding to all the samples used to determine
these limits should be plotted and verified, and it should be established that
all the points fall within these control limits and that there is no evident pattern present. If any sample points exceed the control limits or if there is any
pattern, then the possible special causes should be detected and eliminated
before recalculating the control limits for future use. When recalculating the
control limits, points that exceeded the trial control limits should be ignored,
provided any special causes related to such points have been detected and
eliminated.
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Note: Sometimes for small values of p, n, or both, the value of the LCL
may be negative. In such cases, we always set the LCL at zero because the
fraction of nonconforming units can never go below zero.
Interpreting the Control Chart for Fraction Nonconforming
1. If any point or points exceed the upper or lower control limit,
we conclude that the process is not stable and that some special
causes are present in the process.
2. The presence of special causes, which may be favorable or
unfavorable, must be investigated, and appropriate action(s)
should be taken.
3. A point above the UCL is generally an indication that:
The control limit or the plotted point is in error.
The process performance has deteriorated or is deteriorating.
The measurement system has changed.
4. A point below the LCL is generally an indication that:
The control limit or the plotted point is in error.
The process performance has improved or is improving. This
condition of the process should be investigated very carefully
so that such conditions of improvement are implemented on a
permanent basis at this location and elsewhere in the industry.
5. As in the case of X and R charts, or X and S charts, the presence

of any unusual patterns or trends is either an indication of an
unstable process or an advance warning of conditions that, if
left unattended or without any appropriate action, could make
the process unstable.
6. If p is moderately high (np 5), then an approximately
equal number of points should fall on either side of the CL.
Therefore, either of the following conditions could indicate that
the process has shifted or a trend of a shift has started:
A run of seven or more points going up or going down.
A run of seven or more points falling below or above the CL.
7. A run above the CL or a run going up generally indicates that:
The process performance has deteriorated and may still be
deteriorating.
8. A run below the CL or a run going down generally indicates
that:
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88
Chapter Four
The process performance has improved and may still be

improving.
To illustrate the construction of the p chart, we consider the data in Example
4.1, shown in Table 4.2.
Example 4.1 A semiconductor industry tracks the number of nonconforming computer chips produced each day. A team of Six Sigma Green Belts
wants to improve the overall quality by reducing the fraction of nonconforming computer chips. To achieve this goal, the team decided to set up a p chart
based on daily inspections of 1000 chips over a period of 30 days. Table 4.2
gives the number of nonconforming chips out of 1000 inspected chips each
day during the study period.
Solution: Using the data in Table 4.2, we develop the trial control limits of
the p chart.
First we calculate the sample fraction nonconforming values (pi), which
are listed in columns 3 and 6 of Table 4.2. Substituting the sample fraction
nonconforming values in equation (4.3), we get
p = 0.00837.
Plugging the values of p = 0.00837 and n = 1000 into equations (4.4) and
(4.6), we get the control limits for the p chart:
Table 4.2 Number of nonconforming computer chips out of 1000 inspected each day during the
study period.
Day
Number of
Nonconforming x
Sample Fraction
Nonconforming pi
Day
Number of
Nonconforming x
Sample Fraction
Nonconforming pi
0.009
16
12
0.012
0.005
17
0.005
0.006
18
0.006
11
0.011
19
12
0.012
11
0.011
20
10
0.010
12
0.012
21
0.006
0.007
22
0.007
11
0.011
23
11
0.011
0.006
24
11
0.011
10
0.006
24
11
0.011
11
0.008
26
0.005
12
0.005
27
12
0.012
13
0.008
28
11
0.011
14
0.005
29
0.007
15
0.008
30
0.009
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UCL = 0.01701,
CL = 0.00837,
LCL = 0.0.
The p control chart for the data in Table 4.2 is shown in Figure 4.1.
From the p control chart in Figure 4.1 we observe that all the points are
well within the control limits. We should note, however, that starting from
point number 9, seven successive points fall below the CL. This indicates
that from day 9 through 15, the number of nonconforming chips was relatively low. An investigation to determine the process conditions on these days
should be made so that similar conditions could be implemented for future
use. Otherwise, because all the points of the current data fall within the control limits and no patterns exist, the trial control limits can be extended for use
over the next 30 days, when the control chart should again be reevaluated.
4.2.1 The p Chart: Control Chart for Fraction
Nonconforming with Variable Samples
There are times when, for various reasons, it is not possible to select samples
of equal sizes. This is particularly true when the samples consist of 100 percent inspection during a fixed period of time on each day of the study. The
procedure to develop a p chart with variable sample sizes is very similar to
the procedure for a p chart with constant sample size.
For example, suppose we have m samples of sizes n1, n2, n3, . . . , nm. To
develop a p chart for variable sample sizes, we proceed as follows:
1. From the process under investigation, select m (m 25)
samples of sizes n1, n2, n3, . . . , nm (ni 50) units.
2. Find the number of nonconforming units in each sample.
3. Find the fraction pi of nonconforming units for each sample
Proportion
p Chart for Nonconforming Computer Chips

0.018
0.016
0.014
0.012
0.010
0.008
0.006
0.004
0.002
0.000
UCL = 0.01701
P = 0.00837
LCL = 0
3
Figure 4.1
H1277 ch04.indd 89
12
15
18
Sample
21
24
27
30
MINITAB printout of the p chart for nonconforming computer chips, using trial control
limits from the data in Table 4.2.
3/8/07 5:50:07 PM
90
Chapter Four
pi =
x
,
ni
(4.7)
where x is the number of nonconforming units in the ith (i = 1,

2, . . . , m) sample.
4. Find the average fraction p of nonconforming units over the m
samples, that is,
p=
n1 p1 + n2 p2 + ... + nm pm
.
n1 + n2 + n3 + ... + nm
(4.8)
The value of p determines the CL for the p chart and is an

estimate of p, the process fraction of nonconforming units.
5. The control limits for p with variable sample sizes are
determined for each sample separately. The upper and lower 3
control limits for the ith sample are
UCL = p + 3
p(1 p)
,
ni
CL = p,
LCL = p 3
(4.9)
(4.10)
p(1 p)
.
ni
(4.11)
Note that the CL is the same for all samples, whereas the control limits will
be different.
To illustrate construction of a p chart with variable sample size, we consider the data in Table 4.3 of Example 4.2.
Example 4.2 Suppose in Example 4.1 that all the chips manufactured during a fixed period of time are inspected each day. However, the number of
computer chips manufactured varies during that fixed period on each day.
The data collected for the study period of 30 days are shown in Table 4.3.
Construct a p chart for these data and determine whether the process is
stable.
Solution: Using the data in Table 4.3 and equations (4.8)(4.11), we get
the trial control limits as
UCL = 0.01675,
CL = 0.00813,
LCL = 0.0.
The p chart for the data in Table 4.3 is as shown in Figure 4.2.
From Figure 4.2 we see that all the points are well within the control limits and that there is no apparent pattern or trend in the chart, which means the
process is stable. Also, recall that in Figure 4.1 we had a run of seven points
that fell below the CL. In Figure 4.2 there is no such run, even though we are
dealing with the same process. Such differences are normal when samples are
taken at different times.
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Table 4.3 Number of nonconforming computer chips with different size samples
inspected each day during the study period.
Day
Number of
Nonconforming x
Sample
Size ni
Day
Number of
Nonconforming x
Sample
Size ni
908
16
962
11
986
17
11
926
976
18
917
991
19
978
944
20
961
906
21
970
11
928
22
905
948
23
962
10
994
24
900
10
960
25
11
998
11
982
26
935
12
921
29
970
13
938
28
967
14
10
1000
29
983
15
982
30
976
Proportion
p Chart for Nonconforming Computer Chips with Variable Sample Sizes

0.018
0.016
0.014
0.012
0.010
0.008
0.006
0.004
0.002
0.000
UCL = 0.01675
P = 0.00813
LCL = 0
3
Figure 4.2
H1277 ch04.indd 91
12
15
18
Sample
21
24
27
30
MINITAB printout of the p chart for nonconforming chips with variable sample sizes, using
trial control limits for the data in Table 4.3.
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92
Chapter Four
4.3 The np Chart: Control Chart for

Number of Nonconforming Units
In an np chart, we plot the number of nonconforming units in an inspected
sample instead of the fraction of nonconforming units in the inspected sample. Other than this difference, the np chart is very similar to the p chart.
However, note that in the p chart the sample sizes could be equal or unequal,
whereas in the np chart the sample sizes are equal. Otherwise, both the p
chart and the np chart can be implemented under the same circumstances.
Following are specific points pertinent to the np chart:
The inspection sample sizes should be equal
The sample size should be large enough to include some nonconforming units
Record the sample size and the number of observed nonconforming units
in each sample, and plot the number of nonconforming units on the control
chart.
Control Limits for the np Control Chart
Select m samples, each of size n, from the process under investigation, and
determine the number of nonconforming units that exist in each sample. Let
the number of nonconforming units found be denoted by x1, x2, x3, . . . , xm,
respectively. Then the control limits are found.
First, calculate np, the average number of nonconforming units per sample, that is,
np =
x1 + x 2 + x3 + ... + x m
.
m
(4.12)
Then the 3 control limits and the CL for the np control chart are given by
UCL = np + 3 np(1 p),
CL = np,
LCL = np 3 np(1 p).
(4.13)
(4.14)
(4.15)
To illustrate construction of the np chart, we consider the data in Table 4.2 of

Example 4.1.
Example 4.3 Consider the data on computer chips in Table 4.2, Example
4.1. Construct an np chart for these data and verify whether the process is
stable.
From the np control chart in Figure 4.3 we observe that all the points are
well within the control limits. However, as in Figure 4.1, starting from point
9, seven successive points fall below the CL. This indicates that from day 9
through 15, the number of nonconforming units was relatively low. An investigation to determine the process conditions on these days should be made so
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Sample Count
np Chart for Nonconforming Computer Chips

18
16
14
12
10
8
6
4
2
0
UCL = 17.01
np = 8.37
LCL = 0
3
Figure 4.3
12
15
18
Sample
21
24
27
30
MINITAB printout of the np chart for nonconforming computer chips, using trial control
limits for the data in Table 4.2.
that similar conditions could be extended for future use. Otherwise, because
all the points of the current data fall within the control limits and no patterns
are present, the trial control limits can be extended for use over the next 30
days, when the control chart should again be reevaluated.
4.4 The c Chart (Nonconformities

versus Nonconforming Units)
In many situations we are interested in studying the number of nonconformities in a sample, which is also known as an inspection unit, rather than
studying the fraction or total number of nonconforming units in a sample.
This is particularly true when a unit is nonconforming due to various types of
nonconformities. For example, we may want to study the quality of electric
motors that could be nonconforming due to defective bearings, a defective
gear, a defective seal, or a defective terminal connection of the winding. As
another example, suppose we are interested in studying the quality of printed
circuit boards for laptops that could be nonconforming due to a shorted trace,
an open via, a cold solder joint, or a solder short. In these cases we may
be more likely to study the nonconformities rather than the nonconforming
units. The control chart that is most commonly used to study nonconformities is the c control chart. Whereas the p control chart studies the fraction of
nonconforming units and the np control chart studies the total number of nonconforming units in each sample, the c control chart studies the total number
of nonconformities in each sample. The letter c in c control chart denotes the
total number of nonconformities, which may be of one kind or of various
kinds, in an inspection unit.
To illustrate, suppose that to develop trial control limits for a c control
chart for electric motors, we select samples of size 100 motors each, where
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94
Chapter Four
each sample would be considered as one inspection unit or several inspection units, depending on how the inspection units are defined. Note that the
size of an inspection unit is purely a matter of convenience, but the c control
charts are constructed with sample sizes or the number of inspection units in
a sample being equal. It can be shown that under certain conditions (conditions of a Poisson process, which are briefly discussed in Applied Statistics
for the Six Sigma Green Belt), the number of nonconformities c is distributed
according to a Poisson probability distribution with parameter , where
is the average number of nonconformities per inspection unit. The Poisson
probability distribution is defined as
p( x ) =
e x
x!
x = 0,1, 2, 3, . . . ,
(4.16)
where the mean and the variance of the Poisson distribution are given by .
Now suppose that we select m samples, with each sample being one inspection unit, and let the number of nonconformities in these samples be c1, c2,
c3, . . . , cm, respectively. Then the parameter , which is usually unknown, is
estimated by
c + c + c + ... + cm
= c = 1 2 3
.
m
(4.17)
The 3 control limits for the c control chart are defined as follows:
UCL = c + 3 c ,
CL = c ,
(4.18)
(4.19)
(4.20)
LCL = c 3 c .
Note that for small values of c ( 5), the Poisson distribution is asymmetric:
the value of a Type I error () above the UCL and below the LCL is usually
not the same. For small values of c it may be more prudent to use probability
control limits rather than the 3 control limits. The probability control limits
can be found by using Poisson distribution tables.
To illustrate construction of a c control chart using 3 control limits, we
consider the data in Table 4.4 of Example 4.4.
Example 4.4 A paper mill has detected that almost 90 percent of rejected
paper rolls is due to nonconformities of two types: holes and wrinkles in the
paper. The Six Sigma Green Belt team in the mill decides to set up control
charts to reduce or eliminate the number of these nonconformities. To set
up the control charts, the team collected data by taking random samples of
five rolls each day for 30 days and counting the number of nonconformities
(holes and wrinkles) in each sample. The data are shown in Table 4.4. Set up
a c control chart using these data.
Solution: Using the data in Table 4.4, the estimate of the population parameter is given by
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30
ci
i =1
= c =
30
222
= 7.4.
30
Therefore, using equations (4.18)(4.20), the 3 control limits of the phase I

c control chart are given by
UCL = 7.4 + 3 7.4 = 15.56,
CL = 7.4,
LCL = 7.4 3 7.4 = 0.76 = 0.
Note that if the LCL turns out to be negative, as in this example, then we set
the LCL at zero because the number of nonconformities cannot be negative.
The c control chart for the data in Table 4.4 is as shown in Figure 4.4.
Table 4.4 Total number of nonconformities in samples of five rolls of paper.
Day
Total Number of
Nonconformities
Day
Total Number of
Nonconformities
Day
Total Number of
Nonconformities
11
21
12
22
13
23
14
24
15
25
16
26
17
27
18
28
19
29
10
20
30
C-Chart of Nonconformities
16
UCL = 15.56
Sample Count
14
12
10
8
C = 7.4
6
4
2
LCL = 0
0
3
Figure 4.4
H1277 ch04.indd 95
12
15
18
Sample
21
24
27
30
The c control chart of nonconformities for the data in Table 4.4.
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96
Chapter Four
From Figure 4.4, we can see that the process is stable. In other words,
there are no special causes present, and the only causes that are affecting the
process are the common causes. To eliminate the imperfections in the paper,
the management must take action on the system, such as examining the quality of the wood chips and pulp, replacing old equipment, and providing more
training for the workers. Also, to further enhance the process and eliminate
the nonconformities, the quality engineers should use the techniques available in DOE, which we will discuss in our next volume, Design of Experiments for the Six Sigma Green Belt.
Notes
1. If the economic factors and time allow, one should take
samples or inspection units large enough so that the LCL is
positive. The LCL can be positive only if c > 9. This means
that the sample size should be such that it can catch nine or
more nonconformities with high probability. An advantage
of having a positive LCL is that it will allow us to see the
conditions under which the nonconformities are very low,
and consequently it will give us the opportunity to perpetuate
these conditions on-site and implement them elsewhere in the
industry.
2. As noted earlier, the size of the inspection unit is usually
determined based on what is convenient. However, to determine
the actual inspection unit size, one should also take into
consideration the statistical characteristics of the process, such
as the ARL, the state of the process (that is, whether the process
has deteriorated or improved), and other factors that may
require us to increase or decrease the sample size. So, while
using control charts for nonconformities, particularly in phase I,
situations may arise when the sample size may vary. In these
situations, we use the u control chart instead of the c control
chart. We will discuss the u control chart in the following
section.
If the samples consist of n inspection units, then the control
limits for the c control chart are given by
UCL = nc + 3 nc ,
CL = nc ,
LCL = nc 3 nc .
(4.21)
(4.22)
(4.23)
4.5 The u Chart

The u control chart is essentially the c control chart except that the u control chart is always based on the number of nonconformities per inspection
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unit. In other words, the actual sample size may not be equal to one, or may
vary, but the control limits of the u chart are always determined based on one
inspection unit. If n is constant, one can use either a c chart or a u chart. For a
u chart the CL is determined by u = c/n, and the 3 control limit is given by
UCL = u + 3 u / n ,
(4.24)
LCL = u 3 u / n .
If the sample size varies, then we define u as
(4.25)
u=
c1 + c2 + ... + cm c
= ,
n1 + n2 + ... + nm n
(4.26)
where m is the number of samples selected during the study period; c1, c2,
c3, . . . , cm are the number of nonconformities in the m samples; and n is the
average sample size, which is given by
n=
n1 + n2 + ... + nm
.
m
(4.27)
In this case the CL is fixed, but the control limits are different; that is, the CL
and the 3 control limits for the ith sample are given by
UCL = u + 3 u / ni ,
CL = u,
LCL = u 3 u / ni .
(4.28)
(4.29)
(4.30)
Sometimes, if the samples do not vary too much, the nis in equations (4.28)
and (4.30) are replaced by n so that the control limits are
UCL = u + 3 u / n ,
CL = u,
(4.31)
(4.32)
(4.33)
LCL = u 3 u / n .
To illustrate construction of a u chart, we consider the data in Table 4.5 of
Example 4.5.
Example 4.5 A Six Sigma Green Belt team in a semiconductor industry
found that the printed boards for laptops have nonconformities of several
types, such as shorted trace, cold solder joint, and solder short, and the number of nonconformities is unacceptable. In order to reduce the number of
nonconformities in the printed boards for laptops, the Six Sigma Green Belt
team wants to set up a u chart. They collect data by selecting samples of five
inspection units, where each inspection unit consists of 30 boards. The data,
which are shown in Table 4.5, were collected over a period of 30 days.
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98
Chapter Four
Table 4.5
Day
Number of nonconformities on printed boards for laptops per

sample, each sample consisting of five inspection units.
Number of Nonconformities
Number of Nonconformities
per Sample
Day
per Sample
48
16
42
49
17
34
38
18
30
49
19
49
43
20
44
37
21
47
45
22
33
48
23
37
39
24
33
10
46
25
34
11
40
26
49
12
44
27
50
13
43
28
49
14
35
29
35
15
31
30
39
Solution: Using the data in Table 4.5, we have

c = 41.333.
Therefore,
u=
c 41.333
=
= 8.2667.
5
5
Hence, the control limits are given by

UCL = u + 3 u / n = 8.2666 + 3 8.2666 / 5 = 12.124,
CL = u = 8.2667,
UCL = u 3 u / n = 8.2666 3 8.2666 / 5 = 4.409.
The u chart for the data in Table 4.5 is as shown in Figure 4.5. The u chart in
Figure 4.5 shows that there are no assignable causes present in the process.
In other words, only common causes are affecting the process. Therefore,
management needs to take action on the system.
To illustrate construction of the u chart when the sample sizes vary, we
consider the following example.
Example 4.6 Suppose in Example 4.5, due to some administrative reasons,
it was not possible to examine five inspection units every day. In other words,
the sample size varied. The data obtained are as shown in Table 4.5. Construct and interpret a u chart for the data in Table 4.6.
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U-Chart of Nonconformities
Sample Count Per Unit
13
UCL = 12.124
12
11
10
9
U = 8.267
8
7
6
5
LCL = 4.409
4
3
Figure 4.5
12
15
18
Sample
21
24
27
30
The u chart of nonconformities for the data in Table 4.5, constructed using MINITAB.
Table 4.6 Number of nonconformities on printed boards for laptops per

sample with varying sample size.
Day
Sample
Size
Number of
Nonconformities
per Sample
Day
Sample
Size
Number of
Nonconformities
per Sample
33
16
40
40
17
40
38
18
37
43
19
40
45
20
37
35
21
39
35
22
48
41
23
39
40
24
36
10
30
25
39
11
36
26
36
12
40
27
43
13
33
28
36
14
36
29
49
15
38
30
40
Solution: Using the data in Table 4.6, we have

u=
=
H1277 ch04.indd 99
c1 + c2 + ... + cm
n1 + n2 + ... + nm
33 + 40 + 38 + ... + 40 1162
=
= 9.22.
126
3 + 5 + 3 + ... + 3
3/8/07 5:50:09 PM
100
Chapter Four
U Chart
Sample Count Per Unit
15.0
UCL = 14.48
12.5
10.0
U = 9.22
7.5
5.0
LCL = 3.96
3
12
15
18
Sample
21
24
27
30
Tests performed with unequal sample sizes
Figure 4.6
The u chart of nonconformities for the data in Table 4.6, constructed using MINITAB.
The control limits are calculated for each individual sample. For example, the
control limits for sample one are given by
UCL = u + 3 u / n1 = 9.22 + 3 9.22 / 3 = 14.48,
CL = u = 9.22,
UCL = u 3 u / n1 = 9.22 3 9.22 / 3 = 3.96.
The control limits for the rest of the samples are calculated in the same manner. The CL, however, remains the same. The u chart for the data in Table 4.6
is as shown in Figure 4.6.
The u chart in Figure 4.6 shows that all the points are within the control
limits. However, there are several points that fall beyond the warning control
limits. Moreover, points 8 and 9 in particular fall very close to the UCLs. All
these observations about the process indicate that there may be some special
causes present in the process. In other words, the process may be on the verge
of being unstable. Therefore, precautions should be taken to avoid the process becoming unstable, but certainly without overcontrolling it.
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5
Phase II (Detecting Small
Shifts)SPC: Cumulative
Sum, Moving Average,
and Exponentially
Weighted Moving
Average Control Charts
n Chapters 3 and 4 we studied Shewhart control charts for detecting large

shifts in any process. In this chapter we will study the next generation of
control charts: cumulative sum (CUSUM), moving average (MA), and
exponentially weighted moving average (EWMA) control charts. As noted
earlier, the large shifts usually occur in phase I of implementing SPC, when
a process has a strong influence of special causes and, consequently, large
shifts are occurring in the process. By the time phase I implementation of
SPC is over, most of the special causes are eliminated or at least reduced,
and as a result, the occurrence of large shifts becomes a rare event. In other
words, after phase I implementation of SPC is complete and phase II implementation commences, the process is usually under control; as a result, it
may be having only small shifts. Shewhart control charts are known to be not
very effective in detecting small shifts that are less than 1.5. One possibility
when the shifts are small is to increase the sensitivity of the Shewhart control
charts by using the following criteria from Western Electric (1956, 27):
a. Two out of three consecutive points fall outside the 2 warning
limits
b. Four out of five consecutive points fall at a distance of 1 or
more from the CL
c. Eight consecutive points fall above or below the CL
101
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102
Chapter Five
If one point falls outside the 3 control limits or if any conditions from
this list occur, the process is considered to be out of control. Subsequently,
an appropriate action is taken, such as increasing the sampling frequency,
increasing the sample size, or both. However, even though these actions do
increase the sensitivity, as Champ and Woodall (1987) point out, using these
rules, the in-control ARL is only 91.75. Under normality, the false-alarm rate
is little more than four times the false-alarm rate of a Shewhart chart when the
criteria from Western Electric are not used. Moreover, the advantage of the
simplicity of Shewhart charts, which is an important feature, is lost. Keeping
all this in mind, it is fair to say that when the shifts are small, the Shewhart
chart with these modifications is not a viable alternative to the CUSUM control chart. Also, the CUSUM control chart has another major advantage over
the Shewhart control chart. In the CUSUM control chart, the ith point uses
the information contained in all the samples collected at time i and before,
whereas the Shewhart control chart uses only the information contained in
the ith sample. In other words, the Shewhart control chart ignores all information provided by the samples collected before the ith sample. But at the
same time, we must note that this feature of the CUSUM control chart makes
the plotted points dependent, and therefore it is difficult to interpret any pattern other than when the point exceeds the decision interval for an upward or
downward shift.
Other control charts that are very effective in detecting small shifts are
the MA and EWMA control charts. CUSUM, MA, and EWMA control
charts are excellent alternatives to the Shewhart control chart for controlling
processes in phase II. Relatively speaking, the MA chart is not as effective
as CUSUM and EWMA charts. The CUSUM and EWMA control charts can
be used to monitor not only the process mean but also the process variance
and the fraction nonconforming and nonconformities. However, our major
focus of discussion of these control charts is on the process mean. An excellent reference for a detailed study of CUSUM control charts is Hawkins and
Olwell (1998).
5.1 Basic Concepts of the CUSUM Control Chart
CUSUM Control Chart versus Shewhart X-R Control Chart

The basic assumptions of a CUSUM control chart are:
1. The observations are independently and identically normally
distributed with mean and standard deviation .
2. The mean and standard deviation are known.
Note that in practice the parameters and are never known. Hence, we
always end up estimating them. It is very important to remember that while
estimating these parameters, precision is essential. Even a small error, particularly in estimating , will have an accumulative effect, which will cause
false alarms. One way to avoid such problems is to take very large samples
when estimating these parameters.
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Phase II (Detecting Small Shifts)SPC 103
Before we begin our formal discussion of designing the CUSUM control

chart, we first use a small set of data to show how the CUSUM chart is more
effective than the Shewhart control chart in detecting small shifts in the process mean. Note that the CUSUM chart we will discuss in this section has no
decision interval. In other words, it is not a formal CUSUM control chart.
Example 5.1 Consider a manufacturing process of auto parts. We are
interested in studying a quality characteristic of the parts manufactured by
the process. Let the quality characteristic when the process is under control
be normally distributed with mean 20 and standard deviation 2. The data
shown in Table 5.1 give the first 10 random samples of size four, which are
taken when the process is stable and producing the parts with mean value
20 and standard deviation 2. The last 10 random samples, again of size four,
were taken from that process after its mean experienced an upward shift of
one standard deviation,
resulting in a new process with mean 22. Construct
the Shewhart X-R control chart and the CUSUM control

chart for the data
in Table 5.1. Then comment on the outcomes of the X-R control chart and the
CUSUM chart.
Table 5.1 Data from a manufacturing process of auto parts before and after its mean
experienced a shift of 1 (sample size four).
Sample
(i )
H1277 ch05.indd 103
Sample
Xi
Zi =
X i 20
Si = Z i + Si 1
19.35
20.05
18.92
15.70
18.5050
1.4950
1.4950
17.50
19.37
17.03
19.35
18.3125
1.6875
3.1825
22.99
18.61
18.35
17.77
19.4300
0.5700
3.7525
22.83
19.56
21.14
23.50
21.7575
1.7575
1.9950
18.70
21.26
19.71
19.07
19.6850
0.3150
2.3100
20.70
17.90
22.05
20.62
20.3175
0.3175
1.9925
22.80
19.80
20.15
21.01
20.9400
0.9400
1.0525
20.28
17.15
24.81
19.68
20.4800
0.4800
0.5725
16.87
22.37
18.91
18.43
19.1450
0.8550
1.4275
10
18.96
21.16
19.74
20.56
20.1050
0.1050
1.3225
11
23.96
18.75
22.48
25.85
22.7600
2.7600
1.4375
12
19.20
23.18
24.17
20.77
21.8300
1.8300
3.2675
13
21.18
24.33
19.78
26.46
22.9375
2.9375
6.2050
14
20.42
20.74
24.66
21.70
21.8800
1.8800
8.0850
15
22.76
21.47
20.36
22.84
21.8575
1.8575
9.9425
16
23.01
21.48
21.86
17.99
21.0850
1.0850
11.0275
17
23.12
23.82
21.42
21.96
22.5800
2.5800
13.6075
18
21.37
22.05
25.24
22.70
22.8400
2.8400
16.4474
19
21.84
23.89
15.97
22.67
21.0925
1.0925
17.5400
20
18.49
21.65
22.88
24.67
21.9225
1.9225
19.4625
3/8/07 12:35:03 PM
104
Chapter Five
Solution: As described earlier, the basic principle of the CUSUM chart is

to detect small shifts in the process mean at time i by calculating the accumulated sum Si of deviations of the sample means X1 , X 2 , . . . , X i from the target
value (0) measured in standard deviation units. That is,
i
Si =
j =1
( X j 0 )
( X i 0 )
+ Si 1
(5.1)
= Zi + Si 1 ,
where Z1 , Z 2 , . . . , Zi are the standardized values of X1 , X 2 , . . . , X i , respectively. In Example 5.1, the target value is 20 and the accumulated sum of
deviations of the sample means from the target value at time i, when measured in standard deviation units, is given in column 5 of Table 5.1. From
equation (5.1) one can see that if the samples come from a stable process with
mean 1, the points (i, Si) when plotted on a chart will:
a. Randomly scatter around the zero line
b. Clearly show an upward trend
c. Clearly show a downward trend
The result depends on whether 1 = 0, 1 > 0, or 1 < 0.
The X-R control
chart and the CUSUM chart are as shown in Figures 5.1
and 5.2. The X-R control chart shows that the process is clearly stable and
showing no abnormality other than sample number 13, which comes close
to the UCL. In other words, the chart is not detecting that the samples starting with the 11th sample came from the process after it had experienced an
upward shift of one standard deviation. However, the CUSUM chart shows
an upward trend, which started at the 11th sample. Furthermore, as noted by
Lucas (1982), CUSUM control charts give tighter process control than classical control charts such as Shewhart control charts. With the tighter control
provided by CUSUM control charts, more emphasis is placed on keeping the
process on target rather than allowing it to drift within the limits. Moreover,
the sensitivity of the CUSUM control chart would not be seriously affected if
we took samples of size n = 1 instead of n > 1. In fact, CUSUM control charts
more frequently use n = 1 or individual
values. In CUSUM control charts for
individual values, the quantities Xi, Zi, and / n in Table 5.1 are replaced by
Xi, Zi, and , respectively. We will look at developing the CUSUM control
chart in the next section.
5.2 Designing a CUSUM Control Chart

In section 5.1 we saw that
CUSUM charts are very effective in detecting
small shifts. Unlike the X Shewhart control charts, CUSUM control charts
can be designed to detect one-sided or two-sided shifts. These charts are
defined by two parameters, k and h, called the reference value and the decision interval, which are defined in section 5.2.1. The two-sided process control using the CUSUM control chart is achieved by concurrently using two
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Xbar-R Chart of a Quality Characteristic

UCL = 23
Sample Mean
22.5
21.0
X = 20
19.5
18.0
LCL = 17
2
10
Sample
12
14
16
18
20
UCL = 9.39
Sample Range
8
6
R = 4.12
4
2
LCL = 0
0
2
Figure 5.1
10
Sample
12
14
16
18
20
18
20
X-R control chart for the data in Table 5.1.
CUSUM Chart for Data in Table 5.1

20
15
Si
10
5
0
-5
2
Figure 5.2
H1277 ch05.indd 105
10
12
Index
14
16
CUSUM chart for the data in Table 5.1.
3/8/07 12:35:03 PM
106
Chapter Five
one-sided CUSUM control charts. In both one-sided CUSUM charts, one can
use the same or different reference values, depending on whether the upward
and downward shifts are equally important or one is more important than the
other. Furthermore, in designing a CUSUM control chart, the ARL usually
plays an important role. The ARL of a two-sided control chart is obtained
by combining the ARLs of two one-sided control charts, where the ARLs of
one-sided control charts for upward and downward shifts are not necessarily
the same. Again, note that the value of the two ARLs depends solely on the
sensitivity of the shifts. Sometimes the size of the shift on one side may be
more serious than on the other. For example, consider tensile strength of a
copper wire as the quality characteristic. Any upward shift in mean tensile
strength may not be as serious as a downward shift. It can be seen from Van
Dobben de Bruyn (1968) that
1
1
1
,
=
+ +
ARL(two - sided) ARL
ARL
(5.2)
where ARL+ and ARL are the average run lengths of two one-sided control
charts when the shift is upward and downward, respectively. In this section,
we focus on the two-sided control chart.
CUSUM control charts can be implemented by using either a numerical procedure or a graphical procedure. The numerical procedure consists of
constructing a table known as a tabular CUSUM, whereas a graphical procedure consists of preparing a graph known as a V-mask. Practitioners usually prefer to use numerical procedure. For visual observation, however, the
tabular CUSUM can be plotted in a graph. The tabular CUSUM in Table 5.3
is plotted in Figure 5.3. In this book we will discuss only the construction of
a tabular CUSUM.
5.2.1 Two-Sided CUSUM Control Chart Using Numerical Procedure
The tabular CUSUM control charts are defined by the two parameters k and
h, previously referred to as the reference value and decision interval. The
parameter k is defined as
k=
1 0
2
(5.3)
where 0 is the target value or the process mean when the process is under
control, 1 is the process mean after it has experienced a shift, and is the
process standard deviation. Note that if we are using the standardized values
Zi, then is replaced by 1. In Example 5.1 it can be verified that k = 0.5. As
a rule of thumb, the parameter h is usually equal to 4 or 5 (if the observations are not standardized, then h is equal to 4 or 5, where is the process
standard deviation). In practice, however, h should be chosen so that the value
of the ARL is neither too small nor too large. This is because small values
of ARL cause too many false alarms, whereas large values of ARL allow
the process to continue running even when it has experienced a shift and is
producing nonconforming products. Preferably, h should be such that when
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Table 5.2
Values of h for a given value of k

when ARL0 = 370.
0.25
0.50
0.75
1.00
1.25
1.50
8.01
4.77
3.34
2.52
1.99
1.61
1 = 0, that is, when the process has experienced no shift, the value of ARL,
which we denote by ARL0, is approximately equal to 370. The value 370 of
ARL0 is purposely chosen because it matches the ARL0 of the Shewhart control chart under normal distribution with control limits equal to 3. Hawkins
(1993) gives a table of k values and the corresponding values of h such that
ARL0 for a two-sided CUSUM control chart is equal to 370. Table 5.2 provides certain values of h and k so that ARL0 = 370. Clearly, h = 5 with k = 0.5
will produce ARL0, which will be slightly higher than 370.
Hawkins and Olwell (1998, 4849) have given very extensive tables for
ARL as a function of k and h, and for h as a function of k and ARL, for a
one-sided CUSUM for mean shift of standardized normal data. Hawkins and
Olwell also provide some computer programs that can be used to generate
values of ARL and h that are not encountered in these tables. Having defined
the parameters k and h, we are now ready to define the statistics needed to
implement one-sided CUSUM control charts using a numerical procedure.
Thus, we define here
Si+ = max [0, zi k + Si+1 ],
(5.4)
Si = min [0, zi + k + Si1 ],
(5.5)
where the initial values of S0+ and S0 are zero. The statistics S+i and Si, respectively, are used to implement one-sided CUSUM control charts when the
shifts are upward and downward. For a two-sided CUSUM control chart, the
statistics Si+ and Si are used simultaneously. We illustrate the implementation
of the numerical procedure for the CUSUM control chart by using the data
in Example 5.1.
Example 5.2 Columns 1, 3, and 4 of Table 5.1 have been reproduced in
Table 5.3, and two new columns have been appended, one for S+i and another
for S i , where S+i and S i are defined in equations (5.4) and (5.5), respectively,
and with k = 0.5 and h = 5.
Solution: Using column 3 of Table 5.3, we have
S1+ = max [0, Z1 k + S0+ ]
= max [0, 1.4950 0.50 + 0] = 0.00,
S1 = min [0, Z1 + k + S0 ]
= min [0, 1.4950 + 0.50 + 0] = 0.9950,
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108
Chapter Five
S2+ = max [0, Z 2 k + S1+ ]

= max [0, 1.6875 0.50 + 0] = 0.00,
S2 = min [0, Z 2 + k + S1 ]
= min [0, 1.6875 + 0.50 0.99950] = 2.1825.
Similarly, we can calculate S+i and S i for i = 3, 4, . . . , 20. All these values
are listed in columns 4 and 5 of Table 5.3. Table 5.3 gives us a complete
summary of a two-sided CUSUM control chart for the data in Example 5.1.
From column 4 we see that the value of S+i at i = 13 is 6.0275, which is
greater than the decision interval h = 5; therefore, we conclude that at this
point the process is out of control due to an upward mean shift. Also, note
that in column 5, no value of S i has gone below the decision interval h =
5, which implies that no downward mean shift has occurred. Moreover, the
first nonzero value of S+i occurred at sample number 11, which implies that
the process mean shifted between the time when samples 10 and 11 were
Table 5.3
H1277 ch05.indd 108
Tabular CUSUM control chart for the data given in Table 5.1.
Sample
(i )
Xi
18.5050
Zi
X i 20
n
1.4950
Si+ = max((0, Z i k + Si+ 1 )
0.0000
Si = min((0, Z i + k + Si 1 )
0.9950
18.3125
1.6875
0.0000
2.1825
19.4300
0.5700
0.0000
2.2525
21.7575
1.7575
1.2575
0.0000
19.6850
0.3150
0.4425
0.0000
20.3175
0.3175
0.2600
0.0000
20.9400
0.9400
0.7000
0.0000
20.4800
0.4800
0.6800
0.0000
19.1450
0.8550
0.0000
0.3550
10
20.1050
0.1050
0.0000
0.0000
11
22.7600
2.7600
2.2600
0.0000
12
21.8300
1.8300
3.5900
0.0000
13
22.9375
2.9375
6.0275
0.0000
14
21.8800
1.8800
7.4075
0.0000
15
21.8575
1.8575
8.7650
0.0000
16
21.0850
1.0850
9.3500
0.0000
17
22.5800
2.5800
11.4300
0.0000
18
22.8400
2.8400
13.7700
0.0000
19
21.0925
1.0925
14.3625
0.0000
20
21.9225
1.9225
15.7850
0.0000
3/8/07 12:35:05 PM
CUSUM Chart of a Quality Characteristic
Cumulative Sum
15
10
5
UCL = 5
-5
LCL = -5
2
Figure 5.3
10
12
Sample
14
16
18
20
MINITAB printout of a two-sided CUSUM control chart for the data in Table 5.1.
taken. These conclusions are also confirmed by the CUSUM control chart
shown in Figure 5.3.
Once we conclude that the process is out of control, it is pertinent to
estimate the new process mean, or the shifted mean 1. Without having found
such an estimate, it is difficult to make any appropriate changes or adjustments in the process to bring it back to its target value 0. This estimate can
be found simply by determining the average of the observations taken during
the periods when the shift occurred and when it was concluded that the process was out of control. In this example, because the sample size n is greater
than 1, we have
1 = X = X i m = (22.76 + 21.83 + 22.94) 3 = 22.51,
where m is the number of periods between the time when the shift occurred
and when it was concluded that the process was out of control.
Example 5.3 Reconsider the data presented in Example 5.1. Now we will
take random samples of size one to see if our conclusions change significantly. These data are given in Table 5.4. The first 10 observations were taken
when the process was stable and manufacturing products with mean value 20
and standard deviation 2. The last 10 observations were taken from the same
process after its mean experienced an upward shift of one standard deviation,
resulting in a new process with mean 22.
Solution: In this example, we construct both the X Shewhart control chart

for individual
values and the CUSUM control chart. The MINITAB printouts
of the X control
chart and the CUSUM control chart are shown in Figures 5.4
and 5.5. The X control chart again shows no abnormalities in the process. In
other words, it has not detected the one standard deviation shift in the process
mean, whereas the CUSUM control chart, as we can see from Figure 5.5,
has detected this shift. We will first discuss the construction of the CUSUM
control chart for individual values.
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110
Chapter Five
Following the same steps as shown in Example 5.2 and using the data
in Table 5.4, the entries in the other columns of Table 5.4 are obtained as
follows:
S1+ = max [0, Z1 k + S0+ ]
= max [0, 0.33 0.50 + 0] = 0.00,
S1 = min [0, Z1 + k + S0 ]
= min [0, 0.33 + 0.50 + 0] = 0.00,
S2+ = max [0, Z 2 k + S1+ ]
= max [0, 0.33 0.50 + 0] = 0.00,
S2 = min [0, Z 2 + k + S1 ]
= min [0, 0.33 + 0.50 + 0] = 0.000.
Table 5.4
H1277 ch05.indd 110
Data from a manufacturing process of auto parts before and after its mean
experienced a shift of 1 (sample size one).
Si+ = max((0, Z i k + Si+ 1 ) Si = min((0, Z i + k + Si 1 )
Sample #
Xi
19.35
0.33
0.00
0.00
20.05
0.03
0.00
0.00
18.92
0.54
0.00
0.04
15.70
2.15
0.00
1.69
17.50
1.25
0.00
2.44
19.37
0.32
0.00
2.26
17.03
1.48
0.00
3.24
19.35
0.33
0.00
3.07
22.99
1.50
1.00
1.07
10
18.61
0.70
0.00
1.27
11
23.92
1.96
1.46
0.00
12
18.75
1.13
0.00
0.63
13
22.48
1.24
0.74
0.00
14
25.85
2.93
3.17
0.00
15
19.20
0.60
2.07
0.10
16
23.18
1.59
3.16
0.00
17
24.17
2.09
4.75
0.00
18
20.77
0.39
4.64
0.00
19
21.18
1.09
5.23
0.00
20
24.33
2.17
6.90
0.00
Z i (X i )
3/8/07 12:35:05 PM
We can calculate the other values of Si+ and Si for i = 3, 4, . . . , 20 in the

same manner. These values are listed in columns 4 and 5 of Table 5.4, which
gives us a complete summary of a two-sided CUSUM chart for the data in
this example. From column 4 of Table 5.4 we see that the value of Si+ at
point 19 is 5.23, which is clearly greater than the decision interval of h = 5.
Therefore, we conclude that at this point the process is out of control due to
an upward mean shift. Also, note that in column 5, no value of Si has gone
below the decision interval of h = 5, which implies that no downward mean
shift has occurred. Again, the first nonzero value of Si+ (before it crossed the
decision interval h) occurred at sample number 13, which implies that the
process mean shifted during the period when samples 12 and 13 were taken.
These conclusions are also confirmed by the CUSUM control chart shown
in Figure 5.5.
Xbar Control Chart for Individual Values
Individual Value
30
UCL = 28.69
25
X = 20.64
20
15
LCL = 12.58
1
Figure 5.4
9
11
Observation
13
15
17
19
MINITAB printout of the X control chart for individual values in Table 5.4.
CUSUM Chart of a Quality Characteristic
Cumulative Sum
7.5
UCL = 5
5.0
2.5
0.0
-2.5
LCL = -5
-5.0
2
Figure 5.5
H1277 ch05.indd 111
10
12
Sample
14
16
18
20
MINITAB printout of the CUSUM control chart for individual values in Table 5.4.
3/8/07 12:35:06 PM
112
Chapter Five
Once again, we have concluded that the process is out of control. Therefore,
we should now find the estimate of the new process mean 1, which is given by
1 = X = X i m = (22.48 + 25.85 + 19.20 + 23.18 + 24.17 + 20.77 + 21.18) 7
= 22.404, where m is the number of periods between the time when the shift
occurred and when it was concluded that the process is out of control.
Summarizing the results of Examples 5.2 and 5.3, we have the following:
a. In both cases, the regular

Shewhart X-R control chart in
Example 5.2 and the X control chart for individual values in
Example 5.3 did not detect the one standard deviation shift in
the process mean.
b. In Example 5.2 the CUSUM control chart indicated that the
process was out of control at period i = 13, which means the
third sample taken after the actual shift occurred. Twelve parts
were selected before we knew that the process was out of
control.
c. In Example 5.3 the CUSUM control chart indicated that the
process was out of control at period i = 19, which means the
ninth sample taken after the actual shift occurred. Nine parts
were selected before we knew that the process was out of
control.
Note that in Examples 5.2 and 5.3, if the parts were selected at the same frequency, say, every half hour, then it would be quicker to determine that the
process is out of control with samples of size one rather than size four, a result
that may be true in general. In fact, CUSUM charts are often constructed using
samples of size one. Finally, it is recommended that in order to avoid any confusion of using different values of , and for the sake of simplicity, one should
use the standardized values (zi) rather than the actual values (xi).
5.2.2 The Fast Initial Response Feature
for the CUSUM Control Chart
Lucas and Crosier (1982) introduced the fast initial response (FIR) feature,
which improves the sensitivity either at process start-up or immediately after
any control action has been taken. In standard CUSUM control charts, we use
the initial value S0 = 0, but in a CUSUM control chart with the FIR feature
the starting value of S0 is set up at some value greater than zero. Lucas and
Crosier point out that control of the process is less certain following a possibly ineffective control action, and therefore extra sensitivity is warranted.
The FIR feature in CUSUM control charts provides this extra sensitivity.
Furthermore, Lucas and Crosier recommend setting up the starting CUSUM
value at h/2. For illustration of FIR, we rework Example 5.3.
Example 5.4 Reconsider the data in Example 5.3, where the observations
represent quality characteristics of auto parts manufactured by a given process. These data are reproduced in Table 5.5. Construct the tabular CUSUM
control chart for these data using the FIR feature.
Solution: Table 5.5 gives the complete tabular CUSUM using FIR for the
data in Example 5.3, and the graph is shown in Figure 5.6.
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Table 5.5 Tabular CUSUM control chart using FIR for data in Table 5.4.
Sample #
Xi
19.35
0.33
1.67
2.33
20.05
0.03
1.20
1.80
18.92
0.54
0.16
1.84
15.70
2.15
0.00
3.49
17.50
1.25
0.00
4.24
19.37
0.32
0.00
4.06
17.03
1.48
0.00
5.04
19.35
0.33
0.00
4.87
Z i (X i )
22.99
1.50
1.00
2.87
10
18.61
0.70
0.00
3.07
11
23.92
1.96
1.46
0.61
12
18.75
1.13
0.00
1.24
13
22.48
1.24
0.74
0.00
14
25.85
2.93
3.17
0.00
15
19.20
0.60
2.07
0.10
16
23.18
1.59
3.16
0.00
17
24.17
2.09
4.75
0.00
18
20.77
0.39
4.64
0.00
19
21.18
1.09
5.23
0.00
20
24.33
2.17
6.90
0.00
CUSUM Control Chart of a Quality Characteristic Using FIR
Cumulative Sum
7.5
UCL = 5
5.0
2.5
0.0
-2.5
LCL = -5
-5.0
2
10
12
Sample
14
16
18
20
Figure 5.6 MINITAB printout of the two-sided CUSUM control chart for the data in Table 5.5 using FIR.
H1277 ch05.indd 113
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114
Chapter Five
In Example 5.3, the CUSUM chart parameters were k = 0.5 and h = 5, and the
starting CUSUM value was S0+ = S0 = 0. In this example, we used S0+ = h/2
= 2.5 S0 = h/2 = 2.5. Note that by using FIR, the CUSUM for downward
shift in column 5 showed that at period i = 7, there was a downward shift.
However, before an upward shift occurred, the CUSUM for the upward shift
in column 4 had very little effect. The CUSUM values quickly changed to
zero, and after the zero value, the starting value of 2.5 had no effect. This
happened because these observations came from the process that had not
experienced any upward shift. However, if these observations had come from
a process that had experienced an upward shift, then perhaps the result would
have been altogether different.
To see the effect of FIR when the process is out of control, we construct a
CUSUM chart for the previous process after it experienced an upward shift of
1. For comparative purposes, we use the observations starting from the 11th
observation in Table 5.4, as they were taken after the process experienced an
upward shift of 1. These observations and the corresponding CUSUM with
S0+ = h/2 = 2.5 S0 = h/2 = 2.5 are shown in Table 5.6.
Example 5.5 Reproduce observations 11 through 20 from Table 5.4 in
Table 5.6 and construct the tabular CUSUM control chart for these data
using the FIR feature. Compare the effects of the FIR feature in this example
with the effects of the FIR feature in Example 5.4.
Solution: Table 5.6 gives the complete tabular CUSUM control chart for
the data in Table 5.4. Note that in this example, these data come from a process after it had experienced an upward shift of 1. Clearly, the FIR feature
has quite a significant effect on the CUSUM chart. In this case, the 14th
sample identifies that the process is out of control, whereas in Example 5.4
we had made this conclusion only after the 19th sample. However, because
the shift was only upward, the CUSUM chart for the downward shift had no
effect. In summary, we can say that the FIR feature for the CUSUM chart is
Table 5.6
H1277 ch05.indd 114
Tabular CUSUM control chart using FIR for the process in Table 5.4, after it
had experienced an upward shift of 1.
Sample #
Xi
11
23.92
1.96
3.96
0.64
12
18.75
1.13
2.33
0.67
Z i (X i )
13
22.48
1.24
3.07
0.00
14
25.85
2.93
5.50
0.00
15
19.20
0.60
4.40
0.10
16
23.18
1.59
5.49
0.00
17
24.17
2.09
7.08
0.00
18
20.77
0.39
6.97
0.00
19
21.18
1.09
7.56
0.00
20
24.33
2.17
9.23
0.00
3/8/07 12:35:07 PM
very valuable whenever there is some change in the process; otherwise, the
FIR feature has no significant effect.
One-Sided CUSUM Control Chart
In our previous discussion we noted that a situation can arise where one may
be interested in detecting a shift in one direction only, that is, in either the
upward or downward direction instead of both directions simultaneously. In
applications, situations do arise where the shift in one direction is more serious than a shift in the other direction, as, for example, in the case of tensile
strength of a copper wire. In such cases, to construct the CUSUM control
chart, one needs to calculate only S+ or S depending on whether we are interested in detecting an upward or downward shift. However, to construct a onesided CUSUM, one must note that the values of k and h are not the same as
for a two-sided CUSUM control chart with the same value of ARL. In other
words, if we keep the same values of k and h for a one-sided CUSUM as for
a two-sided CUSUM, then the value of ARL will be much higher. For more
discussion on this topic, see Hawkins and Olwell (1998).
5.2.3 Combined Shewhart-CUSUM Control Chart
As Hawkins and Olwell (1998, 71) put it, CUSUMs are excellent diagnostics for detecting and diagnosing step changes in process parameters. However, these are not the only changes that can occur. Transient special causes
are also an important reality, and an important source of quality problems.
They cannot be ignored, and relying solely on CUSUM charts for SPC is
shortsighted. Just as Shewhart charts are not particularly effective in detecting less-than-massive persistent changes in a process parameter, the CUSUM
charts are not particularly effective in detecting massive transient changes in
process parameters. In fact, the CUSUMs are meant to detect persistent but
small changes in process parameters. Proper SPC requires the use of both
types of controls: CUSUMs for persistent but small changes and Shewhart
charts for large transient problems.
Lucas (1982) introduced a combined Shewhart-CUSUM quality control
scheme. The combined Shewhart-CUSUM control chart gives an out-of-control signal if the most recent sample is either outside the Shewhart control
limits or beyond the CUSUM decision interval value. Lucas recommends
using the standardized values zi for the combined Shewhart-CUSUM control
chart, which is
zi =
( xi 0 )
,
where 0 is the target mean value and is the process standard deviation.
Note that if rational subgroups of size n > 1 are used, then zi, xi, and are
replaced by zi , xi, and / n , respectively.
In the combined Shewhart-CUSUM control chart, an out-of-control signal at time i is given not only when Si+ or Si exceeds the decision interval
value h, but also when the zi or zi falls outside the Shewhart control limits.
H1277 ch05.indd 115
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116
Chapter Five
It can be seen from Lucas (1982) that ARL0 for the combined
Shewhart-CUSUM chart with h = 5, k = 0.5, and Shewhart control limits
3 is 223.9 without the FIR feature and 206.5 with the FIR feature (S0
= 2.5). Both these values are much smaller than 370, the ARL0 for an incontrol Shewhart control chart. This would cause the process to have more
frequent false alarms. For example, if samples are taken every hour, the
Shewhart control chart would cause a false alarm every 15.4 days, whereas
combined, a Shewhart-CUSUM chart without the FIR feature would cause
a false alarm every 9.3 days, and with the FIR feature every 8.5 days. In
order to avoid this scenario, Lucas recommends taking Shewhart control
limits 3.5, which results in ARL0 being approximately equal to 392.7
without the FIR feature and 359.7 with the FIR feature, again with S0 =
2.5. These values of ARL0 are certainly more comparable to 370. Thus,
the combined Shewhart-CUSUM chart can be implemented just by using
the basic CUSUM chart so that an out-of-control signal occurs whenever
either the CUSUM value exceeds the decision interval value or the absolute value of zi or zi becomes greater than 3.5.
5.2.4 CUSUM Control Chart for Controlling Process Variability
No process is immune to changes in variability. Consequently, any unnoticed changes in process variability can adversely affect the conclusion made
about the process mean using CUSUM charts. Hence, while using CUSUM
charts, controlling process variability is as important as controlling the process mean.
Consider a process with its quality characteristic Xi distributed as normal
with mean and variance 2. Then the standardized random variable
Zi =
Xi
is distributed as standard normal. Hawkins (1981) showed that the random

variable Zi is approximately distributed as normal with mean 0.822 and
standard deviation 0.349; that is, the random variable
Vi =
Zi 0.822
0.349
is distributed as standard normal. Furthermore, when the variance of Xi

increases, the mean of Vi will increase. However, any change in the mean of
Vi can be detected by designing a two-sided CUSUM chart, as follows:
Vi + = max [0, vi k + Vi +1 ],
(5.6)
Vi = min [0, vi + k + Vi 1 ],
(5.7)
where V+0 = V0 = 0 and k and h are the reference value and the decision interval. As Hawkins and Olwell (1998) point out, we can use the FIR feature in
H1277 ch05.indd 116
3/8/07 12:35:07 PM
the same manner as in the basic CUSUM chart, that is, by taking V+0 = V0 =
h/2. The interpretation of this CUSUM chart is very much parallel to the
CUSUM chart in section 5.2.1. Thus, if either of the CUSUM values Vi+ or
Vi exceeds the decision interval, an out-of-control signal for the variance
occurs.
5.3 The MA Control Chart

Consider the process of manufacturing auto parts discussed earlier in this
chapter. Let x1, x2, x3, . . . , xn be the observation on the quality characteristics under investigation. Then the moving average Mi of span m at time i is
defined as
Mi =
Mi =
x1 + x 2 + ... + xi
,
i
i = 1, 2, ..., m 1
xi m +1 + xi m + 2 + ... + xi
,
m
i = m, m + 1, ..., n
(5.8)
(5.9)
Example 5.6 Suppose in the manufacturing process of auto parts we collect five observations on the quality characteristic under investigation. Find
the moving averages Mi, i = 1, 2, . . . , 5 of span 3.
Solution: Because n = 5 and m = 3, we have
M1 = x1 , M 2 =
x +x +x
x +x +x
x +x +x
x1 + x 2
, M3 = 1 2 3 , M 4 = 2 3 4 , annd M5 = 3 4 5
2
3
3
3
The variance of the moving average Mi is given by

For i < m
V ( Mi ) = (
x1 + x 2 + ... + xi
)
i
2
= 2 V (x j ) = ,
i
i j =1
1
For i m
V ( Mi ) = (
i
j>0
xi m+1 + xi m+2 + ... + xi

)
m
2
= 2 V (x j ) = ,
m
m j =1m+1
1
(5.10)
(5.11)
where 2 is the process variance. The variance of the moving averages in

Example 5.6 is
V ( M1 ) = 2 , V ( M 2 ) =
H1277 ch05.indd 117
2
2
2
2
, V ( M3 ) = , V ( M 4 ) =
and, V ( M5 ) = .
2
3
3
3
3/8/07 12:35:07 PM
118
Chapter Five
Now consider a quality characteristic of a process that is normally distributed

with target mean value 0 and variance 2. The probability control limits for
Mi with Type I error for i < m are
UCL = 0 + z 2
,
i
(5.12)
LCL = 0 z 2
,
i
(5.13)
and for i m the control limits are

UCL = 0 + z 2
LCL = 0 z 2
(5.14)
.
m
(5.15)
In order to have 3 control limits, replace z/2 in equations (5.12)(5.15) with

3. The process is considered out of control as soon as Mi falls outside the control limit. Because the plotted points (i, Mi) are not independent, no reasonable interpretation can be made about the patterns in the graph. For detecting
smaller shifts, m should be large. However, note that a large value of m would
mean a longer time in detecting bigger shifts. To illustrate, we consider the
data in Table 5.4.
Note: In the preceding discussion we considered the MA chart for individual values. Sometimes the process allows us to take samples of size n > 1.
In such situations, the individual values in Table 5.7 are replaced by the sample means. Furthermore, the probability control limits in equations (5.12)
(5.15) are defined as follows:
for i < m
and for i m
UCL = 0 + z 2
,
in
(5.16)
LCL = 0 z 2
,
in
(5.17)
UCL = 0 + z 2
mn
(5.18)
LCL = 0 z 2
mn
(5.19)
Example 5.7 Consider the data in Table 5.4, the manufacturing process of
auto parts from Example 5.1. Design an MA control chart for these data with
span m = 4 and interpret the results.
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Table 5.7 MA chart (Mis) for data in Table 5.4 with = 20, = 2.
Sample #
10
Xi
19.35
20.05
18.92
15.70
17.50
19.37
17.03
19.35
22.99
18.61
Mi
19.35
19.70
19.44
18.51
18.04
17.87
17.40
18.31
19.69
19.50
Sample #
11
12
13
14
15
16
17
18
19
20
Xi
23.92
18.75
22.48
25.85
19.20
23.18
24.17
20.77
21.18
24.33
Mi
21.22
21.07
20.94
22.75
21.57
22.68
23.10
21.83
22.33
22.61
Solution: The data from Table 5.4 are reproduced in Table 5.7. The Mi values are determined as shown in the following equations, and these values are
then entered in Table 5.7.
M1 = X1 = 19.35,
M2 = (X1 + X2)/2 = (19.35 + 20.05)/2 = 19.70,
M3 = (X1 + X2 + X3)/3 = (19.35 + 20.05 + 18.92)/3 = 19.44,
M4 = (X1 + X2 + X3 + X4)/4 = (19.35 + 20.05 + 18.92 + 15.70)/4 = 18.51,
M5 = (X2 + X3 + X4 + X5)/4 = (20.05 + 18.92 + 15.70 + 17.50)/4 = 18.04,
.
.
.
M20 = (X17 + X18 + X19 + X20)/4 = (24.17 + 20.77 + 21.18 + 24.33)/4 = 22.61.
Now the points (i, Mi) from Table 5.7 are plotted in the MA control chart.
The MA control chart for the data in Table 5.4 is as shown in Figure 5.7. The
17th point falls outside the control limits. The process is out of control at
time i = 17. Note that the control limits for i < m are wider and varying, but
from i = m onward the control limits become narrower and steady. The 3
control limits in Figure 5.7 are determined using equations (5.12) and (5.13),
as shown here.
For time period i = 1, these limits are
UCL = 20 + 3
2
= 26,
1
LCL = 20 3
2
= 14.
1
H1277 ch05.indd 119
UCL = 20 + 3
2
= 24.24,
2
LCL = 20 3
2
= 15.76.
2
3/8/07 12:35:08 PM
120
Chapter Five
Moving Average Chart for the Data in Table 6.4

27.5
Moving Average
25.0
UCL = 23
22.5
20.0
X = 20
17.5
LCL = 17
15.0
2
Figure 5.7
10
12
Sample
14
16
18
20
MINITAB printout of the MA control chart for the data in Table 5.4.
Similarly, for time period i = 20, these limits are

UCL = 20 + 3
2
= 21.34,
20
LCL = 20 3
2
= 18.66.
20
5.4 The EWMA Control Chart

The EWMA control chart is very useful for processes in which only one observation per period is available. Like the CUSUM control chart, the EWMA
chart has the capability of detecting small shifts in the process mean. The
EWMA control chart was introduced by S. W. Roberts (1959), who called it a
geometric moving average chart. In recent years, however, the chart has come
to be known as an exponentially weighted moving average chart, and in the
rest of this chapter and in subsequent chapters, we shall use this terminology.
The EWMA chart uses information on all the observations, not only the last
observation.
The basic concept is to plot a statistic, which is defined as
zi = xi + (1 ) zi 1 ,
(5.20)
where 0 < 1 is a constant, the initial value z0 is set at the process target
mean value 0 (if 0 is not given, then we set z0 at x), and is the weight.
The statistics zi, zi1 in equation (5.20) are the exponentially weighted moving
averages at time i, i 1, respectively, and xi is the value of the observation
at time i. Furthermore, note that zi is the weighted average of all the previous observations. This can easily be shown by using iterative method, as
follows:
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3/8/07 12:35:08 PM
zi = xi + (1 ) zi 1
= xi + (1 )[ xi 1 + (1 ) zi 2 ]
= xi + (1 ) xi 1 + (1 )2 zi 2
.
(5.21)
.
.
i 1
= (1 ) j xi j + (1 )i z0 .
j =0
At any time i, the most recent observation xi is assigned the weight , while at
any earlier time (i j), j = 1, 2, . . . , i 1, the corresponding observation xij is
assigned the weight (1 ) j, which decreases geometrically as j increases.
For example, if = 0.3, then the current observation is assigned the weight of
0.3, and the preceding observations are assigned the weights of 0.21, 0.147,
0.1029, 0.072, 0.0504, and so on. We can see that the older observations carry
a lesser weight. This makes a lot of sense, particularly when the process mean
is changing slowly but continuously. Moreover, it is also interesting to note
that because EWMA uses the weighted average of all past and present observations, it is not very sensitive to the normality assumption.
If we assume the observations xi are independent with process mean
and variance 2, then from equation (5.21) the mean of the statistic zi is
given by
i 1
E ( zi ) = (1 ) j + (1 )i E ( z0 )
j =0
= [1 + (1 ) + (1 )2 + ... + (1 )i 1 ] + (1 )i E ( z0 ).
The quantity inside the brackets is a geometric series with the ratio equal to
(1 ). Recall that the sum of a finite geometric series is [1 + r + ri 2 + . . . +
r n1 = (1 r n)/(1 r)]. The quantity in the bracket equals 1 (1 ) .
Therefore, we have
E ( zi ) = + (1 )i ( 0 ).
(5.22)
Note that if z0 is set at x, then the equation (5.22) reduces to

E ( zi ) =
(5.23)
because E(x) = . It is customary to set the target value 0 at . In any case,

in all applications we set the expected value of zi at as defined in equation
(5.23). If is not known or the target value is not given, then the EWMA
control chart uses the value of x. The variance of the statistic zi is given by
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122
Chapter Five
V ( zi ) = ( 2 + 2 (1 )2 + 2 (1 )4 + ... + 2 (1 )2i ) 2
= 2 [1 + (1 )2 + (1 )4 + ... + (1 )2i ] 2 .
Again, the quantity inside the brackets is a geometric series with the ratio
equal to (1 )2. We have
V ( zi ) = 2
= 2
[1 (1 )2i ]
[1 (1 )2 ]
[1 (1 )2i ]
[2 2 ]
2
2
(5.24)

[1 (1 )2i ] 2 .
=
2
From equations (5.23) and (5.24) it follows that the CL and the control limits
for the EWMA control charts are given by

UCL = 0 + 3
[1 (1 )2i ],
2
(5.25)
CL = 0,
(5.26)

LCL = 0 3
[1 (1 )2i ].
2
(5.27)
Note that the control limits in equations (5.25) and (5.27) are variable. However, when i becomes very large, the quantity [1 (1 )2i] approaches unity,
and consequently, the EWMA control limits become constant, which are
given by

UCL = 0 + 3
,
2
(5.28)
CL = 0,
(5.29)
.
LCL = 0 3
2
(5.30)
In both cases, the value of has to be determined, which we discuss in the

following text. The general form of the EWMA control chart is given by

UCL = 0 + L
[1 (1 )2i ],
2
H1277 ch05.indd 122
(5.31)
3/8/07 12:35:09 PM
CL = 0,
(5.32)

LCL = 0 L
[1 (1 )2i ],
2
(5.33)
and if i is very large, these equations reduce to

UCL = 0 + L
2 ,
(5.34)
CL = 0,
(5.35)
.
LCL = 0 L
2
(5.36)
Several authors, including Crowder (1987, 1989) and Lucas and Saccucci
(1990), have studied the problem of determining the ARL for different values
of the parameters and L. Quesenberry (1997) has discussed in detail some
of their results. Lucas and Saccucci (1990) have provided tables of ARL as
a function of , L, and , where is a shift in the process mean, measured
in units of the process standard deviation. Some of their results are shown in
Table 5.8.
Example 5.8 Consider the data in Table 5.4 on the manufacturing process
of auto parts in Example 5.1. Design an EWMA control chart for these data
with = 0.20, L = 2.962, 0 = 20, and = 2 and interpret the results.
Solution: The data from Table 5.4 are reproduced in Table 5.9. The zi values
are determined as shown in the following equations, which are then entered
in Table 5.9. Thus, using equation (5.20), we have
= 500.
Table 5.8 A selection of EWMA charts with ARL0 ~
= 0.05
L = 2.615
H1277 ch05.indd 123
= 0.10
L = 2.814
106
= 0.20
L = 2.962
150
= 0.25
L = 2.998
170
= 0.40
L = 3.054
0.25
84.1
224
0.50
28.8
31.3
41.8
48.8
71.2
0.75
16.4
15.9
18.2
20.1
28.4
1.00
11.4
10.3
10.5
11.1
14.3
1.50
7.1
6.1
5.5
5.5
5.9
2.00
5.2
4.4
3.7
3.6
3.5
2.50
4.2
3.4
2.9
2.7
2.5
3.00
3.5
2.9
2.4
2.3
2.0
4.00
2.7
2.2
1.9
1.7
1.4
3/8/07 12:35:09 PM
124
Chapter Five
Table 5.9
Sample #
EWMA control chart (zis) for data in Table 5.4 with = 0.20, L = 2.962.
1
10
xi
19.35 20.05 18.92 15.70 17.50 19.37 17.03 19.35 22.99 18.61
zi
19.87 19.91 19.71 18.91 18.63 18.78 18.43 18.61 19.49 19.31
Sample #
11
12
13
14
15
16
17
18
19
20
xi
23.92 18.75 22.48 25.85 19.20 23.18 24.17 20.77 21.18 24.33
zi
20.23 19.93 20.44 21.52 21.06 21.48 22.02 21.77 21.65 22.19
z1 = x1 + (1 ) z0
= 0.20 19.35 + (1 0.20) 20
= 19.87,
z2 = x 2 + (1 ) z1
= 0.20 20.05 + (1 0.20) 19.87
= 19.91,
z3 = x3 + (1 ) z2
= 0.20 18.92 + (1 0.20) 19.91
= 19.71.
.
.
.
z20 = x 20 + (1 ) z19
= 0.20 24.33 + (1 0.20) 21.65
= 22.19.
The control limits in Figure 5.6 with = 0.20, L = 2.962, 0 = 20, and = 2
are determined using equations (5.31)(5.36).
0.2
UCL = 20 + 2.962 2
[1 (1 0.2)2 ]
2 0.2
= 21.1848,
0.2
LCL = 20 2.962 2
[1 (1 0.2)2 ]
2 0.2
= 18.8152.
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0.2
UCL = 20 + 2.962 2
[1 (1 0.2)4 ]
2 0.2
= 21.5173,
0.2
LCL = 20 2.962 2
[1 (1 0.2)4 ]
2 0.2
= 18.4827.
.
.
.
Similarly, for period i = 20 (because i is fairly large) these limits are
0.2
UCL = 20 + 2.962 2
2 0.2
= 21.9746,
0.2
LCL = 20 2.962 2
2 0.2
= 18.0254.
Now the points (i, zi) from Table 5.9 are plotted in the EWMA control chart.
The EWMA control chart for the data in Table 5.4 is as shown in Figure 5.8.
The 17th point falls outside the control limits. This means the process is out
of control at time i = 17.
Note that in this example, both the MA chart and the EWMA chart showed
that the process was out of control at time i = 17, whereas the CUSUM control chart indicated that the process was out of control at period i = 19.
EWMA Chart of a Quality Characteristic
+2.962SL = 21.975
22
EWMA
21
20
X = 20
19
18
-2.962SL = 18.025
2
Figure 5.8
H1277 ch05.indd 125
10
12
Sample
14
16
18
20
MINITAB printout of the EWMA control chart for the data in Table 5.4.
3/8/07 12:35:09 PM
H1277 ch05.indd 126
3/8/07 12:35:10 PM
6
Process Capability Indices
n Chapter 3 we defined a process as a series of actions or operations

performed in producing manufactured or nonmanufactured products. A
process may also be defined as a combination of workforce, equipment,
raw materials, methods, and environment that works together to produce output. Figure 6.1, which was presented earlier as Figure 3.1, shows where each
component of a process fits.
The quality of the final product depends on how the process is designed
and executed. However, no matter how perfectly a process is designed or how
well it is executed, no two items produced by the process are identical. The
difference between two items is called the variation. Such variation occurs
because of two causes:
1. Common causes or random causes
2. Special causes or assignable causes
Shewhart was the first to attempt to understand and remove variation in a
very systematic way, in 1924 when he presented the graph of a control chart.
In Chapters 3, 4, and 5 we studied various types of control charts, including Shewhart control charts, and noted that they help bring the process into
control. Recall that a process is brought into control by eliminating special
or assignable causes so that the process contains only common or random
causes, and consequently, the process is stable and thus predictable. To study
process capability, it is essential that the process is stable; otherwise, studying process capability is simply a futile exercise.
6.1 Development of Process Capability Indices

Once the process is under statistical control and thus predictable, the next
concern of a manufacturer is to ensure that he or she can deliver the product the consumer wants. In other words, the manufacturer wants to determine
whether the process is capable of delivering the desired product. One way to
127
H1277 ch06.indd 127
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128
Chapter Six
Figure 6.1
Planning
department
Necessary changes for

further needs of
customers and to
stay competitive
Top
management
Testing in
service
Design
department
Shipped to
consumer
Management
Final product
Training of
workers
On-line
testing of
production
Procurement
of raw
materials
Start of
production
Flowchart of a process.
address such a concern is to quantify the capability. A process capability index

(PCI) is a unitless measure that quantifies the process capability, specifically
the relationship between the process output and the designed tolerances. This
measure has become an important tool in process capability analysis. Moreover, because the PCI is a unitless measure of capability, it has become an easy
tool for communication between the manufacturer and the supplier. More and
more manufacturers and suppliers are using PCI as an important part of their
contract to ensure quality.
A process capability analysis is simply a comparison of the distribution of a process output with the product tolerances. As noted by Kotz and
Lovelace (1998), results of process capability analysis have proven very
valuable in many ways. Deleryd (1996) and Kotz and Lovelace (1998, 3)
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Process Capability Indices 129
developed a list of the 13 most common ways of using the results of process
capability analysis:
1. As a basis in the improvement process.
2. As an alarm clock.
3. As specifications for investments. By giving specifications for
levels of PCIs expected to be reached by new machines, the
purchasing process is facilitated.
4. As a certificate for customers. The supplier is able to attach
with the delivery the results from the process capability studies
conducted when the actual products were produced.
5. As a basis for new constructions. By knowing the capability
of the production processes, the designer knows how to
set reasonable specifications in order to make the product
manufacturable.
6. For control of maintenance efforts. By continuously conducting
process capability studies, it is possible to see if some machines
are gradually deteriorating.
7. As specifications for introducing new products.
8. For assessing reasonableness of customer demands.
9. For motivation of coworkers.
10. For deciding priorities in the improvement process.
11. As a base for inspection activities.
12. As a receipt for improvement.
13. For formulating quality improvement programs.
To implement a process capability analysis, one needs to consider the
following:
1. The target value specification, which is usually defined by the
customer.
2. The specification limits, which should be defined by the
customer or the customers technical staff and agreed upon by
the manufacturer. Furthermore, the specification limits should
be such that they allow manufacturing variability without
jeopardizing proper function of the product.
3. An analysis of the process that would allow the manufacturer
to determine whether the product can meet the customers
specifications.
Once production starts, the manufacturer conducts capability studies to compare the measures of the quality characteristic of the manufactured product
with the specification limits. This is where PCIs are used.
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130
Chapter Six
The first-generation PCIs were established by Japanese manufacturers in

the 1970s. They used the following indices:
CpInherent capability of a process
kPosition of the process in relation to the target value
CpkPosition of the 6 process in relation to the target value
CplPosition of the 6 process in relation to the LSL
CpuPosition of the 6 process in relation to the USL
In this chapter we will study these and various other capability indices frequently used in process capability analysis. This book does not cover every
aspect of these indices. However, an excellent reference for a more detailed
study is Kotz and Lovelace (1998).
Throughout the study of these indices, we are going to assume that the
process producing the desired quality characteristic is under control and thus
predictable.
6.2 PCI Cp
Let X be the process quality characteristic we want to monitor. Let USL and
LSL be the upper specification limit and lower specification limit, respectively. The performance of the process with respect to these limits is defined
as follows:
Percentage of nonconforming produced
by the process at the upper end = P(X > USL),
Percentage of nonconforming produced
by the process at the lower end = P(X < LSL).
The total percentage of nonconforming products produced by the process is
defined as
P(X < LSL or X > USL) = 1 P(LSL < X < USL).
In the preceding paragraph we saw the performance of the process with
respect to the specification limits. Now we will look at the performance of
the process with respect to the natural tolerance limits (NTLs), that is, the
UNTL and the LNTL.
The performance of the process with respect to the NTLs is the percentage of the product produced by the process with its quality characteristic
falling within the interval ( 3, + 3), where and , respectively, are
the mean and the standard deviation of the process quality characteristic.
Assuming that the process quality characteristic is normally distributed and
that the process is under control, the percentage of the product produced by
the process with its quality characteristic falling within the interval ( 3,
+ 3) is approximately 99.74 percent. As noted earlier, a PCI is the comparison between what a process is expected to produce and what it is actually
H1277 ch06.indd 130
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producing. We now define the PCI Cp, one of the first five indices used in
Japan and proposed by Juran et al. (1974) as follows:
USL LSL
UNTL LNTL
USL LSL
=
( + 3 ) ( 3 )
Cp =
(6.1)
USL LSL
.
6
Note that the numerator in equation (6.1) is the desired range of the process
quality characteristic, whereas the denominator is the actual range of the process quality characteristic. From this definition, we see that a process can
produce a product of desired quality and that the process is capable only if
the range in the numerator is at least as large as that in the denominator. In
other words, the process is capable only if Cp 1 and larger values of Cp are
indicative of a process. For a 6 process (3.4 defects per million opportunities
[DPMO]), Cp = 2. A predictable processwhich is normally distributed with
Cp = 1 and its mean located at the center of the specification limits, usually
known as the target value of the process characteristicis expected to produce 0.27 percent nonconforming units. Montgomery (2005b) gives a comprehensive list of values of the PCI Cp and associated process nonconforming
for one-sided specifications and two-sided specifications.
Because Cp is very easy to calculate, it is widely used in the industry.
However, the fact that it does not take into consideration the position of the
process mean is a major drawback. A process could be incapable even if the
value of Cp is large (>1). For example, a process could produce 100 percent
defectives if the process mean falls outside the specification limits and is far
from the target value. Furthermore, the value of Cp will become even larger
if the value of the process standard deviation decreases, while the process
mean moves away from the target value.
Note that the numerator in equation (6.1) is always known, but the denominator is usually unknown. This is because in almost all practical applications,
the process standard deviation is unknown. To calculate Cp we must replace
in equation (6.1) by its estimator . From Chapter 4 we know
that can
be estimated either by the sample
standard
deviation
S
or
by
R
/d2. However,
remember that the estimate R /d2 is normally used only when the process is
under control and the sample size is fewer than 10. An estimated value of Cp
is given by
USL LSL
C p =
.
6
We illustrate the computation of C with the following example.
(6.2)
Example 6.1 The following table gives the summary statistics on X and R
for 25 samples of size n = 5 collected from a process producing tie rods for
certain types of cars. The measurement data are the lengths of the tie rods,
and the measurement scale is in millimeters.
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132
Chapter Six
Sample Number
Sample Number
274
14
268
265
15
271
269
16
275
273
17
274
270
18
272
275
19
270
271
20
274
275
21
273
272
22
270
10
273
23
274
11
269
24
273
12
273
25
273
13
274
The target value and the specification limits for the lengths of the rods
are 272 and 272 8, respectively. Calculate the value of Cp assuming that the
tie rod lengths are normally distributed, and find the percentage of nonconforming tie rods produced by the process.
Solution: To find the value of Cp and the percentage of nonconforming tie
rods produced by the process, we first need to estimate the process mean
and the process standard deviation . These estimates may be found by using
X and R /d2, respectively. We get
X
y
1 m
Xi
m i 1
1
(274 265 269 . . . 273)
25
272,

R d 2
1 m
Ri d2
m i 1
1
(6 8 . . . 5 6 ) 2.326
25
6 2.3226 2.58,

where the value of d2 for different samples of size five is found from Table A.2.
Substituting the values of USL, LSL, and in equation (6.2), we get
280 284
= 1.03,
C p =
6(2.58)
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which indicates that the process is capable. To find the percentage of nonconforming tie rods produced by the process, we proceed as follows:
Percentage of nonconforming = (1 P(264 X 280)) 100%
= (1 P(3.1 Z 3.1)) 100%
= (1 0.9980) 100% = 0.2%.
In this example, the percentage of nonconforming tie rods is as expected
when we consider the value of Cp. But as noted earlier, this may not always be
the case, because Cp does not take into consideration where the process mean
is located. To better explain this, we use the following example.
Example 6.2 Suppose that the process in Example 6.1 had a special cause
variation, and as a result, the process had an upward shift. Furthermore, suppose that after the process experienced this shift, we took
another set
of 25 random samples of size n =
5
and
these
samples
produced
X
=
276
and
R
= 6. In this
example the value of X changed from 272 to 276 while R remained the same.
Solution: From the given values of X and R , we obtain

= 276 and = 2.58.
Because the process standard deviation did not change, the value of Cp
remained the same, that is, Cp = 1.03. However, the percentage of nonconforming tie rods produced by the process will be
Percentage of nonconforming = (1 P(264 X 280))100%
264 276 X 276 280 276
))100%
2.58
2.58
2.58
= (1 P ( 4.65 Z 1.55))100%
= (1 P (
6.06%.
Even though the value of Cp did not change after the process mean experienced a shift, the process is producing nonconforming units, which are 30
times more nonconforming than in the previous example. In other words,
Cp did not measure the effect that the upward or downward shift had on the
ability of the process to produce products within the specification limits. This
major drawback of Cp makes it less reliable than many other PCIs. We will
study several of these indices here, but first we will look at an alternative but
equivalent interpretation of Cp, which is given by finding the percentage of
specification band used, that is,
Percentage of specification band used =
1
100 .
Cp
A smaller percentage of specification band used indicates a better process.

Again, for reasons discussed earlier, this interpretation can sometimes be
misleading.
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134
Chapter Six
The other two PCIs first used by Japanese manufacturers are Cpl and
Cpu. These indices are related to the LSL and the USL, respectively, and are
defined as follows:
C pl =
LSL
,
3
(6.3)
C pu =
USL
.
3
(6.4)
The estimates of Cpl and Cpu are given by

X LSL
C pl =
,
3
(6.5)
USL X
(6.6)
C pu =
.
3
To illustrate the computation of Cpl and Cpu, we use the information in Examples 6.1 and 6.2.
Example 6.3 Using the information given in Example 6.1, compute Cpl and
Cpu.
Solution:
X LSL 272 264
C pl =
=
= 1.03
3
3(2.58)
USL X 280 272
=
= 1.03
C pu =
3
3(2.58)
Note that both Cpl and Cpu are equal to Cp, which is always the case when the
process mean is centered between the specification limits. Moreover, when
both Cpl and Cpu are equal, the percentage of nonconforming units below
the LSL and the percentage of nonconforming units above the USL are the
same.
Example 6.4 Using the information in Example 6.2, compute C and C .
pl
pu
Solution:
X LSL 276 264
C pl =
=
= 1.55
3
3(2.58)
USL X 280 276
C pu =
=
= 0.52
3
3(2.58)
In this case, the value of Cpl is much larger than 1, whereas the value of Cpu is
much smaller than 1, which indicates that most of the nonconforming units
produced by the process are falling above the USL. Finally, note that both Cpl
and Cpu are sensitive to where the process mean is located.
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6.3 PCI Cpk

To overcome the centering problem in Cp discussed in the preceding section,
the PCI Cpk was introduced. The PCI Cpk, which is again one of the first five
used in Japan, is defined as
Cpk = min (Cpl, Cpu).
(6.7)
The index Cpk is related to the index Cp as

C pk = (1 k )C p ,
(6.8)
(USL + LSL ) / 2
.
(USL LSL ) / 2
(6.9)
where
k=
Furthermore, it can be seen that 0 k 1, so Cpk is always less than or equal

to Cp. Also note that when the process mean coincides with the midpoint
between the specification limits, k = 0, and therefore Cpk equals Cp.
Cpk takes care of the centering problem only if the process standard
deviation remains the same. If the process standard deviation changes, then
the value of Cpk may not change even when the process mean moves away
from the center. It can be seen that this will always be the scenario when the
distance of the process mean from the nearest specification limit in terms of
remains the same. For example, in Table 6.1 we consider four processes
with the same specification limits but different process means ( ) and different standard deviations () such that the value of Cpk in each case remains
the same.
The value of Cpk for each process remains the same even though the process mean has been moving away from the center, because in each case, the
distance between the process mean and the nearest specification limit (in this
example, the LSL) is three times the process standard deviation. So, we can
say that in some ways Cpk is not an adequate measure of centering. Table 6.2
gives the parts per million (ppm) of nonconforming units for different values of Cpk when it is assumed that the process characteristic is normally
distributed.
From Table 6.2, we can see that each process in Table 6.1 will produce
1350 nonconforming ppm. This is possible only if the process standard deviation is shrinking while the process mean is shifting and the NTLs remain
within the specification limits. In fact, by definition, the process with standard
Table 6.1 Different processes with the same value of Cpk.
Process
LSL
USL
Center
12
36
24
24
1.00
12
36
24
22
3.33
1.00
12
36
24
20
2.67
1.00
12
36
24
18
2.00
1.00
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Cpk
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136
Chapter Six
Table 6.2
Parts per million of nonconforming units for different values of Cpk.
Cpk
1.00
1.33
1.67
2.00
ppm
1350
30
.001
deviation = 2 would be of Six Sigma quality if the process mean were at

the center point. In this case, however, the process is producing 1350 nonconforming ppm because the process mean is off center by 3, a shift larger than
1.5, which would be tolerable only in a Six Sigma quality process.
Boyles (1991) gave the upper and lower bounds on percentage of conforming units associated with values of Cpk as
100 ((2P(Z 3Cpk) 1) (percentage of conforming units)
(6.10)
100 P(Z 3Cpk)).
For example, bounds on percentage of conforming units associated with
Cpk = 1 are
100 ((2P(Z 3) 1) (percentage of conforming units)
100 P(Z 3))
or
99.73 (percentage of conforming units) 99.865.
From this inequality we can easily determine that the bounds on percentage
of nonconforming units associated with Cpk = 1 are
0.135 (percentage of nonconforming units) 0.27
or
1350 (nonconforming ppm) 2700.
6.4 PCI Cpm

The PCI Cpk was introduced because the capability index Cp did not consider
the position of the process mean relative to the target value, which usually
coincides with the center of the specification limits. However, from our discussion in section 6.3, it should be quite clear that even Cpk does not adequately
serve the intended purpose when the process standard deviation is changing.
To meet this challenge, a new capability index, Cpm, was introduced.
Taguchi (1985, 1986) applied the loss function to quality improvement,
where the characteristics of Taguchis loss function are:
Quality is best when on target
Quality decreases as products deviate
Customer dissatisfaction grows with deviation
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Dissatisfaction can be expressed as dollar loss to customer and

society
Dollar loss can often be approximated by a simple quadric function
Taguchi (1986), focusing on the reduction of variation from the target value,
defined the capability index Cp as
Cp =
USL LSL
,
6
(6.11)
where
2 = E(X T)2 = 2 + ( T)2.
(6.12)
Chan et al. (1988) independently introduced Taguchis index Cp and called it

Cpm. They noted that Cpm reacts to changes in the process in much the same
manner as Cpk.
However, the changes in Cpm are more severe than in Cpk. This can be
seen by comparing the values of Cpk and Cpm presented in Table 6.3.
Consider, for example, USL = 22, LSL = 10, T = 16, = 1, and let vary.
Then the changes in the values of Cpk and Cpm as deviates from the target
are as shown in Table 6.3.
Because in practice and are not known, to measure the capability of
a process it becomes necessary to estimate and . Thus, using the estimates
of and , the estimator for Cpm most commonly used is
C pm =
USL LSL
6 s 2 + ( x T )2
(6.13)
where
s2 =
1 n
( x x )2
n 1 i =1 i
(6.14)
.
Taguchi (1985) proposed a slightly different estimator for Cpm, that is,
C pm
=
(6.15)
3 [ fs + n( x T )2 ] / ( f + 1)
2
f = n1, d = (USLLSL)/2.
Kotz and Lovelace (1998) prefer this estimator over the one given in equation
(6.13) due to some statistical properties.
Table 6.3 The values of Cpk and Cpm as deviates from the target.
16
15
14
13
12
Cpk
2.00
1.67
1.33
1.00
0.67
Cpm
2.00
1.41
0.89
0.63
0.49
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138
Chapter Six
Example 6.5 Consider a stable process that has lower and upper specification limits of 24 and 44, respectively, and the target value at T = 34. Suppose a random sample of size 25 from this process produced a sample mean
of x = 36 and standard deviation of s = 2.5. Determine the point estimates
for Cp, Cpk, and Cpm.
Solution: Using the information given in this example and the formulas
presented earlier, we obtain the following point estimates:
USL LSL 44 24
= 1.33,
C p =
=
6s
6 2.5
x LSL USL x
C pk = min
,
= min(1.6, 1.06) = 1.06,
3s
3s
C pm =
C pm
=
=
USL LSL
6 s 2 + ( x T )2
44 24
6 (2.5)2 + (36 34)2
= 1.04,
d
3 [ fs 2 + n( x T )2 ] / ( f + 1)
(44 24) / 2
3 [24(2.5)2 + 25(36 34)2 ] / 25
= 1.054.
6.5 PCI Cpmk

The PCI Cpmk was introduced as a further improvement over Cpm by Pearn et
al. (1992). The index Cpmk is usually known as a third-generation capability
index and is defined as
LSL USL
,
C pmk = min
3
3
(6.16)
where is as defined in equation (6.10). Thus, Cpmk can also be defined as
LSL
USL
,
C pmk = min
3 2 + ( x T )2 3 2 + ( x T )2 .
(6.17)
The relationship between Cpmk and Cpm is similar to that between Cpk and Cp.
In other words,
C pmk = (1 k )C pm ,
(6.18)
where k is as defined in equation (6.9).

A point estimator for Cpmk is given by
H1277 ch06.indd 138
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(USL LSL ) / 2 + x T
C pmk =
,
3
(6.19)
= s 2 + ( x T )2 .
(6.20)
where
Example 6.6 Find an estimator Cpmk of Cpmk for the process in Example 6.5.
Solution: Substituting the values of LSL, USL, T, s, and x in equation
(6.19) we get
C pmk =
=
(44 24) / 2 + 36 34
3 2.52 + (36 34)2
12
3 10.25
= 1.25.
Chen and Hsu (1995) show that the preceding estimator is asymptotically
normal. Wallgren (1996) emphasizes that Cpmk is more sensitive than Cpk
or Cpm to the deviation of the process mean from the target value. Later in
this chapter we will use numerical data to see this characteristic of Cpmk,
Cpm, Cpk, and some other indices. Pearn and Kotz (1994) and Vnnman
(1995) rank the four indices in terms of their sensitivity to differences
between the process mean and the target value as (1) Cpmk, (2) Cpm, (3)
Cpk, and (4) Cp.
6.6 PCI Cpnst

Gupta (2005) recently introduced the capability index Cpnst. Before we formally define this index, we will give some background and rationale.
Deming (1986) points out that there is no process, no capability and no
meaningful specifications, except in statistical control. When a process has
been brought into a statistical control it has a definable capability, expressible
as the economic level of quality of the process. Thus, NTLs should play a
very important role in defining the PCI. Some indicesthe ones we have discussed so far, for examplehave successfully solved the problem of process
variation () and process centering (that is, the distance T between the
process mean and the target value T). Particularly, these indices are secondand third-generation indicesnamely, Cpk, Cpm, and Cpmkwhich are defined
as we saw earlier in terms of process variation () and process centering T
and the distance between the process mean and the specification limits, that
is, LSL and USL . However, none of these indices consider the distance
between the NTLs and the specification limits. A process becomes barely
capable or incapable as the NTLs coincide or cross the specification limits.
A process should be deemed incapable before the process mean coincides or
crosses the specification limits. Once the position of the NTLs is determined
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140
Chapter Six
by the position of the mean , it is the distance between the NTLs and the
specification limits that is more important than the distance between and
the specification limits.
The capability index Cpnst is defined as
LNTL LSL USL UNTL
C pnst = min
,
,
3
3
(6.21)
where LNTL and UNTL are the lower and the upper natural tolerance limits
and is as defined in equation (6.12). Furthermore, using the customary definition of LNTL and UNTL, that is,
LNTL = 3, UNTL = + 3,
Cpnst can be expressed as
3 LSL
USL 3
,
C pnst = min
2
2
2
2
3 + ( T) 3 + ( T)
LSL
USL
1
1
3
3
,
= min
2
2
T
T
1+
1+
(6.22)
USL
LSL
min
1,
1 .
3
3
T
1+

1
Using the notation of Montgomery (2005b, 342), we can express Cpnst as

C pnst =
=
USL
LSL
min
1,
1
3
3
1 + 2
1
1
1 + 2
(6.23)
(C pk 1),
where
T
.
=
A point estimator of Cpnst is given by
C pnst =
1
1+
(C pk 1),
(6.24)
where
H1277 ch06.indd 140
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= =
(6.25)
and
2
xi
1 n 2 i =1
= x , = s =
x n
n 1 i =1 i
(6.26)
or
= x , =
R
d2
s
c4
(6.27)
.
Values of d2 and c4 for various sample sizes are given in Table A.2. Note that
the second set of estimates is used only if the process is in a state of control
and the estimate based on the sample range is used for sample sizes fewer
than 10. Also, note that Cpnst has an asymptotic normal distribution.
or
Examples Comparing Cpnst with PCIs Cpk and Cpm

Example 6.7 (Bothe 2002) Consider two processes, A and B, with the following summary statistics:
A = 3.0
B = 0.0
A = 1.143
B = 2.66.
Further, it is given that LSL = 5, USL = 5, and T M.

Plugging these values into equation (6.7), we get
Cpk (A) = 0.58
Cpk (B) = 0.63.
Process A has a smaller Cpk value than process B. However, process A is

producing a higher percentage of conforming parts than process B, which
is clearly a contradiction. Now if we choose T = 1.5 (T M), so that T is
equidistant from the two means, then substituting all the values in equation
(6.21), we get
Cpnst = 0.2545 for process A
= 0.3222 for process B,
which indicates that process A is better than process B. Moreover, both values of Cpnst are negative, which indicates that both processes are producing
nonconforming parts and therefore are not capable.
Example: 6.8 (Bothe 2002) Consider two processes, A and B, with the following summary statistics:
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142
Chapter Six
A = 12
B = 15
A = 2
B = 0.667.
Also, it is given that LSL = 6, USL = 18, and T = 12. Furthermore, it is

known that process A is inferior to process Binferior in the sense that it is
more likely to produce a higher percentage of nonconforming parts.
From Bothe (2002), we have Cpm for processes A and B equal to 1.0 and 0.65,
respectively, which is again not indicative of the actual capability.
Now, using the summary statistics and the values of LSL, USL, and T in
equation (6.21), we get
which are consistent and indicate that process A is inferior to process B.
Moreover, both values of Cpnst are positive, which indicates that both processes are capable. However, process A is just barely capable. In other words,
process A is more likely than process B to produce nonconforming parts.
Example 6.9 (Pearn et al. 1992) Consider two processes, A and B, with the
following summary statistics:
A = T
d
d
d
1
, B = T + , A = B = , T = (3(USL ) + LSL ),
2
2
3
4
where d = 1/2(USL LSL). Furthermore, under these conditions, processes

A and B are expected to produce 0.27 percent and 50 percent, respectively,
nonconforming parts.
However, from Pearn et al. (1992) it is known that for both processes,
Cpm = 0.555, which, again, is clearly a contradiction. Substituting the values
provided to us in equation (6.21), we get
which are again consistent with what we would expect. Furthermore, the values of Cpnst indicate that process A is barely capable and process B is not
capable at all.
These examples show that the capability index Cpnst generally presents a
clearer picture than the indices Cpk and Cpm.
6.6.1 Certain Features of the Capability Index Cpnst
1. The index Cpnst can take any real value: negative, zero, or
positive.
2. Cpnst < 0 implies that at least one of the NTLs does not fall
within the specification limits, which indicates that the process
is no longer capable.
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3. Cpnst = 0 implies that at least one of the NTLs has coincided

with the specification limits, and hence the process is barely
capable. Under the normality assumptions, the process is
producing either 1350 ppm or 2700 ppm nonconforming
parts, depending on whether one or both NTLs have coincided
with the specification limits. Furthermore, any change in the
processthat is, a change in process mean, process variation,
or bothcan make the process incapable.
4. 0 < Cpnst < 1 implies that the process is capable. The higher the
value of the index, the better the process. As Cpnst approaches 1,
the process mean is approaching the target value and the NTLs
are moving away from the specification limits toward the target
value.
5. Cpnst 1 implies a very desirable situation. The process
standard deviation has become very small, and the distance
between the specification limits and the NTLs is at least
3; that is, the distance between the target value T and the
specification limits is at least 6, which means the process is
performing at a Six Sigma quality level or better. The process
mean may shift as much as 1.5 off the target value without
causing any problems. This is because a shift in the mean
of 1.5 on either side of the target would lead to a rate of at
most 3.4 ppm nonconforming. This is, in fact, another way of
looking at a process performing at a Six Sigma quality level.
6. It can easily be seen that as the process mean moves away from
the target value, the value of the process standard deviation
remains fixed (say at = 2), whereas the distance between
the NTLs and the specification limits and the value of Cpnst
are changing (for example, see Table 6.4). The change in Cpnst
occurs much faster than in any other of the indices (Cp, Cpk,
Cpm, or Cpmk).
7. Similarly, it can be seen that the process variation is increasing
while the value of the process mean is fixed (say, =20),
and the distance between the NTLs and the specification limits
Table 6.4 Values of Cp, Cpk, Cpm, Cpmk, and Cpnst for = 20, 22, 24, 26, 28; T = 24;
LSL = 12; and USL = 36 ( = 2).
M
Cp
Cpk
Cpm
Cpmk
Cpnst
20
1.333
0.894
0.596
0.149
22
1.667
1.414
1.179
0.471
24*
2.000
2.000
2.000
1.000
26
1.667
1.414
1.179
0.471
28
1.333
0.894
0.596
0.149
*Target value
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144
Chapter Six
Table 6.5
Values of Cp, Cpk, Cpm, Cpmk, and Cpnst for = 2, 2.5, 3.0, 3.5, 4.0, 4.5; T =
24, LSL = 12, and USL = 36 ( = 20).
Cp
Cpk
Cpm
Cpmk
Cpnst
2.000
1.333
0.894
0.596
0.149
2.5
1.600
1.067
0.848
0.565
0.035
3.0
1.333
0.889
0.800
0.533
0.067
3.5
1.143
0.762
0.753
0.502
0.157
4.0
1.000
0.663
0.707
0.471
0.236
4.5
0.889
0.593
0.664
0.443
0.305
and the value of the index Cpnst are changing (for example, see
Table 6.5)again, at a much faster rate than the values of any
other indices.
6.7 PCIs Pp and Ppk

The capability indices we have studied so far have one characteristic in common: each one is used when the process is stable. In 1991 the American
Automotive Industry Group (AAIG), consisting of representatives from Ford
Motor Company, General Motors Corporation, American Daimler/Chrysler
Corporation, and the American Society for Quality, was founded. This group
of individuals standardized the supplier quality reporting procedure for the
industry. It also advocated for the use of two sets of PCIsone consisting of
Cp and Cpk, and the other consisting of Pp and Ppk. Furthermore, the group
advised using Cp and Cpk when the process is stable and Pp and Ppk when
the process is not in control, where the two sets of indicesPp and Ppk, and
Cp and Cpkare defined in exactly the same manner and differ only in their
estimates. We have
USL LSL
Pp =
,
6 s
(6.28)
USL LSL
C p =
,
6 R / d2
(6.29)
USL X X LSL
Ppk = min
,
,
3 s
3 s
(6.30)
USL X X LSL
C pk = min
,
.
3 R / d2 3 R / d2
(6.31)
and
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In other words, they differ only in the method in which one estimates
the standard deviation. The estimate s is the usual standard deviation
s=
( xij x )2 / (mn 1),

i =1 j =1
and R / d2 = R / d 2 is an estimate obtained
using the subgroup ranges Ri, i = 1, 2, . . . , m and the corresponding value

of d2. Note that the estimate s measures the process variability by using the
variability within and between subgroups, whereas R / d2 uses only the variability within the subgroups. When the process is stable, there is very little
variability between the subgroups; the two sets of indices are essentially the
same because the estimates s and R / d2 are approximately equal. But if the
process is not stable, there is potentially a very large variability between the
subgroups. This would mean that R / d2 underestimates the process standard
deviation, and consequently Cpk would overestimate the process capability.
Fortunately, this situation will not arise, because the use of Cpk is recommended only when the process is stable.
Kotz and Lovelace (1998, 253) strongly argue against the use of Pp and
Ppk: We highly recommend against using these indices when the process is
not in statistical control. Under these conditions, the P-numbers are meaningless with regard to process capability, have no tractable statistical properties,
and infer nothing about long-term capability of the process. Worse still, they
provide no motivation to the user-companies to get their process in control.
The P-numbers are a step backwards in the efforts to properly quantify process capability, and a step towards statistical terrorism in its undiluted form.
Montgomery (2005b, 349) agrees with Kotz and Lovelace: The process performance indices Pp and Ppk are more than a step backwards. They are a waste
of engineering and management effortthey tell you nothing. The authors
wholeheartedly agree with Kotz and Lovelace and Montgomery. No one can
judge a process when its future behavior is so unpredictable.
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7
Measurement Systems
Analysis
easurement Systems Analysis (MSA) is used to understand and

quantify the variability associated with measurements and measurement systems. In the Measurement Systems Analysis Reference
Manual, the Automotive Industry Action Group (AIAG) and MSA Work
Group (2002, 64) define measurement and measurement systems as follows:
Definition 7.1 Measurement: the assignment of numbers [or values] to material things to represent the relations among them with
respect to particular properties.
Definition 7.2 Measurement system: the collection of instruments
or gauges, standards, operations, methods, fixtures, software, personnel, environment and assumptions used to quantify a unit of measure
or fix assessment to the feature characteristic being measured; the
complete process used to obtain measurements.
These definitions will serve as the basis of our discussion. However, we must
first provide a clarification. The term MSA is commonly used interchangeably with the term Gage repeatability and reproducibility (Gage R&R). MSA
is a more comprehensive analysis quantifying variability components from
gage stability, gage bias, gage linearity, and gage repeatability and reproducibility (that is, variability from operator measurements). Gage R&R is, in
fact, a subset or component of MSA. The underlying reason for mistaken
interchange of the two terms is that many, if not most, problems with measurement systems are detected and corrected with the Gage R&R procedure
without having to continue with a more comprehensive MSA. For a detailed
discussion of analysis techniques for gage stability, gage bias, and gage linearity, see AIAG and MSA Work Group (2002).
147
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148
Chapter Seven
7.1 Using SQC to Understand Variability

In each of the preceding chapters of this book, and in the previous book,
Applied Statistics for the Six Sigma Green Belt, we have discussed the concept of variability in both manufacturing and service delivery processes. The
fact that variability exists in virtually any and all processes cannot be overemphasized. In many of our previous discussions and related references, the
point has been made that variability in processes can be quantified by a probability distribution. Further, we made the point that a probability distribution
of statistics (sample mean) from repeated samples would form the normal
distribution through a concept called the central limit theorem (CLT). Figure 7.1 graphically describes the CLT.
As we can see in Figure 7.1, regardless of the distribution shape in a production or service delivery process, a plot of statistics from repeated samples
forms the normal distribution.
Variability in the Production or Service Delivery Process
An interesting point is that variability is present in production or service
delivery processes. We make the point that common cause variation, the type
of variation expected in natural process behavior, can be reduced but not
completely eliminated. And we continue to make the point that special cause
variation, the type of variation not expected in natural process behavior, can
and must be eliminated.
Variability in the Measurement Process
It is critically important that we understand that the methods, procedures,
tools, and equipment we use to make measurements constitute an independent process that creates, and is susceptible to, its own variation. This means
** *
**
Figure 7.1
H1277 ch07.indd 148
** *
**
** * * *
**
** *
** *
**
Approximate sampling distribution of sample statistics X with sample size five.
3/8/07 5:58:28 PM
Measurement Systems Analysis
=
Total variation
Figure 7.2
149
+
Part variation
Gage R&R variation

(Measurement variation)
Components of total variation.
there are two sources or components of variation present in each measurement we take, as is shown in Figure 7.2.
It is important to ensure that the component of variability associated with
the measurement system does not consume an excessive amount of variability as is allowed in the process specification. The purpose of MSA, then, is to
quantify measurement system variability.
7.2 Evaluating Measurement System Performance

So far we have focused on bringing a process under statistical control, or, in
other words, reducing the overall variation in the process. In this chapter, we
focus on the MSA, which constitutes an important part of the total process
variation. The total process variation can be divided into three major categories: variation due to parts, variation due to measurement instruments or
equipment (gage), and variation due to operators. Part-to-part variation may
be due to environment, methods, materials, machines, or some combination
thereof, and other factors. Variation caused by the measurement instrument
and variation caused by the operators who use the instrument are two of the
components that constitute the variation from the measurement system. In
the industrial world, these components are usually referred to as repeatability
and reproducibility, respectively. Thus, repeatability and reproducibility may
be considered as the major indicators of measurement system performance.
In addition, sometimes there is a third component: the variation caused by the
interaction between the operators and the instrument.
Because repeatability refers to the variation generated by the instrument
(that is, measurement equipment or gage), it is referred to as instrument or
equipment variation (EV). Reproducibility refers to variation generated by
operators using measurement instruments, and it is referred to as operator or
appraiser variation (AV). The study of Gage R&R is usually referred to as a
Gage R&R study.
The Measurement Systems Analysis Reference Manual gives several methods
for conducting Gage R&R. In this book we will study MSA using two methods,
one based on range and the other based on the analysis of variance (ANOVA).
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150
Chapter Seven
Because ANOVA is an advanced statistical technique that is not covered in our

first volume, Applied Statistics for the Six Sigma Green Belt, or in this book,
details will be kept to a minimum. We will focus our attention on explaining
and interpreting the results of an example that we will work out using computer
software.
7.2.1 MSA Based on Range
Various authors, including IBM (1986) and Barrentine (2003), have presented
a form of what is known as the range method. Before we discuss the details
of this method, we will define certain terms, namely, measurement capability
index, K1-Factor, and K2-Factor. In addition, we will define some other terms
that are very useful in understanding the MSA.
An MSA is a technique for collecting and analyzing data to evaluate
the effectiveness of the measurement process. To collect data, we randomly
select some parts and then select a certain number of operators (usually three
or more, but as a general rule, the more the better). Each operator takes multiple measurements (at least two) on each part, and all the parts are measured
in random order. These measurements are also known as trials. Using the
terminology of the control charts discussed in earlier chapters, the measurements on each part (or the number of trials) constitute a rational subgroup,
and the number of parts times the number
of operators constitutes the num
ber of subgroups or samples. Then R isdefined as the average of the ranges
of trials within the same operator, and R is defined as the average of the R s
between the operators.
Definition 7.3 The measurement capability index (MCI) is a measurement that quantifies our belief that the gage is reliable enough to
support decisions made under the existing circumstances.
The MCI relates to four characteristics of a measurement system, which are
the key to any measurement system. These characteristics are:
1. Precision
2. Accuracy
3. Stability
4. Linearity
The characteristic precision is further subdivided into two categories: repeatability and reproducibility.
Definition 7.4 Repeatability measures the preciseness (consistency) of the observations taken under the same conditions, which is
achieved by computing the variance of such observations.
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151
For example, we say a gage possesses the characteristic of repeatability if an

operator obtains similar observations when measuring the same part again
and again.
Definition 7.5 Reproducibility measures the preciseness (consistency) of the observations taken by different operators when measuring
the same part.
For example, we say a gage possesses the characteristic of reproducibility if
various operators obtain similar observations when measuring the same part
again and again.
Definition 7.6 Accuracy of a measurement system is the closeness
of the average of measurements taken to the true value.
The distinction between precision and accuracy is explained in the diagram
in Figure 7.3.
Definition 7.7 Stability is defined by the total variation in measurements
obtained with a measurement system on the same master or same parts
when measuring a single characteristic over an extended period of time.
The smaller the total variation, the more stable the measurement system.
Definition 7.8 The difference between the true value (master measurement) and the average of the observed measurements of the same
part has the same distribution over the entire measurement range.
Linearity is best explained by the diagram in Figure 7.4.
In any manufacturing process, the total variability consists of two componentsone due to the variability among the parts and the other due to the
variability in the measurement system. The MCI of a measurement system,
which is directly related to the variability due to the measurement system, is
(a)
(b)
Target
Figure 7.3
H1277 ch07.indd 151
(c)
Target
(d)
Target
Target
The distinction between accurate and precise, where (a) is accurate and precise, (b) is
accurate but not precise, (c) is not accurate but precise, and (d) is neither accurate nor precise.
3/8/07 5:58:28 PM
152
Chapter Seven
Observed value
60
50
40
30
20
20
25
30
35
40
45
50
55
Actual value
Figure 7.4
The linear relationship between the actual and the observed values.
a very pertinent factor in improving any process. The total variability due to
the measurement system itself consists of three components: variability due
to operators, variability due to the measurement instrument, and variability
due to the interaction between the operators and the measurement instrument.
Statistically, these relationships can be expressed as follows:
2
2total = 2parts + meas
.,
(7.1)
2
2meas. = 2inst . + operator
+ 2
parts operator
(7.2)
The total variability due to the measurement (2meas.) is also known as the
total Gage R&R variability. The instrument variability is represented by the
variability in the repeated measurements by the same operator, and for this
reason it is also known as repeatability. In the ANOVA method, the repeatability variance component is the error variance (that is, 2inst. = 2EV = 2).
The remainder of the variability in the measurement system comes from various operators who use the instrument and from the interaction between the
instruments and the operators. Note that the interaction appears when any
operator can measure one type of part better than another. This total variability from the operators and from the interaction between the operators and
the instruments is also known as reproducibility. Equation (7.2) can also be
expressed as
2
2
2meas. = repeatability
+ reproducibility
.
(7.3)
Using Barrentines approach, repeatability is defined as

Repeatability = EV = 5.15 repeatability = 5.15
H1277 ch07.indd 152
R
= K1 R ,
d2
where K1 =
5.15
(7.4)
d2
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153
and where the factor 5.15 represents the 99 percent range of the standard
normal distribution, which follows from the fact that
P(2.575 Z 2.575) = 0.99.
(7.5)
Note that the AIAG recommends using the factor 6 instead of 5.15 because it
covers almost 100 percentor to be exact, 99.74 percentof the range. Values of K1 for various sample sizes (that is, the number of trials or the number
of measurements taken on the same part by the same operator) are given in
Table A.3. Duncan (1986) points out that this estimation procedure should be
slightly modified if N = r n = (# operators) (# parts) is less than 16. If N
is less than 16, then K1 is defined as
K1 =
5.15
d 2*
(7.6)
The values of d2* are listed in Duncan (1986), Table D3. The values of K1
listed in Table A.3 are determined according to the value of N. Again, using
Barrentines notation (2003, 57), the Reproducibility = AV, ignoring the interaction term, is defined as
Reproducibility = AV = ( K 2 Rx )2
( EV )2
,
( r n)
(7.7)
where r is the number of trials, n is the number of parts or samples, EV is as

given in equation (7.4), Rx is the range of the operators means, and the factor
K2 is defined as
K2 =
5.15
d 2*
(7.8)
The value of d2* can be found from Duncans Table D3 by selecting g = 1

and m = n (# operators). For example, if we have five operators, then from
Duncans Table D3 for g = 1, m = 5, we have
K2 =
5.15
= 2.077 .
2.48
We now illustrate the range-based method and then the ANOVA method with
the following example.
Example 7.1 A manufacturer of bolts (parts) used in automotive applications has installed a new measuring gage. In order to perform the MSA on
the new gage, the quality manager randomly selects three Six Sigma Green
Belts from the quality control department, who decide to conduct the MSA by
taking a random sample of 10 bolts. Each Six Sigma Green Belt takes three
measurements on each bolt, which is randomly selected. The data obtained are
as shown in Table 7.1.
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154
Chapter Seven
Table 7.1
Data on an experiment involving three operators, 10 bolts, and three

measurements (in millimeters) on each bolt by each operator.
Bolt
(Part)
Number
Operator 1
Operator 2
Operator 3
Trial
1
Trial
2
Trial
3
Trial
1
Trial
2
Trial
3
Trial
1
Trial
2
Trial
3
26
22
26
21
23
21
24
22
26
28
26
28
24
29
26
24
25
24
28
31
28
28
27
28
32
30
27
35
33
31
35
31
30
34
35
31
37
35
38
36
38
35
35
34
35
40
38
40
40
38
40
36
37
38
39
42
41
40
39
43
43
41
43
42
43
46
42
46
42
43
44
45
50
52
50
53
52
53
49
53
49
10
28
3
28
R 1 = 3.0, x 1 = 35.33
28
27
28
R 2 = 2.5, x 2 = 34.67
32
30
27
R 3 = 3.0, x 3 = 34.93
Solution: We first discuss Gage R&R using the range-based method

(Barrentine 2003, IBM 1984).
Step 1: Verify gage calibration is current.
Step 2: Identify operators. Three operators are typically used in gage
studies; however, the more operators, the better.
Step 3: Select a random sample of parts and have each operator
measure all parts. One operator measures all parts, taking
several measurements on each part, then the second
operator takes measurements, then the third operator takes
measurement, and so on. All parts are measured in random
order.
Step 4: Calculate the sample mean, the intertrial range for
each sample, and the average range for each operator.
The sample means and average ranges are provided in
Table 7.1.
Step 5: Calculate the range of sample means ( Rx ), that is,
Rx = max( xi ) min( xi )
= 35.33 34.67 = 0.66.
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155
Step 6: Calculate the average range (R) for operators:

R1 + R2 + R3
3
3.00 + 2.50 + 3.00
=
= 2.83.
3
R=
Step 7: Calculate repeatability (this value is also referred to as

equipment variation [EV]) and the estimate of the standard
deviation of repeatability (repeatability):
Repeatability (EV) = R K1 = 2.83 3.05 = 8.63,
where from Table A.3, K1 = 3.05
repeatability =
EV 8.63
=
= 1.67.
5.15 5.15
Step 8: Calculate reproducibility (this value is also referred to as

operator or appraiser variation [AV]) and the estimate of
the standard deviation of repeatability (repeatability)
Reproducibility (AV) = ( Rx K 2 )2 [(EV)2 / n r ],
where from Table A.4, K2 = 2.70, n = # of parts or samples,
and r = # of trials. We have
Reproducibility (AV) = (0.66 2.70)2 [(8.63)2 / 10 3]
= 0.83.
Note that if the number under the radical is negative, then
AV is zero. The estimate of the standard deviation of
reproducibility is
reproducibility =
0.83
= 0.16.
5.15
Using this method, the reproducibility is calculated by

ignoring the interaction term, and the standard deviation of
reproducibility may merely be looked upon as the operator
standard deviation.
Step 9: Calculate Gage R&R (that is, repeatability and reproducibility)
and the estimate of Gage R&R standard deviation.
Gage R&R = (repeatability)2 + (reproducibility)2
= (8.63)2 + (.83)2
= 8.67
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Chapter Seven
The estimate of Gage R&R standard deviation is given by

gage =
8.67
= 1.68.
5.15
7.2.2 MSA Based on ANOVA

MSA using the ANOVA method is done by using two types of experimental
designs: crossed and nested, or hierarchical, designs. Crossed designs are
used when each operator measures the same parts, whereas nested, or hierarchical, designs are used when each operator measures different partsin
which case we say that the parts are nested within operators. In this chapter
we will discuss crossed designs. Nested, or hierarchical, designs are beyond
the scope of this book.
Gage R&R StudyANOVA Method (Based on Data in Table 7.1)
Two-Way ANOVA Table with Interaction
Source
Part Numbers
Operators
DF
SS
6135.73
MS
681.748 165.532
P
0.000
6.76
3.378
0.820
0.456
Part Numbers*Operators
18
74.13
4.119
1.477
0.131
Repeatability
60
167.33
2.789
Total
89
6383.95
Alpha to remove interaction term = 0.25
In the Two-Way ANOVA Table with Interaction, we test three hypotheses:

H0: All parts are similar versus H1: All parts are not similar
H0: All operators are equally good versus H1: All operators are not
equally good
H0: Interactions between parts and operators are negligible versus H1:
Interactions between parts and operators are not negligible
The decision whether to reject any of these hypotheses depends on the p value
(shown in the last column of the Two-Way ANOVA Table with Interaction)
and the corresponding value of the level of significance. If the p value is less
than or equal to the level of significance (), we reject the null hypothesis.
Otherwise, we do not reject the null hypothesis. For example, the p value for
parts is zero, which means we reject the null hypothesis that the parts are
similar at any level of significance. In other words, the measurement system
is capable of distinguishing the different parts. The p value for operators is
0.456. Therefore, at any level of significance less than 0.456, we do not reject
the null hypothesis that the operators are equally good (in most applications,
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157
an acceptable value of the level of significance is 0.05). Finally, the interactions are not negligible at a significance level greater than 0.131. Because the
chosen value of alpha is 0.25, the interaction term is not removed from the
ANOVA.
Two-Way ANOVA Table without Interaction
Source
DF
SS
MS
6135.73
681.748
220.222
0.000
1.091
0.341
Part Numbers
Operators
6.76
3.378
Repeatability
78
241.46
3.096
Total
89
6383.95
Because in this case the value of alpha is less than 0.131, the interaction term
is removed from the Two-Way ANOVA Table without Interaction. In this case,
the SS (sum of squares) and DF (degrees of freedom) are merged with corresponding terms of repeatability, which act as an error due to uncontrollable
factors. The interpretation for parts and operators is the same as in the Two-Way
ANOVA Table with Interaction. However, it is important to note that the p values
can change from one ANOVA table to another. For example, the p values for
operators are different in the two tables. We will not discuss here the reason for
these changes in the p values, as it is beyond the scope of this book.
Gage R&R
%Contribution
Source
Total Gage R&R
VarComp
(of VarComp)
3.2321
4.12
Repeatability
2.7889
3.55
Reproducibility
0.4432
0.56
Operators
0.0000
0.00
Operators*Part Numbers
0.4432
0.56
Part-to-Part
75.2922
95.88
Total Variation
78.5243
100.00
Process tolerance = 60
The first column in the Gage R&R MINITAB printout provides the breakdown
of the variance components (estimates of variances). The second column provides percent contribution of the variance components, which becomes the
basis of a Gage R&R study using the ANOVA method. For example, the
total variation due to gage is 4.12 percent, of which 3.55 percent variation is
contributed by the repeatability and the remaining 0.56 percent is contributed
by the reproducibility. The variation due to parts is 95.88 percent of the total
variation. This implies that the measurement system is very capable.
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Chapter Seven
Note that the percent contributions are calculated simply by dividing the
variance components by the total variation and then multiplying by 100. The
percent contribution due to repeatability, for example, is given by
2.7889
100 = 3.55%.
78.5243
StdDev
Study Var
%Study Var
%Tolerance
(SD)
(6 * SD)
(%SV)
(SV/Toler)
1.79780
10.7868
20.29
17.98
Repeatability
1.67000
10.0200
18.85
16.70
Reproducibility
0.66574
3.9944
7.51
6.66
Operators
0.00000
0.0000
0.00
0.00
0.66574
3.9944
7.51
6.66
Part-to-Part
8.67711
52.0626
97.92
86.77
Total Variation
8.86139
53.1684
100.00
88.61
Source
Total Gage R&R
Number of distinct categories = 6
This part of the MINITAB printout provides various percent contributions

using estimates of standard deviations, which are obtained by taking the
square root of the variance components. The comparison with standard deviation does make more sense because the standard deviation uses the same
units as those of the measurements. The study variation (that is, measurement
system variation, which is equivalent to the process variation in the study of
process control) is obtained by multiplying the standard deviation by 6. The
percent study variations are calculated by dividing the standard deviation by
the total variation and then multiplying by 100. The percent contribution due
to part-to-part, for example, is given by
8.67711
100 = 97.92%.
8.86139
The percent tolerance is obtained by dividing the (6*SD) by the process tolerance and then multiplying by 100. The process tolerance of total Gage R&R,
for example, is given by
10.7868
100 = 17.98%.
60
Note that the total percent tolerances in this example do not add up to 100.
Rather, the total sum is 88.61, which means the total variation is using 88.61
percent of the specification band.
The last entry in the MINITAB printout is the number of distinct categories, which in this case is 6. The number of distinct categories can be
determined as follows:
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159
part-to-part SD
Number of distinct categories = Integral parrt of

1.4142
total Gage R&R SD
8.67711
= Integral part of
1.4142
1.79780
= 6.
Under AIAGs recommendations, a measurement system is capable if the
number of categories is greater than or equal to five. In this example, the
measurement system is capable of separating the parts into the different
categories in which they belong. This quantity is equivalent to the one
defined in Montgomery (2005b) and is referred to as signal-to-noise ratio
(SNR), that is,
SNR =
2 p
1 p
(7.9)
where
p =
2p
1 2p
(7.10)
7.2.2.1 Graphical Representation of Gage R&R Study

Figure 7.5 shows the various percent contributions of Gage R&R, repeatability, reproducibility, and part-to-part variations, which we discussed in the
previous section.
Figure 7.5
H1277 ch07.indd 159
Percent contribution of variance components for the data in Example 7.1.
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160
Chapter Seven
As usual, in Figure 7.6 we first interpret the R chart. All the data points
are within the control limits, which indicates that the operators are measuring consistently. The X chart shows many points beyond the control limits,
but this does not mean the measurement system is out of control. Rather,
this indicates the narrower control limits because the variation due to repeatability is small and the measurement system is capable of distinguishing the
different parts.
Figure 7.7 plots the average of each part by any single operator. In this
graph we have three lines because we have three operators. These lines intersect one another, but they are also very close to one another. This implies
that there is some interaction between the operators and the parts, which is
significant only at significance level 0.131 or greater.
In Figure 7.8, the clear circles represent the measurements by each operator, and the dark circles represent the means. The spread of measurements for
each operator is almost the same. The means fall on a horizontal line, which
indicates that the average measurement for each operator is also the same.
In this example, the operators are measuring the parts consistently. In other
words, the variation due to reproducibility is low.
In Figure 7.9, the clear circles represent the measurements on each part,
and the dark circles represent the mean for each part. In this case, the spread
of measurements for each part is not exactly the same, but is nonetheless very
small. This means that each part is measured with the same precision and
accuracy. Greater variability among the means indicates that the measurement system is quite capable of distinguishing the parts belonging to different categories. Combining the outcomes of Figures 7.8 and 7.9, we can say
that, overall, the Gage R&R variability is not very significant.
Figure 7.6
H1277 ch07.indd 160
X and R charts for the data in Example 7.1.
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Figure 7.7
Interaction between operators and parts for the data in Example 7.1.
Figure 7.8
Scatter plot for measurements versus operators.
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162
Chapter Seven
Figure 7.9
Scatter plot for measurements versus parts (bolts).
7.3 MCIs
As the PCI quantifies the ability of a process to produce products of desired
quality, likewise the MCI quantifies the ability of a measurement system to
provide accurate measurements. In other words, the MCI evaluates the adequacy of the measurement system. Various MCIs are in use, and one such
MCI was defined in equation (7.9). We discuss here the other two most commonly used MCIs: percentage of process variation and percentage of process
specification. The MCI should always be used in conjunction with the PCI
(Barrentine 2003).
MCI as a Percentage of Process Variation (MCIpv)
Gage
R&R
(7.11)
total
The criteria for assessment of this index are usually as follows (Barrentine
2003):
MCI pv = 100
20 percent: good
> 20 percent, 30 percent: marginal
> 30 percent: unacceptable
Using the preceding ANOVA table for the data in Example 7.1, we have
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163
1.79780
= 20%.
8.86139
This MCI indicates that the measurement system is good.
MCI pv = 100
MCI as a Percentage of Process Specification (MCIps)

MCI ps =
6 Gage
R&R
USL LSL
(7.12)
The criteria for assessment of this index are the same as MCIpv (Barrentine
2003):
20 percent: good
> 20 percent, 30 percent: marginal
> 30 percent: unacceptable
Again, using the preceding ANOVA table for the data in Example 7.1 and
with process tolerance 60, we have
6 1.79780
= 18%.
60
Thus, this MCI indicates that the measurement system is good.
MCI ps = 100
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8
PRE-control
n Chapter 1, Figure 1.1 clarified how the SQC tools are related primarily
to applied statistics and DOE. Figure 1.1 has been revised and is given
here as Figure 8.1 to clarify relationships among the SQC tools.
As can be seen in Figure 8.1, PRE-control, if it is used at all, is used after
a process is determined to be capable and operating in a state of statistical
control.
8.1 PRE-control Background

Dorian Shainin developed the term PRE-control and the supporting concepts
in the early 1980s. While PRE-control is not a formal trademark, this SQC
tool is most commonly identified in professional literature as PRE-control,
wherein the first three letters remain capitalized. In the years following the
DOE
Capability
analysis
SPC
Acceptance
sampling
PRE-control
Figure 8.1
Relationships among the SQC tools.
165
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166
Chapter Eight
development and introduction of PRE-control, many papers have been written

in support of it, and many have been written criticizing this SQC technique.
For more about the development and implementation of PRE-control, see the
references in the bibliography.
8.1.1 What Are We Trying to Accomplish with PRE-control?
PRE-control is used as a mechanism to reduce the amount of sampling and
inspection required to validate that a process is producing products and services consistent with customer expectations, as defined by tolerances or specifications. In many, if not most, applications, SPC (and process capability
analysis) is used to validate process performance by monitoring statistically
significant signals that indicate the presence or absence of variation due to
assignable causes. SPC, however, does require regular sampling of rational
subgroups (typically, sample sizes of five or more), and sampling, measurement, and inspection can become expensive, particularly when production
volume is high. As noted in Figure 8.1, PRE-control follows the use of SPC
(and process capability analysis), and it requires much less sampling, inspection, and measurement than does SPC. PRE-control, therefore, is intended to
indicate process performance that is less expensive than SPC once a process
has achieved long-term statistical control. However, PRE-control is not
intended to be a substitute for SPC (Ledolter and Swersey 1997).
8.1.2 The Conditions Necessary for PRE-control to Be Valid
For PRE-control to be valid, a process must satisfy the following conditions:
Be in a state of statistical control
Be capable, as determined by a process capability analysis
Exhibit a low defect rate
These conditions are commonly cited in professional literature. However, for
PRE-control to be valid, it is necessary to further define what it means to be
in statistical control, to be capable, and to have a low defect rate.
Definition 8.1 Statistical control means there are no assignable
causes of variation working on the process. Note that being in a state
of statistical control does not necessarily mean that any given process is producing products or services that meet customer expectations, as defined with a specification. In fact, it is entirely possible
that a process could be in a state of statistical control (that is, have no
assignable causes of variation) and not meet customer expectations,
as was discussed in Chapter 6, Process Capability Indices.
Also, as was discussed in Chapter 6, there are several PCIs, of which Cp and
Cpk are the most commonly used. In the case where the Cp and Cpk ratios are
one, the process variability equals the tolerance, as can be seen in Figure 8.2.
Figure 8.2 illustrates what is commonly referred to as the worst case, where,
as described in Chapter 6, the process is barely capable of acceptable process
performance.
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PRE-control 167
LSL
LNTL
Figure 8.2
Target
USL
UNTL
A barely capable process.
We see in Figure 8.2 that any process drift or shift will result in the production of products or services outside customer specifications or tolerances.
So for PRE-control to be a valid SQC tool, the process capability ratio must
be something greater than one, which means there is some room for the process to vary and yet still produce products or services that meet customer
expectations. How high the PCI Cpk should be to make PRE-control valid is
commonly defined in professional literature as 1.5, which equates to six standard deviations of variability consuming only 0.88 of the tolerance. Process
capability ratios at or above two are commonly considered to be economically unjustified. And because PRE-control is valid only on processes with
capability ratios at or above 1.5, and processes with capability ratios above 2
are not particularly common, PRE-control has a fairly limited range of use.
Lastly, what constitutes a low defect rate as a condition validating the use
of PRE-control is a matter of debate. There are no guidelines, heuristics, or
rules of thumb to qualify a process as having a low defect rate. Several publications cited in the bibliography identify the term near zero defect rate to
describe the conditions necessary to validate the use of PRE-control. It is clear
that whatever value is selected for a low defect rate standard, the process must
be inherently stable and capable, and it must have been through enough iterations of process improvement that defects are extremely unlikely to occur.
8.2 Global Perspective on the Use of PRE-control

(Understanding the Color-Coding Scheme)
PRE-control uses a color-coding scheme associated with each of six zones
consistent with Figure 8.3.
Figure 8.3 shows two green zones (some authors consider there to be only
one large green zone), two yellow zones, and two red zones. Because PREcontrol is based on the standard normal distribution, which is a symmetrical
distribution, there is one green, one yellow, and one red zone on each side
of the process target (center). Whether or not intended by the originator of
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Chapter Eight
Red
Yellow
LSL
1.5S
app. 7%
Figure 8.3
Green
Yellow
Red
USL
3S
app. 86%
1.5S
app. 7%
PRE-control zones.
PRE-control, these zones apply a color-coding scheme used throughout the

world, as reflected in traffic-control systems.
In virtually all countries, green, yellow, and red signify for vehicular and
pedestrian traffic the operational conditions of go, caution, and stop,
respectively. As will be discussed in the next section, green indicates that the
process is performing as expected and warrants continued production. Yellow indicates a low probability of observing process behavior if the process
is performing as expected; caution, along with additional sampling and testing, is warranted. Red indicates that the product or service does not conform
to customer expectations, specifications, or tolerance and that the process
should be stopped. This color-coding scheme is embedded in the mechanics
of how we actually use PRE-control.
8.3 The Mechanics of PRE-control

Use of PRE-control is accomplished with the following steps.
Step 1: Ensure the Process Is Sufficiently Capable
Several authors advocate that for PRE-control to be valid in a worst-case
situation, process capability must be equal to one. When process capability
is equal to one, the process variability is exactly equal to the specification or
tolerancein this case there is no room for process drift without producing
products or services that are defective. Remember from the discussion in
section 8.1.2 that the process capability must be at least 1.5 (that is, process
variability consumes 0.88 of the specification or tolerance) in order for the
process to be a candidate for PRE-control.
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PRE-control 169
Step 2: Establish the PRE-control Zones

Zones for PRE-control are established by dividing the specification or tolerance by four. Having defined four zones within the specification or tolerance,
two of the zones are green and two of the zones are yellow, consistent with
Figure 8.3.
Step 3: Verify That the Process Is Ready to Begin PRE-control
A process is considered ready to begin PRE-control when five consecutive
pieces or service delivery iterations produce output that, when measured, fall
within the green zone established in step 2. If the process is determined to be
capable, as defined in step 1, and yet does not produce five consecutive pieces
in the green zone established in step 2, the process is not yet a candidate for
PRE-control and additional process improvements must be completed.
Step 4: Begin Sampling
Sampling for PRE-control involves pulling samples of two consecutive
pieces. Frequency of sampling is based on the amount of production completed without having to adjust the process. If 25 samples are taken without
having to adjust the process, sampling frequency is considered to be adequate. If the process requires adjustment prior to taking 25 samples, sampling
should be conducted more frequently. Likewise, if more than 25 samples are
taken before a process adjustment is required, sampling frequency can be
decreased to let the process run longer before sampling.
Step 5: Apply the PRE-control Rules
Rules for the use of PRE-control are provided in Table 8.1.
Table 8.1 PRE-control rules.

Each Sample
(Two Consecutive
Pieces)
PRE-control
Zone
Green
Piece 2 not needed
Run process,
step 4
1
2
Yellow
Green
Measure piece 2
Run process,
step 4
1
2
Yellow
Yellow
Measure piece 2
Reset process
Pieces 1 and 2 in same
yellow zone
Pieces 1 and 2 in
opposite yellow zones
Step 3
Red
Reset process
Step 1
H1277 ch08.indd 169
Measurement
Requirement
PRE-control Step
to Follow
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170
Chapter Eight
8.4 The Statistical Basis for PRE-control

The statistical basis for PRE-control is related to probability and the standard normal distribution (mean = 0 and standard deviation = 1). For further
explanation of the standard normal distribution, refer to Chapter 7 in Applied
Statistics for the Six Sigma Green Belt.
The statistical basis for PRE-control begins in a worst-case situation with a
process capability equal to one, in which case the process variability is exactly
equal to the specification or tolerance. Dividing the specification/tolerance by
four establishes the boundaries for four zones, the reasons for which will be
described in more detail in the next section. For now, two of the zones contained within the specification will be referred to as green zones and two will
be referred to as yellow zones. Dividing the specification/tolerance, or in this
case the process variability, by four creates the probability that 86 percent of
the observations will fall within the green zones and 7 percent of the observations will fall within each of the yellow zones, as shown in Figure 8.3. With 7
percent of the process output falling in a single yellow zone, we have (1/14)
chance of actually observing process output in a single yellow zone. With 7
percent of the process falling in each of two yellow zones (one zone on each
side of the process target), we have (1/14)(1/14) = 1/196 chance of actually
observing process output from the same sample falling in both yellow zones.
We can see in Figure 8.4 that, with a process capability equal to one, we
expect to see a very small number of observations beyond the specifications/
tolerance.
8.5 Advantages and Disadvantages of PRE-control

Use of PRE-control involves balancing advantages and disadvantages. As
noted earlier, PRE-control, if it is used at all, is used after a process is deter-
99.74%
LSL
LNTL
Figure 8.4
H1277 ch08.indd 170
Target
USL
UNTL
A process with process capability equal to one.
3/8/07 12:37:40 PM
PRE-control 171
mined to be capable and operating in a state of statistical control. Additionally, PRE-control has its supporters and critics. Therefore, one must consider
and balance these advantages and disadvantages prior to using PRE-control.
8.5.1 Advantages of PRE-control
Conditions may warrant the use of PRE-control, as has been discussed
throughout this chapter. The following list provides the advantages of using
this SQC tool:
It is much easier for shop-floor operators to use than SPC
There is a cost savings from reduced measurement, as compared
with SPC
The measurement devices needed to support PRE-control (go/no-go
gages) are less expensive than measurement devices for continuous
variables
PRE-control does not require computation and charting, as does
SPC
PRE-control provides process performance data faster than SPC does
(remember that SPC requires 25 subgroups/samples to be drawn,
control limits to be calculated, and charting to be completed before
any conclusions can be made about process performance)
PRE-control is designed to ensure that defective products and services do not reach the customer (as compared with SPC, which is
designed to detect assignable cause variation)
8.5.2 Disadvantages of PRE-control
PRE-control also presents certain disadvantages when compared with
other SQC tools such as SPC. Montgomery (2005a, 475) summarizes these
disadvantages:
Because SPC is commonly discontinued when PRE-control begins,
diagnostic information contained as patterns of assignable cause
variation in control charts is lost
Historical records of process performance (that is, records of why
assignable cause variation occurred) over time are lost
Small sample sizes with PRE-control reduce the ability to detect
even moderate-to-large shifts
PRE-control provides no information helpful in establishing statistical control or in reducing variability
PRE-control is extremely sensitive to deviations from being in statistical control and being capable
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Chapter Eight
PRE-control will likely lead to unnecessary tampering with the

process
PRE-control will have more false alarms or more missed signals
than the control chart (Wheeler and Chambers 1992, 82)
8.6 What Comes After PRE-control?

In Chapter 1 a point was made that the use of SQC tools should be tailored
to the specific needs of a situation. This tailoring referred to how the various
SQC tools are designed, implemented, and interpreted. This tailoring also
referred to the use of the SQC tools relative to each other. Figure 1.1, and
later Figure 8.1, was provided to help show the relationship among the SQC
tools.
A quick review of Figure 8.1 reveals that use of acceptance sampling
follows use of either (1) capability analysis and SPC, or (2) PRE-control.
Acceptance sampling for variables and attributes is the subject of Chapter 9.
It should be noted that in order for acceptance sampling to be a valid
SQC tool, there must be some objective evidence that a process is operating in a state of statistical control, is determined to be capable, and exhibits
an acceptably low defect rate. It should also be noted that use of acceptance
sampling may not be required to support production operations, because the
consumer may elect not to use this SQC tool, perhaps in favor of mutually
supportive, long-term supplier relationships based on the use of other tools,
techniques, or methods.
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9
Acceptance Sampling
9.1 The Intent of Acceptance Sampling1
Acceptance sampling is a method for inspecting a product. Inspection can
be done with screening (also called sorting, or 100 percent inspection), in
which all units are inspected, or with sampling. Acceptance sampling is the
process of inspecting a portion of the product in a lot for the purpose of making a decision regarding classification of the entire lot as either conforming
or nonconforming to quality specifications.
Whether inspection is done with screening or with sampling, the results
can be used for different purposes, as follows:
1. To distinguish between good lots and bad lots using acceptance
sampling plans (as in incoming material inspection and final
product inspection).
2. To distinguish between good products and bad products.
3. To determine the status of process control and whether the
process is changing. This is usually done in conjunction with
control charts.
4. To evaluate process capability. In this case, inspection is used to
determine whether the process exhibits excessive variation and
whether it is approaching or exceeding the specification limits.
5. To determine process adjustment. Based on inspection results
of process output, as depicted by a histogram, for example, the
process mean may require adjustment and/or process variation
may need to be reduced. A process might require adjustment
even though all the units produced to date conform to the
quality standards agreed upon with the customer.
Originally published in a slightly different form in R. W. Berger, D. W. Benbow, A. K. Elshennawy, and H. F. Walker, eds., The Certified Quality Engineer Handbook, 2nd ed. (Milwaukee,
WI: ASQ Quality Press, 2007), 190242. Reprinted with permission.
173
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Chapter Nine
6. To rate the accuracy of inspectors or inspection equipment

by comparing the inspection results with the corresponding
standards. An inspection operation can result in two types of
error: classification of a conforming unit as nonconforming
and classification of a nonconforming unit as conforming. The
probabilities of both types of errors can be easily estimated
using probability theory and other statistical methods.
7. To serve as a mechanism for evaluating vendors in terms of
their products quality. Vendors that consistently deliver highquality products can receive preferred status involving reduced
inspection and priority in bidding for new contracts, while
vendors that do not stand up to quality requirements could be
warned or discontinued altogether. This type of procedure is
known as vendor qualification or vendor certification.
The last three uses of inspection might be seen as feedback about the production processes, the measurement processes, and the supplier.
9.2 Sampling Inspection versus

100 Percent Inspection
Sampling provides the economic advantage of lower inspection costs due
to fewer units being inspected. In addition, the time required to inspect a
sample is substantially less than that required for the entire lot, and there is
less damage to the product due to reduced handling. Most inspectors find that
selection and inspection of a random sample is less tedious and monotonous
than inspection of the complete lot. Another advantage of sampling inspection is related to the supplier/customer relationship. By inspecting a small
fraction of the lot and forcing the supplier to screen 100 percent in case of lot
rejection (which is the case for rectifying inspection), the customer emphasizes that the supplier must be concerned with quality. On the other hand, the
variability inherent in sampling results in sampling errors: rejection of lots of
conforming quality and acceptance of lots of nonconforming quality.
Acceptance sampling is most appropriate when inspection costs are
high and when 100 percent inspection is monotonous and can cause inspector fatigue and boredom, resulting in degraded performance and increased
error rates. Obviously, sampling is the only choice available for destructive
inspection. Rectifying sampling is a form of acceptance sampling. Sample
units detected as nonconforming are discarded from the lot, replaced with
conforming units, or repaired. Rejected lots are subject to 100 percent screening, which can involve discarding, replacing, or repairing units detected as
nonconforming.
In certain situations, it is preferable to inspect 100 percent of the product. This would be the case for critical or complex products, where the cost
of making the wrong decision would be too high. Screening is appropriate
when the fraction nonconforming is extremely high. In this case, most of the
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Acceptance Sampling 175
lots would be rejected under acceptance sampling, and those accepted would
be so as a result of statistical variations rather than better quality. Screening
is also appropriate when the fraction nonconforming is not known and an
estimate based on a large sample is needed.
9.3 Sampling Concepts

Sampling may be performed according to the type of quality characteristics
to be inspected. There are three major categories of sampling plans: sampling
plans for attributes, sampling plans for variables, and special sampling plans.
It should be noted that acceptance sampling is not advised for processes in
continuous production and in a state of statistical control. For these processes,
Deming provides decision rules for selecting either 100 percent inspection or
no inspection.1
9.3.1 Lot-by-Lot versus Average Quality Protection
For continuing processes, sampling plans based on average quality protection
have characteristics calculated from the binomial and/or Poisson distributions. For processes not considered to be continuing, sampling plans based on
lot-by-lot protection have characteristics calculated from the hypergeometric
distribution, which takes the lot size into consideration.
Sampling plans based on the Poisson and binomial distributions are more
common than those based on the hypergeometric distribution. This is due
to the complexity of calculating plans based on the hypergeometric distribution. New software on personal computers, however, may eliminate this
drawback.
9.3.2 The OC Curve
No matter which type of attribute sampling plan is considered, the most
important evaluation tool is the OC curve.
The OC curve allows a sampling plan to be almost completely evaluated at a glance, giving a pictorial view of the probabilities of accepting lots
submitted at varying levels of percent defective. The OC curve illustrates
the risks involved in acceptance sampling. Figure 9.1 shows an OC curve
for a sample size n of 50 drawn from an infinite lot size, with an acceptance
number c of 3.
As can be seen by the OC curve, if the lot were 100 percent to specifications, the probability of acceptance Pa would also be 100 percent. But if the
lot were 13.4 percent defective, there would be a 10 percent probability of
acceptance. There are two types of OC curves to consider: (1) type A OC
curves and (2) type B OC curves. Type A OC curves are used to calculate the
probability of acceptance on a lot-by-lot basis when the lot is not a product
of a continuous process. These OC curves are calculated using the hypergeometric distribution.
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176
Chapter Nine
1.00
0.90
0.80
n = 50
c= 3
0.70
Pa
0.60
0.50
0.40
0.30
0.20
0.10
0
1
9 10
15
20
p (percent nonconforming)
Figure 9.1
An OC curve.
Type B OC curves are used to evaluate sampling plans for a continuous

process. These curves are based on the binomial and/or Poisson distributions when the requirements for usage are met. In general, the ANSI/ASQ
Z1.4-2003 standard OC curves are based on the binomial distribution for
sample sizes through 80 and the Poisson approximation to the binomial
for sample sizes greater than 80.
9.3.3 Plotting the OC Curve
In the following examples, the points for the OC curve shown in Figure 9.1
will be calculated for products produced from a continuous process. The
Poisson distribution will be used as an approximation to the binomial. The
approximation is accurate if the sample size is at least 16, the population is
at least 10 times the sample size, and the proportion defective is less than
0.1.2 Because the process is continuous, the lot size is not considered during
calculation. The sample size is 50, and the lot will be accepted if three or
fewer nonconformances are found in the sample. To plot the OC curve, six to
eight representative points for every fraction nonconforming should be used
to draw the continuous curve through the points.
If the formula for the Poisson as an approximation to the binomial were
used, one would be required to calculate
(np) x e np
x! ,
x =0
r
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where x is the index of the summation, n is the sample size, p is the lot fraction nonconforming, and r is the number of nonconformances in the sample,
for every fraction nonconforming for which a point is to be plotted. The letter
c in Figure 9.1 is equivalent to r in the preceding equation.
Example 9.1 For a sampling plan with n = 50 and the acceptable number of nonconformances c is three or fewer, the following table may be
constructed.
p
np
Pa
0.01
0.50
0.998
0.02
1.00
0.981
0.03
1.50
0.934
0.05
2.50
0.758
0.07
3.50
0.537
0.08
4.00
0.433
0.09
4.50
0.342
0.10
5.00
0.265
For example, to calculate the first point, one should access Table A.6,
Poisson probabilities, in the appendix, for np = (50) (0.01) = 0.50 and
three or fewer nonconformances c and find a value of 0.99P (Pa). Other points
are calculated in the same way. These points can then be plotted, and a curve
such as the one shown in Figure 9.1 can be drawn.
Values for p (fraction defective) are chosen arbitrarily and are selected
to result in a product of np that has a corresponding table value. Table A.6
lists values of 0, 1, 2, 3, . . . , n. These are the cumulative number of nonconformances. For example, the value under 0 for a given value of np is the
probability of exactly zero nonconformances in the sample. This is Pa at c = 0
for a given value of np. The value listed under 1 is the probability of one or
fewer nonconformances, the value under 2 is the probability of two or fewer
nonconformances, and so on.
9.3.4 Acceptance Sampling by Attributes
Acceptance sampling by attributes is generally used for two purposes: (1) protection against accepting lots from a continuing process whose average quality deteriorates beyond an acceptable quality level, and (2) protection against
isolated lots that may have levels of nonconformances greater than what can
be considered acceptable. The most commonly used form of acceptance sampling plan is sampling by attributes. The most widely used standard of all attribute plans, although not necessarily the best, is ANSI/ASQ Z1.4-2003. The
following sections provide more details on the characteristics of acceptance
sampling and a discussion of military standards in acceptance sampling.
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Chapter Nine
9.3.5 Acceptable Quality Limit

As part of the revision of ANSI/ASQC Z1.4-1993, acceptable quality level
(AQL) has been changed to acceptable quality limit (AQL) in ANSI/ASQ
Z1.4-2003 and is defined as the quality level that is the worst tolerable process
average when a continuing series of lots is submitted for acceptance sampling. This means that a lot that has a fraction defective equal to the AQL
has a high probability (generally in the area of 0.95, although it may vary) of
being accepted. As a result, plans that are based on AQL, such as ANSI/ASQ
Z1.4-2003, favor the producer in getting lots accepted that are in the general
neighborhood of the AQL for fraction defective in a lot.
9.3.6 Lot Tolerance Percent Defective
The lot tolerance percent defective (LTPD), expressed in percent defective,
is the poorest quality in an individual lot that should be accepted. The LTPD
has a low probability of acceptance. In many sampling plans, the LTPD is the
percent defective having a 10 percent probability of acceptance.
9.3.7 Producers and Consumers Risks
There are risks involved in using acceptance sampling plans. These risks are
(1) producers risk and (2) consumers risk. These risks correspond with Type
I and Type II errors in hypothesis testing. The definitions of producers and
consumers risks are:
Producers risk (). The producers risk for any given sampling plan
is the probability of rejecting a lot that is within the acceptable quality level.3 This means that the producer faces the possibility (at level of
significance ) of having a lot rejected even though the lot has met the
requirements stipulated by the AQL level.
Consumers risk (). The consumers risk for any given sampling plan
is the probability of acceptance (usually 10 percent) for a designated
numerical value of relatively poor submitted quality.4 The consumers
risk, therefore, is the probability of accepting a lot that has a quality level
equal to the LTPD.
9.3.8 Average Outgoing Quality
The average outgoing quality (AOQ) is the expected average quality of outgoing products, including all accepted lots, plus all rejected lots that have
been sorted 100 percent and have had all the nonconforming units replaced
by conforming units.
There is a given AOQ for specific fractions nonconforming of submitted
lots sampled under a given sampling plan. When the fraction nonconforming
is very low, a large majority of the lots will be accepted as submitted. The few
lots that are rejected will be sorted 100 percent and have all nonconforming
units replaced with conforming units. Thus, the AOQ will always be less than
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the submitted quality. As the quality of submitted lots declines in relation to

the AQL, the percentage of lots rejected increases in proportion to accepted
lots. As these rejected lots are sorted and combined with accepted lots, an
AOQ lower than the average fraction of nonconformances of submitted lots
emerges. Therefore, when the level of quality of incoming lots is good, the
AOQ is good; when the incoming quality is bad and most lots are rejected
and sorted, the result is also good.
To calculate the AOQ for a specific fraction nonconforming and a sampling plan, the first step is to calculate the probability of accepting the lot at
that level of fraction nonconforming. Then, multiply the probability of acceptance by the fraction nonconforming for the AOQ. Thus,
AOQ = Pa p[1 (sample size/lot size)].
If the desired result is a percentage, multiply by 100.
The average outgoing quality limit is the maximum AOQ for all possible
levels of incoming quality.
9.3.9 Average Outgoing Quality Limit
The AOQ is a variable dependent on the quality level of incoming lots. When
the AOQ is plotted for all possible levels of incoming quality, a curve as shown
in Figure 9.2 results. The average outgoing quality limit (AOQL) is the highest
value on the AOQ curve.
Assuming an infinite lot size, the AOQ may be calculated as AOQ = Pa p.
Probability of acceptance (Pa) may be obtained from tables, as explained earlier, and then multiplied by p (associated value of fraction nonconforming)
to produce a value for AOQ, as shown in Example 9.2, using the previous
equation.
Example 9.2 Given an OC curve points (Pa and p) as shown, construct the
AOQ curve. Note that Pa and p are calculated as explained in the previous
example.
H1277 ch09.indd 179
Probability of
Acceptance (Pa)
Fraction Defective
(p)
AOQ
0.998
0.01
0.00998
0.982
0.02
0.01964
0.937
0.03
0.02811
0.861
0.04
0.03444
0.760
0.05
0.03800
0.647
0.06
0.03882
0.533
0.07
0.03731
0.425
0.08
0.03400
0.330
0.09
0.02970
0.250
0.10
0.02500
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AOQ (%)
180
Chapter Nine
4.0
3.6
3.2
2.8
2.4
2.0
1.6
1.2
0.8
0.4
0
0.0388
0.0367
N=
0.0367
n = 50
0.0312
0.0258
c=3
0.0220
0.0134
0.0077
1
10
15
20
Figure 9.2
AOQ curve for N = , n = 50, c = 3.
As can be seen, the AOQ rises until the incoming quality level of 0.06
nonconforming is reached. The maximum AOQ point is 0.03882, which is
called the AOQL. This is the AOQL for an infinite lot size, sample size = 50,
accept on three or fewer nonconformances.
9.3.10 Lot Size, Sample Size, and Acceptance Number
For any single sampling plan, the plan is completely described by the lot size,
sample size, and acceptance number. In this section, the effect of changing the
sample size, acceptance number, and lot size on the behavior of the sampling
plan will be explored, along with the risks of constant percentage plans.
The effect on the OC curve caused by changing the sample size while
holding all other parameters constant is shown in Figure 9.3. The probability
of acceptance changes considerably as sample size changes. The Pa for the
given sample sizes for a 10 percent nonconforming lot and an acceptance
number of zero are shown in the following table.
Sample Size (n)
Probability of
Acceptance (Pa%)
10
35
68
82
90
The effect of changing the acceptance number on a sampling plan while holding all other parameters constant is shown in Figure 9.4. Another point of interest
is that for c = 0, the OC curve is concave in shape, while plans with larger acceptance numbers have a reverse s shape. Figure 9.4 and the following table show
the effect of changing the acceptance number of a sampling plan on the indifference quality level (IQL: 50-50 chance of accepting a given percent defective).
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1.00
n=1
n=2
0.90
0.80
n=4
0.70
n = 10
Pa
0.60
0.50
0.40
0.30
0.20
0.10
0
10
20
30
40
50
60
70
80
90
100
Figure 9.3
Effect on an OC curve of changing sample size (n) when acceptance

number (c) is held constant.
1.00
n = 10
c=0
0.90
0.80
c=1
0.70
c=2
Pa
0.60
Indifference quality level
0.50
0.40
0.30
0.20
0.10
0
10
20
30
40
50
60
70
80
90
100
Figure 9.4
H1277 ch09.indd 181
Effect of changing acceptance number (c) when sample size (n) is held
constant.
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182
Chapter Nine
Sample Size (n)
Acceptance
Number (c)
Percent Defective
at IQL
10
27
10
17
10
The parameter having the least effect on the OC curve is the lot size N.
Figure 9.5 shows the changes in the OC curve for a sample size of 10, acceptance number of 0, and lot sizes of 100, 200, and 1000. For this reason, using
the binomial and Poisson approximations, even when lot sizes are known
(and are large compared with sample size), results in little error in accuracy.
Some key probabilities of acceptance points for the three lot sizes follow. As
can be seen, the differences due to lot size are minimal.
Fraction
Defective (p)
Probability of
Acceptance (Pa)
Lot Size (N)
0.10
0.330
100
0.30
0.023
100
0.50
0.001
100
0.10
0.340
200
0.30
0.026
200
0.50
0.001
200
0.10
0.347
1000
0.30
0.028
1000
0.50
0.001
1000
Computing the sample size as a percentage of the lot size has a large effect
on risks and protection, as shown in Figure 9.6. In this case, plans having a
sample size totaling 10 percent of the lot size are shown. As can be seen, the
degree of protection changes dramatically with changes in lot size, which
results in low protection for small lot sizes and gives excessively large sample
requirements for large lot sizes.
9.4 Types of Attribute Sampling Plans

There are several types of attribute sampling plans in use, with the most common being single, double, multiple, and sequential sampling plans. The type
of sampling plan used is determined by ease of use and administration, general quality level of incoming lots, average sample number, and so on.
9.4.1 Single Sampling Plans
When single sampling plans are used, the decision to either accept or reject
the lot is based on the results of the inspection of a single sample of n items
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1.00
0.90
n = 10
0.80
c=0
0.70
N = 1000
Pa
0.60
N = 200
0.50
N = 100
0.40
0.30
0.20
0.10
0
10
Figure 9.5
20
30
40 50 60 70 80 90
100
Effect of changing lot size (N) when acceptance number (c) and sample
size (n) are held constant.
1.00
0.90
N = 250, n = 25, c = 0
0.80
N = 100, n = 10, c = 0
0.70
Pa
0.60
N = 50, n = 5, c = 0
0.50
0.40
0.30
0.20
0.10
0
10
Figure 9.6
H1277 ch09.indd 183
20
30
40
50
OC curves for sampling plans having the sample size equal to 10 percent
of the lot size.
3/8/07 12:38:09 PM
184
Chapter Nine
from a submitted lot. In the example shown earlier, the OC curve and the
AOQ curve were calculated for a single sampling plan where n = 50 and
c = 3. Single sampling plans have the advantage of ease of administration,
but due to the unchanging sample size, they do not take advantage of the
potential cost savings of reduced inspection when incoming quality is either
excellent or poor.
9.4.2 Double Sampling Plans
When using double sampling plans, a smaller first sample is taken from the
submitted lot, and one of three decisions is made: (1) accept the lot, (2) reject
the lot, or (3) draw another sample. If a second sample is to be drawn, the lot
will either be accepted or rejected after the second sample. Double sampling
plans have the advantage of a lower total sample size when the incoming
quality is either excellent or poor because the lot is either accepted or rejected
on the first sample.
Example 9.3 A double sampling plan is to be executed as follows: Take a
first sample (n1) of 75 units and set c1 (the acceptance number for the first
sample) = 0. The lot will be accepted based on the first sample results if no
nonconformances are found in the first sample. If three nonconformances are
found in the first sample, the lot will be rejected based on the first sample
results. If, after analyzing the results of the first sample, one or two nonconformances are found, take a second sample (n2 = 75). The acceptance
number for the second sample (c2) is set to three. If the combined number of
nonconformances in the first and second samples is three or fewer, the lot will
be accepted; if the combined number of nonconformances is four or more, the
lot will be rejected. The plan is represented in the following table.
Sample Size
Acceptance
Number (c)
Rejection
Number (r )
n1 = 75
c1 = 0
r1 = 3
n2 = 75
c2 = 3
r2 = 4
9.4.3 OC Curve for a Double Sampling Plan

To calculate the OC curve for a double sampling plan, Table A.6 can again be
utilized. To calculate probabilities of acceptance, some arbitrary points for p
are chosen to cover the range of the OC curve. The fraction defective p is then
multiplied by n1 (the first sample) or n2 (the second sample) to determine the
expected value np.
The calculated value of np is then used with Table A.6 (as with the single
sampling plan) to determine the necessary probabilities.
The generalized formula for calculating the probability of acceptance
(Pa) is
Pa = p0 + (p1p2 + p1p1 + p1p0) + (p2p1 + p2p0),
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where
p0 = probability of zero nonconformances in first sample
p1p2 = probability of one nonconformance in first sample
times the probability of two nonconformances in the
second sample, and so on.
Example 9.4 For a double sampling plan where n1 = 75, c1 = 0, r1 = 3,
n2 = 75, c2 = 3, and r2 = 4, show the computations for the OC curve.
To determine the technique of plotting the OC curve, three points for p may
be used (0.01, 0.04, and 0.08), although in practice, 6 to 10 should be used.
The points for the OC curve are calculated using the generalized equation for
each fraction nonconforming, selected as shown in the following table.
Generalized
Equation Values
p = 0.01
p = 0.04
p = 0.08
p0
0.4720
0.050
0.002
p1p0
0.1676
0.0075
0.00003
p1p1
0.1260
0.0222
0.000225
p1p2
0.0433
0.0334
0.000675
p2 p0
0.0623
0.0112
0.00009
p2 p1
0.0433
0.0334
0.000675
Totals for Pa
0.9145
0.1577
0.003695
These points are used to construct the OC curve for the double sampling
plan, as shown in Figure 9.7.
1.00
0.90
0.80
0.70
Pa
0.60
n1 = 75, c1 = 0, r1 = 3
0.50
n2 = 75, c2 = 3, r2 = 4
0.40
0.30
0.20
0.10
0
1
Figure 9.7
H1277 ch09.indd 185
4
5
6
7
8
10
OC curve for double sampling plan where n1 = 75, c1 = 0, r1 = 3, n2 = 75,

c2 = 3, and r2 = 4.
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186
Chapter Nine
9.4.4 Multiple Sampling Plans

Multiple sampling plans work in the same way as double sampling plans but
with an extension of the number of samples to be taken up to seven, according to
ANSI/ASQ Z1.4-2003. In the same manner that double sampling is performed,
acceptance or rejection of submitted lots may be reached before the seventh
sample, depending on the acceptance/rejection criteria established for the plan.
9.4.5 AOQ and AOQL for Double and Multiple Plans
The AOQ curve and AOQL for double and multiple sampling plans are plotted and determined in the same manner as single sampling plans. An AOQ
curve for a double sampling plan is shown in Figure 9.8, and the AOQL is
approximately 1.3 percent.
9.4.6 Average Sample Number
The average sample number (ASN) is a determination of the expected average amount of inspection per lot for a given sampling plan. The ASN for
single sampling plans is a constant value that is equal to the single sample
size for the plan. The ASN for double sampling plans is the sum of the first
sample size plus the second sample size times the probability that a second
sample will be required. The ASN is also a function of fraction nonconforming when working with a double sampling plan. The double sampling plan
ASN formula is
ASN = n1 + n2(P2),
where
n1 = size of first sample,
n2 = size of second sample,
P2 = probability of requiring a second sample.
3.0
AOQ (%)
n1 = 75, c1 = 0, r1 = 3
n2 = 75, c2 = 3, r2 = 4
2.0
1.0
0
1
10
Figure 9.8
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AOQ curve for double sampling plan.
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Example 9.5
The double sampling plan in the earlier section was

n1 = 75,
c1 = 0,
r1 = 3,
n2 = 75,
c2 = 3,
r2 = 4.
A second sample is required if, on the first sample, one or two nonconformances are noted
If zero nonconformances are found in the first sample, the lot is
accepted
If three or more nonconformances are found in the first sample, the
lot is rejected
Denote the probability of making a decision, accept or reject, on the first
sample as P(D1). Then,
P(D1) = P(0) + P (3 or more),
P(0) = The probability of 0 nonconformances on the first sample,
P (3 or more) = The probability of 3 or more nonconformances
on the first sample,
P2 = 1 P(D1), then ASN = n1 + n2(P2).
When using Table A.6 to calculate the probability of three or more nonconformances, remember that the probability is given by
(1 probability of 2 or fewer nonconformances) in the sample.
The ASN will be plotted for several values of fraction nonconforming p,
and an ASN curve will be plotted. An example of the ASN calculation for the
fraction nonconforming p = 0.01 is shown in the following equation. Several
other points need to be plotted for other values of p. Figure 9.9 shows an ASN
curve for the example.
When p = 0.01:
P(0) = Probability of 0 nonconformances in sample = 0.4724,
P (3 or more) = Probability of 3 or more nonconformances
in sample = 0.0410,
P(D1) = Probability of a decision on the first sample
(using the preceding equation) = 0.4724 + 0.0410 =
0.5134,
Then P2 = Probability of requiring a second sample
= 1 0.5134 = 0.4866.
Thus, the ASN is:
ASN(0.01) = Average sample number for a lot quality p = 0.01
= n1 + n2 (P2)
= 75 + 75 (0.4866) = 111.50 or 112.
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Chapter Nine
130
n1 = 75, c1 = 0, R1 = 3
120
n2 = 75, c2 = 3, R2 = 4
110
100
ASN
90
80
70
60
50
40
30
20
10
0
.01
Figure 9.9
.02
.03
.04
.05
.06
.07
.08
Fraction nonconforming
.09
.10
.11
ASN curve for double sampling plan.
Values of ASN at different p values (ASNp) may be calculated in a similar

way, and the results are given in the following list. All values are rounded to
the next highest integer.
ASN(0.01) = 112
ASN(0.06) = 87
ASN(0.02) = 120
ASN(0.07) = 82
ASN(0.03) = 113
ASN(0.08) = 79
ASN(0.04) = 103
ASN(0.09) = 78
ASN(0.05) = 94
ASN(0.1) = 77
When comparing sampling plans with equal protection, double sampling

plans will generally result in smaller average sample sizes when quality is
excellent or poor. When quality is near the indifference level, double sampling plans could rarely result in greater ASN.
9.5 Sampling Standards and Plans

9.5.1 ANSI/ASQ Z1.4-2003
ANSI/ASQ Z1.4-2003 is a revision of ANSI/ASQC Z1.4-1993 that includes
the following changes:5
1. Acceptable quality level (AQL) has been changed to acceptable
quality limit (AQL).
2. The definition and explanation of AQL have been changed (see
item 1 in this list).
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3. The discontinuation of inspection rule has been changed. See

later sections in this chapter.
4. ANSI/ASQC A2-1987 has been changed to ANSI/ASQ
A3534-2-1993.
5. ANSI/ASQC Q3 has been changed to ASQC Q3-1988.
Other than these changes and changes to the footnotes of some tables, all
tables, table numbers, and procedures used in MIL-STD-105E (which was
canceled in 1995) and ANSI/ASQC Z1.4-1993 have been retained.
ANSI/ASQ Z1.4-2003 is probably the most commonly used standard for
attribute sampling plans, but its wide recognition and acceptance could be
due to government contracts stipulating the standard rather than its statistical
importance. Producers submitting products at a nonconformance level within
AQL have a high probability of having the lot accepted by the customer.
When using ANSI/ASQ Z1.4-2003, the characteristics under consideration should be classified. The general classifications are critical, major, and
minor defects:
A critical defect is a defect that judgment and experience indicate is
likely to result in hazardous or unsafe conditions for the individuals
using, maintaining, or depending on the product; or it is a defect that
judgment and experience indicate is likely to prevent performance of
the unit. In practice, critical characteristics are commonly inspected
to an AQL level of 0.40 to 0.65 percent, if not 100 percent inspected.
One hundred percent inspection is recommended for critical characteristics if possible. Acceptance numbers are always zero for critical
defects.
A major defect is a defect other than critical that is likely to result in
failure or to reduce materially the usability of the unit of product for
its intended purpose. In practice, AQL levels for major defects are
generally about 1 percent.
A minor defect is a defect that is not likely to reduce materially the
usability of the unit of product for its intended purpose. In practice,
AQL levels for minor defects generally range from 1.5 percent to 2.5
percent.
9.5.2 Levels of Inspection
There are seven levels of inspection used in ANSI/ASQ Z1.4-2003: reduced
inspection, normal inspection, tightened inspection, and four levels of special
inspection. The special inspection levels should be used only when small
sample sizes are necessary and large risks can be tolerated. When using
ANSI/ASQ Z1.4-2003, a set of switching rules must be followed as to the use
of reduced, normal, and tightened inspection.
The following guidelines are taken from ANSI/ASQ Z1.4-2003:
Initiation of inspection. Normal inspection Level II will be used at the start
of inspection unless otherwise directed by the responsible authority.
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Chapter Nine
Continuation of inspection. Normal, tightened, or reduced inspection

shall continue unchanged for each class of defect or defectives on successive lots or batches except where the following switching procedures
require change. The switching procedures shall be applied to each class
of defects or defectives independently.
Switching procedures. Switching rules are graphically shown in Figure 9.10.
Normal to tightened. When normal inspection is in effect, tightened
inspection shall be instituted when two out of five consecutive lots or
batches have been rejected on original inspection (that is, ignoring resubmitted lots or batches for this procedure).
Tightened to normal. When tightened inspection is in effect, normal
inspection shall be instituted when five consecutive lots or batches have
been considered acceptable on original inspection.
Normal to reduced. When normal inspection is in effect, reduced inspection shall be instituted providing that all of the following conditions are
satisfied:
a. The preceding 10 lots or batches (or more), as indicated by
the note on ANSI/ASQ Z1.4-2003 Table VIII, also shown
as Figure 9.13 at the end of this chapter, have been on
normal inspection and none have been rejected on original
inspection.
Start
Preceding 10 lots
accepted, with
Total nonconforming
less than limit number
(optional), and
Production steady, and
Approved by
responsible authority
Reduced
Two out of five

consecutive lots
not accepted
Normal
Lot not accepted, or

Lot accepted but
nonconformities
found lie between Ac
and Re of plan, or
Production irregular, or
Other conditions
warrant
Tightened
Five consecutive
lots accepted
Five consecutive
lots remain on
tightened
Discontinue
inspection
under Z1.4
Figure 9.10
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Switching rules for normal, tightened, and reduced inspection.
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b. The total number of defectives (or defects) in the sample

from the preceding 10 lots or batches (or such other number
as was used for condition (a)) is equal to or less than the
applicable number given in Table VIII of ANSI/ASQ Z1.42003 (shown as Figure 9.13 at the end of this chapter). If
double or multiple sampling is in use, all samples inspected
should be included, not first samples only.
c. Production is at a steady rate.
d. Reduced inspection is considered desirable by the
responsible authority.
Reduced to normal. When reduced inspection is in effect, normal inspection
shall be instituted if any of the following occur on original inspection:
a. A lot or batch is rejected.
b. A lot or batch is considered acceptable under reduced
inspection but the sampling procedures terminated without
either acceptance or rejection criteria having been met. In
these circumstances, the lot or batch will be considered
acceptable, but normal inspection will be reinstated starting
with the new lot or batch.
c. Production becomes irregular or delayed.
d. Other conditions warrant that normal inspection shall be instituted.
Discontinuation of inspection. If the cumulative number of lots not
accepted in a sequence of consecutive lots on tightened inspection reaches
five, the acceptance procedures of this standard shall be discontinued.
Inspection under the provisions of this standard shall not be resumed
until corrective action has been taken. Tightened inspection shall then be
used as normal to tightened.
9.5.3 Types of Sampling
ANSI/ASQ Z1.4-2003 allows for three types of sampling:
1. Single sampling
2. Double sampling
3. Multiple sampling
The choice of the type of plan depends on many variables. Single sampling
is the easiest to administer and perform, but it usually results in the largest
average total inspection (ATI). Double sampling results in a lower ATI than
single sampling, but it requires more decisions to be made, such as:
Accept the lot after the first sample
Reject the lot after the first sample
Take a second sample
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192
Chapter Nine
Accept the lot after the second sample

Reject the lot after the second sample
Multiple sampling plans further reduce the ATI, but they also increase the
number of decisions to be made. As many as seven samples may be required
before a decision to accept or reject the lot can be made. This type of plan
requires the most administration.
A general procedure for selecting plans from ANSI/ASQ Z1.4-2003 is
as follows:
1. Decide on an AQL.
2. Decide on the inspection level.
3. Determine the lot size.
4. Find the appropriate sample size code letter. See Table I from
ANSI/ASQ Z1.4-2003, also shown as Figure 9.14 at the end of
this chapter.
5. Determine the type of sampling plan to be used: single, double,
or multiple.
6. Using the selected AQL and sample size code letter, enter the
appropriate table to find the desired plan to be used.
7. Determine the normal, tightened, and reduced plans as required
from the corresponding tables.
Example 9.6 A lot of 1750 parts has been received and is to be checked to
an AQL level of 1.5 percent. Determine the appropriate single, double, and
multiple sampling plans for general inspection Level II.
Steps to define the plans are as follows:
4.1 Using Table I on page 10 of ANSI/ASQ Z1.4-2003, also shown
as Figure 9.14 at the end of this chapter, stipulates code letter K.
4.2 Normal inspection is applied. For code letter K, using Table
II-A of ANSI/ASQ Z1.4-2003 on page 11 of the standard, also
shown as Figure 9.15 at the end of this chapter, a sample of 125
is specified.
4.3 For double sampling, two samples of 80 may be required. Refer
to Table III-A on page 14 of the standard, shown as Figure 9.16
at the end of this chapter.
4.4 For multiple sampling, at least two samples of 32 are required
and it may take up to seven samples of 32 before an acceptance
or rejection decision is made. Refer to Table IV-A on page 17
of the standard, shown as Figure 9.17 at the end of this chapter.
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A breakdown of all three plans follows:

Sampling
Plan
Single
sampling
Sample(s)
Size
Ac
Re
125
6
5
Double
sampling
First
80
Second
80
Multiple
sampling
First
32
Second
32
Third
32
Fourth
32
Fifth
32
Sixth
32
Seventh
32
10
Ac = acceptance number (Ac)

Re = rejection number (Re)
* Acceptance not permitted at this sample size.
9.5.4 Dodge-Romig Tables

Dodge-Romig tables were designed as sampling plans to minimize ATI.
These plans require an accurate estimate of the process average nonconforming in selection of the sampling plan to be used. The Dodge-Romig tables use
the AOQL and LTPD values for plan selection rather than AQL as in ANSI/
ASQ Z1.4-2003. When the process average nonconforming is controlled to
requirements, Dodge-Romig tables result in lower ATI, but rejection of lots
and sorting tend to minimize the gains if process quality deteriorates.
Note that if the process average nonconforming shows statistical control,
acceptance sampling should not be used. The most economical course of
action in this situation is either no inspection or 100 percent inspection.6
9.6 Variables Sampling Plans

Variables sampling plans use the actual measurements of sample products for
decision making rather than classifying products as conforming or nonconforming, as in attribute sampling plans. Variables sampling plans are more
complex in administration than attribute plans, thus they require more skill.
They provide some benefits, however, over attribute plans:
1. Equal protection to an attribute sampling plan with a much smaller
sample size. There are several types of variables sampling plans
in use, three of these being the following: (1) known; (2)
unknown but can be estimated using sample standard deviation s;
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194
Chapter Nine
and (3) unknown and the range R is used as an estimator. If an

attribute sampling plan sample size is determined, the variables
plans previously listed can be compared as a percentage to the
attribute plan.
Plan
Attribute
Sample Size
(percent)
100
unknown, range method
60
unknown, s estimated from sample
40
known
15
2. Variables sampling plans allow the determination of how close

to nominal or a specification limit the process is performing.
Attribute plans either accept or reject a lot; variables plans give
information on how well or poorly the process is performing.
Variables sampling plans, such as ANSI/ASQ Z1.9-2003, have some disadvantages and limitations:
1. The assumption of normality of the population from which the
samples are being drawn
2. Unlike attribute sampling plans, separate characteristics on
the same parts will have different averages and dispersions,
resulting in a separate sampling plan for each characteristic
3. Variables plans are more complex in administration
4. Variables gauging is generally more expensive than attribute
gauging
9.6.1 ANSI/ASQ Z1.9-2003
ANSI/ASQ Z1.9-2003 is a revision of ANSI/ASQC Z1.9-1993 that includes
changing the term acceptable quality level (AQL) to acceptable quality limit
(AQL), changing the definition and explanation of AQL, and changing the
discontinuation of inspection rule, as explained previously in the ANSI/ASQ
Z1.4-2003.
The most common standard for variables sampling plans is ANSI/
ASQ Z1.9-2003, which has plans for (1) variability known, (2) variability
unknownstandard deviation method, and (3) variability unknownrange
method. Using the aforementioned methods, this sampling plan can be used
to test for a single specification limit, a double (or bilateral) specification
limit, estimation of the process average, and estimation of the dispersion of
the parent population.
As in ANSI/ASQ Z1.4-2003, several AQL levels are used, and specific
switching procedures for normal, reduced, or tightened inspection are followed. ANSI/ASQ Z1.9-2003 allows for the same AQL value for each specification limit of double specification limit plans or the use of different AQL
H1277 ch09.indd 194
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values for each specification limit. The AQL values are designated ML for
the LSL and MU for the USL.
There are two forms used for every specification limit ANSI/ASQ
Z1.9-2003 plan: Form 1 and Form 2. Form 1 provides only acceptance or
rejection criteria, whereas Form 2 estimates the percent below the LSL and
the percent above the USL. These percentages are compared with the AQL
for acceptance/rejection criteria. Figure 9.11 summarizes the structure and
organization of ANSI/ASQ Z1.9-2003.
There are 14 AQL levels used in ANSI/ASQ Z1.9-2003 that are consistent
with the AQL levels used in ANSI/ASQ Z1.4-2003. Section A of ANSI/ASQ
Z1.9-2003 contains both an AQL conversion table and a table for selecting the
desired inspection level. Inspection Level II should be used unless otherwise
specified. See Section A7.1 of the standard for further information about levels.
Table A-3 on page 7 of ANSI/ASQ Z1.9-2003 contains the OC curves for
the sampling plans in Sections B, C, and D.
Section B contains sampling plans used when the variability is unknown
and the standard deviation method is used. Part I is used for a single specification limit, Part II is used for a double specification limit, and Part III is used for
estimation of process average and criteria for reduced and tightened inspection.
Section C contains sampling plans used when the variability is unknown
and the range method is used. Parts I, II, and III are the same as Parts I, II,
and III in Section B.
Section A
AQL conversion
and inspection
levels
Variability unknown
Standard deviation
method
Variability known
Single specification
limits
k-method
Procedure 1
Figure 9.11
H1277 ch09.indd 195
M-method
Procedure 2
Double
specification limits
Variability unknown
Range method
Process average
estimation and criteria
for reduced and
tightened inspection
M-method
Procedure 2
Structure and organization of ANSI/ASQ Z1.9-2003.
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196
Chapter Nine
Section D contains sampling plans used when variability is known. Parts

I, II, and III are the same as Parts I, II, and III in Section B.
9.6.1.1 Variability UnknownRange Method
An example from Section C is used here to illustrate the use of the variability
unknownrange method for a single specification limit. The quality indices
for a single specification limit are
( U X ) or ( X L ) ,
R
where
U = upper specification limit
L = lower specification limit
X = sample average
R = average range of the sample

The
criterion is a comparison of the quality (U X)/R or
acceptance
(X L)/R to the acceptability constant k. If the calculated quantity is equal to

or greater than k, the lot is accepted; if the calculated quantity is negative or
less than k, the lot is rejected.
The following example illustrates the use of the variability unknown
range method, Form I variables sampling plan and is similar to examples
from Section C of ANSI/ASQ Z1.9-2003.
Example 9.7 The LSL for electrical resistance of a certain electrical component is 620 ohms. A lot of 100 items is submitted for inspection. Inspection
Level IV, normal inspection, with AQL = 0.4 percent, is to be used. From
ANSI/ASQ Z1.9-2003 Table A-2 and Table C-1, shown at the end of this chapter as Figure 9.18 and Figure 9.19, respectively, it is seen that a sample size
of 10 is required. Suppose that values of the sample resistances (reading from
left to right) are:
645, 651, 621, 625, 658 (R = 658 621 = 37),
670, 673, 641, 638, 650 (R = 673 638 = 35).
Determine compliance with the acceptability criterion.
Line
Value
Sample size: n
10
2.
Sum of measurement: X
Sample mean X : X/n
Average range R : R/no. of

subgroups
6472
3.
4.
5.
6.
H1277 ch09.indd 196
Information Needed
1.
Explanation
647.2
6472/10
36
(37 + 35)/2
Specification limit (lower): L 620
The quantity: (X L)/R

.756
(647.2 620)/36
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7.
Acceptability constant: k
.811
8.
Acceptability criterion:
compare (X L)/R with k
.756 .811
See Table C-1 (Figure 9.19 at

the end of this chapter)
The lot does not meet the acceptability criterion, because (X L)/R is
less than k.
Note: If a single USL U is given, then compute the quantity (U X)/

R in line
6 and compare it with k. The lot meets the acceptability criterion if
(U X )/ R is equal to or greater than k.
9.6.1.2 Variability UnknownStandard Deviation Method
In this section, a sampling plan is shown for the situation where the variability is not known and the standard deviation is estimated from the sample data.
The sampling plan will be that for a double specification limit, and it is found
in Section B of the standard with one AQL value for both upper and lower
specification limits combined.
The acceptability criterion is based on comparing an estimated percent nonconforming with a maximum allowable percent nonconforming
for the given AQL level. The estimated percent nonconforming is found in
ANSI/ASQ Z1.9-2003 Table B-5, shown as Figure 9.20 at the end of this
chapter.
The quality indices for this sampling plan are
QU =
UX
X L
and QL =
,
s
s
where
U = upper specification limit
L
= lower specification limit
X = sample mean
s = estimate of lot standard deviation
The quality level of the lot is in terms of the lot percent defective. Three values are calculated: PU, PL, and p. PU is an estimate of conformance with the
USL; PL is an estimate of conformance with the LSL; and p is the sum of PU
and PL.
The value of p is then compared with the maximum allowable percent
defective. If p is less than or equal to M (ANSI/ASQ Z1.9-2003 Table B-5,
shown as Figure 9.20 at the end of this chapter), or if either QU or QL is
negative, the lot is rejected. The following example illustrates the preceding
procedure.
Example 9.8 The minimum temperature of operation for a certain device
is specified as 180F. The maximum temperature is 209F. A lot of 40 items
is submitted for inspection. Inspection Level IV, normal inspection with
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198
Chapter Nine
AQL = 1 percent, is to be used. ANSI/ASQ Z1.9-2003 Table A-2, shown as

Figure 9.18 at the end of this chapter, gives code letter D, which results
in a sample size of five from ANSI/ASQC Z1.9-2003 Table B-3, shown as
Figure 9.21 at the end of this chapter. The results of the five measurements in
degrees Fahrenheit are as follows: 197, 188, 184, 205, and 201. Determine if
the lot meets acceptance criteria.
Information Needed
Value Obtained
Explanation
1.
Sample size: n
2.
Sum of measurements:
X
975
3.
Sum of squared
measurements: X 2
190,435
4.
Correction factor: (X )2/n
190,125
9752/5
5.
Corrected sum of squares

(SS): X 2 CF
310
190,435 190,125
6.
Variance (V ): SS/(n 1)
77.5
310/4
8.81
7.
8.
Standard deviation s:
Sample mean X : X/n
77.5
v
195
975/5
9.
Upper specification limit:

U
209
10.
Lower specification limit: L
180
11.
Quality index: QU =
(U X )/s
1.59
(209 195)/8.81
12.
Quality index: QL =
(X L)/s
1.7
(195 180)/8.81
13.
Estimate of lot percent

defective above U: PU
2.19%
See Table B-5 (Figure 9.20

at the end of this chapter)
14.
Estimate of lot percent

defective below L: PL
0.66%

15.
Total estimate of percent

defective in lot: p = PU +
PL
2.85%
2.19 + 0.66
16.
Maximum allowable
percent defective: M
3.32%

17.
Acceptability criterion:
compare p = PU + PL
with M.
2.85% < 3.32%
The lot meets the acceptability criterion because p = PU + PL is less

than M.
ANSI/ASQ Z1.9-2003 provides a variety of other examples for variables
sampling plans.
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9.7 Sequential Sampling Plans

When tests are either destructive in nature or costly, it may be advantageous
to use sequential sampling plans popularized by Wald.7 These plans have the
advantage of greatly reduced sample sizes while giving good protection.
To determine a sequential sampling plan, the following parameters must
be defined:
= producers risk
AQL = acceptable quality level = p1
= consumers risk
RQL = rejectable (or unacceptable) quality level = p2
The following example uses = 0.05, AQL = 0.05, = 0.1, and RQL = 0.2.
This results in a plan that will have a 5 percent chance of rejecting a lot that
is 5 percent nonconforming and a 10 percent chance of accepting a lot that is
20 percent nonconforming.
Figure 9.12 shows the accept, reject, and continue testing areas for a
sequential sampling plan. The y axis represents the number of nonconforming units in the sample, and the x axis scales the number of units inspected.
The equations for the acceptance and rejection zone lines are
Reject zone line = sn + h2,
Accept zone line = sn h1,
Number of nonconforming units
sn + h2
Reject zone
Continue testing
Accept zone
sn h1
Number of units inspected

Figure 9.12
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Decision areas for a sequential sampling plan.
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200
Chapter Nine
where
n = sample size,
h1 =
h2 =
s=
b
,
p2 (1 p1 )
log
p1 (1 p2 )
a
,
p2 (1 p1 )
loog
p1 (1 p2 )
log [ (1 p1 ) / (1 p2 ) ]
,
p (1 p1 )
log 2
p1 (1 p2 )
a = log
(1 )
,
b = log
(1 )
.
Example 9.9 Assume that the following values are desired for a sequential
sampling plan:
= 0.05, p1 (AQL) = 0.05,
= 0.1, p2 (RQL) = 0.2.
Then:
a = log
1 0.10
= 1.2553,
0.05
b = log
1 0.05
= 0.97777,
0.10
s = log
log [(1 0.05) / (1 0.20 )]

= 0.1103,
0.20(1 0.05)
log
0.05(1 0.20)
h1 =
0.9777
= 1.4448,
0.20(1 0.05)
log
0.05(1 0.20)
h2 =
1.2553
= 1.855.
0.20(1 0.05)
log
0.05(1 0.20)
Reject line = sn + h2 = (0.1103)(n) + 1.855,

Accept line = sn h1 = (0.1103)(n) 1.4448.
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Points for Accept and Reject Lines*

n
Acceptance
Number
Rejection
Number
Acceptance
Number
Rejection
Number
14
20
24
40
50
Accept values are rounded down to the nearest integer.

Note A: Acceptance not possible when acceptance number is negative.
Note B: Rejection not possible when rejection number is greater than
sample number.
As can be seen by the preceding plan, rejecting the lot is not possible
until the 3rd sample unit, and accepting the lot is withheld until the 14th
sample unit.
9.8 Continuous Sampling Plans

Many production processes do not produce lots, and thus lot-by-lot acceptance sampling plans discussed earlier cannot be applied. In cases such as
these, continuous sampling plans are developed. In continuous sampling
plans, 100 percent inspection and sampling inspection are alternately applied.
The most recent standard for developing continuous sampling plans is the
MIL-STD-1235B.
Continuous sampling plans are characterized by two parameters: i is
called the clearance number or the number of conforming units under 100
percent inspection, and f is the ratio of the units inspected to the total number
of units produced or passing through the inspection station.
9.8.1 Types of Continuous Sampling Plans
There are two different standards for continuous sampling plans:
1. Dodges continuous sampling plans. These include CSP-1 and
CSP-2 sampling plans. These plans take AOQL as an index.
That is, for every AOQL value, there are different combinations
of i and f.
2. MIL-STD-1235B. These plans are selected using a sample size
code letter and an AQL value. The standard includes CSP-1,
CSP-2, CSP-F, CSP-T, and CSP-V plans.
9.8.1.1 Dodges Continuous Sampling Plans
Dodges CSP-1 continuous sampling plans operate as follows for a selected
AOQL value:
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202
Chapter Nine
1. Start with 100 percent inspection

2. When i (clearance number) consecutive number of units are
found free from nonconformities, 100 percent inspection is then
substituted with sampling inspection
2.1. A fraction of f units is randomly selected and then inspected
2.1.1. If one nonconformity is found, the 100 percent
inspection procedure is to restart again and the
cycle is repeated
Dodges CSP-2 continuous sampling plans operate as follows for a selected
value of AOQL:
2.1. A fraction of f units is randomly selected and then
inspected
2.1.1. If one nonconformity is found, the sampling
inspection continues and the following procedure
(2.1.2) is initiated
2.1.2. The number of conforming units (after finding the
nonconformity) is counted
2.1.2.1. If i consecutive number are found free
of nonconformities, sampling inspection
continues
2.1.2.2. If one nonconformity is found, 100 percent
inspection is reinstated
9.8.1.2 MIL-STD-1235B
The standard uses the same parameters, i and f, as previously defined. The
standard includes CSP-1, CSP-2, CSP-F, CSP-T, and CSP-V plans.
CSP-1 and CSP-2 plans operate in the same way as Dodges CSP-1 and
CSP-2 plans, but they are selected based on a sample size code letter and an
AQL value as a quality index. The sample size code letter is selected based
on the number of units in the production interval.
CSP-F plans work the same way as CSP-1 plans, providing alternate
sequences of 100 percent and sampling inspection procedures, but the difference is that AOQL and the number of units in the production interval are used
in this case to characterize the plans. Once AOQL and f values are selected,
go to the corresponding table to read i, the clearance number. CSP-F is a
single-level continuous sampling scheme.
CSP-T plans provide reduced sampling frequency once the product shows
superior quality. The CSP-T plan works as follows:
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3. A fraction of f units is randomly selected and then inspected
3.1. If one nonconformity is found, the inspector reinstates 100
percent inspection
3.2. If the inspector finds i consecutive units free from
nonconformities, the frequency f is reduced to f/2
3.2.1. If one nonconformity is found, the inspector
switches back to 100 percent inspection
3.2.2. If the inspector finds i consecutive units free from
nonconformities, the frequency f is reduced to f/4
3.2.2.1. If one nonconformity is found, 100 percent
inspection is reinstated
CSP-V plans work the same way as CSP-T plans but with reduced i instead
of reduced f. The procedure is as follows:
3. A fraction of f units is randomly selected and then inspected
3.1. If one nonconformity is found, the inspector reinstates 100
percent inspection
3.2. If the inspector finds i consecutive units free from
nonconformities, the inspection continues with inspecting
the same fraction f
3.2.1. If one nonconformity is found, the inspector
switches back to 100 percent inspection
3.2.2. If the inspector finds i/3, the sampling inspection
continues with the same fraction f
9.9 Variables Plan When the

Standard Deviation Is Known
There are applications for developing a variables plan when the standard
deviation is known, as outlined in Burr.8 These plans are based on the Z-test
for testing for differences in means. The equation is
Z=
H1277 ch09.indd 203
X
/ n
3/8/07 12:38:12 PM
204
Chapter Nine
The and risks and unacceptable process levels must be set prior to designing the test. The next example illustrates the procedure.
Example 9.10 A pressure-sensing gage has a tensile strength requirement
after staking of 30,000 pounds psi. The lot will be acceptable if no more than
2.5 percent of the units are below 29,000 pounds psi ( risk). The vendor also
wants a high probability of acceptance of a lot that has a tensile strength of
31,000 pounds psi ( risk). The process standard deviation is known to be
4200 pounds psi. What sample size and sample mean are required to meet
these given levels and risks?
Utilizing the previous equation, then
X
/ n
= Z and
X
/ n
= Z.
The producers risk () = 0.05 at 31,000 psi

The consumers risk ( ) = 0.10 at 29,000 psi
Substitute the given values into this equation:
X 29, 000
4200 / n
= 1.282 and
X 31, 000
4200 / n
= 1.645
Subtracting the second equation from the first results in the following:
2000
= 2.927, which gives a value for n = 37.78 or n = 38
4200 / n
Substituting this value of n into either equation will provide a solution
for X. If the known value for n is substituted into the first equation, the consumers risk () will be maintained at the required level. If the known value
for n is substituted into the second equation, the producers risk () will be
maintained at the required level. One or the other, but not both, will be at the
average given level. To maintain the risk:
X = 31, 000 1.645 4200 / 38
X = 29, 879.21
Then Z =
29, 879.21 29, 000

= 1.2904, which resultts in a risk of 0.0985.
4200 / 38
Therefore, the sampling plan as developed is:

Sample size n = 38
Accept the lot if X 29,879.21

Reject the lot if X < 29,879.21
H1277 ch09.indd 204
3/8/07 12:38:12 PM
H1277 ch09.indd 205
*
*
*
*
*
0
*
*
*
*
*
*
0
0
20,00031,499
31,500 and over
40
67
22
38
14
24
14
2
4
24
13
7
14
1
3
111
68
40
24
14
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
186
115
69
42
25
14
*
*
*
*
*
181
110
68
40
24
14
*
*
*
*
*
*
1.0
169
105
63
38
22
13
*
*
*
1.5
181
110
67
40
24
14
*
*
*
2.5
181
111
68
49
24
14
*
*
4.0
AQL
186
115
69
42
25
14
6.5
105 181
68
181
169
181
63
110
113
68
110
39
189
471
277
181
115
68
40
22
14
40
490
301
177
72
42
25
24
297
181
105
68
115
42
24
14
7
13
301
181
110
63
40
25
14
277
178
63
36
22
181
115
68
105
40
22
14
650 1000
13
400
250
150
100
65
40
25
15
10
Figure 9.13
ANSI/ASQ Z1.4-2003 Table VIII: Limit numbers for reduced inspection.
may be used for the calculation, provided that the lots or batches used are the most recent ones in sequence, that they have all been on normal inspection, and that none have
been rejected while on original inspection.
* = Denotes that the number of sample units from the last 10 lots or batches is not sufficient for reduced inspection for this AQL. In this instance, more than 10 lots or batches
12,50019,999
800012,499
50007999
31504999
20003149
12501999
8001249
*
*
*
*
*
*
*
*
*
500799
320499
200319
*
*
*
*
*
*
*
*
*
130199
80129
5079
*
*
*
*
*
*
3049
2029
*
*
*
Number of
Sample Units
from Last 10
Lots or Batches 0.010 0.015 0.025 0.040 0.065 0.10 0.15 0.25 0.40 0.65
3/8/07 12:38:12 PM
H1277 ch09.indd 206
to
to
to
to
to
to
151
281
501
1201
3201
10,001
3200
10,000
35,000
280
500
1200
50
90
150
8
15
25
D
D
D
C
C
C
B
B
C
A
B
B
A
A
A
S-1
E
E
E
D
D
D
C
C
C
B
B
B
A
A
A
S-2
G
G
H
E
F
F
D
D
E
B
C
C
A
A
B
S-3
Figure 9.14 ANSI/ASQ Z1.4-2003 Table I: Sample size code letters.
to 150,000
to 500,000
and
over
to
to
to
26
51
91
35,001
150,001
500,001
to
to
to
2
9
16
Lot or Batch Size
Special Inspection Levels
J
J
K
G
G
H
E
E
F
C
C
D
A
A
B
S-4
L
M
N
H
J
K
E
F
G
C
C
D
A
A
B
N
P
Q
K
L
M
G
H
J
D
E
F
A
B
C
II
P
Q
R
L
M
N
H
J
K
E
F
G
B
C
D
III
General Inspection Levels
206
Chapter Nine
3/8/07 12:38:12 PM
H1277 ch09.indd 207
8
13
20
32
50
80
125
200
315
500
800
1250
2000
D
E
F
G
H
J
K
L
M
N
P
Q
Figure 9.15
2
3
5
A
B
C
0 1
1 2 2 3 3 4 5 6 7 8 10 11 14 15 21 22 30 31
1 2 2 3 3 4 5 6 7 8 10 11 14 15 21 22 30 31 44 45
1 2 2 3 3 4 5 6 7 8 10 11 14 15 21 22 30 31 44 45
2 3 3 4 5 6 7 8 10 11 14 15 21 22
3 4 5 6 7 8 10 11 14 15 21 22
5 6 7 8 10 11 14 15 21 22
1 2 2 3 3 4 5 6 7 8 10 11 14 15 21 22 30 31 44 45
1 2 2 3 3 4 5 6 7 8 10 11 14 15 21 22 30 31 44 45
1 2 2 3 3 4 5 6 7 8 10 11 14 15 21 22
0 1
= Use first sampling plan above arrow.
= Use first sampling plan below arrow. If sample size equals or exceeds lot size, carry out 100 percent inspection.
2 3 3 4 5 6 7 8 10 11 14 15 21 22
3 4 5 6 7 8 10 11 14 15 21 22
5 6 7 8 10 11 14 15 21 22
7 8 10 11 14 15 21 22
1 2 2 3 3 4 5 6 7 8 10 11 14 15 21 22
1 2 2 3 3 4 5 6 7 8 10 11 14 15 21 22
2 3 3 4 5 6 7 8 10 11 14 15 21 22
1 2
1 2
0 1
1 2
1 2 2 3
1 2 2 3 3 4
1 2 2 3
1 2 2 3 3 4
1 2 2 3 3 4 5 6
0 1
0 1
0 1
ANSI/ASQ Z1.4-2003 Table II-A: Single sampling plans for normal inspection.
Re = Rejection number.
Ac = Acceptance number.
0 1
0 1
0 1
0 1
0 1
0 1
0 1
0 1
0 1
AQLs in Percent Nonconforming Items and Nonconformities per 100 Items (normal inspection)
Sample
Size Sample 0.010 0.015 0.025 0.040 0.065 0.10 0.15 0.25 0.40 0.65 1.0 1.5 2.5 4.0 6.5 10
15
25
40
65 100 150 250 400 650 1000
Code
Size
Letter
Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re Ac Re
3/8/07 12:38:12 PM
H1277 ch09.indd 208
Sample Size
Code Letter
Sample Size
2.5
4.0
6.5
10
15
25
40
65
0
1
0
1
2 0
2 3
2
2
3
4
0
1
0
3
1
4
2
2
3
4
4
5
0
1
0
3
1
4
2
6
2
2
3
4
4
5
5
7
0
1
0
3
1
4
2
6
3
8
2
2
3
4
4
5
5
7
7
9
0 2
1 2
0 3
3 4
1 4
4 5
2 5
6 7
3 7
8 9
5 9
12 13
8
0 2
1 2
0 2 0 3
1 2 3 4
0 3 1 4
3 4 4 5
1 4 2 5
4 5 6 7
2 5 3 7
6 7 8 9
3 7 5 9
8 9 12 13
5 9 7 11
12 13 18 19
7 11 11 16
18 19 26 27
0
1
0
3
1
4
2
6
3
8
5
12
7
18
11
26
2
2
3
4
4
5
5
7
7
9
9
13
11
19
16
27
0
1
0
3
1
4
2
6
3
8
5
12
7
18
11
26
2
2
3
4
4
5
5
7
7
9
9
13
11
19
16
27
0
1
0
3
1
4
2
6
3
8
5
12
7
18
11
26
2
2
3
4
4
5
5
7
7
9
9
13
11
19
16
27
0
1
0
3
1
4
2
6
3
8
5
12
7
18
11
26
2
2
3
4
4
5
5
7
7
9
9
13
11
19
16
27
0
1
0
3
1
4
2
6
3
8
5
12
7
18
11
26
2
2
3
4
4
5
5
7
7
9
9
13
11
19
16
27
0
1
0
3
1
4
2
6
3
8
5
12
7
18
11
26
2
2
3
4
4
5
5
7
7
9
9
13
11
19
16
27
0
1
0
3
1
4
2
6
3
8
5
12
7
18
11
26
2
2
3
4
4
5
5
7
7
9
9
13
11
19
16
27
0
3
1
4
2
6
3
8
5
12
7
18
11
26
3
4
4
5
5
7
7
9
9
13
11
19
16
27
+
1
4
2
6
3
8
5
12
7
18
11
26
4
5
5
7
7
9
9
13
11
19
16
27
+
2
6
3
8
5
12
7
18
11
26
5
7
7
9
9
13
11
19
16
27
= Use first sampling plan below arrow. If sample size equals or exceeds lot or batch size, do 100 percent inspection.
2
4
3
6
5
10
8
16
13
26
20
40
32
64
50
100
80
160
125
250
200
400
315
630
500
1000
800
1600
1250
2500
Cumulative
Sample Size
ANSI/ASQ Z1.4-2003 Table III-A: Double sampling plans for normal inspection.
+ = Use corresponding single sampling plan or double sampling plan for code letter B.
8 = Use corresponding single sampling plan.
2
First
2
Second
3
First
3
Second
5
First
5
Second
8
First
8
Second
13
First
13
Second
20
First
20
Second
32
First
32
Second
50
First
50
Second
80
First
80
Second
125
First
Second 125
200
First
Second 200
315
First
Second 315
500
First
Second 500
800
First
Second 800
1250
First
Second 1250
Sample
Figure 9.16
1.5
AQLs (reduced inspection)

1.0
100
150
250
400
650 1000
3
8
5
12
7
18
11
26
7
9
9
13
11
19
16
27
+
5
12
7
18
11
26
17
37
9
13
11
19
16
27
22
38
+
7
18
11
26
17
37
25
56
11
19
16
27
22
38
31
57
11
26
17
37
25
56
16
27
22
38
31
57
17
37
25
56
+
22 25 31
38 56 57
31
57
0.010 0.015 0.025 0.040 0.065 0.10 0.15 0.25 0.40 0.65
208
Chapter Nine
3/8/07 12:38:12 PM
H1277 ch09.indd 209
Sample Size
Code Letter
Sample
2
4
6
8
10
12
14
3
6
9
12
15
18
21
5
10
15
20
25
30
35
8
16
24
32
40
48
56
13
26
39
52
65
78
91
20
40
60
80
100
120
140
= Use first sampling plan below arrow. If sample size equals

or exceeds lot or batch size, do 100 percent inspection.
2
2
2
2
2
2
2
3
3
3
3
3
3
3
5
5
5
5
5
5
5
8
8
8
8
8
8
8
13
13
13
13
13
13
13
20
20
20
20
20
20
20
Sample Size
1.5
2.5
4.0
#
#
0
0
1
1
2
2
2
2
3
3
3
3
#
#
0
0
1
1
2
#
0
0
1
2
3
4
2
2
2
3
3
3
3
2
3
3
4
4
5
5
#
#
0
0
1
1
2
#
0
0
1
2
3
4
#
0
1
2
3
4
6
2
2
2
3
3
3
3
2
3
3
4
4
5
5
3
3
4
5
6
6
7
# 2
# 2
0 2
0 3
1 3
1 3
2 3
# 2
0 3
0 3
1 4
2 4
3 5
4 5
# 3
0 3
1 4
2 5
3 6
4 6
6 7
# 4
1 5
2 6
3 7
5 8
7 9
9 10
2
2
2
3
3
3
3
2
3
3
4
4
5
5
3
3
4
5
6
6
7
4
5
6
7
8
9
10
4
6
8
10
11
12
14
#
#
0
0
1
1
2
#
0
0
1
2
3
4
#
0
1
2
3
4
6
#
1
2
3
5
7
9
0
1
3
5
7
10
13
++ = Use corresponding double sampling plan or multiple sampling plan for code letter D.
= Use corresponding single sampling plan.
First
Second
Third
Fourth
Fifth
Sixth
Seventh
First
Second
Third
Fourth
Fifth
Sixth
Seventh
First
Second
Third
Fourth
Fifth
Sixth
Seventh
First
Second
Third
Fourth
Fifth
Sixth
Seventh
First
Second
Third
Fourth
Fifth
Sixth
Seventh
First
Second
Third
Fourth
Fifth
Sixth
Seventh
Cumulative
Sample Size
6.5
10
15
#
#
0
0
1
1
2
#
0
0
1
2
3
4
#
0
1
2
3
4
6
#
1
2
3
5
7
9
0
1
3
5
7
10
13
0
3
6
8
11
14
18
2
2
2
3
3
3
3
2
3
3
4
4
5
5
3
3
4
5
6
6
7
4
5
6
7
8
9
10
4
6
8
10
11
12
14
5
8
10
13
15
17
19
#
0
0
1
2
3
4
#
0
1
2
3
4
6
#
1
2
3
5
7
9
0
1
3
5
7
10
13
0
3
6
8
11
14
18
1
4
8
12
17
21
25
2
3
3
4
4
5
5
3
3
4
5
6
6
7
4
5
6
7
8
9
10
4
6
8
10
11
12
14
5
8
10
13
15
17
19
7
10
13
17
20
23
26
++
#
0
1
2
3
4
6
#
1
2
3
5
7
9
0
1
3
5
7
10
13
0
3
6
8
11
14
18
1
4
8
12
17
21
25
2
7
13
19
25
31
37
3
3
4
5
6
6
7
4
5
6
7
8
9
10
4
6
8
10
11
12
14
5
8
10
13
15
17
19
7
10
13
17
20
23
26
9
14
19
25
29
33
38
++
++
Figure 9.17 ANSI/ASQ Z1.4-2003 Table IV-A: Multiple sampling plans for normal inspection.
A
B
C
1.0
25
40
65
100
150
250
400
650 1000
4
5
6
7
8
9
10
4
6
8
10
11
12
14
5
8
10
13
15
17
19
7
10
13
17
20
23
26
9
14
19
25
29
33
38
0
1
3
5
7
10
13
0
3
6
8
11
14
18
1
4
8
12
17
21
25
2
7
13
19
25
31
37
4
6
8
10
11
12
14
5
8
10
13
15
17
19
7
10
13
17
20
23
26
9
14
19
25
29
33
38
++
++
0
3
6
8
11
14
18
1
4
8
12
17
21
25
2
7
13
19
25
31
37
5
8
10
13
15
17
19
7
10
13
17
20
23
26
9
14
19
25
29
33
38
++
++
1
4
8
12
17
21
25
2
7
13
19
25
31
37
7
10
13
17
20
23
26
9
14
19
25
29
33
38
++
++
2
7
13
19
25
31
37
4
11
19
27
36
45
53
9
14
19
25
29
33
38
12
19
27
34
40
47
54
++
++
4
11
19
27
36
45
53
6
17
29
40
53
65
77
12
19
27
34
40
47
54
16
27
39
49
58
68
78
++
++
6
17
29
40
53
65
77
16
27
39
49
58
68
78
++
++
##
##
##
(continued)
## = Use corresponding double sampling plan.
# = Acceptance not permitted at this sample size.
#
1
2
3
5
7
9
0
1
3
5
7
10
13
0
3
6
8
11
14
18
1
4
8
12
17
21
25
2
7
13
19
25
31
37
++
++
0.010 0.015 0.025 0.040 0.065 0.10 0.15 0.25 0.40 0.65
AQLs (normal inspection)
3/8/07 12:38:13 PM
H1277 ch09.indd 210
Sample Size
Code Letter
Sample
32
64
96
128
160
192
224
50
100
150
200
250
300
350
80
160
240
320
400
480
560
125
250
375
500
625
750
875
200
400
600
800
1000
1200
1400
315
630
945
1260
1575
1890
2205
500
1000
1500
2000
2500
3000
3500
1.0
1.5
2.5
4.0
6.5
10

15
25
40
65
100
150
250
400
650 1000
#
#
0
0
1
1
2
2
2
2
3
3
3
3
#
#
0
0
1
1
2
#
0
0
1
2
3
4
2
2
2
3
3
3
3
2
3
3
4
4
5
5
#
#
0
0
1
1
2
#
0
0
1
2
3
4
#
0
1
2
3
4
6
2
2
2
3
3
3
3
2
3
3
4
4
5
5
3
3
4
5
6
6
7
#
#
0
0
1
1
2
#
0
0
1
2
3
4
#
0
1
2
3
4
6
#
1
2
3
5
7
9
2
2
2
3
3
3
3
2
3
3
4
4
5
5
2
3
4
5
6
6
7
4
5
6
7
8
9
10
#
#
0
0
1
1
2
#
0
0
1
2
3
4
#
0
1
2
3
4
6
#
1
2
3
5
7
9
0
1
3
5
7
10
13
2
2
2
3
3
3
3
2
3
3
4
4
5
5
3
3
4
5
6
6
7
4
5
6
7
8
9
10
4
6
8
10
11
12
14
#
#
0
0
1
1
2
#
0
0
1
2
3
4
#
0
1
2
3
4
6
#
1
2
3
5
7
9
0
1
3
5
7
10
13
0
3
6
8
11
14
18
2
2
2
3
3
3
3
2
3
3
4
4
5
5
3
3
4
5
6
6
7
4
5
6
7
8
9
10
4
6
8
10
11
12
14
5
8
10
13
15
17
19
#
#
0
0
1
1
2
#
0
0
1
2
3
4
#
0
1
2
3
4
6
#
1
2
3
5
7
9
0
1
3
5
7
10
13
0
3
6
8
11
14
18
1
4
8
12
17
21
25
2
3
3
4
4
5
5
3
3
4
5
6
6
7
4
5
6
7
8
9
10
4
6
8
10
11
12
14
5
8
10
13
15
17
19
7
10
13
17
20
23
26
9
14
19
25
29
33
38
#
0
1
2
3
4
6
#
1
2
3
5
7
9
0
1
3
5
7
10
13
0
3
6
8
11
14
18
1
4
8
12
17
21
25
2
7
13
19
25
31
37
3
3
4
5
6
6
7
4
5
6
7
8
9
10
4
6
8
10
11
12
14
5
8
10
13
15
17
19
7
10
13
17
20
23
26
9
14
19
25
29
33
38
#
1
2
3
5
7
9
0
1
3
5
7
10
13
0
3
6
8
11
14
18
1
4
8
12
17
21
25
2
7
13
19
25
31
37
4
5
6
7
8
9
10
4
6
8
10
11
12
14
5
8
10
13
15
17
19
7
10
13
17
20
23
26
9
14
19
25
29
33
38
0
1
3
5
7
10
13
0
3
6
8
11
14
18
1
4
8
12
17
21
25
2
7
13
19
25
31
37
4
6
8
10
11
12
14
5
8
10
13
15
17
19
7
10
13
17
20
23
26
9
14
19
25
29
33
38
0
3
6
8
11
14
18
1
4
8
12
17
21
25
2
7
13
19
25
31
37
5
8
10
13
15
17
19
7
10
13
17
20
23
26
9
14
19
25
29
33
38
1
4
8
12
17
21
25
2
7
13
19
25
31
37
7
10
13
17
20
23
26
9
14
19
25
29
33
38
2
7
13
19
25
31
37
9
14
19
25
29
33
38
#
0
0
1
2
3
4
#
0
1
2
3
4
6
#
1
2
3
5
7
9
0
1
3
5
7
10
13
0
3
6
8
11
14
18
1
4
8
12
17
21
25
2
7
13
19
25
31
37
# = Acceptance not permitted at this sample size.
= Use corresponding single sampling plan.
2
2
2
3
3
3
3
2
3
3
4
4
5
5
3
3
4
5
6
6
7
4
5
6
7
8
9
10
4
6
8
10
11
12
14
5
8
10
13
15
17
19
7
10
13
17
20
23
26
(continued)
= Use first sampling plan below arrow. If sample size equals

or exceeds lot or batch size, do 100 percent inspection.
32
32
32
32
32
32
32
50
50
50
50
50
50
50
80
80
80
80
80
80
80
125
125
125
125
125
125
125
200
200
200
200
200
200
200
315
315
315
315
315
315
315
500
500
500
500
500
500
500
Cumulative
Sample Size
Figure 9.17 ANSI/ASQ Z1.4-2003 Table IV-A: Multiple sampling plans for normal inspection.
Sample Size
First
Second
Third
Fourth
Fifth
Sixth
Seventh
First
Second
Third
Fourth
Fifth
Sixth
Seventh
First
Second
Third
Fourth
Fifth
Sixth
Seventh
First
Second
Third
Fourth
Fifth
Sixth
Seventh
First
Second
Third
Fourth
Fifth
Sixth
Seventh
First
Second
Third
Fourth
Fifth
Sixth
Seventh
First
Second
Third
Fourth
Fifth
Sixth
Seventh
0.010 0.015 0.025 0.040 0.065 0.10 0.15 0.25 0.40 0.65
(continued)
210
Chapter Nine
3/8/07 12:38:13 PM
Inspection Levels
Lot Size
General
I II III
to
to
15
16
to
25
26
to
50
51
to
90
91
to
150
151
to
280
281
to
400
401
to
500
501
to
1200
1201
to
3200
3201
to
10,000
10,001
to
35,000
35,001
to
150,000
150,001
to
500,000
over
500,001 and
Figure 9.18
Special
S3 S4
4.20 ANSI/ASQ Z1.9-2003 Table A-2*: Sample size code letters.**
The theory governing inspection by variables depends on the properties of the normal
distribution; therefore, this method of inspection is applicable only when there is reason to believe
that the frequency distribution is normal.
**
Sample size code letters given in body of table are applicable when the indicated inspection
levels are to be used.
H1277 ch09.indd 211
3/8/07 12:38:14 PM
212
Chapter Nine
Sample
Size
Code
Letter

Sample
Size
.10
.15
.25
.40
.65
1.00
1.50
2.50
4.00
6.50 10.00
.587
.502
.401 .296
.598
.525
.450
.364 .276
.663 .614
.565
.498
.431
.352 .272
.651
.702 .659
.613 .569
.525
.465
.405
.336 .266
10
.916 .863 .811
.755 .703
.650
.579
.507
.424 .341
15
1.04
.958 .903 .850
.792 .738
.684
.610
.536
.452 .368
25
1.10
1.05
1.01
.951 .896
.835 .779
.723
.647
.571
.484 .398
30
1.10
1.06
1.02
.959 .904
.843 .787
.730
.654
.577
.490 .403
40
1.13
1.08
1.04
.978 .921
.860 .803
.746
.668
.591
.503 .415
60
1.16
1.11
1.06 1.00
.948
.885 .826
.768
.689
.610
.521 .432
85
1.17
1.13
1.08 1.02
.962
.899 .839
.780
.701
.621
.530 .441
115
1.19
1.14
1.09 1.03
.975
.911 .851
.791
.711
.631
.539 .449
175
1.21
1.16
1.11 1.05
.994
.929 .868
.807
.726
.644
.552 .460
230
1.21
1.16
1.12 1.06
.996
.931 .870
.809
.728
.646
.553 .462
.10
.15
.40
.65
1.00 1.50
2.50
4.00
6.50 10.00
.999
.25
AQLs (tightened inspection)

All AQL values are in percent nonconforming. T denotes plan used exclusively on tightened inspection
and provides symbol for identification of appropriate OC curve.
= Use first sampling plan below arrow, that is, both sample size and k value. When sample size
equals or exceeds lot size, every item in the lot must be inspected.
Figure 9.19
H1277 ch09.indd 212
ANSI/ASQ Z1.9-2003 Table C-1: Master table for normal and tightened inspection
for plans based on variability unknown (single specification limitForm 1).
3/8/07 12:38:14 PM
QU
or
QL
Sample size
3
10
15
20
25
30
35
50
75
100
150
200
.1
.2
.3
.31
.32
.33
.34
.35
.36
.37
.38
.39
50.00
47.24
44.46
41.63
41.35
41.06
40.77
40.49
40.20
39.91
39.62
39.33
39.03
50.00
46.67
43.33
40.00
39.67
39.33
39.00
38.67
38.33
38.00
37.67
37.33
37.00
50.00
46.44
42.90
39.37
39.02
38.67
38.32
37.97
37.62
37.28
36.93
36.58
36.23
50.00
46.26
42.54
38.87
38.50
38.14
37.78
37.42
37.06
36.69
36.33
35.98
35.62
50.00
46.16
42.35
38.60
38.23
37.86
37.49
37.12
36.75
36.38
36.02
35.65
35.29
50.00
46.10
42.24
38.44
38.06
37.69
37.31
36.94
36.57
36.20
35.83
35.46
35.10
50.00
46.08
42.19
38.37
37.99
37.62
37.24
36.87
36.49
36.12
35.75
35.38
35.02
50.00
46.06
42.16
38.33
37.95
37.58
37.20
36.83
36.45
36.08
35.71
35.34
34.97
50.00
46.05
42.15
38.31
37.93
37.55
37.18
36.80
36.43
36.05
35.68
35.31
34.94
50.00
46.05
42.13
38.29
37.91
37.54
37.16
36.78
36.41
36.04
35.66
35.29
34.93
50.00
46.04
42.11
38.27
37.89
37.51
37.13
36.75
36.38
36.01
35.63
35.26
34.89
50.00
46.03
42.10
38.25
37.87
37.49
37.11
36.73
36.36
35.98
35.61
35.24
34.87
50.00
46.03
42.09
38.24
37.86
37.48
37.10
36.72
36.35
35.97
35.60
35.23
34.86
50.00
46.02
42.09
38.23
37.85
37.47
37.09
36.71
36.34
35.96
35.59
35.22
34.85
50.00
46.02
42.08
38.22
37.84
37.46
37.08
36.71
36.33
35.96
35.58
35.21
34.84
.40
.41
.42
.43
.44
.45
.46
.47
.48
.49
38.74
38.45
38.15
37.85
37.56
37.26
36.96
36.66
36.35
36.05
36.67
36.33
36.00
35.67
35.33
35.00
34.67
34.33
34.00
33.67
35.88
35.54
35.19
34.85
34.50
34.16
33.81
33.47
33.12
32.78
35.26
34.90
34.55
34.19
33.84
33.49
33.13
32.78
32.43
32.08
34.93
34.57
34.21
33.85
33.49
33.13
32.78
32.42
32.07
31.72
34.73
34.37
34.00
33.64
33.28
32.92
32.57
32.21
31.85
31.50
34.65
34.28
33.92
33.56
33.20
32.84
32.48
32.12
31.77
31.41
34.60
34.24
33.87
33.51
33.15
32.79
32.43
32.07
31.72
31.36
34.58
34.21
33.85
33.48
33.12
32.76
32.40
32.04
31.69
31.33
34.56
34.19
33.83
33.46
33.10
32.74
32.38
32.02
31.67
31.31
34.53
34.16
33.79
33.43
33.07
32.71
32.35
31.99
31.63
31.28
34.50
34.13
33.77
33.40
33.04
32.68
32.32
31.96
31.61
31.25
34.49
34.12
33.76
33.39
33.03
32.67
32.31
31.95
31.60
31.24
34.48
34.11
33.75
33.38
33.02
32.66
32.30
31.94
31.58
31.23
34.47
34.11
33.74
33.38
33.01
32.65
32.29
31.93
31.58
31.22
.50
.51
.52
.53
.54
.55
.56
.57
.58
.59
35.75
35.44
35.13
34.82
34.51
34.20
33.88
33.57
33.25
32.93
33.33
33.00
32.67
32.33
32.00
31.67
31.33
31.00
30.67
30.33
32.44
32.10
31.76
31.42
31.08
30.74
30.40
30.06
29.73
29.39
31.74
31.39
31.04
30.70
30.36
30.01
29.67
29.33
28.99
28.66
31.37
31.02
30.67
30.32
29.98
29.64
29.29
28.95
28.61
28.28
31.15
30.80
30.45
30.10
29.76
29.41
29.07
28.73
28.39
28.05
31.06
30.71
30.36
30.01
29.67
29.32
28.98
28.64
28.30
27.96
31.01
30.66
30.31
29.96
29.62
29.27
28.93
28.59
28.25
27.92
30.98
30.63
30.28
29.93
29.59
29.24
28.90
28.56
28.22
27.89
30.96
30.61
30.26
29.91
29.57
29.22
28.88
28.54
28.20
27.87
30.93
30.57
30.23
29.88
29.53
29.19
28.85
28.51
28.17
27.83
30.90
30.55
30.20
29.85
29.51
29.16
28.82
28.48
28.14
27.81
30.89
30.54
30.19
29.84
29.49
29.15
28.81
28.47
28.13
27.79
30.88
30.53
30.18
29.83
29.48
29.14
28.80
28.46
28.12
27.78
30.87
30.52
30.17
29.82
29.48
29.13
28.79
28.45
28.11
27.78
.60
.61
.62
.63
.64
.65
.66
.67
.68
.69
32.61
32.28
31.96
31.63
31.30
30.97
30.63
30.30
29.96
29.61
30.00
29.67
29.33
29.00
28.67
28.33
28.00
27.67
27.33
27.00
29.05
28.72
28.39
28.05
27.72
27.39
27.06
26.73
26.40
26.07
28.32
27.98
27.65
27.32
26.99
26.66
26.33
26.00
25.68
25.35
27.94
27.60
27.27
26.94
26.61
26.28
25.96
25.63
25.31
24.99
27.72
27.39
27.05
26.72
26.39
26.07
25.74
25.42
25.10
24.78
27.63
27.30
26.96
26.63
26.31
25.98
25.66
25.33
25.01
24.70
27.58
27.25
26.92
26.59
26.26
25.93
25.61
25.29
24.97
24.65
27.55
27.22
26.89
26.56
26.23
25.90
25.58
25.26
24.94
24.62
27.53
27.20
26.87
26.54
26.21
25.88
25.56
25.24
24.92
24.60
27.50
27.16
26.83
26.50
26.18
25.85
25.53
25.21
24.89
24.57
27.47
27.14
26.81
26.48
26.15
25.83
25.51
25.19
24.87
24.55
27.46
27.13
26.80
26.47
26.14
25.82
25.49
25.17
24.86
24.54
27.45
27.11
26.78
26.46
26.13
25.81
25.48
25.16
24.85
24.53
27.44
27.11
26.78
26.45
26.12
25.80
25.48
25.16
24.84
24.52
Figure 9.20
H1277 ch09.indd 213
ANSI/ASQ Z1.9-2003 Table B-5: Table for estimating the lot

percent nonconforming using standard deviation method.
Values tabulated are read as percentages.
(continued)
3/8/07 12:38:14 PM
214
Chapter Nine
QU
or
QL
10
15
20
25
30
35
50
75
100
150
200
.70
.71
.72
.73
.74
.75
.76
.77
.78
.79
29.27
28.92
28.57
28.22
27.86
27.50
27.13
26.76
26.39
26.02
26.67
26.33
26.00
25.67
25.33
25.00
24.67
24.33
24.00
23.67
25.74
25.41
25.09
24.76
24.44
24.11
23.79
23.47
23.15
22.83
25.03
24.71
24.39
24.07
23.75
23.44
23.12
22.81
22.50
22.19
24.67
24.35
24.03
23.72
23.41
23.10
22.79
22.48
22.18
21.87
24.46
24.15
23.83
23.52
23.21
22.90
22.60
22.30
21.99
21.70
24.38
24.06
23.75
23.44
23.13
22.83
22.52
22.22
21.92
21.63
24.33
24.02
23.71
23.40
23.09
22.79
22.48
22.18
21.89
21.59
24.31
23.99
23.68
23.37
23.07
22.76
22.46
22.16
21.86
21.57
24.29
23.98
23.67
23.36
23.05
22.75
22.44
22.14
21.85
21.55
24.26
23.95
23.64
23.33
23.02
22.72
22.42
22.12
21.82
21.53
24.24
23.92
23.61
23.31
23.00
22.70
22.40
22.10
21.80
21.51
24.23
23.91
23.60
23.30
22.99
22.69
22.39
22.09
21.78
21.50
24.22
23.90
23.59
23.29
22.98
22.68
22.38
22.08
21.79
21.49
24.21
23.90
23.59
23.28
22.98
22.68
22.38
22.08
21.78
21.49
.80
.81
.82
.83
.84
.85
.86
.87
.88
.89
25.64
25.25
24.86
24.47
24.07
23.67
23.26
22.84
22.42
21.99
23.33
23.00
22.67
22.33
22.00
21.67
21.33
21.00
20.67
20.33
22.51
22.19
21.87
21.56
21.24
20.93
20.62
20.31
20.00
19.69
21.88
21.58
21.27
29.97
20.67
20.37
20.07
19.78
19.48
19.19
21.57
21.27
20.98
29.68
20.39
20.10
19.81
19.52
19.23
18.95
21.40
21.10
20.81
20.52
20.23
19.94
19.66
19.38
19.10
18.82
21.33
21.04
20.75
20.46
20.17
19.89
19.60
19.32
19.05
18.77
21.29
21.00
20.71
20.42
20.14
19.86
19.57
19.30
19.02
18.74
21.27
20.98
20.69
20.40
20.12
19.84
19.56
19.28
19.00
18.73
21.26
20.97
20.68
20.39
20.11
19.82
19.54
19.27
18.99
18.72
21.23
20.94
20.65
20.37
20.09
19.80
19.53
19.25
18.98
18.70
21.22
20.93
20.64
20.35
20.07
19.79
19.51
19.24
18.96
18.69
21.21
20.92
20.63
20.35
20.06
19.78
19.51
19.23
18.96
18.69
21.20
20.91
20.62
20.34
20.06
19.78
19.50
19.23
18.95
18.68
21.20
20.91
20.62
20.34
20.05
19.77
19.50
19.22
18.95
18.68
.90
.91
.92
.93
.94
.95
.96
.97
.98
.99
21.55
21.11
20.66
20.19
19.73
19.25
18.75
18.25
17.74
17.21
20.00
19.67
19.33
19.00
18.67
18.33
18.00
17.67
17.33
17.00
19.38
19.07
18.77
18.46
18.16
17.86
17.55
17.25
16.96
16.66
18.90
18.61
18.33
18.04
17.76
17.48
17.20
16.92
16.65
16.37
18.67
18.39
18.11
17.84
17.56
17.29
17.03
16.76
16.49
16.23
18.54
18.27
18.00
17.73
17.46
17.20
16.94
16.68
16.42
16.16
18.50
18.23
17.96
17.69
17.43
17.17
16.90
16.65
16.39
16.14
18.47
18.20
17.94
17.67
17.41
17.16
16.89
16.63
16.38
16.13
18.46
18.19
17.92
17.66
17.40
17.14
16.88
16.62
16.37
16.12
18.45
18.18
17.92
17.65
17.39
17.13
16.88
16.62
16.37
16.12
18.43
18.17
17.90
17.64
17.38
17.12
16.87
16.61
16.36
16.12
18.42
18.16
17.89
17.63
17.37
17.12
16.86
16.61
16.36
16.11
18.42
18.15
17.89
17.63
17.37
17.11
16.86
16.61
16.36
16.11
18.41
18.15
17.89
17.62
17.37
17.11
16.86
16.61
16.36
16.11
18.41
18.15
17.88
17.62
17.36
17.11
16.86
16.60
16.36
16.11
1.00
1.01
1.02
1.03
1.04
1.05
1.06
1.07
1.08
1.09
16.67
16.11
15.53
14.93
14.31
13.66
12.98
12.27
11.51
10.71
16.67
16.33
16.00
15.67
15.33
15.00
14.67
14.33
14.00
13.67
16.36
16.07
15.78
15.48
15.19
14.91
14.62
14.33
14.05
13.76
16.10
15.83
15.56
15.30
15.03
14.77
14.51
14.26
14.00
13.75
15.97
15.72
15.46
15.21
14.96
14.71
14.46
14.22
13.97
13.73
15.91
15.66
15.41
15.17
14.92
14.68
14.44
14.20
13.97
13.74
15.89
15.64
15.40
15.15
14.91
14.67
14.44
14.20
13.97
13.74
15.88
15.63
15.39
15.15
14.91
14.67
14.44
14.21
13.98
13.75
15.88
15.63
15.39
15.15
14.91
14.67
14.44
14.21
13.98
13.75
15.87
15.63
15.38
15.15
14.91
14.67
14.44
14.21
13.98
13.76
15.87
15.63
15.38
15.15
14.91
14.68
14.45
14.22
13.99
13.77
15.87
15.62
15.38
15.15
14.91
14.68
14.45
14.22
13.99
13.77
15.87
15.62
15.38
15.15
14.91
14.68
14.45
14.22
14.00
13.77
15.87
15.62
15.39
15.15
14.91
14.68
14.45
14.23
14.00
13.78
15.87
15.62
15.39
15.15
14.91
14.68
14.45
14.22
14.00
13.78
Sample size
Figure 9.20
H1277 ch09.indd 214

(continued)
3/8/07 12:38:14 PM
QU
or
QL
10
15
20
25
30
35
50
75
100
150
200
1.10
1.11
1.12
1.13
1.14
1.15
1.16
1.17
1.18
1.19
9.84
8.89
7.82
6.60
5.08
2.87
0.00
0.00
0.00
0.00
13.33
13.00
12.67
12.33
12.00
11.67
11.33
11.00
10.67
10.33
13.48
13.20
12.93
12.65
12.37
12.10
11.83
11.56
11.29
11.02
13.49
13.25
13.00
12.75
12.51
12.27
12.03
11.79
11.56
11.33
13.50
13.26
13.03
12.80
12.57
12.34
12.12
11.90
11.68
11.46
13.51
13.28
13.05
12.83
12.61
12.39
12.18
11.96
11.75
11.54
13.52
13.29
13.07
12.85
12.63
12.42
12.21
12.00
11.79
11.58
13.52
13.30
13.08
12.86
12.65
12.44
12.22
12.02
11.81
11.61
13.53
13.31
13.09
12.87
12.66
12.45
12.24
12.03
11.82
11.62
13.54
13.31
13.10
12.88
12.67
12.46
12.25
12.04
11.84
11.63
13.54
13.32
13.11
12.89
12.68
12.47
12.26
12.06
11.85
11.65
13.55
13.33
13.12
12.90
12.69
12.48
12.28
12.07
11.87
11.67
13.55
13.34
13.12
12.91
12.70
12.49
12.28
12.08
11.88
11.68
13.56
13.34
13.13
12.91
12.70
12.49
12.29
12.09
11.88
11.69
13.56
13.34
13.13
12.92
12.71
12.50
12.29
12.09
11.89
11.69
1.20
1.21
1.22
1.23
1.24
1.25
1.26
1.27
1.28
1.29
0.00 10.00 10.76 11.10 11.24 11.34 11.38 11.41 11.42

9.67 10.50 10.87 11.03 11.13 11.18 11.21 11.22
0.00
9.33 10.23 10.65 10.82 10.93 10.98 11.01 11.03
0.00
9.00 9.97 10.42 10.61 10.73 10.78 10.81 10.84
0.00
8.67 9.72 10.20 10.41 10.53 10.59 10.62 10.64
0.00
8.33 9.46 9.98 10.21 10.34 10.40 10.43 10.46
0.00
8.00 9.21 9.77 10.00 10.15 10.21 10.25 10.27
0.00
7.67 8.96 9.55 9.81 9.96 10.02 10.06 10.09
0.00
7.33 8.71 9.34 9.61 9.77 9.84 9.88 9.90
0.00
7.00 8.46 9.13 9.42 9.58 9.66 9.70 9.72
0.00
11.43
11.24
11.04
10.85
10.66
10.47
10.29
10.10
9.92
9.74
11.46
11.26
11.07
10.88
10.69
10.50
10.32
10.13
9.95
9.78
11.47
11.28
11.09
10.90
10.71
10.52
10.34
10.16
9.98
9.80
11.48
11.29
11.09
10.91
10.72
10.53
10.35
10.17
9.99
9.82
11.49
11.30
11.10
10.92
10.73
10.54
10.36
10.18
10.00
9.83
11.49
11.30
11.11
10.92
10.73
10.55
10.37
10.19
10.01
9.83
1.30
1.31
1.32
1.33
1.34
1.35
1.36
1.37
1.38
1.39
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
6.67
6.33
6.00
5.67
5.33
5.00
4.67
4.33
4.00
3.67
8.21
7.97
7.73
7.49
7.25
7.02
6.79
6.56
6.33
6.10
8.93
8.72
8.52
8.32
8.12
7.92
7.73
7.54
7.35
7.17
9.22
9.03
8.85
8.66
8.48
8.30
8.12
7.95
7.77
7.60
9.40
9.22
9.04
8.86
8.69
8.52
8.35
8.18
8.01
7.85
9.48
9.30
9.12
8.95
8.78
8.61
8.44
8.28
8.12
7.96
9.52
9.34
9.17
9.00
8.83
8.66
8.50
8.33
8.17
8.01
9.55
9.37
9.20
9.03
8.86
8.69
8.53
8.37
8.21
8.05
9.57
9.39
9.22
9.05
8.88
8.72
8.55
8.39
8.24
8.08
9.60
9.43
9.26
9.09
8.92
8.76
8.60
8.44
8.28
8.12
9.63
9.46
9.29
9.12
8.95
8.79
8.63
8.47
8.31
8.16
9.64
9.47
9.30
9.13
8.97
8.81
8.65
8.49
8.33
8.18
9.65
9.48
9.31
9.15
8.98
8.82
8.66
8.50
8.35
8.19
9.66
9.49
9.32
9.15
8.99
8.83
8.67
8.51
8.36
8.20
1.40
1.41
1.42
1.43
1.44
1.45
1.46
1.47
1.48
1.49
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
3.33
3.00
2.67
2.33
2.00
1.67
1.33
1.00
.67
.33
5.88
5.66
5.44
5.23
5.02
4.81
4.60
4,39
4.19
3.99
6.98
6.80
6.62
6.45
6.27
6.10
5.93
5.77
5.60
5.44
7.44
7.27
7.10
6.94
6.78
6.63
6.47
6.32
6.17
6.02
7.69
7.53
7.37
7.22
7.07
6.92
6.77
6.63
6.48
6.34
7.80
7.64
7.49
7.34
7.19
7.04
6.90
6.75
6.61
6.48
7.86
7.70
7.55
7.40
7.26
7.11
6.97
6.83
6.69
6.55
7.90
7.74
7.59
7.44
7.30
7.15
7.01
6.87
6.73
6.60
7.92
7.77
7.62
7.47
7.33
7.18
7.04
6.90
6.77
6.63
7.97
7.82
7.67
7.52
7.38
7.24
7.10
6.96
6.82
6.69
8.01
7.86
7.71
7.56
7.42
7.28
7.14
7.00
6.86
6.73
8.02
7.87
7.73
7.58
7.44
7.30
7.16
7.02
6.88
6.75
8.04
7.89
7.74
7.60
7.46
7.32
7.18
7.04
6.90
6.77
8.05
7.90
7.75
7.61
7.47
7.32
7.19
7.05
6.91
6.78
Sample size
Figure 9.20
H1277 ch09.indd 215

(continued)
3/8/07 12:38:14 PM
216
Chapter Nine
QU
or
QL
10
15
20
25
30
35
50
75
100
150
200
1.50
1.51
1.52
1.53
1.54
1.55
1.56
1.57
1.58
1.59
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
3.80
3.61
3.42
3.23
3.05
2.87
2.69
2.52
2.35
2.19
5.28
5.13
4.97
4.82
4.67
4.52
4.38
4.24
4.10
3.96
5.87
5.73
5.59
5.45
5.31
5.18
5.05
4.92
4.79
4.66
6.20
6.06
5.93
5.80
5.67
5.54
5.41
5.29
5.16
5.04
6.34
6.20
6.07
5.94
5.81
5.69
5.56
5.44
5.32
5.20
6.41
6.28
6.15
6.02
5.89
5.77
5.65
5.53
5.41
5.29
6.46
6.33
6.20
6.07
5.95
5.82
5.70
5.58
5.46
5.34
6.50
6.36
6.23
6.11
5.98
5.86
5.74
5.62
5.50
5.38
6.55
6.42
6.29
6.17
6.04
5.92
5.80
5.68
5.56
5.45
6.60
6.47
6.34
6.21
6.09
5.97
5.85
5.73
5.61
5.50
6.62
6.49
6.36
6.24
6.11
5.99
5.87
5.75
5.64
5.52
6.64
6.51
6.38
6.26
6.13
6.01
5.89
5.78
5.66
5.55
6.65
6.52
6.39
6.27
6.15
6.02
5.90
5.79
5.67
5.56
1.60
1.61
1.62
1.63
1.64
1.65
1.66
1.67
1.68
1.69
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
2.03
1.87
1.72
1.57
1.42
1.28
1.15
1.02
0.89
0.77
3.83
3.69
3.57
3.44
3.31
3.19
3.07
2.95
2.84
2.73
4.54
4.41
4.30
4.18
4.06
3.95
3.84
3.73
3.62
3.52
4.92
4.81
4.69
4.58
4.47
4.36
4.25
4.15
4.05
3.94
5.08
4.97
4.86
4.75
4.64
4.53
4.43
4.32
4.22
4.12
5.17
5.06
4.95
4.84
4.73
4.62
4.52
4.42
4.32
4.22
5.23
5.12
5.01
4.90
4.79
4.68
4.58
4.48
4.38
4.28
5.27
5.16
5.04
4.94
4.83
4.72
4.62
4.52
4.42
4.32
5.33
5.22
5.11
5.01
4.90
4.79
4.69
4.59
4.49
4.39
5.38
5.27
5.16
5.06
4.95
4.85
4.74
4.64
4.55
4.45
5.41
5.30
5.19
5.08
4.98
4.87
4.77
4.67
4.57
4.47
5.43
5.32
5.21
5.11
5.00
4.90
4.80
4.70
4.60
4.50
5.44
5.33
5.23
5.12
5.01
4.91
4.81
4.71
4.61
4.51
1.70
1.71
1.72
1.73
1.74
1.75
1.76
1.77
1.78
1.79
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.66
0.55
0.45
0.36
0.27
0.19
0.12
0.06
0.02
0.00
2.62
2.51
2.41
2.30
2.20
2.11
2.01
1.92
1.83
1.74
3.41
3.31
3.21
3.11
3.02
2.93
2.83
2.74
2.66
2.57
3.84
3.75
3.65
3.56
3.46
3.37
3.28
3.20
3.11
3.03
4.02
3.93
3.83
3.74
3.65
3.56
3.47
3.38
3.30
3.21
4.12
4.02
3.93
3.84
3.75
3.66
3.57
3.48
3.40
3.32
4.18
4.09
3.99
3.90
3.81
3.72
3.63
3.55
3.47
3.38
4.22
4.13
4.04
3.94
3.85
3.77
3.68
3.59
3.51
3.43
4.30
4.20
4.11
4.02
3.93
3.84
3.76
3.67
3.59
3.51
4.35
4.26
4.17
4.08
3.99
3.90
3.81
3.73
3.64
3.56
4.38
4.29
4.19
4.10
4.01
3.93
3.84
3.76
3.67
3.59
4.41
4.31
4.22
4.13
4.04
3.95
3.87
3.78
3.70
3.62
4.42
4.32
4.23
4.14
4.05
3.97
3.88
3.80
3.71
3.63
1.80
1.81
1.82
1.83
1.84
1.85
1.86
1.87
1.88
1.89
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
1.65
1.57
1.49
1.41
1.34
1.26
1.19
1.12
1.06
0.99
2.49
2.40
2.32
2.25
2.17
2.09
2.02
1.95
1.88
1.81
2.94
2.86
2.79
2.71
2.63
2.56
2.48
2.41
2.34
2.28
3.13
3.05
2.98
2.90
2.82
2.75
2.68
2.61
2.54
2.47
3.24
31.6
3.08
3.00
2.93
2.85
2.78
2.71
2.64
2.57
3.30
3.22
3.15
3.07
2.99
2.92
2.85
2.78
2.71
2.64
3.35
3.27
3.19
3.11
3.04
2.97
2.89
2.82
2.75
2.69
3.43
3.35
3.27
3.19
3.12
3.05
2.97
2.90
2.83
2.77
3.48
3.40
3.33
3.25
3.18
3.10
3.03
2.96
2.89
2.83
3.51
3.43
3.36
3.28
3.21
3.13
3.06
2.99
2.92
2.85
3.54
3.46
3.38
3.31
3.23
3.16
3.09
3.02
2.95
2.88
3.55
3.47
3.40
3.32
3.25
3.17
3.10
3.03
2.96
2.90
Sample size
Figure 9.20
H1277 ch09.indd 216

(continued)
3/8/07 12:38:14 PM
QU
or
QL
Sample size
25
30
35
50
75
100
150
200
1.90
1.91
1.92
1.93
1.94
1.95
1.96
1.97
1.98
1.99
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.93
0.87
0.81
0.76
0.70
0.65
0.60
0.56
0.51
0.47
1.75
1.68
1.62
1.56
1.50
1.44
1.38
1.33
1.27
1.22
2.21
2.14
2.08
2.02
1.96
1.90
1.84
1.78
1.73
1.67
2.40
2.34
2.27
2.21
2.15
2.09
2.03
1.97
1.92
1.86
2.51
2.44
2.38
2.32
2.25
2.19
2.14
2.08
2.02
1.97
2.57
2.51
2.45
2.38
2.32
2.26
2.20
2.14
2.09
2.03
2.62
2.56
2.49
2.43
2.37
2.31
2.25
2.19
2.13
2.08
2.70
2.63
2.57
2.51
2.45
2.39
2.33
2.27
2.21
2.16
2.76
2.69
2.63
2.57
2.51
2.45
2.39
2.33
2.27
2.22
2.79
2.72
2.66
2.60
2.54
2.48
2.42
2.36
2.30
2.25
2.82
2.75
2.69
2.63
2.56
2.50
2.44
2.39
2.33
2.27
2.83
2.77
2.70
2.64
2.58
2.52
2.46
2.40
2.34
2.29
2.00
2.01
2.02
2.03
2.04
2.05
2.06
2.07
2.08
2.09
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.43
0.39
0.36
0.32
0.29
0.26
0.23
0.21
0.18
0.16
1.17
1.12
1.07
1.03
0.98
0.94
0.90
0.86
0.82
0.78
1.62
1.57
1.52
1.47
1.42
1.37
1.33
1.28
1.24
1.20
1.81
1.76
1.71
1.66
1.61
1.56
1.51
1.47
1.42
1.38
1.91
1.86
1.81
1.76
1.71
1.66
1.61
1.57
1.52
1.48
1.98
1.93
1.87
1.82
1.77
1.73
1.68
1.63
1.59
1.54
2.03
1.97
1.92
1.87
1.82
1.77
1.72
1.68
1.63
1.59
2.10
2.05
2.00
1.95
1.90
1.85
1.80
1.76
1.71
1.66
2.16
2.11
2.06
2.01
1.96
1.91
1.86
1.81
1.77
1.72
2.19
2.14
2.09
2.04
1.99
1.94
1.89
1.84
1.79
1.75
2.22
2.17
2.11
2.06
2.01
1.96
1.92
1.87
1.82
1.78
2.23
2.18
2.13
2.08
2.03
1.98
1.93
1.88
1.84
1.79
2.10
2.11
2.12
2.13
2.14
2.15
2.16
2.17
2.18
2.19
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.14
0.12
0.10
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.74
0.71
0.67
0.64
0.61
0.58
0.55
0.52
0.49
0.46
1.16
1.12
1.08
1.04
1.00
0.97
0.93
0.90
0.87
0.83
1.34
1.30
1.26
1.22
1.18
1.14
1.10
1.07
1.03
1.00
1.44
1.39
1.35
1.31
1.28
1.24
1.20
1.16
1.13
1.09
1.50
1.46
1.42
1.38
1.34
1.30
1.26
1.22
1.19
1.15
1.54
1.50
1.46
1.42
1.38
1.34
1.30
1.27
1.23
1.20
1.62
1.58
1.54
1.50
1.46
1.42
1.38
1.34
1.30
1.27
1.68
1.63
1.59
1.55
1.51
1.47
1.43
1.40
1.36
1.32
1.71
1.66
1.62
1.58
1.54
1.50
1.46
1.42
1.39
1.35
1.73
1.69
1.65
1.61
1.57
1.53
1.49
1.45
1.41
1.38
1.75
1.70
1.66
1.62
1.58
1.54
1.50
1.46
1.42
1.39
2.20
2.21
2.22
2.23
2.24
2.25
2.26
2.27
2.28
2.29
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.015
0.010
0.006
0.003
0.002
0.001
0.000
0.000
0.000
0.000
0.437
0.413
0.389
0.366
0.345
0.324
0.304
0.285
0.267
0.250
0.803
0.772
0.734
0.715
0.687
0.660
0.634
0.609
0.585
0.561
0.968
0.936
0.905
0.874
0.845
0.816
0.789
0.762
0.735
0.710
1.160
1.028
0.996
0.965
0.935
0.905
0.876
0.848
0.821
0.794
1.120
1.087
1.054
1.023
0.992
0.962
0.933
0.904
0.876
0.849
1.160
1.128
1.095
1.063
1.032
1.002
0.972
0.943
0.915
0.887
1.233
1.199
1.166
1.134
1.102
1.071
1.041
1.011
0.982
0.954
1.287
1.253
1.219
1.186
1.154
1.123
1.092
1.062
1.033
1.004
1.314
1.279
1.245
1.212
1.180
1.148
1.117
1.087
1.058
1.029
1.340
1.305
1.271
1.238
1.205
1.173
1.142
1.112
1.082
1.053
1.352
1.318
1.284
1.250
1.218
1.186
1.155
1.124
1.095
1.065
Figure 9.20
H1277 ch09.indd 217
10
15
20

(continued)
3/8/07 12:38:14 PM
218
Chapter Nine
QU
or
QL
10
15
20
25
30
35
50
75
100
150
200
2.30
2.31
2.32
2.33
2.34
2.35
2.36
2.37
2.38
2.39
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.233
0.218
0.203
0.189
0.175
0.163
0.151
0.139
0.128
0.118
0.538
0.516
0.495
0.474
0.454
0.435
0.416
0.398
0.381
0.364
0.685
0.661
0.637
0.614
0.592
0.571
0.550
0.530
0.510
0.491
0.769
0.743
0.719
0.695
0.672
0.650
0.628
0.606
0.586
0.566
0.823
0.797
0.772
0.748
0.724
0.701
0.678
0.656
0.635
0.614
0.861
0.834
0.809
0.784
0.760
0.736
0.714
0.691
0.670
0.648
0.927
0.900
0.874
0.848
0.824
0.799
0.776
0.753
0.730
0.709
0.977
0.949
0.923
0.897
0.872
0.847
0.823
0.799
0.777
0.754
1.001
0.974
0.947
0.921
0.895
0.870
0.846
0.822
0.799
0.777
1.025
0.998
0.971
0.944
0.919
0.893
0.869
0.845
0.822
0.799
1.037
1.009
0.982
0.956
0.930
0.905
0.880
0.856
0.833
0.810
2.40
2.41
2.42
2.43
2.44
2.45
2.46
2.47
2.48
2.49
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.109
0.100
0.091
0.083
0.076
0.069
0.063
0.057
0.051
0.046
0.348
0.332
0.317
0.302
0.288
0.275
0.262
0.249
0.237
0.226
0.473
0.455
0.437
0.421
0.404
0.389
0.373
0.359
0.345
0.331
0.546
0.527
0.509
0.491
0.474
0.457
0.440
0.425
0.409
0.394
0.594
0.575
0.555
0.537
0.519
0.501
0.484
0.468
0.452
0.436
0.628
0.608
0.588
0.569
0.551
0.533
0.516
0.499
0.482
0.466
0.687
0.667
0.646
0.627
0.608
0.589
0.571
0.553
0.536
0.519
0.732
0.711
0.691
0.670
0.651
0.632
0.613
0.595
0.577
0.560
0.755
0.733
0.712
0.692
0.672
0.653
0.634
0.615
0.597
0.580
0.777
0.755
0.734
0.713
0.693
0.673
0.654
0.636
0.617
0.600
0.787
0.766
0.744
0.724
0.703
0.684
0.664
0.646
0.627
0.609
2.50
2.51
2.52
2.53
2.54
2.55
2.56
2.57
2.58
2.59
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.041
0.037
0.033
0.029
0.026
0.023
0.020
0.017
0.015
0.013
0.214
0.204
0.193
0.184
0.174
0.165
0.156
0.148
0.140
0.133
0.317
0.305
0.292
0.280
0.268
0.257
0.246
0.236
0.226
0.216
0.380
0.366
0.352
0.339
0.326
0.314
0.302
0.291
0.279
0.269
0.421
0.407
0.392
0.379
0.365
0.352
0.340
0.327
0.316
0.304
0.451
0.436
0.421
0.407
0.393
0.379
0.366
0.354
0.341
0.330
0.503
0.487
0.472
0.457
0.442
0.428
0.414
0.401
0.388
0.375
0.543
0.527
0.511
0.495
0.480
0.465
0.451
0.437
0.424
0.410
0.563
0.546
0.530
0.514
0.499
0.484
0.469
0.455
0.441
0.428
0.582
0.565
0.549
0.533
0.517
0.502
0.487
0.473
0.459
0.445
0.592
0.575
0.559
0.542
0.527
0.511
0.496
0.482
0.468
0.454
2.60
2.61
2.62
2.63
2.64
2.65
2.66
2.67
2.68
2.69
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.011
0.009
0.008
0.007
0.006
0.005
0.004
0.003
0.002
0.002
0.125
0.118
0.112
0.105
0.099
0.094
0.088
0.083
0.078
0.073
0.207
0.198
0.189
0.181
0.172
0.165
0.157
0.150
0.143
0.136
0.258
0.248
0.238
0.229
0.220
0.211
0.202
0.194
0.186
0.179
0.293
0.282
0.272
0.262
0.252
0.242
0.233
0.224
0.216
0.208
0.318
0.307
0.296
0.285
0.275
0.265
0.256
0.246
0.237
0.229
0.363
0.351
0.339
0.328
0.317
0.307
0.296
0.286
0.277
0.267
0.398
0.385
0.373
0.361
0.350
0.339
0.328
0.317
0.307
0.297
0.415
0.402
0.390
0.378
0.366
0.355
0.344
0.333
0.322
0.312
0.432
0.419
0.406
0.394
0.382
0.371
0.359
0.348
0.338
0.327
0.441
0.428
0.415
0.402
0.390
0.379
0.367
0.356
0.345
0.335
Sample size
Figure 9.20
H1277 ch09.indd 218

(continued)
3/8/07 12:38:14 PM
QU
or
QL
10
15
20
25
30
35
50
75
100
150
200
2.70
2.71
2.72
2.73
2.74
2.75
2.76
2.77
2.78
2.79
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.001
0.001
0.001
0.001
0.000
0.000
0.000
0.000
0.000
0.000
0.069
0.064
0.060
0.057
0.053
0.049
0.046
0.043
0.040
0.037
0.130
0.124
0.118
0.112
0.107
0.102
0.097
0.092
0.087
0.083
0.171
0.164
0.157
0.151
0.144
0.138
0.132
0.126
0.121
0.115
0.200
0.192
0.184
0.177
0.170
0.163
0.157
0.151
0.145
0.139
0.220
0.212
0.204
0.197
0.189
0.182
0.175
0.168
0.162
0.156
0.258
0.249
0.241
0.232
0.224
0.216
0.209
0.201
0.194
0.187
0.288
0.278
0.269
0.260
0.252
0.243
0.235
0.227
0.220
0.212
0.302
0.293
0.283
0.274
0.266
0.257
0.249
0.241
0.223
0.220
0.317
0.307
0.298
0.288
0.279
0.271
0.262
0.254
0.246
0.238
0.325
0.315
0.305
0.296
0.286
0.277
0.269
0.260
0.252
0.244
2.80
2.81
2.82
2.83
2.84
2.85
2.86
2.87
2.88
2.89
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.035
0.032
0.030
0.028
0.026
0.024
0.022
0.020
0.019
0.017
0.079
0.075
0.071
0.067
0.064
0.060
0.057
0.054
0.051
0.048
0.110
0.105
0.101
0.096
0.092
0.088
0.084
0.080
0.076
0.073
0.133
0.128
0.122
0.117
0.112
0.108
0.103
0.099
0.094
0.090
0.150
0.144
0.138
0.133
0.128
0.122
0.118
0.113
0.108
0.104
0.181
0.174
0.168
0.162
0.156
0.150
0.145
0.139
0.134
0.129
0.205
0.198
0.192
0.185
0.179
0.173
0.167
0.161
0.155
0.150
0.218
0.211
0.204
0.197
0.190
0.184
0.178
0.172
0.166
0.160
0.230
0.223
0.216
0.209
0.202
0.195
0.189
0.183
0.177
0.171
0.237
0.229
0.222
0.215
0.208
0.201
0.195
0.188
0.182
0.176
2.90
2.91
2.92
2.93
2.94
2.95
2.96
2.97
2.98
2.99
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.016
0.015
0.013
0.012
0.011
0.010
0.009
0.009
0.008
0.007
0.046
0.043
0.041
0.038
0.036
0.034
0.032
0.030
0.028
0.027
0.069
0.066
0.063
0.060
0.057
0.054
0.051
0.049
0.046
0.044
0.087
0.083
0.079
0.076
0.072
0.069
0.066
0.063
0.060
0.057
0.100
0.096
0.092
0.088
0.084
0.081
0.077
0.074
0.071
0.068
0.125
0.120
0.115
0.111
0.107
0.103
0.099
0.095
0.091
0.088
0.145
0.140
0.135
0.130
0.125
0.121
0.117
0.112
0.108
0.104
0.155
0.150
0.145
0.140
0.135
0.130
0.126
0.121
0.117
0.113
0.165
0.160
0.155
0.149
0.144
0.140
0.135
0.130
0.126
0.122
0.171
0.165
0.160
0.154
0.149
0.144
0.140
0.135
0.130
0.126
3.00
3.01
3.02
3.03
3.04
3.05
3.06
3.07
3.08
3.09
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.006
0.006
0.005
0.005
0.004
0.004
0.003
0.003
0.003
0.002
0.025
0.024
0.022
0.021
0.019
0.018
0.017
0.016
0.015
0.014
0.042
0.040
0.038
0.036
0.034
0.032
0.030
0.029
0.027
0.026
0.055
0.052
0.050
0.048
0.045
0.043
0.041
0.039
0.037
0.036
0.065
0.062
0.059
0.057
0.054
0.052
0.050
0.047
0.045
0.043
0.084
0.081
0.078
0.075
0.072
0.069
0.066
0.064
0.061
0.059
0.101
0.097
0.093
0.090
0.087
0.083
0.080
0.077
0.074
0.072
0.109
0.105
0.101
0.098
0.094
0.091
0.088
0.085
0.081
0.079
0.118
0.113
0.110
0.106
0.102
0.099
0.095
0.092
0.089
0.086
0.122
0.118
0.114
0.110
0.106
0.103
0.099
0.096
0.092
0.089
Sample size
Figure 9.20
H1277 ch09.indd 219

(continued)
3/8/07 12:38:15 PM
220
Chapter Nine
QU
or
QL
10
15
20
25
30
35
50
75
100
150
200
3.10
3.11
3.12
3.13
3.14
3.15
3.16
3.17
3.18
3.19
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.002
0.002
0.002
0.002
0.001
0.001
0.001
0.001
0.001
0.001
0.013
0.012
0.011
0.011
0.010
0.009
0.009
0.008
0.007
0.007
0.024
0.023
0.022
0.021
0.019
0.018
0.017
0.016
0.015
0.015
0.034
0.032
0.031
0.029
0.028
0.026
0.025
0.024
0.022
0.021
0.041
0.039
0.038
0.036
0.034
0.033
0.031
0.030
0.028
0.027
0.056
0.054
0.052
0.050
0.048
0.046
0.044
0.042
0.040
0.038
0.069
0.066
0.064
0.061
0.059
0.057
0.055
0.053
0.050
0.049
0.076
0.073
0.070
0.068
0.065
0.063
0.060
0.058
0.056
0.054
0.083
0.080
0.077
0.074
0.071
0.069
0.066
0.064
0.062
0.059
0.086
0.083
0.080
0.077
0.075
0.072
0.069
0.067
0.065
0.062
3.20
3.21
3.22
3.23
3.24
3.25
3.26
3.27
3.28
3.29
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.001
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.006
0.006
0.005
0.005
0.005
0.004
0.004
0.004
0.003
0.003
0.014
0.013
0.012
0.011
0.011
0.010
0.009
0.009
0.008
0.008
0.020
0.019
0.018
0.017
0.016
0.015
0.015
0.014
0.013
0.012
0.026
0.024
0.023
0.022
0.021
0.020
0.019
0.018
0.017
0.016
0.037
0.035
0.034
0.032
0.031
0.030
0.028
0.027
0.026
0.025
0.047
0.045
0.043
0.041
0.040
0.038
0.037
0.035
0.034
0.032
0.052
0.050
0.048
0.046
0.044
0.043
0.042
0.040
0.038
0.037
0.057
0.055
0.053
0.051
0.049
0.048
0.046
0.044
0.042
0.041
0.060
0.058
0.056
0.054
0.052
0.050
0.048
0.046
0.045
0.043
3.30
3.31
3.32
3.33
3.34
3.35
3.36
3.37
3.38
3.39
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.003
0.003
0.002
0.002
0.002
0.002
0.002
0.002
0.001
0.001
0.007
0.007
0.006
0.006
0.006
0.005
0.005
0.005
0.004
0.004
0.012
0.011
0.010
0.010
0.009
0.009
0.008
0.008
0.007
0.007
0.015
0.015
0.014
0.013
0.013
0.012
0.011
0.011
0.010
0.010
0.024
0.023
0.022
0.021
0.020
0.019
0.018
0.017
0.016
0.016
0.031
0.030
0.029
0.027
0.026
0.025
0.024
0.023
0.022
0.021
0.035
0.034
0.032
0.031
0.030
0.029
0.028
0.026
0.025
0.024
0.039
0.038
0.036
0.035
0.034
0.032
0.031
0.030
0.029
0.028
0.042
0.040
0.038
0.037
0.036
0.034
0.033
0.032
0.031
0.029
3.40
3.41
3.42
3.43
3.44
3.45
3.46
3.47
3.48
3.49
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.000
0.004
0.003
0.003
0.003
0.003
0.003
0.002
0.002
0.002
0.002
0.007
0.006
0.006
0.005
0.005
0.005
0.005
0.004
0.004
0.004
0.009
0.009
0.008
0.008
0.007
0.007
0.007
0.006
0.006
0.005
0.015
0.014
0.014
0.013
0.012
0.012
0.011
0.011
0.010
0.010
0.020
0.020
0.019
0.018
0.017
0.016
0.016
0.015
0.014
0.014
0.023
0.022
0.022
0.021
0.020
0.019
0.018
0.018
0.017
0.016
0.027
0.026
0.025
0.024
0.023
0.022
0.021
0.020
0.019
0.019
0.028
0.027
0.026
0.025
0.024
0.023
0.022
0.022
0.021
0.020
Sample size
Figure 9.20
H1277 ch09.indd 220

(continued)
3/8/07 12:38:15 PM
QU
or
QL
10
15
20
25
30
35
50
75
100
150
200
3.50
3.51
3.52
3.53
3.54
3.55
3.56
3.57
3.58
3.59
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.002
0.002
0.002
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.003
0.003
0.003
0.003
0.003
0.003
0.002
0.002
0.002
0.002
0.005
0.005
0.005
0.004
0.004
0.004
0.004
0.003
0.003
0.003
0.009
0.009
0.008
0.008
0.008
0.007
0.007
0.006
0.006
0.006
0.013
0.013
0.012
0.011
0.011
0.011
0.010
0.010
0.009
0.009
0.015
0.015
0.014
0.014
0.013
0.012
0.012
0.011
0.011
0.010
0.018
0.017
0.016
0.016
0.015
0.015
0.014
0.013
0.013
0.012
0.019
0.018
0.018
0.017
0.016
0.016
0.015
0.014
0.014
0.013
3.60
3.61
3.62
3.63
3.64
3.65
3.66
3.67
3.68
3.69
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.001
0.001
0.001
0.001
0.001
0.001
0.000
0.000
0.000
0.000
0.002
0.002
0.002
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.003
0.003
0.003
0.002
0.002
0.002
0.002
0.002
0.002
0.002
0.006
0.005
0.005
0.005
0.004
0.004
0.004
0.004
0.004
0.003
0.008
0.008
0.008
0.007
0.007
0.007
0.006
0.006
0.006
0.005
0.010
0.010
0.009
0.009
0.008
0.008
0.008
0.007
0.007
0.007
0.012
0.011
0.011
0.010
0.010
0.010
0.009
0.009
0.008
0.008
0.013
0.012
0.012
0.011
0.011
0.010
0.010
0.010
0.009
0.009
3.70
3.71
3.72
3.73
3.74
3.75
3.76
3.77
3.78
3.79
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.000
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.000
0.000
0.002
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.003
0.003
0.003
0.003
0.003
0.002
0.002
0.002
0.002
0.002
0.005
0.005
0.005
0.005
0.004
0.004
0.004
0.004
0.004
0.003
0.006
0.006
0.006
0.006
0.005
0.005
0.005
0.005
0.004
0.004
0.008
0.007
0.007
0.007
0.006
0.006
0.006
0.006
0.005
0.005
0.008
0.008
0.008
0.007
0.007
0.007
0.007
0.006
0.006
0.006
3.80
3.81
3.82
3.83
3.84
3.85
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0.000
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Sample size
Figure 9.20
H1277 ch09.indd 221

(continued)
3/8/07 12:38:15 PM
222
Chapter Nine
Sample
Size
Code
Letter

Sample
Size
10
.10
.15
.25
.40
.65
1.00
1.50
2.50
4.00
6.50 10.00
M
7.59 18.86 26.94 33.69

1.49
5.46 10.88 16.41 22.84 29.43
0.041 1.34 3.33
5.82
9.80 14.37 20.19 26.55
0.005 0.087 0.421 1.05
2.13 3.54
5.34
8.40 12.19 17.34 23.30
0.077
0.179 0.349 0.714 1.27
2.14 3.27
4.72
7.26 10.53 15.17 20.73
15
0.186
0.311 0.491 0.839 1.33
2.09 3.06
4.32
6.55
9.48 13.74 18.97
20
0.228
0.356 0.531 0.864 1.33
2.03 2.93
4.10
6.18
8.95 13.01 18.07
25
0.250
0.378 0.551 0.874 1.32
2.00 2.86
3.97
5.98
8.65 12.60 17.55
35
0.253
0.373 0.534 0.833 1.24
1.87 2.66
3.70
5.58
8.11 11.89 16.67
50
0.243
0.355 0.503 0.778 1.16
1.73 2.47
3.44
5.21
7.61 11.23 15.87
75
0.225
0.326 0.461 0.711 1.06
1.59 2.27
3.17
4.83
7.10 10.58 15.07
100
0.218
0.315 0.444 0.684 1.02
1.52 2.18
3.06
4.67
6.88 10.29 14.71
150
0.202
0.292 0.412 0.636 0.946 1.42 2.05
2.88
4.42
6.56
9.86 14.18
200
0.204
0.294 0.414 0.637 0.945 1.42 2.04
2.86
4.39
6.52
9.80 14.11
1.00 1.50
2.50
4.00
6.50 10.00
.10
.15
.25
.40
.65
AQLs (tightened inspection)

All AQL values are in percent nonconforming. T denotes plan used exclusively on tightened inspection
and provides symbol for identification of appropriate OC curve.
= Use first sampling plan below arrow; that is, both sample size and M value. When sample size
equals or exceeds lot size, every item in the lot must be inspected.
Figure 9.21
H1277 ch09.indd 222
ANSI/ASQ Z1.9-2003 Table B-3: Master table for normal and tightened inspection
for plans based on variability unknown (double specification limit and Form 2
single specification limit).
3/8/07 12:38:15 PM
Notes
1. W. E. Deming, Out of the Crisis (Cambridge, MA: MIT Center for Advanced Engineering, 1986).
2. J. M. Juran and F. N. Gryna Jr., Quality Planning and Analysis (New York: McGrawHill, 1980).
3. ASQ Statistics Division, Glossary and Tables for Statistical Quality Control, 4th ed.
(Milwaukee, WI: ASQ Quality Press, 2004).
4. Ibid.
5. ANSI/ASQ Z1.4-2003, Sampling Procedures and Tables for Inspection by Attributes
(Milwaukee, WI: ASQ Quality Press, 2003).
6. Deming, Crisis.
7. A. Wald, Sequential Analysis (New York: Dover, 1973).
8. W. Burr, Statistical Quality Control Methods (New York: Marcel Dekker, 1976).
H1277 ch09.indd 223
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10
Computer Resources
to Support SQC: MINITAB
n the past two decades, the use of technology to analyze complicated

data has increased substantially, which not only has made the analysis
much easier, but also has reduced the time required to complete the analysis. To facilitate statistical analysis, many companies use personal computer
(PC)based statistical application software. Several software packages are
available, including BMDP, JMP, MINITAB, SAS, SPSS, and SYSTAT, to
name a few. A great deal of effort has been expended in the development of
these software packages to create graphical user interfaces that allow software users to complete statistical analysis activities without having to know
a computer programming or scripting language. We believe that publishing
a book about applied statistics without acknowledging and addressing the
importance and usefulness of statistical software is not in the best interests of
the reader. Accordingly, in this and the next chapter, we will briefly discuss
two very popular statistical packages: MINITAB and JMP. It is our explicit
intent not to endorse either software package, as each has different strengths
and features/capabilities.
10.1 Using MINITABVersion 14

MINITAB has the option of using commands from the menu bar, typing in
Session commands, or using both. As shown in Figure 10.1 in the Windows
environment, it has the look and feel of most other Windows applications,
where the menu options help you to easily navigate through the software.
Once you are in MINITAB, you will see the heading MINITAB - Untitled and three windows:
1. The Data window (Worksheet) is used to enter data in columns
labeled C1, C2, C3, . . . , C4000.
2. The Session window displays the output and also allows you to
enter commands when using the command language.
225
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226
Chapter Ten
3. The Project Manager window (minimized at start-up) displays

project folders, which enables you to navigate through them
and manipulate as necessary.
Getting Started with MINITAB
In this section we will briefly discuss how to use the MINITAB pull-down
menus to analyze statistical data. Once you log on to your PC and open up
MINITAB, you will see the screen shown in Figure 10.1. The pull-down
menus appear at the top of the screen. Menu commands include:
File
Edit
Data Calc Stat
Graph Editor
Tools
Window
Help
By clicking any of these menu commands, you arrive at options included

in that command. For example, if you click on File, you get the drop-down
menu shown in Figure 10.2. The first option, New, allows you to create a new
worksheet.
Creating a New Worksheet
Creating a new worksheet means to enter new data in the data window. The
data window consists of four thousand columns, which are labeled C1, C2,
. . . , C4000. The data can be entered in one or more columns, depending on
the setup of the problem. In each column immediately below the labels, there
Figure 10.1
H1277 ch10.indd 226
The welcome screen in MINITAB.
3/8/07 6:07:44 PM
Computer Resources to Support SQC: MINITAB 227
Figure 10.2
Showing the menu command options.
is one cell that is not labeled, whereas the rest of the cells are labeled 1, 2,
3, and so on. In the unlabeled cell, you can enter the variable name, such as
part name, shift, lot number, and so on. Data are then entered in the labeled
cells, using one cell for each data point. If a numerical observation is missing,
MINITAB will automatically replace the missing value with a star (*).
Saving a Data File
Using the command File > Save Current Worksheet As allows saving the
current data file. When you enter this command, a dialog box titled Save
Worksheet As appears. Type the file name in the box next to File Name,
select the drive location for the file, and then click Save.
Retrieving a Saved MINITAB Data File
Using the command File > Open Worksheet prompts the dialog box Open
Worksheet to appear. Select the drive and directory where the file was saved
by clicking the down arrow next to the Look in box, enter the file name in the
box next to FILE NAME, and then click Open. The data will appear in the
same format you had entered earlier.
Saving a MINITAB Project
Using the command File > Save Project saves the ongoing project in a
MINITAB Project (MPJ) file to the designated directory with the name you
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228
Chapter Ten
choose. Saving the project saves all windows opened in the project, along
with the contents of each window.
Print Options
To print the contents in any specific window, you need to make the window
active by clicking on it, and then use the command File > Print Session
Window. . .(Graph. . ., Worksheet. . .).
If you want to print multiple graphs on a single page, highlight the graphs
in the Graph folder in the Project Manager window by right-clicking on
each and choose Print. The Print Multiple Graphs dialog box appears. To
change the page orientation of the multiple graphs, use File > Page Setup to
adjust the printing options.
The construction of several main tools of SPC using MINITAB is discussed
in Applied Statistics for the Six Sigma Green Belt. In this book, however, we
will discuss only the construction of various control charts using MINITAB
and JMP.
10.2 The Shewhart Xbar-R Control Chart

To construct a Shewhart Xbar-R chart, first enter the data in one column
of the Worksheet window. Then from the Menu Command, select Stat >
Control Charts > Variable Charts for Subgroups > Xbar-R. The dialog
box Xbar-R Chart shown in Figure 10.3 immediately appears. We illustrate
construction of the Xbar-R chart with the following example.
Example 10.1 Consider the data on the diameter measurements of ball
bearings used in the wheels of heavy construction equipment shown in
Table 3.4 of Example 3.4 in Chapter 3. Then use the following steps to construct the Xbar-R control chart.
Solution:
1. Enter all the data in column C1 of the Worksheet window.
Note that you have the option to enter the data in rows
of columns such that each row contains data from one
subgroup. This option is usually preferred when the
sample size is variable. We shall consider this option for
constructing an Xbar-R control chart with unequal sample
sizes.
2. Click Stat from the Menu Command.
3. Select Control Charts from the pull-down menu in the Stat
command menu.
4. Select Variable Charts for Subgroups from the Control
Charts command menu.
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5. Click Xbar-R from the Variable Charts for Subgroups

command menu. The dialog box Xbar-R Chart shown in
Figure 10.3 immediately appears.
6. From the dialog box Xbar-R Chart, choose the option All
observations for a chart are in one column.
7. Enter C1 in the next box.
8. Enter the sample size in the box next to the Subgroup sizes.
9. In the dialog box Xbar-R Chart, options such as Scale and
Labels are available. If you select Labels, a new dialog box
will appear and you can enter the title of an Xbar-R chart
and any footnotes you would like to see on the output of
the Xbar- R chart. Then click OK. By default, the title will
be Xbar-R Chart for C1 or Xbar-R Chart for name of the
variable if you have given such a name in column C1 of the
data window. Use Xbar-R Options. . . if you want to specify
the values of the population mean and population standard
deviation instead of estimating them by using the given data.
Then click OK in the Xbar-R Chart dialog box. The desired
Xbar-R control chart will appear in the Session window. In
our example, the Xbar-R Chart dialog box will look as shown
in Figure 10.3, and the output of the Xbar-R chart is as shown
in Figure 3.10 in Chapter 3.
Figure 10.3
H1277 ch10.indd 229
MINITAB window showing the Xbar-R Chart dialog box.
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230
Chapter Ten
10.3 The Shewhart Xbar-R Control Chart

When Process Mean and Process
Standard Deviation Are Known
To construct a Shewhart Xbar-R control chart when process mean and process standard deviation are known, follow steps 1 through 8 of the solution
shown in Example 10.1. Then click Xbar-R Options. . . . A new dialog box,
shown in Figure 10.4, will appear. In the boxes next to Mean and Standard
deviation, enter the specified values and then click OK. Then click OK again
in the Xbar-R Chart dialog box. The desired Xbar-R control chart will appear
in the Session window.
10.4 The Shewhart Control Chart

for Individual Observations
To construct a Shewhart control chart for individual observations, first enter
the data in one column, say C1, of the Worksheet window. Then from the
Menu Command, select Stat > Control Charts > Variable Charts for Individuals > I-MR. The dialog box Individuals-Moving Range Chart, shown
in Figure 10.5, appears. We illustrate the construction of a Shewhart control
chart for individual observations with the following example.
Table 3.5 of Example 3.6 in Chapter 3. Then use the following steps to construct the Shewhart control chart for individual observations.
Figure 10.4
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MINITAB window showing the Xbar-R Chart - Options dialog box.
3/8/07 6:07:45 PM
Figure 10.5 MINITAB window showing the Individuals-Moving Range Chart dialog box.
Solution:
1. Enter all the data in column C1 of the data (Worksheet)
window. Click Stat from the Menu Command.
command menu.
3. Select Variable Charts for Individuals from the Control
4. Click I-MR from the Variable Charts for Individuals
command menu. The dialog box Individuals-Moving Range
Chart, shown in Figure 10.5, immediately appears.
5. Enter C1 in the box next to Variables.
Select the other options from the dialog box Individuals-Moving Range
Chart in the same manner as discussed in step 9 of Example 10.1. Then click
OK. The output of the Shewhart control chart for individual observations will
appear in the Session window. The control chart for our example is shown in
Figure 3.11 of Chapter 3.
10.5 The Shewhart Xbar-S Control

ChartEqual Sample Size
To construct a Shewhart Xbar-S control chart for equal sample size, first
enter the data in one column, say C1, of the Worksheet window. Then from
the Menu Command, select Stat > Control Charts > Variable Charts for
Subgroups > Xbar-S. The dialog box Xbar-S Chart shown in Figure 10.6
appears. We illustrate the construction of the Shewhart Xbar-S control chart
with the following example.
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232
Chapter Ten
Figure 10.6
MINITAB window showing the Xbar-S Chart dialog box.

Table 3.4 of Example 3.4 in Chapter 3. Then use the following steps to construct the Xbar-S control chart.
Solution:
1. Enter all the data in column C1 of the Worksheet window. Note
that as in the case of the Xbar-R chart, you have the option to
enter the data in rows of columns such that each row contains
data from one subgroup. This option is usually preferred when
the sample size is variable. We will consider this option for
constructing the Xbar-S control chart with unequal sample
sizes.
command menu.
5. Click Xbar-S from the Variable Charts for Subgroups
command menu. The dialog box Xbar-S Chart shown in
Figure 10.6 appears.
6. From the dialog box Xbar-S Chart, choose the option All
7. Enter C1 in the next box.
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9. In the dialog box Xbar-S Chart, options such as Scale and
will appear and you can enter the title of an Xbar-S chart and
any footnotes you would like to see on the output of the Xbar-S
chart. Then click OK. By default, the title will be Xbar-S Chart
for C1 or Xbar-S Chart for name of the variable if you have
given such a name in column C1 of the data window. Use Xbar-S
Options. . . if you want to specify the values of the population
mean and population standard deviation instead of estimating
them by using the given data. Then click OK in the Xbar-S
Chart dialog box. The desired Xbar-S control chart will appear
in the Session window. In our example, the Xbar-S Chart dialog
box will look as shown in Figure 10.6, and the output of the
Xbar-S chart is as shown in Figure 3.12 in Chapter 3.
10.6 The Shewhart Xbar-S Control

ChartSample Size Variable
To construct a Shewhart Xbar-S control chart for variable sample size,
first enter the data in rows of the Worksheet window, using a separate row
for each subgroup. Then from the Menu Command, select Stat > Control Charts > Variable Charts for Subgroups > Xbar-S. The dialog box
Xbar-S Chart shown in Figure 10.7 appears. We illustrate the construction
of a Shewhart Xbar-S control chart with variable sample size with the following example.
Example 10.4 Consider the data on finished inside diameter measurements
of piston rings shown in Table 3.6 of Example 3.8 in Chapter 3. Then use the
following steps to construct the Xbar-S control chart.
Solution:
1. Enter all the data in columns C1 through C10 of the Worksheet
window. Note that as in the case of the Xbar-S chart with
equal sample size, you have the option to enter the data in
one column, say C1, and then in column C2 identify each
observation by entering the corresponding sample numbers.
For example, the first 10 observations in column C1 come from
sample one; therefore, the first 10 entries in column C2 should
be 1.
command menu.
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234
Chapter Ten
5. Click Xbar-S from the Variable Charts for Subgroups

command menu. The dialog box Xbar-S Chart shown in
Figure 10.7 appears.
6. From the dialog box Xbar-S Chart, choose the option
Observations for a subgroup are in one row of columns.
Figure 10.7
H1277 ch10.indd 234
MINITAB windows showing the Xbar-S Chart and Xbar-S

Chart Options dialog boxes.
3/8/07 6:07:45 PM
7. Enter C1-C10 in the next box, because the largest sample size
is 10.
8. In the dialog box Xbar-S Chart, options such as Scale and
will appear and you can enter the title of an Xbar-S chart and
any footnotes you would like to see on the output of the Xbar-S
chart. Then click OK. By default, the title will be Xbar-S Chart
for C1-C10 or Xbar-S Chart for name of the variable if you
have entered the data in one column, say C1, and have given
such a name in column C1 of the data window. Use Xbar-S
Options. . . if you want to specify the values of the population
mean and population standard deviation instead of estimating
them by using the given data as, for example, in the present
example. Then click OK in the Xbar-S chart dialog box. The
desired Xbar-S control chart will appear in the Session window.
In our example, the Xbar-S chart and Xbar-S Options dialog
boxes will look as shown in Figure 10.7, and the output of the
Xbar-S chart is as shown in Figure 3.13 in Chapter 3.
10.7 Process Capability Analysis

To construct a process capability analysis chart, first enter the data in one
column, say C1, of the Worksheet window. Then from the Menu Command,
select Stat > Quality Tools > Capability Analysis > Normal. Then the dialog box Capability Analysis (Normal Distribution), shown in Figure 10.8,
appears. We illustrate the capability analysis of a process with the following
example.
Example 10.5 Consider a quality characteristic of a process that is normally distributed. Suppose that the process is stable with respect to the 3
control limits. Furthermore, suppose that the data of 25 samples, each of size
five, from this process are as shown in Table 10.1. Also, we are given that
the LSL = 0.95 and the USL = 1.05. Perform the capability analysis of the
process.
Solution:
1. Enter all the data in columns C1 through C5 of the Worksheet
window. Note that in this case you have the option to enter the
data in one column, say, C1.
3. Select Quality Tools > Normal from the pull-down menu in
the Stat command menu.
4. Select Capability Analysis from the Control Charts command
menu.
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236
Chapter Ten
5. Click Normal (or the distribution of the process characteristic)

from the Capability Analysis command menu. The dialog box
Capability Analysis (Normal Distribution), shown in Figure
10.8, immediately appears.
6. From the Capability Analysis (Normal Distribution) dialog
box, next to Data are arranged as, select either Single column
or Subgroups across rows of, depending on how you entered
the data in step 1, and then enter the column number or column
numbers in which you have entered the data.
7. Click OK. The capability analysis output will appear as shown
in Figure 10.9.
Table 10.1
Data of 25 samples, each of size five, from a given process.
Sample Number
H1277 ch10.indd 236
Observations
0.97076
0.98518
1.01204
0.97892
0.99094
0.99455
0.96904
0.99770
0.97502
0.98483
0.99538
0.99765
0.96011
1.03059
0.98048
1.00332
0.98891
0.98018
1.01699
1.00391
1.03023
0.98663
1.01498
0.97483
0.99836
0.98491
1.00487
0.96951
0.99613
1.03365
0.98894
1.00631
0.98630
0.98115
0.96755
0.93771
0.99017
1.03221
1.01045
1.01297
1.00103
1.01641
0.97683
1.00149
1.03012
10
1.01493
1.02220
1.00179
1.01556
1.01080
11
1.01606
0.96502
1.00546
0.99259
0.96857
12
0.98266
0.99031
0.99349
1.00499
1.03806
13
0.95560
1.00033
1.01098
0.99380
1.04496
14
0.97406
1.01305
0.97556
0.98493
1.00347
15
1.03027
0.97009
1.00151
0.99929
0.98366
16
1.02527
1.01652
1.02743
0.99951
0.99565
17
1.02837
1.01676
0.97056
0.95207
1.03254
18
0.98646
0.99434
1.00163
0.98811
1.01234
19
0.96072
1.02716
1.01030
1.04141
0.96355
20
1.03511
0.94637
1.00852
0.99454
1.00620
21
0.99550
0.98307
1.00948
1.00793
1.04035
22
0.98397
1.03082
0.98643
1.00540
0.97880
23
0.99934
0.99544
1.00959
1.00664
1.02905
24
1.00286
1.00777
1.01661
0.99793
1.03805
25
0.96557
0.98535
0.99911
1.03566
1.00453
3/8/07 6:07:46 PM
Figure 10.8
MINITAB window showing the Capability Analysis (Normal Distribution)

dialog box.
Figure 10.9
MINITAB windows showing the process capability analysis.
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238
Chapter Ten
10.8 The p Chart: Control Chart for

Fraction Nonconforming Units
To construct a p chart, first enter the data (number of nonconforming units)
in one column, say C1, of the Worksheet window. Then from the Menu Command, select Stat > Attributes Charts > P. . . . The dialog box P Chart
shown in Figure 10.10 immediately appears. We illustrate the construction of
a p chart with the following example.
wants to improve the overall quality by reducing the fraction of nonconforming computer chips. To achieve this goal, the team decides to set up a p chart,
and in order to do so, the Six Sigma Green Belts inspect a sample of 1000
chips each day over a period of 30 days. Table 4.2 of Example 4.1 in Chapter
4 gives the number of nonconforming chips out of 1000 inspected chips each
day during the study period.
Solution:
1. Enter all the data (number of nonconforming chips given in
Table 4.2 in Chapter 4) in column C1 of the Worksheet window.
Click Stat from the Menu Command.
command menu.
3. Select Attributes Charts from the Control Charts command
menu.
Figure 10.10
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MINITAB window showing the P Chart dialog box.
3/8/07 6:07:46 PM
4. Click P. . . from the Attributes Charts command menu. The

dialog box P Chart shown in Figure 10.10 appears.
7. In the dialog box P Chart, options such as Scale and Labels are
available. If you select Labels, a new dialog box will appear and
you can enter the title of a p chart and any footnotes you would
like to see on the output of the p chart. Then click OK. By
default, the title will be P Chart for C1 or P Chart for name of
the variable if you have given such a name in column C1 of the
data window. Use P Chart Options. . . if you want to specify the
values of fraction of nonconforming in the population instead
of estimating them using the given data. Then click OK in the P
Chart dialog box. The desired p control chart will appear in the
Session window. Thus, in our example, the output of the p chart
is shown in Figure 4.1 in Chapter 4.
10.9 The p Chart: Control Chart for Fraction

Nonconforming Units with Variable Sample Size
Constructing a p chart with variable sample size is the same as constructing a p chart with fixed sample size, except in this case we enter the data on
number of nonconforming units in column C1 and the corresponding sample
sizes in column C2; and in step 6, instead of entering the sample size in the
box next to the Subgroup sizes, we enter C2.
10.10 The np Chart: Control Chart

for Nonconforming Units
In an np chart we plot the number of nonconforming units in an inspected
sample. The np chart is very similar to the p chart, except that in the p chart
we plot the fraction nonconforming units in each inspected sample. Moreover, in a p chart the sample sizes could be equal or unequal, whereas in an
np chart, the sample sizes are equal. Otherwise, a p chart and an np chart can
be implemented under the same circumstances. We summarize here some
specific points that are important for an np chart:
Record the sample size and number of nonconforming units (np) in each
sample and plot the number of nonconforming units on the control chart.
To construct an np control chart, follow all the steps for a p control chart
in section 10.8.
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Chapter Ten
10.11 The c Chart

In many situations, we are interested in studying the number of nonconformities in a sample, which is also called the inspection unit, rather than studying
the fraction nonconforming or total number of nonconforming in the sample.
To construct the c chart, first enter the data (number of nonconformities) in
one column, say C1, of the Worksheet window. Then from the Menu Command, select Stat > Attributes Charts > C. . . The dialog box C Chart,
shown in Figure 10.11, immediately appears. We illustrate the construction
of a c chart with the following example.
paper rolls are due to nonconformities of two types: holes and wrinkles in the
charts to reduce or eliminate the number of these nonconformities. To set up
the control charts, the team collects data by taking random samples of five
rolls each day for 30 days and counting the number of nonconformities (holes
and wrinkles) in each sample. The data are shown in Table 4.4 of Example
4.4 in Chapter 4. Set up a c control chart using these data.
Solution:
1. Enter all the data (number of nonconformities given in
Table 4.4 in Chapter 4) in column C1 of the Worksheet window.
Click Stat from the Menu Command.
command menu.
menu.
4. Click C. . . from the Attributes Charts command menu.
The dialog box C Chart, shown in Figure 10.11, appears.
6. In the dialog box C Chart, options such as Scale and Labels
are available. If you select Labels, a new dialog box will appear
and you can enter the title of a c chart and any footnotes you
would like to see on the output of the c chart. Then click OK.
By default, the title will be C Chart for C1 or C Chart for
name of the variable if you have given such a name, say
nonconformities, in column C1 of the data window. Use
C Chart Options. . . if you want to specify the mean value of
nonconformities in the population instead of estimating it using
the given data. Then click OK in the C chart dialog box. The
desired c control chart will appear in the Session window. Thus,
in our example, the output of the c chart is shown in Figure 4.4
in Chapter 4.
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Figure 10.11
MINITAB window showing the C Chart dialog box.
10.12 The u Chart

The u chart is essentially the c chart, except that the u chart is always based
on the number of nonconformities per inspection unit. In other words, the
actual sample size may be different from one or may vary, but the control
limits of the u chart are always determined based on one inspection unit. For
example, if n is constant, one can use either a c chart or a u chart. We illustrate
the construction of a u chart with the following example.
found that the printed boards for laptops have nonconformities of several types,
such as shorted trace, open trace, cold solder joint, and solder short. In order
to monitor nonconformities in the printed boards for laptops, the team members
want to set up a u chart; therefore, they collect data by selecting samples of five
inspection units, each inspection unit consisting of 30 boards. The data, which
are shown in Table 4.5 of Example 4.5 in Chapter 4, are collected over a period
of 30 days.
Solution:
1. Enter all the data (number of nonconformities given in Table 4.5
in Chapter 4) in column C1 of the Worksheet window. Click Stat
from the Menu Command.
command menu.
menu.
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Chapter Ten
Figure 10.12
MINITAB window showing the U Chart dialog box.
4. Click U. . . from the Attributes Charts command menu. The

dialog box U Chart, shown in Figure 10.12, appears.
6. Enter the sample size in the box next to Subgroup sizes.
7. In the dialog box U Chart, options such as Scale and Labels
are available. If you select Labels, a new dialog box will appear
and you can enter the title of a u chart and any footnotes you
would like to see on the output of the u chart. Then click
OK. By default, the title will be U Chart for C1 or U Chart
for name of the variable if you have given such a name,
say nonconformities, in column C1 of the data window. Use
U Chart Options. . . if you want to specify the mean value of
nonconformities per unit in the population instead of estimating
it using the given data. Then click OK in the U chart dialog box.
The desired u control chart will appear in the Session window.
Thus, in our example, the output of the u chart is shown in
Figure 4.5 in Chapter 4.
10.13 The u Chart: Variable Sample Size

Constructing a u chart with variable sample size is the same as constructing a u chart with fixed sample size, except in this case we enter the data on
number of nonconforming in column C1 and the corresponding sample sizes
in column C2; and in step 6, instead of entering the sample size in the box
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next to the Subgroup sizes, we enter C2. For an example of a u chart, see
Figure 4.6 in Chapter 4.
10.14 Designing a CUSUM Control Chart
CUSUM charts are very effective in detecting small shifts. Unlike the X
Shewhart control charts, CUSUM control charts can be designed to detect
one-sided or two-sided shifts. These charts are defined by two parameters, k
and h, which are called the reference value and the decision interval, respectively, and are defined in section 5.2.1. The two-sided process control by
using a CUSUM control chart is achieved by concurrently using two onesided CUSUM control charts. In both one-sided CUSUM charts one can
use the same or different reference values depending on whether the upward
and downward shifts are equally important. We discuss the construction of
CUSUM control charts with the following example.
the process. Let the quality characteristic when the process is under control
be normally distributed with mean 20 and standard deviation 2. The data
shown in Table 5.1 of Example 5.1 in Chapter 5 give the first 10 random
samples of size four, which are taken when the process is stable and producing the parts with mean value 20 and standard deviation 2. The last 10
random samples, again of size four, were taken from that process after its
mean experienced an upward shift of one standard deviation, resulting in a
new process with mean 22. Construct a Shewhart CUSUM control chart for
the data in Table 5.1.
Solution:
1. Enter all the data in Table 5.1 of Chapter 5 in columns C1 through
C4 (observations for each subgroup are entered in one row of
columns) of the Worksheet window. Click Stat from the Menu
Command.
command menu.
3. Select Time Weighted Charts from the Control Charts
command menu.
4. Click CUSUM from the Control Charts command menu. The
dialog box CUSUM Chart, shown in Figure 10.13, appears.
5. From the dialog box CUSUM Chart, choose the option
Observations for a subgroup are in one row of columns.
6. Enter C1-C4 in the next box, because the sample size is four.
7. Enter the target value in the box next to Target, which in our
example is 20.
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Chapter Ten
Figure 10.13
MINITAB window showing the CUSUM Chart dialog box.
8. In the dialog box CUSUM Chart, options such as Scale and

Labels are available. If you select Labels, a new dialog box will
appear and you can enter the title of a CUSUM chart and any
footnotes you would like to see on the output of the CUSUM
chart. Then click OK. By default, the title will be CUSUM
Chart for C1-C4.
9. Select CUSUM Options . . . and the dialog box CUSUM Chart
Options, shown in Figure 10.14, will appear. In this dialog
box are various options, but we will be using only a few of
them, namely, Parameters, Estimate, Plan/Type, and Storage.
a. Parameters: This option is used to specify a value for the
standard deviation. Enter the specified value in the box
next to Standard deviation. MINITAB will use this value
instead of estimating it from the data.
b. Estimate: This option presents various methods for estimating
the standard deviation. For example, you may choose moving
range, Rbar, Sbar, pooled standard deviation, or others.
c. Plan/Type: Under this option you choose the type of CUSUM
chart you would like to prepare, that is, tabular CUSUM,
V-mask CUSUM, and the suboption of FIR CUSUM, and reset
after each signal. You also choose the appropriate values of
the parameters h and k. For a tabular CUSUM chart, check the
circles next to one sided (LCL, UCL).
d. Storage: Under this option, many of the choices are used when
you want to prepare a V-mask CUSUM chart. For a tabular
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Figure 10.14
MINITAB window showing the CUSUM Chart - Options dialog box.
CUSUM, you need to check the boxes next to point plotted,

center line value, and control limit.
Using these steps, a tabular CUSUM control chart for the data in Table 5.1
is constructed, which is presented in Table 5.3, and its graph is shown in
Figure 5.3. The center line value and control limits are shown in Figure 5.3.
10.15 The FIR Feature for a CUSUM Control Chart

Lucas and Crosier (1982) introduced the FIR feature, which improves the sensitivity at process start-up or immediately after any control action has been
taken. In standard CUSUM control charts, we use the initial value S0 = 0, but in
a CUSUM control chart with the FIR feature, the starting value of S0 is set up
at some value greater than zero. Lucas and Crosier recommend setting up the
starting value of S0 at h/2. The procedure to construct a CUSUM control chart
with FIR using MINITAB is exactly the same as discussed in Example 10.9,
except in step 9(c) we must check the box next to use FIR and enter the value
of S0 in the box next to Standard deviation. For an example of a CUSUM
control chart using the FIR feature, see Example 5.4 in Chapter 5.
10.16 The MA Control Chart

The MA control chart is usually more effective in detecting small shifts in
process mean than the Shewhart chart. However, it is usually not as effective
as the CUSUM and EWMA charts. We illustrate the construction of an MA
control chart with the following example.
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Chapter Ten
Example 10.10 Consider the data in Table 5.4 of Example 5.3 in Chapter 5
on the manufacturing process of auto parts. Design an MA control chart for
these data with span m = 4 and interpret the results.
Solution:
1. Enter all the data in Table 5.4 in column C1 of the Worksheet
command menu.
command menu.
4. Click Moving Average. . . from the Control Charts command
menu. The dialog box Moving Average Chart, shown in
Figure 10.15, appears.
5. From the dialog box Moving Average Chart, choose the option
All observations for a chart are in one column.
6. Enter C1 in the next box. (If the sample size is n > 1, then
enter the data in columns C1 through Cn and in step 5 choose
the option Observations for a subgroup are in one row of
columns.)
7. In the box next to Subgroup sizes, enter 1, or the appropriate
value of n if the sample size is greater than 1.
8. In the box next to Length of MA, enter 4, or any other specified
value of span.
9. In the dialog box Moving Average Chart, options such as
Scale and Labels are available. If you select Labels, a new
Figure 10.15
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MINITAB window showing the Moving Average Chart dialog box.
3/8/07 6:07:47 PM
dialog box will appear and you can enter the title of a Moving
Average chart and any footnotes that you would like to see on
the output of the Moving Average chart. Then click OK. By
default, the title will be Moving Average Chart for C1.
10. Select MA Options . . . and the dialog box Moving Average
Chart Options will appear. In this dialog box are various
options, but we will be using only a few of them, namely,
Parameters, Estimate, S Limits, and Storage.
a. Parameters: This option is used to specify a value of
the mean and a value of the standard deviation. Enter the
specified values in the boxes next to Mean and Standard
deviation. MINITAB will use this value instead of
estimating it from the data.
b. Estimate: This option presents various methods for
estimating the mean and the standard deviation. For
example, you may choose moving range, Rbar, Sbar, and
others.
c. S Limits: Under this option you choose, for example,
control limits, bounds on control limits, and sample size.
d. Storage: Under this option, check the boxes next to point
plotted, center line value, and control limit and then
click OK. Finally, click OK in the Moving Average Chart
dialog box.
Using these steps, the MA control chart for the data in Table 5.4 is constructed. It is presented in Table 5.7, and its graph is shown in Figure 5.7. The
center line value and control limits are shown in Figure 5.7.

The EWMA control chart is very useful for processes in which only one
observation per period may be available. We discuss the construction of an
EWMA control chart using MINITAB with the following example.
Example 10.11 Consider the data in Table 5.4 of Example 5.3 in Chapter 5
on the manufacturing process of auto parts. Design an EWMA control chart
for these data with = 0.20, L = 2.962, 0 = 20, and = 2 and interpret the
results.
Solution:
1. Enter all the data in Table 5.4 in column C1 of the Worksheet
command menu.
command menu.
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Chapter Ten
4. Click EWMA. . . from the EWMA Chart command menu.

The dialog box EWMA Chart, shown in Figure 10.16,
immediately appears.
5. From the dialog box EWMA Chart, choose the option All
6. Enter C1 in the next box. (If the sample size is n > 1, then enter
the data in columns C1 through Cn and in step 5 choose the
option Observations for a subgroup are in one row of columns.)
7. In the box next to Subgroup sizes, enter 1, or the appropriate
value of n if sample size is greater than 1.
8. Enter the specified value of (weight of EWMA) in the box
next to Weight of EWMA.
9. In the dialog box EWMA Chart, options such as Scale and
Labels are available. If you select Labels, a new dialog box will
appear and you can enter the title of an EWMA chart and any
footnotes you would like to see on the output of the EWMA
chart. Then click OK. By default, the title will be EWMA Chart
for C1.
10. Select EWMA Options. . . . The dialog box EWMA
Chart Options will appear. In this dialog box are various
options, but we will be using only a few of them, namely,
Parameters, Estimate, S Limits, and Storage.
a. Parameters: This option is used to specify a value of
the mean and a value of the standard deviation. Enter the
specified values in the boxes next to Mean and Standard
Figure 10.16
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MINITAB window showing the EWMA Chart dialog box.
3/8/07 6:07:48 PM
deviation. MINITAB will use this value instead of estimating

it from the data.
b. Estimate: This option presents various methods for estimating
the standard deviation. For example, you may choose
Average moving range, Rbar, Sbar, Pooled standard
deviation, or others.
c. S Limits: Under this option you choose, for example,
Display control limits, bounds on control limits, and sample
size. In this example, under the option Display control
limits, enter the value of L = 2.962 in the box next to These
multiples of the standard deviation.
d. Storage: Under this option, check the boxes next to point
plotted, center line value, and control limit and then
click OK. Finally, click OK in the EWMA Chart dialog
box.
Using these steps, the EWMA control chart for the data in Table 5.4 is constructed. It is presented in Table 5.9, and its graph is shown in Figure 5.8. The
center line value and control limits are shown in Figure 5.8.
10.18 Measurement System Capability Analysis

The measurement system plays an important role in any effort to improve a
process. In any process, the total process variation consists of two sources:
Part-to-part variation
Measurement system variation
If the measurement system variation is large compared with part-to-part
variation, the measurement system cannot adequately discriminate between
parts for complete process evaluation. In other words, the measurement system is not capable. It becomes very important to perform measurement system capability analysis.
Suppose we measure a quality characteristic of a part and let t be the total
observed value of the quality characteristic, p be its true value, and e be the
measurement error. Then, we have
t = p + e.
(10.1)
Assume now that the true value of the quality characteristic and the measurement error are normally distributed with mean and 0 and variances 2p and
2m , respectively. Then it can be shown that
2t = 2p + m2 ,
(10.2)
where 2t is the variance of the total observed values. Furthermore, the error
variance 2m usually consists of two components: one due to gage variation
(repeatability) and the other due to operator variation (reproducibility). The
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Chapter Ten
purpose of measurement system capability analysis is to separate these components and analyze them. In other words, we have
2measurement
error
2
2
= reproducibilty
+ repeat
ability .
To study these components, we usually use the ANOVA technique, which

is also known as Gage R&R study. When using the ANOVA technique, we
commonly deal with two types of situations: (1) when each operator measures
the same specimens of a part, and (2) when each operator measures different
specimens of a part. The designs used under these situations are known as
crossed and nested designs, respectively. The following section discusses the
Gage R&R study using MINITAB and crossed designs. We do not discuss
nested designs here, as they are beyond the scope of this book.
10.18.1 Measurement System Capability
Analysis (Using Crossed Designs)
A manufacturer of tubes used in automotive applications has installed a new
measuring gage. The Six Sigma Green Belt team is interested in determining
how well the new gage measures the inside diameter of the tube. In other
words, the team is interested in performing the measurement system capability analysis. We discuss the measurement system capability analysis with the
following example.
Example 10.12 A manufacturer of bolts (parts) used in automotive
applications has installed a new measuring gage. In order to perform the
MSA on the new gage, the quality manager randomly selects three Six Sigma
Green Belts from the quality control department, who decide to take a random sample of 10 bolts. Each Six Sigma Green Belt takes three measurements
on each bolt, which is selected randomly. The data obtained are shown in
Table 10.2.
Estimate the repeatability and reproducibility of the measurement
system.
Estimate how much of the total process variation is due to the measurement system.
If the tube diameter specifications are 70 10, what can we say
about the discrimination power of the measurement system? In other
words, is the measurement system capable of discriminating between
different parts?
Solution: We have already discussed this example earlier, in Chapter 7.
Here we discuss step by step how to set up MINITAB to find the solution to
this or any other similar problem.
1. Following the steps discussed in section 10.1, start up
MINITAB. The screen titled MINITAB UNTITLED will
appear first.
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Table 10.2

measurements (in mm) on each bolt by each operator.
Bolt
(Parts)
Number
Operator 1
Operator 2
Operator 3
Trial
1
Trial
2
Trial
3
Trial
1
Trial
2
Trial
3
Trial
1
Trial
2
Trial
3
26
22
26
21
23
21
24
22
26
28
26
28
24
29
26
24
25
24
28
31
28
28
27
28
32
30
27
35
33
31
35
31
30
34
35
31
37
35
38
36
38
35
35
34
35
40
38
40
40
38
40
36
37
38
39
42
41
40
39
43
43
41
43
42
43
46
42
46
42
43
44
45
50
52
50
53
52
53
49
53
49
10
28
31
28
R 1 = 3.0 x 1 = 35.33
28
27
28
R 2 = 2.5 x 2 = 34.67
32
30
27
R 3 = 3.0 x 3 = 34.93
2. Enter the data using column C1 for the part numbers, column
C2 for the operators, and column C3 for the observed values of
the parts.
3. Select from the bar menu of the screen MINITAB
UNTITLED, Stat > Quality Tools > Gage Study >
Gage R&R Study (Crossed) . . . and the screen MINITAB
UNTITLED with these selections is shown in Figure 10.17.
4. Click once on Gage R&R Study (Crossed). . . . The dialog
box Gage R&R Study (Crossed), shown in Figure 10.18,
appears.
Double-click on C1, C2, and C3 in the square box within the dialog box
Gage R&R Study (Crossed), and the entries from the square box will move
to the boxes next to Part numbers, Operators, and Measurement data, respectively. Check the circle next to ANOVA. Then click on Options. . .. The
dialog box Gage R&R Study (Crossed) Options, shown in Figure 10.19,
appears. Enter 6 in the box next to Study variation (some authors use 5.15,
for instance, Barrentine [2003]) .
Check the circle next to Upper spec Lower spec, and in the box next
to it enter the value of the specification band. Enter the value of alpha of
your choice next to Alpha to remove interaction term (for example, we
entered 0.25). Note that the interaction term (part*operator) will appear in
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Chapter Ten
Figure 10.17
Screen showing the selections Stat > Quality Tools > Gage Study > Gage R&R Study
(Crossed). . .
Figure 10.18
Gage R&R Study (Crossed) dialog box.
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Figure 10.19
Gage R&R Study (Crossed) - Options dialog box.
the analysis only if the p value is less than or equal to the value you enter in
the box next to Alpha to remove interaction term. If you wish, check the
box next to Draw figures on separate graphs, one figure per graph. Otherwise, all the figures will appear on one graph. Finally, if you wish, you can
enter the title of your project next to Title, and click OK. Then click OK in
the dialog box Gage R&R Study (Crossed). The output, including ANOVA
tables and all the following graphs, will appear in the Session Window. We
discussed this example earlier, in Chapter 7. However, for the sake of continuation of our discussion, we represent it here.
Gage R&R StudyANOVA Method
Two-Way ANOVA Table with Interaction
Source
Part Numbers
Operators
DF
SS
6135.73
MS
681.748 165.532
P
0.000
6.76
3.378
0.820
0.456
Part Numbers*Operators
18
74.13
4.119
1.477
0.131
Repeatability
60
167.33
2.789
Total
89
6383.95
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Chapter Ten
In the Two-Way ANOVA Table with Interaction, we test three hypotheses:

H0: All parts are similar versus H1: All parts are not similar
H0: All operators are equally good versus H1: All operators are not
equally good
H0: Interactions between parts and operators are negligible versus H1:
Interactions between parts and operators are not negligible
The decision whether to reject any of these hypotheses depends on the p
value (shown in the last column of the Two-Way ANOVA Table with Interaction) and the corresponding value of the level of significance. If the p value
is less than or equal to the level of significance (), we reject the null hypothesis. Otherwise, we do not reject the null hypothesis. For example, the p value
for parts is zero, which means we reject the null hypothesis that the parts are
similar at any level of significance. In other words, the measurement system
is capable of distinguishing the different parts. The p value for operators is
0.456. Therefore, at any level of significance less than 0.456, we do not reject
the null hypothesis that the operators are equally good (in most applications,
an acceptable value of the level of significance is 0.05). Finally, the interactions are not negligible at a significant level greater than 0.131. Because
the chosen value of alpha is 0.25, interaction term is not removed from the
ANOVA.
Two-Way ANOVA Table without Interaction
Source
DF
SS
MS
Part Numbers
6135.73
681.748
220.222
0.000
Operators
6.76
3.378
1.091
0.341
3.096
Repeatability
78
241.47
Total
89
6383.96
Because in this case the value of is less than 0.131, the interaction term is
removed from the Two-Way ANOVA Table without Interaction. In this case,
the SS (sum of squares) and DF (degrees of freedom) are merged with corresponding terms of repeatability, which act as an error due to uncontrollable
factors. The interpretation for parts and operators is the same as in the TwoWay ANOVA Table with Interaction. However, it is important to note that the
p values can change from one ANOVA table to another. For example, the p
values for operators are different in the two tables. We will not discuss here
the reason for these changes in the p values, as it is beyond the scope of this
book.
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Gage R&R
%Contribution
Source
Total Gage R&R
VarComp
(of VarComp)
3.2321
4.12
Repeatability
2.7889
3.55
Reproducibility
0.4432
0.56
Operators
0.0000
0.00
0.4432
0.56
Part-to-Part
75.2922
95.88
Total Variation
78.5243
100.00
Process tolerance = 60
The first column in the Gage R&R MINITAB printout provides the breakdown
of the variance components (estimates of variances). The second column provides percent contribution of the variance components, which becomes the
basis of a Gage R&R study using the ANOVA method. For example, the
total variation due to gage is 4.12 percent, of which 3.55 percent variation is
contributed by the repeatability and the remaining 0.56 percent is contributed
by the reproducibility. The variation due to parts is 95.88 percent of the total
variation. This implies that the measurement system is very capable.
Note that the percent contributions are calculated simply by dividing
the variance components by the total variation and then multiplying by 100.
Thus, the percent contribution due to repeatability, for example, is given by
2.7889
100 = 3.55%.
78.5243
StdDev
Study Var
%Study Var
%Tolerance
Source
(SD)
(6 * SD)
(%SV)
(SV/Toler)
Total Gage R&R
1.79780
10.7868
20.29
17.98
Repeatability
1.67000
10.0200
18.85
16.70
Reproducibility
0.66574
3.9944
7.51
6.66
Operators
0.00000
0.0000
0.00
0.00
0.66574
3.9944
7.51
6.66
Part-to-Part
8.67711
52.0626
97.92
86.77
Total Variation
8.86139
53.1684
100.00
88.61
Number of distinct categories = 6
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Chapter Ten
The preceding MINITAB printout provides various percent contributions

using estimates of standard deviations, which are obtained by taking the square
root of the variance components. The comparison with standard deviation
does make more sense because the standard deviation uses the same units as
those of the measurements. The study variation (that is, measurement system
variation, which is equivalent to the process variation in the study of process
control) is obtained by multiplying the standard deviation by 6. The percent
study variations are calculated by dividing the standard deviation by the total
variation and then multiplying by 100. The percent contribution due to partto-part, for example, is given by
8.67711
100 = 97.92%.
8.86139
The percent tolerance is obtained by dividing the (6*SD) by the process tolerance and the multiplying by 100. Thus, the process tolerance of total Gage
R&R, for example, is given by
10.7868
100 = 17.98%.
60
Note that the total percent tolerances in this example do not add up to 100.
Rather, the total sum is 88.61, which means the total variation is using 88.61
percent of the specification band.
The last entry in the MINITAB printout is the number of distinct categories, which in this case is 6. The number of distinct categories can be
determined as follows:
part-to-part SD
Number of distinct categories = Integral parrt of
1.4142
total Gage R&R SD
8.67711
= Integral part of
1.4142
1.79780
= 6.
Under AIAGs recommendations, a measurement system is capable if the
number of categories is greater than or equal to five. In this example, the
measurement system is capable of separating the parts into the different
categories in which they belong. This quantity is equivalent to the one
defined in Montgomery (2005b) and is referred to as signal-to-noise ratio
(SNR), that is,
2 p
SNR =
,
1 p
2p
where p =
.
1 2p
Graphical Representation of Gage R&R Study

Figure 10.20 shows the various percent contributions of Gage R&R, repeatability, reproducibility, and part-to-part variations, which we discussed in the
previous section.
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Figure 10.20
Percent contribution of variance components for the data in

Example 10.12.
As usual, in Figure 10.21 we first interpret the R chart. All the data points
are within the control limits, which indicates that the operators are measuring consistently. The X chart shows many points beyond the control limits,
but this does not mean the measurement system is out of control. Rather,
this indicates the narrower control limits because the variation due to repeatability is small and the measurement system is capable distinguishing the
different parts.
Figure 10.22 plots the average of each part by any single operator. In this
graph we have three lines because we have three operators. These lines intersect one another, but they are also very close to one another. This implies
that there is some interaction between the operators and the parts, which is
significant only at 0.131 or greater.
In Figure 10.23 the clear circles represent the measurements by each
operator, and the dark circles represent the means. The spread of measurements for each operator is almost the same. The means fall on a horizontal
line, which indicates that the average measurement for each operator is also
the same. Thus, in this example, the operators are measuring the parts consistently. In other words, the variation due to reproducibility is low.
In Figure 10.23, the clear circles represent the measurements on each
part, and the dark circles represent the mean for each part. In this case, the
spread of measurements for each part is not exactly the same but is nonetheless very small. This means that each part is measured with the same precision
and accuracy. Greater variability among the means indicates that the measurement system is quite capable of distinguishing the parts belonging to different
categories. Combining the outcomes of Figures 10.23 and 10.24, we can say
that, overall, the Gage R&R variability is not very significant.
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Chapter Ten
Figure 10.21
X and R charts for the data in Example 10.12.
Figure 10.22
Interaction between operators and parts for the data in Example 10.12.
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Figure 10.23
Scatter plot for measurements versus operators.
Figure 10.24
Scatter plot for measurements versus parts (bolts).
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11
Computer Resources
to Support SQC: JMP
se of all the SQC tools discussed in this book began with hand calculation. Aside from the tediousness of the calculations, data transcription, and calculation errors, the amount of time required to complete
the calculations and related graphing drove the need for computer support of
SQC applications. Now there are many desktop statistical application software packages available to support SQC, and the focus of this chapter is on
one of those software packages: JMP. In this chapter we will limit our discussion of topics to demonstrating the use of JMP for the tools and techniques
discussed throughout this book, and we will emphasize the use of JMP for
phase I and II SPC charts, process capability, and MSA. We will not discuss
the use of JMP for acceptance sampling or PRE-control, as JMP is not specifically designed in Version 6.0 to support these SQC tools and techniques.
It is not our intent as authors to endorse any one software package, as
each package has particular strengths and areas for improvement. We do,
however, feel the need to introduce JMP as a software package that is very
popular, that is statistically very powerful, and that supports the statistical
content discussed in each of the four books in the Six Sigma Green Belt
series. In order to gain the most benefit from the material in this chapter,
readers should have basic computing literacy.
11.1 Using JMPVersion 6.0

When launching JMP, you will see the screen shown in Figure 11.1, which
identifies JMP Starter as the topmost heading, indicating that there are no
open files. Immediately below the drop-down menu is a dialog box, also with
the heading of JMP Starter.
The JMP Starter is designed to assist new(er) JMP users by providing
easily accessible prompts for and brief descriptions of the most common
functions needed to start a JMP session. The JMP Starter is organized around
categories of functions whereby you can select any of the categories of functions listed on the left side of Figure 11.1. The current category displayed
is File, and the functions corresponding to the File category are shown in
261
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Chapter Eleven
Figure 11.1
JMP Starter display.
the remainder of the dialog box. Each category displays a different set of
functions.
In addition to the JMP Starter, JMP functions can be used by accessing
the drop-down menus located at the top of the initial display, as can be seen
in Figure 11.1 and Figure 11.2.
Clicking on any of the drop-down menu commands reveals a set of functions associated with that command. Examples of drop-down menu commands and associated functions are shown in Figures 11.3 and 11.4.
As can be seen in Figure 11.3, the File, Edit, and Tables commands
have many functions that, for purposes of this chapter, are focused on file
processing.
If you are familiar with Microsoft Windows products, the drop-down
menus will appear quite familiar. As you gain familiarity with JMP, you may
wish to disable the JMP Starter, which you can do by accessing File > Preferences and then deselecting the JMP Starter box.
Figure 11.2
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JMP drop-down menus.
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Computer Resources to Support SQC: JMP 263
Figure 11.3
JMP file processing commands.
As can be seen in Figure 11.4, the DOE, Analyze, and Graph commands have many functions that, for the purposes of this chapter, are focused
on statistical analysis.
Getting Started with JMP
To begin a JMP session, you will need to complete one of the following three
steps:
1. Create a new data table
2. Open an existing JMP file
3. Create a new journal
As the intent of this chapter is to introduce readers to the use of JMP for
SQC applications, creating new data tables and opening existing JMP files
will be discussed. Creating journals is considered to be an advanced feature beyond the scope of this chapter. For more information on the many
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Chapter Eleven
Figure 11.4
JMP statistical analysis commands.
advanced features of JMP, refer to the online help options within JMP, the
JMP system documentation, or the book JMP Start Statistics (3rd edition;
Thompson-Brooks/Cole Publishers).
Creating a New Data Table
Creating a new data table establishes a workspace empty of data, formatting, or labels. The steps required to create a new data table are identified in
Figure 11.5.
As can be seen in Figure 11.5, to create a new data table, select the File
drop-down menu, select the New command, and select Data Table. A new
data table, which looks much like a Microsoft Excel worksheet, appears, as
is shown in Figure 11.6.
Within the data table, column headings may be changed by doubleclicking the heading and retyping the desired heading. New columns
may be added by right-clicking in the workspace and selecting the option
New column. Descriptive statistics about the rows and columns defined are
presented on the left of the display.
Lastly, it should be noted that blue arrows on any JMP display indicate
the presence of a toggle switch, whereby clicking on the switch turns the
display on or off. Red arrows on any JMP display indicate the presence of
additional features or functions that may be selected. Selecting a red arrow
reveals a drop-down menu of additional features or functions.
Figure 11.5
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Creating a new data table.
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Figure 11.6
A new data table.
Opening an Existing JMP File

To open an existing JMP file, follow the steps in Figure 11.7. Select File
from the drop-down menu and then select Open. Once the Open command
has been selected, you can browse files in locations established in the system
configuration.
Saving JMP Files
To save JMP files, use either the JMP Starter or the drop-down menu commands. The steps required to save a newly created JMP file are identified in
Figure 11.8.
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Chapter Eleven
Figure 11.7
Opening an existing JMP file.
There are two ways to save a JMP file. If a file has not been previously
saved, as would be the case with a new data file, select File from the dropdown menu and then select Save As. Once Save As has been selected, you
will be prompted for a file name and storage location.
If a file has been previously saved, as would be the case with an existing
data file, select File from the drop-down menu and then select Save, as shown
in Figure 11.9. Once Save has been selected, the file will automatically be
saved with the existing file name and in the existing storage location.
Print Options
To print any portion of a JMP data file or graphical display, select the entire
table or graphical display with a single click of the mouse. If only certain portions of a data table or graphical display are desired, select the desired items
by pressing and holding the SHIFT key and then selecting each of the desired
items to print. The steps needed to print JMP data or graphs are identified in
Figure 11.10. Select File from the drop-down menu and then select Print.
Assuming that a printer is connected, configured, and on line, the output will
print. If you want to view the output prior to printing, select Print Preview
from the File menu.
Figure 11.8
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Saving a newly created JMP file.
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Figure 11.9
Saving an existing JMP file.
Using JMP Images for Reporting

One particularly useful feature of JMP is that images of data or graphics may
be readily used in documents generated for reporting purposes. To use JMP
images, simply select the desired images, as was described in the subsection
Print Options, right-click on them, and select Copy. Once the images are
copied, launch your word processing software, such as Microsoft Word, and
Figure 11.10
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Printing JMP output.
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Chapter Eleven
then open your document and paste the images. This powerful feature eliminates the need for import/export functions.
11.2 The Shewhart XBar and R Control Chart

To create an XBar and R chart we begin by entering data into column 1 of
a new data table. Once the data have been entered, we generate the chart by
following the steps identified in Figure 11.11.
As can be seen in Figure 11.11, we first select Graph from the dropdown menu, then select Control Chart, and then XBar. A dialog box will be
presented, as shown in Figure 11.12.
The dialog box in Figure 11.12 requires us to select a variable. The data
table in this case contains only one variable, which is identified as Column 1
in the Select Columns box, located in the upper left section of the dialog box.
At this point, we would select the variable (click with the mouse) and assign
it to the Process block, located in the upper center section of the dialog box,
which indicates that a numeric variable is required.
Three additional points about the dialog box should be noted at this
time. First, in an effort to anticipate the most frequently requested control
chart, JMP automatically assumes we want to create an XBar and R chart. If
any other type of variables control chart is desired, we must select the new
Figure 11.11
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Generating an XBar and R chart.
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Figure 11.12
XBar chart dialog box.
chart type here. Second, the KSigma parameter is automatically set to three.
KSigma refers to the selection of scaling factors based on +/ three standard
deviationswhich is the most common scaling factor used. Third, the sample size is automatically set to five. It is critically important that we ensure
that the sample size defined in this block matches the sample size defined in
the data table. It is common to collect sample sizes other than five, which are
then recorded in the data table. If the actual sample size recorded in the data
table does not match the sample size selected in the dialog box, JMP will calculate a control chart based on the sample sizes defined in the dialog box.
Once we complete our interaction with the dialog box, we select the OK
function in the Action block, located in the upper right corner of the dialog
box, and the control chart is generated and displayed.
Table 3.4 of Example 3.4 in Chapter 3. Use the following steps to construct
the XBar and R control chart.
Solution:
1. Enter the data in column 1 of the data table.
2. Select Graph from the drop-down menu.
3. Select the Control Chart function.
4. Select the XBar chart option. The dialog box XBar Control
Chart shown in Figure 11.12 appears.
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Chapter Eleven
5. Check the R option.

6. Choose the KSigma option in the Parameters box, and make
sure 3 is entered as the parameter.
7. Set the sample size to be consistent with the sample size
entered in the data table.
8. Assign a variable to be modeled in the Process field.
9. Select OK in the Action box.
11.3 The Shewhart XBar and S Control

ChartEqual Sample Size
To create an XBar and S chart we begin by entering data into column 1 of
a new data table. Once the data have been entered, we generate the chart by
As can be seen in Figure 11.13, we select Graph from the drop-down
menu, then select Control Chart, and then XBar. Once the XBar chart has
been selected, a dialog box will be presented, as shown in Figure 11.14.
The dialog box shown in Figure 11.14 requires us to select a chart type.
An R chart is the default setting, and to generate an S chart, we must select
the appropriate box, as is seen in the left section of the dialog box. Next, we
must select a variable. The data table in this case contains only one variable,
which is identified as Column 1 in the Select Columns box, located in the
upper left section of the dialog box. At this point, we would select the variable (click with the mouse) and assign it to the Process field, located in the
upper center section of the dialog box, which indicates that a numeric variable is required.
Two additional points about the dialog box should be noted at this time.
First, the KSigma parameter is automatically set to three. KSigma refers to
the selection of scaling factors based on +/ three standard deviationswhich
is the most common scaling factor used. Second, the sample size is automatically set to five. It is critically important that we ensure that the sample size
defined in this block matches the sample size defined in the data table. It is
common to collect sample sizes other than five, which are then recorded in
the data table. If the actual sample size recorded in the data table does not
match the sample size selected in the dialog box, JMP will calculate a control
chart based on the sample sizes defined in the dialog box.
Once we complete our interaction with the dialog box, we click OK in
the Action block, located in the upper right corner of the dialog box, and the
control chart is generated and displayed.
Table 3.4 of Example 3.4 in Chapter 3. Then use the following steps to construct the XBar and S control chart.
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Figure 11.13
Generating an XBar and S chart.
Figure 11.14
XBar chart dialog box.
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Chapter Eleven
Solution:
5. Check the S option.
11.4 The Shewhart XBar and S Control

ChartSample Size Variable
To generate an XBar and S chart with sample size variable, we follow the
same procedural steps that were described for the XBar and S chart for equal
sample size in section 11.3. The primary differences between generating an
XBar and S chart for equal sample size and generating an XBar and S chart
for varying sample size become apparent when we are presented with the
dialog box shown in Figure 11.15.
To complete the XBar and S chart for sample size varying, we must assign
the variables data in the Process field and a label in the Sample Label field.
Because all the variables data are recorded in a single column, JMP requires
the use of a second column labeling the data as belonging to a specific sample
(for example, sample 1, sample 2). The Sample Grouped by Sample Label
button is then selected, and JMP associates the amount of data in each sample
with the appropriate sample label in further calculations.
Example 11.3 Consider the data on finished inside diameter measurements
of piston rings shown in Table 3.6 of Example 3.8 in Chapter 3. Then use the
following steps to construct the XBar and S control chart.
Solution:
1. Enter the variables data in column 1 and the label (sample) data
in column 2 of the data table.
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Figure 11.15
XBar and S chart dialog box.
5. Check the S option.
7. Assign the variable to be modeled in the Process box.
8. Assign the label in the Sample Label field (the Sample Grouped
by Sample Label button will automatically be enabled).
11.5 The Shewhart Control Chart

for Individual Observations
To create a control chart for individual observations, we begin by entering
data into column 1 of a new data table. Once the data have been entered, we
generate the chart by following the steps identified in Figure 11.16.
As can be seen in Figure 11.16, we select Graph from the drop-down menu,
then select the Control Chart function, and then select IR. Once the IR chart
has been selected, a dialog box will be presented, as shown in Figure 11.17.
The dialog box shown in Figure 11.17 requires us to select a variable.
The data table in this case contains only one variable, which is identified as
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Chapter Eleven
Column 1 in the Select Columns box, located in the upper left section of
the dialog box. At this point, we would select the variable (click with the
mouse) and assign it to the Process field, located in the upper center section
of the dialog box, which indicates that a numeric variable is required.
As default settings, JMP enables Individual Measurement and Moving
Range charts to be generated via the check boxes located on the left side of
the dialog box. JMP also defaults to a moving range of two, which can be
changed at the discretion of the user.
An additional point about the dialog box is that the KSigma parameter is automatically set to three. KSigma refers to the selection of scaling factors based on
+/ three standard deviationswhich is the most common scaling factor used.
Once we complete our interaction with the dialog box, we click OK in
the Action block, located in the upper right corner of the dialog box, and the
control chart is generated and displayed.
Table 3.5 of Example 3.6 in Chapter 3. Then use the following steps to construct the Shewhart control chart for individual observations.
Solution:
Figure 11.16
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Generating a control chart for individual observations.
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Figure 11.17
IR chart dialog box.

4. Select the IR chart option. The dialog box IR Control Chart,
shown in Figure 11.17, appears.
5. Check the Individual Measurement and Moving Range
options.
6. Define the range in the Range Span field.
8. Assign the variable to be modeled in the Process field.
11.6 Process Capability Analysis

A process capability analysis in JMP is conducted in the context of a data set
that is being evaluated for process control. This means that in the dialog box
presented for any of the control charts, a check box for a process capability analysis is presented, enabling the analysis. We illustrate the capability
analysis of a process with the following example.
Example 11.5 Consider a quality characteristic of a process that is normally
distributed. Suppose that the process is stable with respect to the 3 control limits. Furthermore, suppose that the data of 25 samples, each of size five, from this
process are as shown in Table 11.1. Also, we are given that the LSL = 0.95 and
the USL = 1.05. Perform the capability analysis of the process.
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Chapter Eleven
Solution:
4. Select any of the control chart options. A dialog box associated
with the type of control chart selected appears. For the data in
this example, an XBar and S chart was selected and the process
capability analysis was enabled, as is seen in Figure 11.18.
5. Complete the interaction with the dialog box as has been
explained for each of the control chart types.
Table 11.1
Data of 25 samples, each of size five, from a given process.
Sample Number
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Observations
0.97076
0.98518
1.01104
0.97892
0.99094
0.99455
0.96904
0.99770
0.97502
0.98483
0.99538
0.99765
0.96011
1.03059
0.98048
1.00332
0.98891
0.98018
1.01699
1.00391
1.03023
0.98663
1.01498
0.97483
0.99836
0.98491
1.00487
0.96951
0.99613
1.03365
0.98894
1.00631
0.98630
0.98115
0.96755
0.93771
0.99017
1.03221
1.01045
1.01197
1.00103
1.01641
0.97683
1.00149
1.03011
10
1.01493
1.02220
1.00179
1.01556
1.01080
11
1.01606
0.96502
1.00546
0.99259
0.96857
12
0.98266
0.99031
0.99349
1.00499
1.03806
13
0.95560
1.00033
1.01098
0.99380
1.04496
14
0.97406
1.01305
0.97556
0.98493
1.00347
15
1.03027
0.97009
1.00151
0.99929
0.98366
16
1.02527
1.01652
1.02743
0.99951
0.99565
17
1.02837
1.01676
0.97056
0.95207
1.03254
18
0.98646
0.99434
1.00163
0.98811
1.01134
19
0.96072
1.02716
1.01030
1.04141
0.96355
20
1.03511
0.94637
1.00852
0.99454
1.00620
21
0.99550
0.98307
1.00948
1.00793
1.04035
22
0.98397
1.03082
0.98643
1.00540
0.97880
23
0.99934
0.99544
1.00959
1.00664
1.02905
24
1.00286
1.00777
1.01661
0.99793
1.03805
25
0.96557
0.98535
0.99911
1.03566
1.00453
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6. Check the Capability option on the right side of the dialog box.
7. Select OK in the Action box. A process capability analysis
dialog box appears, as is presented in Figure 11.19.
8. Define the specification limits and target value in accordance
with the example instructions.
9. Check the Long Term Sigma box for Cp and Cpk.
10. Select OK, and the analysis output appears, as shown in
Figure 11.20.

Nonconforming Units with Constant Sample Size
To create a p chart we begin by entering data (the number of nonconforming
units) into column 1 of a new data table. Once the data have been entered,
we generate the chart by following the steps identified in Figure 11.21.
As can be seen in Figure 11.21, we select Graph from the dropdown menu, then select the Control Chart function, and then select P.
Once the p chart has been selected, a dialog box is presented, as shown
in Figure 11.22.
Figure 11.18
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Capability analysis based on an XBar and S chart for Example 11.5.
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Chapter Eleven
Figure 11.19
Process capability analysis dialog box.
table in this case contains three variables, which are identified as Lot,
Lot Size, and # defects in the Select Columns box, located in the upper
left section of the dialog box. At this point, we would select the variable #
defects (click with the mouse) and assign it to the Process field, located in
the upper center section of the dialog box, which indicates that a numeric
variable is required.
Two additional points about the dialog box should be noted at this
time. First, the KSigma parameter is automatically set to three. KSigma
refers to the selection of scaling factors based on +/ three standard deviationswhich is the most common scaling factor used. Second, the sample
size is automatically set to 100. It is critically important that we ensure
that the sample size defined in this block matches the sample size defined
in the data table. It is common to collect sample sizes other than 100 for a
p chart, which are then recorded in the data table. If the actual sample size
recorded in the data table does not match the sample size selected in the
dialog box, JMP will calculate a control chart based on the sample sizes
defined in the dialog box.
Once we complete our interaction with the dialog box, we select the OK
function in the Action block, located in the upper right corner of the dialog
box, and the control chart is generated and displayed.
wants to improve the overall quality by reducing the fraction of nonconforming computer chips. To achieve this goal, the team decides to set up a p chart,
and in order to do so, the team members inspect a sample of 1000 chips each
day over a period of 30 days. Table 4.2 of Example 4.1 in Chapter 4 gives the
number of nonconforming chips out of 1000 inspected chips each day during
the study period.
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Figure 11.20
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Process capability analysis output.
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Chapter Eleven
Figure 11.21
Generating a p chart.
Figure 11.22
p chart dialog box.
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Solution:
1. Enter the data (number of nonconforming units given in
Table 4.2 in Chapter 4) in column 1 of the data table.
4. Select the P chart option. The dialog box titled P Control
Chart, shown in Figure 11.22, appears.
8. Select OK in the Action field.

Nonconforming Units with Sample Size Varying
To generate a p chart with sample size varying, we use the same procedure
as for a p chart with constant sample size. In the case of a sample size varying, we enter the sample numbers in column 1 and the corresponding nonconforming data in column 2, and in step 7 we assign the sample numbers
entered in column 1 to the Sample Label field and the nonconforming data
entered in column 2 to the Process Field.
11.9 The np Chart: Control Chart

for Nonconforming Units
To create an np chart we plot the number of nonconforming units in an
inspected sample. The np chart is very similar to the p chart except that in the
p chart we plot the fraction nonconforming units in each inspected sample.
Sample sizes in an np chart must be equal. We summarize here some specific
points that are important for np charts:
Record the sample size and number of nonconforming units (np) in each
sample and plot the number of nonconforming units on the control chart.
To generate an np control chart, follow all the steps for creating a p control chart outlined in section 11.7.
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Chapter Eleven
11.10 The c Chart

The c chart is used for studying the number of nonconformities in a sample. In this case, we are studying the number of nonconformities in a unit
of production, also referred to as an inspection unit, rather than studying
the fraction nonconforming or total number of nonconforming units in
the sample.
To create a c chart we begin by entering data (the number of nonconformities) into column 1 of a new data table. Once the data have been entered,
we generate the chart by following the steps identified in Figure 11.23.
then select the Control Chart function, and then select C. Once the c chart has
The dialog box in Figure 11.24 requires us to select a variable. The
data table in this case contains three variables, which are identified as
Lot, Lot Size, and # nonconformities in the Select Columns box,
located in the upper left section of the dialog box. At this point, we would
select the variable # nonconformities (click with the mouse) and assign
it to the Process field, located in the upper center section of the dialog
box, which indicates a numeric variable is required. We then select OK to
generate the chart. We illustrate how to create a c chart with the following
example.
Figure 11.23
H1277 ch11.indd 282
Generating a c chart.
3/8/07 12:39:56 PM
Figure 11.24
c chart dialog box.
paper rolls are due to nonconformities of two types: holes and wrinkles in the
charts to reduce or eliminate the number of these nonconformities. To set up
the control charts the team collects data by taking random sample of five rolls
each day for 30 days and counting the number of nonconformities (holes and
wrinkles) in each sample. The data are shown in Table 4.4 of Example 4.4 in
Chapter 4. Set up a c control chart using these data.
Solution:
1. Enter the data (number of nonconformities given in Table 4.4 in
Chapter 4) in column 1 of the data table.
4. Select the C chart option. The dialog box C Control Chart,
H1277 ch11.indd 283
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284
Chapter Eleven
11.11 The u Chart with Constant Sample Size

The u chart is used for studying the number of nonconformities in a single
inspection unit rather than in a sample of inspection units, as was the case
with the c chart. The control limits in a u chart are based on the number of
nonconformities in a single inspection unit.
To create a u chart we begin by entering data (the number of nonconformities per inspection unit) into column 1 of a new data table. Once the data
have been entered, we generate the chart by following the steps identified in
Figure 11.25.
then select the Control Chart function, and then select U. Once the u chart has
table in this case contains three variables, which are identified as Lot, Lot
Size, and # nonconformities in the Select Columns box, located in the
upper left section of the dialog box. At this point, we would select the variable # nonconformities (click with the mouse) and assign it to the Process
field, located in the upper center section of the dialog box, which indicates
a numeric variable is required. We then select OK to generate the chart. We
illustrate how to create a u chart with the following example.
Figure 11.25
H1277 ch11.indd 284
Generating a u chart.
3/8/07 12:39:57 PM

found that the printed boards for laptops have nonconformities of several
types, such as shorted trace, open trace, cold solder joint, and solder short.
In order to monitor nonconformities in the printed boards for laptops, the
Six Sigma Green Belt team wants to set up a u chart. Therefore, they collect
data by selecting samples of five inspection units, where each inspection unit
consists of 30 boards. The data, which are shown in Table 4.5 of Example 4.5
in Chapter 4, are collected over a period of 30 days.
Solution:
1. Enter the data (number of nonconformities given in Table 4.5 in
Chapter 4) in column 1 of the data table.
4. Select the U chart option. The dialog box U Control Chart,
Figure 11.26
H1277 ch11.indd 285
u chart dialog box.
3/8/07 12:39:57 PM
286
Chapter Eleven
11.12 The u Chart: Control Chart for Fraction

Nonconforming Units with Sample Size Varying
To generate a u chart with sample size varying, we use the same procedure as
for the u chart with constant sample size. In the case of a sample size varying,
we enter the sample numbers in column 1 and the corresponding nonconformities data in column 2, and in step 7 we assign the sample numbers entered
in column 1 to the sample lable field and the nonconforming data entered in
column 2 to the Process field.
11.13 The CUSUM Chart
CUSUM charts are very effective in detecting small shifts. Unlike the X
Shewhart control charts, CUSUM control charts can be designed to detect
one-sided or two-sided shifts. These charts are defined by two parameters,
k and h, which are called the reference value and the decision interval,
respectively, and are defined in section 5.2.1. The two-sided process control by using a CUSUM control chart is achieved by concurrently using two
one-sided CUSUM control charts. In both one-sided CUSUM charts we can
use the same or different reference values depending on whether the upward
and downward shifts are equally important.
To create a CUSUM chart we begin by entering sample numbers in column
1 and process data in column 2 of a new data table. Once the data have been
entered, we generate the chart by following the steps identified in Figure 11.27.
menu, then select the Control Chart function, and then select CUSUM.
Once the CUSUM chart has been selected, a dialog box will be presented, as
The dialog box in Figure 11.28 requires us to select a variable. The data table
in this case contains two variables, which are identified as hour and weight, in
the Select Columns box, located in the upper left section of the dialog box. At this
point, we select the variable weight (click with the mouse) and assign it to the
Process field, located in the upper center section of the dialog box, which indicates
that a numeric variable is required. We then select the variable hour and assign
it to the Sample Label field. We specify a one-sided or two-sided chart by selecting or deselecting the Two-Sided check box on the left side of the dialog box. We
could then click the Specify Stats button at the bottom center of the dialog box,
which would generate an additional dialog box, as is presented in Figure 11.29.
As can be seen in Figure 11.29, the Specify Stats dialog box allows us to
specify a Target, Delta (difference to detect), Shift, process variable Sigma,
and a Head Start. Once the desired parameters have been inserted, we select
OK to generate the chart. We illustrate how to create a CUSUM chart with
the following example.
the process. Let the quality characteristic when the process is under control be
H1277 ch11.indd 286
3/8/07 12:39:57 PM
Figure 11.27
Generating a CUSUM chart.
Figure 11.28
CUSUM chart dialog box.
H1277 ch11.indd 287
3/8/07 12:39:58 PM
288
Chapter Eleven
normally distributed with mean 20 and standard deviation 2. The data shown
in Table 5.1 of Example 5.1 in Chapter 5 give the first 10 random samples of
size four, which are taken when the process is stable and producing the parts
with mean value 20 and standard deviation 2. The last 10 random samples,
again of size four, were taken from that process after its mean experienced an
upward shift of one standard deviation, resulting in a new process with mean
22. Construct a Shewhart CUSUM control chart for the data in Table 5.1.
Solution:
1. Enter the sample number and data in Table 5.1 in columns 1
and 2, respectively, of the data table.
2. Select Control Chart from the Graph drop-down menu.
3. Select the CUSUM option. The dialog box CUSUM Control
4. Select the Two Sided check box.
5. Click the Specify Stats button.
6. Enter the target value = 20, standard deviation = 2, and Delta = 1.
7. Select OK and the CUSUM control chart consistent with the
data from Table 5.1 will be generated.
11.14 The Uniformly Weighted

Moving Average Chart
The moving average control chart is usually more effective in detecting small
shifts in process mean than the Shewhart chart. However, it is usually not as
effective as the CUSUM and EWMA charts.
To create a uniformly weighted moving average (UWMA) chart, we
begin by entering sample numbers in column 1 and process data in column 2
of a new data table. Once the data have been entered, we generate the chart
by following the steps identified in Figure 11.30.
Figure 11.29
H1277 ch11.indd 288
Specify Stats dialog box.
3/8/07 12:39:58 PM

menu, then select the Control Chart function, and then select UWMA. Once
the UWMA chart has been selected, a dialog box will be presented, as shown
in Figure 11.31.
table in this case contains three variables, which are identified as Sample,
Gap, and Status in the Select Columns box, located in the upper left
section of the dialog box. At this point, we select the variable Gap (click
with the mouse) and assign it to the Process field, located in the upper center
section of the dialog box, which indicates that a numeric variable is required.
We then select the variable Sample and assign it to the Sample Label field.
Finally, we select a span for the moving average (3 in this case) and establish a
constant sample size (5 in this case). We then select OK to generate the chart.
We illustrate how to create a UWMA chart with the following example.
Example 11.10 Consider the data in Table 5.4 of Example 5.3 in Chapter
5 on the manufacturing process of auto parts. Design a UWMA control chart
for these data with span m = 4 and interpret the results.
Solution:
3. Select the UWMA option. The dialog box UWMA Control
Chart, shown in Figure 11.31, appears.
Figure 11.30
H1277 ch11.indd 289
Generating a UWMA chart.
3/8/07 12:39:58 PM
290
Chapter Eleven
Figure 11.31
UWMA chart dialog box.
4. Enter 4, or any other specified value, in the Moving Average

Span field.
5. Enter the sample size in the box below Sample Size Constant.
6. Select OK and the UWMA control chart consistent with the

The EWMA control chart is very useful for processes in which only one
observation per period may be available. To create an EWMA chart we begin
by entering sample numbers in column 1 and process data in column 2 of a
new data table. Once the data have been entered, we generate the chart by
menu, then select the Control Chart function, and then select EWMA. Once
the EWMA chart has been selected, a dialog box will be presented, as shown
in Figure 11.33.
table in this case contains three variables, which are identified as Sample,
Gap, and Status in the Select Columns box, located in the upper left
section of the dialog box. At this point, we select the variable Gap (click
with the mouse) and assign it to the Process field, located in the upper center
section of the dialog box, which indicates that a numeric variable is required.
We then select the variable Sample and assign it to the Sample Label field.
Once the variables have been assigned, we specify the weighting factor in the
Weight field, located on the left of the dialog box (0.2 is the default). Finally,
H1277 ch11.indd 290
3/8/07 12:39:59 PM
Figure 11.32
Generating an EWMA chart.
we can click Specify Stats if we want to specify a mean and standard deviation for the process variable. We then select OK to generate the chart. We
illustrate how to create an EWMA chart with the following example.
Example 11.11 Consider the data in Table 5.4 of Example 5.3 in Chapter 5 on
the manufacturing process of auto parts. Design an EWMA control chart for these
data with = 0.20, L = 2.962, 0 = 20, and = 2 and interpret the results.
Solution:
3. Select the EWMA option. The dialog box EWMA Control
4. Assign the process and sample variables.
5. Enter the desired weighting factor (0.2 in this case).
6. Click the Specify Stats button.
7. Assign the process mean and standard deviation.
8. Select OK and the EWMA control chart consistent with the
H1277 ch11.indd 291
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292
Chapter Eleven
Figure 11.33
EWMA chart dialog box.
11.16 Measurement System Capability Analysis

The measurement system plays an important role in any efforts to improve a
process. In any process, the total process variation consists of two sources:
Part-to-part variation
Measurement system variation
If the measurement system variation is large compared with part-to-part
variation, the measurement system cannot adequately discriminate between
parts for complete process evaluation. In other words, the measurement system is not capable. Thus, it becomes very important to perform measurement
systems capability analysis.
Suppose we measure a quality characteristic of a part and let t be the total
observed value of the quality characteristic, p be its true value, and e be the
measurement error. Then, we have
t = p + e.
(11.1)
Assume now that the true value of the quality characteristic and the measurement error are normally distributed with mean and 0 and variances 2p and
2m , respectively. Then it can easily be shown that
2t = 2p + m2 ,
(11.2)
2t
where
is the variance of the total observed values. Furthermore, the error
variance 2m usually consists of two components: one due to gage variation
H1277 ch11.indd 292
3/8/07 12:40:00 PM
(repeatability) and the other due to operator variation (reproducibility). The

purpose of measurement system capability analysis is to separate these components and analyze them. In other words, we have
2
2measurement error = 2reproducibilty + repea
tability.
To study these components, we usually use the ANOVA technique, which

is also known as Gage R&R study. When using the ANOVA technique, we
commonly deal with two types of situations: (1) when each operator measures the same specimens of a part, and (2) when each operator measures different specimens of a part. The designs used in these situations are known as
crossed and nested designs, respectively. The following section discusses the
Gage R&R study using JMP and crossed designs. We do not discuss nested
designs here, as they are beyond the scope of this book.
11.16.1 Measurement System Capability
Analysis (Using Crossed Designs)
A manufacturer of tubes used in automotive applications has installed a new
measuring gage. The Six Sigma Green Belt team is interested in determining how well the new gage measures the inside diameter of the tube. In other
words, the team is interested in performing the measurement system capability analysis. We discuss the measurement system capability analysis with the
following example.
Example 11.12 A manufacturer of bolts (parts) used in automotive
applications has installed a new measuring gage. In order to perform the
MSA on the new gage, the quality manager randomly selects three Six
Sigma Green Belt operators from the department of quality control, who
decide to take a random sample of 10 bolts. Each operator takes three
measurements on each bolt, which is selected randomly. The data obtained
are shown in Table 11.2.
Estimate the repeatability and reproducibility of the measurement
system.
Estimate how much of the total process variation is due to the measurement system.
If the tube diameter specifications are 70 10, what can we say
about the discrimination power of the measurement system? In other
words, is the measurement system capable of discriminating between
different parts?
Solution: We have already discussed this example earlier, in Chapter 7. Here
we discuss step by step how to set up JMP to find the solution to this or any
other similar problem.
H1277 ch11.indd 293
3/8/07 12:40:00 PM
294
Chapter Eleven
1. Following the steps discussed in section 11.1, start up JMP. The

JMP Starter or the initial JMP start-up platform will appear
first.
2. Enter the data in a new data table, using column 1 for the part
numbers, column 2 for the operators, and column 3 for the
observed values of the parts.
3. Select Graph from the drop-down menu, and then select the
Variability/Gage Chart option, as shown in Figure a11.34.
A Gage R&R dialog box is presented, as shown in
Figure 11.35.
4. Complete the dialog box by assigning the variable Length in
MM as the Y, Response, and assign the variables Bolt and
Operator as the X, Grouping. Next, in the Model Type box
located in the lower left corner of the dialog box, set the model
type to Crossed. Once complete, the dialog box should appear
as shown in Figure 11.36.
5. Choose OK to proceed with the analysis. Variability charts for
the Y, Response variable Length in MM are generated, as
6. Having generated the variability charts, as shown in
Figure 11.37, select the red drop-down arrow located in the
upper left corner of the variability charts window. Select both
Variance Components and Gage Studies from the dropTable 11.2

measurements (in mm) on each bolt by each operator.
Bolt
(Parts)
Number
Operator 2
Operator 3
Trial
2
Trial
3
Trial
1
Trial
2
Trial
3
Trial
1
Trial
2
Trial
3
26
22
26
21
23
21
24
22
26
28
26
28
24
29
26
24
25
24
28
31
28
28
27
28
32
30
27
35
33
31
35
31
30
34
35
31
37
35
38
36
38
35
35
34
35
40
38
40
40
38
40
36
37
38
39
42
41
40
39
43
43
41
43
42
43
46
42
46
42
43
44
45
50
52
50
53
52
53
49
53
49
10
H1277 ch11.indd 294
Operator 1
Trial
1
28
31
28
R 1 = 3.0 x 1 = 35.33
28
27
28
R 2 = 2.5 x 2 = 34.67
32
30
27
R 3 = 3.0 x 3 = 34.93
3/8/07 6:25:14 PM
Figure 11.34
Initiating a Gage R&R.
down menu, which is shown in Figure 11.38. The variance

components, shown in Figure 11.39, are generated as output.
To generate the Gage R&R, a dialog box is presented, as
7. Enter 6 in the K, Sigma Multiplier field (some authors use
5.15, Barrentine [2003]).
8. Enter 70 +/ 10 in the Tolerance Interval field. Then select
OK. The output shown in Figure 11.41 will appear.
We discussed this example in Chapter 7 and again in Chapter 10. It should be
noted that the treatment of Gage R&R as presented in this chapter is an introduction to the use of JMP. There are many additional features and capabilities
of JMP as it pertains to MSA and Gage R&R. To learn more about the capabilities of JMP, see the online help within JMP, which provides instruction on
use of the software as well as instruction on applicable statistical theory and
interpretation.
Figure 11.35
H1277 ch11.indd 295
Gage R&R dialog box.
3/8/07 12:40:00 PM
296
H1277 ch11.indd 296
Chapter Eleven
Figure 11.36
Completed Gage R&R dialog box.
Figure 11.37
Y, Response variability charts.
3/8/07 12:40:01 PM
Figure 11.38
Continuing the Gage R&R.
Variance Components
Component
Var Component
Operator
0.000000
Bolt
Operator*Bolt
Within
Total
Figure 11.39
Variance components.
Figure 11.40
Gage R&R dialog box.
H1277 ch11.indd 297
% of Total Plot%
Sqrt(Var Comp)
0.0
0.0000
75.935665
95.9
8.7141
0.322222
0.4069
0.5676
2.922222
3.7
1.7095
79.180110
100.0
8.8983
3/8/07 12:40:02 PM
298
Chapter Eleven
Gage R&R
Measurement
Variation
which is k*sqrt of
Repeatability
(EV) 10.256705 Equipment variation
V(Within)
Operator*Bolt
(IV)
3.405877 Interaction variation
V(Operator*Bolt)
3.405877 Appraiser variation
V(Operator) + V(Operator*Bolt)
Reproducibility (AV)
Gage R&R
(RR) 10.807405 Measurement variation V(Within) + V(Operator) + V(Operator*Bolt)
Part Variation
(PV) 52.284644 Part variation
V(Bolt)
Total Variation
(TV) 53.389924 Total variation
V(Within) + V(Operator) + V(Operator*Bolt) + V(Bolt)
6 K
20.2424 % Gage R&R = 100*(RR/TV)
0.2067 Precision to Part Variation = RR/PV
6 Number of Distinct Categories = 1.41(PV/RR)
Using column Operator for Operator, and column Bolt for Part.
Variance Components for Gage R&R

Component
Var Component
Gage R&R
Repeatability
Reproducibility
Part-to-Part
Figure 11.41
H1277 ch11.indd 298
% of Total Plot%
3.244444
4.10
2.922222
3.69
0.322222
0.41
75.935665
95.90
Gage R&R output.
3/8/07 12:40:03 PM
Appendix
Statistical Factors and Tables
299
H1277 ch12 App.indd 299
3/8/07 12:57:06 PM
300
Appendix
Table A.1
Random numbers.
051407
989018
492019
104768
575186
245627
286990
734378
453966
057822
269053
276922
626639
672429
195157
261315
654257
422375
431234
118589
367431
749277
842766
168999
210133
816278
847625
664969
065701
024018
124630
013237
179229
435437
550763
752891
089084
292255
199266
557418
235703
291002
385271
207907
360800
276579
676139
769805
783328
436849
690077
456559
436334
395621
700837
781531
186054
821361
983046
055051
064522
297716
600883
381178
169364
100801
596694
928310
703015
277547
764938
805569
604184
977595
363240
078850
996467
690208
334904
842078
875941
644067
510442
811601
829395
040948
746376
609475
676581
258998
758163
303864
360595
406956
613170
659663
165049
285017
508337
823585
805127
590014
144389
672585
094987
111625
331838
818612
481421
401552
525959
799809
141968
625825
297508
334761
860898
960450
785312
746866
351524
456015
143766
420487
368857
730553
815900
317512
047606
283084
940666
599608
558502
853032
057656
056246
479494
975590
713502
116101
557125
106544
069601
752609
897074
240681
209045
145960
683943
437854
190980
359006
623535
763922
122217
220988
416186
312541
738818
490698
992339
518042
207523
781965
792693
594357
758633
193427
143471
502953
915848
881688
291695
447687
462282
802405
706686
055756
580658
814693
197116
180139
716829
291097
056602
424613
236547
415732
423617
644397
118122
936037
305685
509440
108748
215414
684961
684762
362416
133571
283321
359369
900968
211269
865878
952056
233151
978019
775520
968944
474018
149319
582300
362831
346320
692174
547654
948322
384851
801187
809947
466717
020564
975865
223465
112251
403475
222629
379671
270475
224102
479858
549809
622585
751051
468493
018852
493268
146506
178368
(continued)
3/8/07 12:57:06 PM
Statistical Factors and Tables 301
Table A.1
(continued)
Random numbers.
366694
104709
967459
251556
079166
652152
505645
639175
028598
404765
734814
311724
026072
962867
814804
190999
740559
023023
327014
811488
319937
808873
539157
307523
098627
909137
770359
114529
881772
145209
036430
039847
167620
072545
428240
600695
003392
565195
332140
503965
894345
168655
706409
748967
876037
365212
660673
571480
558421
426590
227929
567801
552407
365578
580152
897712
858336
400702
406915
830437
720918
315830
269847
043686
006433
277134
378624
907969
762816
959970
291797
701820
728789
699785
715058
750720
536696
611293
544362
402326
564482
758563
645279
943094
588786
125794
749337
615120
568039
899783
236422
473016
993530
507143
335475
436568
798873
027549
940155
530141
689701
926465
003731
242454
058491
385395
519231
042314
955428
238312
857239
581295
661440
496859
529204
410573
528164
003660
587030
270332
209684
798568
429214
353484
193667
287780
342053
706113
193544
818766
780527
198360
307604
179501
891015
513358
300694
204837
681840
231955
753734
619631
790026
637123
101453
454308
147441
686401
027541
945805
823316
720549
567136
213060
266102
621525
708377
251598
278505
802855
967448
479578
890643
687587
046236
580267
798545
062865
752600
335860
582204
247423
235450
566691
086168
455891
197764
140909
747406
253775
801682
781300
754834
224141
068082
893656
002893
039025
414661
882745
386489
999069
053767
557623
688263
306146
836909
609168
823938
499821
242456
974476
979505
641408
240580
428127
532147
666926
018437
291907
935535
398184
874762
563669
548471
998446
436267
489528
430501
311211
838423
749391
911628
800272
143947
918833
130208
783122
827365
308491
821829
694139
038590
889019
212883
739878
121333
242205
312241
777086
589642
722828
677276
169636
465933
525376
836387
969518
231291
330460
634530
779956
167305
517950
851658
764485
341043
689067
402153
061227
3/8/07 12:57:06 PM
2.12130
1.73205
1.50000
1.34164
1.22474
1.13389
1.06066
1.00000
0.94868
0.90453
0.86603
0.83205
0.80178
0.77460
0.75000
0.72761
0.70711
0.68825
0.67082
0.65465
0.63960
0.62554
0.61237
0.60000
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
0.15263
0.15869
0.16214
0.16748
0.17328
0.17960
0.18657
0.19426
0.20279
0.21234
0.22310
0.23533
0.24942
0.26582
0.28507
0.30821
0.33670
0.37255
0.41934
0.48332
0.57680
0.72851
1.02307
1.88060
A2
0.60628
0.61906
0.63269
0.64726
0.66289
0.67970
0.69787
0.71758
0.73905
0.76260
0.78854
0.81734
0.84954
0.88591
0.92739
0.97535
1.03166
1.09910
1.18191
1.28713
1.42729
1.62810
1.95440
2.65870
A3
0.98964
0.98919
0.98870
0.98817
0.98758
0.98693
0.98621
0.98541
0.98451
0.98348
0.98232
0.98097
0.97941
0.97756
0.97535
0.97266
0.96931
0.96503
0.95937
0.95153
0.93999
0.92132
0.88623
0.79788
C4
1.01047
1.01093
1.01143
1.01197
1.01258
1.01324
1.01398
1.01481
1.01573
1.01680
1.01800
1.01940
1.02102
1.02296
1.02527
1.02811
1.03166
1.03624
1.04235
1.05094
1.06384
1.08540
1.12838
1.25332
1/C4
0.56478
0.55527
0.54514
0.53440
0.52272
0.51015
0.49656
0.48185
0.46574
0.44783
0.42826
0.40622
0.38162
0.35352
0.32128
0.28372
0.23912
0.18508
0.11770
0.03033
0.00000
0.00000
0.00000
0.00000
B3
B4
1.43522
1.44473
1.45486
1.46560
1.47728
1.48985
1.50344
1.51815
1.53426
1.55217
1.57174
1.59378
1.61838
1.64648
1.67872
1.71628
1.76088
1.81492
1.88230
1.96967
2.08895
2.26603
2.56814
3.26657
Factors helpful in constructing control charts for variables.
Table A.2
B5
0.55893
0.54927
0.53898
0.52808
0.51623
0.50348
0.48971
0.47482
0.45852
0.44043
0.42069
0.39849
0.37377
0.34559
0.31336
0.27596
0.23179
0.17861
0.11292
0.02886
0.00000
0.00000
0.00000
0.00000
B6
1.42035
1.42911
1.43842
1.44826
1.45893
1.47038
1.48271
1.49600
1.51050
1.52653
1.54395
1.56345
1.58505
1.60953
1.63734
1.66936
1.70683
1.75145
1.80582
1.87420
1.96360
2.08774
2.27597
2.60633
d2
3.931
3.859
3.858
3.819
3.778
3.735
3.689
3.640
3.588
3.532
3.472
3.407
3.336
3.258
3.173
3.078
2.970
2.847
2.704
2.534
2.326
2.059
1.693
1.128
1/d2
0.25439
0.25913
0.25920
0.26185
0.26469
0.26774
0.27108
0.27473
0.27871
0.28313
0.28802
0.29351
0.29976
0.30694
0.31516
0.32489
0.33670
0.35125
0.36982
0.39463
0.42992
0.48567
0.59067
0.88652
d3
0.708
0.712
0.716
0.720
0.724
0.729
0.734
0.739
0.744
0.750
0.756
0.763
0.770
0.778
0.787
0.797
0.808
0.820
0.833
0.848
0.864
0.880
0.888
0.853
D1
1.807
1.723
1.710
1.659
1.606
1.548
1.487
1.423
1.356
1.282
1.204
1.118
1.026
0.924
0.812
0.687
0.546
0.387
0.205
0.000
0.000
0.000
0.000
0.000
D2
6.055
5.995
6.006
5.979
5.950
5.922
5.891
5.857
5.820
5.782
5.740
5.696
5.646
5.592
5.534
5.469
5.394
5.307
5.203
5.078
4.918
4.699
4.357
3.687
D3
0.4597
0.4465
0.4432
0.4344
0.4251
0.4145
0.4031
0.3909
0.3779
0.3630
0.3468
0.3282
0.3076
0.2836
0.2559
0.2232
0.1838
0.1359
0.0758
0.0000
0.0000
0.0000
0.0000
0.0000
D4
1.54032
1.55351
1.55677
1.56559
1.57491
1.58554
1.59691
1.60907
1.62207
1.63703
1.65323
1.67185
1.69245
1.71639
1.74409
1.77680
1.81616
1.86407
1.92419
2.00395
2.11436
2.28218
2.57354
3.26862
302
Appendix
3/8/07 12:57:07 PM
3.01
3.01
4.02
4.19
4.26
4.33
4.36
4.40
4.44
4.44
4.44
4.44
4.48
4.48
4.48
4.48
4.56
10
11
12
13
14
15
n 16
2.50
2.49
2.49
2.49
2.49
2.48
2.48
2.48
2.48
2.46
2.46
2.45
2.44
2.43
2.40
2.30
n = (# of parts (samples)) (# of operators)
3.05
3.01
3.01
3.01
2.99
2.99
2.99
2.98
2.98
2.96
2.94
2.91
2.85
2.70
3.65
2.21
2.20
2.20
2.20
2.20
2.20
2.20
2.20
2.19
2.19
2.19
2.18
2.17
2.16
2.15
2.08
2.04
2.03
2.03
2.02
2.02
2.02
2.02
2.02
2.02
2.02
2.01
2.01
2.00
2.00
1.98
1.93
1.91
1.90
1.90
1.90
1.89
1.89
1.89
1.89
1.89
1.89
1.89
1.89
1.88
1.87
1.86
1.82
1.81
1.81
1.81
1.81
1.81
1.80
1.80
1.80
1.79
1.79
1.79
1.79
1.79
1.78
1.77
1.74
1.73
1.73
1.73
1.73
1.73
1.73
1.73
1.73
1.73
1.72
1.72
1.72
1.72
1.71
1.71
1.67
Number of Trials
Values of K1 for computing repeatability using the range method.
Table A.3
10
1.67
1.67
1.67
1.67
1.67
1.67
1.67
1.67
1.67
1.66
1.66
1.66
1.66
1.66
1.65
1.62
11
1.62
1.62
1.62
1.62
1.62
1.62
1.62
1.62
1.61
1.61
1.61
1.61
1.61
1.60
1.60
1.57
12
1.58
1.58
1.57
1.57
1.57
1.57
1.57
1.57
1.57
1.57
1.57
1.57
1.57
1.57
1.56
1.54
13
1.54
1.54
1.54
1.54
1.54
1.54
1.54
1.54
1.54
1.54
1.54
1.54
1.53
1.53
1.52
1.51
14
1.51
1.51
1.51
1.51
1.51
1.51
1.51
1.51
1.51
1.51
1.51
1.51
1.50
1.50
1.49
1.48
15
1.48
1.48
1.48
1.48
1.48
1.48
1.48
1.48
1.48
1.48
1.48
1.48
1.48
1.47
1.47
1.47
3/8/07 12:57:08 PM
304
Appendix
Table A.4
Values of K2 for computing reproducibility using the range method.

Number of Operators
10
11
12
13
14
15
2.70 2.30 2.08 1.93 1.82 1.74 1.67 1.62 1.57 1.54 1.51 1.48 1.47
Table A.5
Binomial probabilities.
n
Tabulated values are P (X = x ) = p x (1 p )n x .

x
p
n
.05
.10
.20
.30
.40
.50
.60
.70
.80
.90
.95
.950
.900
.800
.700
.600
.500
.400
.300
.200
.100
.050
.050
.100
.200
.300
.400
.500
.600
.700
.800
.900
.950
.902
.810
.640
.490
.360
.250
.160
.090
.040
.010
.003
.095
.180
.320
.420
.480
.500
.480
.420
.320
.180
.095
.003
.010
.040
.090
.160
.250
.360
.490
.640
.810
.902
.857
.729
.512
.343
.216
.125
.064
.027
.008
.001
.000
.136
.243
.384
.441
.432
.375
.288
.189
.096
.027
.007
.007
.027
.096
.189
.288
.375
.432
.441
.384
.243
.135
.000
.001
.008
.027
.064
.125
.216
.343
.512
.729
.857
.815
.656
.410
.240
.130
.062
.025
.008
.002
.000
.000
.171
.292
.410
.412
.346
.250
.154
.076
.026
.004
.001
.014
.048
.154
.265
.345
.375
.346
.264
.154
.048
.014
.000
.004
.025
.075
.154
.250
.346
.412
.409
.292
.171
.000
.000
.001
.008
.025
.063
.129
.240
.409
.656
.815
.774
.591
.328
.168
.078
.031
.010
.002
.000
.000
.000
.204
.328
.410
.360
.259
.156
.077
.028
.006
.001
.000
.021
.073
.205
.309
.346
.312
.230
.132
.051
.008
.001
.001
.008
.051
.132
.230
.312
.346
.308
.205
.073
.021
.000
.000
.006
.028
.077
.156
.259
.360
.410
.328
.204
.000
.000
.000
.003
.010
.031
.078
.168
.328
.590
.774
.735
.531
.262
.118
.047
.016
.004
.001
.000
.000
.000
.232
.354
.393
.302
.187
.094
.037
.010
.002
.000
.000
.031
.098
.246
.324
.311
.234
.138
.059
.015
.001
.000
.002
.015
.082
.185
.276
.313
.277
.185
.082
.015
.002
.000
.001
.015
.059
.138
.234
.311
.324
.246
.098
.031
.000
.000
.002
.010
.037
.094
.186
.302
.393
.354
.232
.000
.000
.000
.001
.004
.015
.047
.118
.262
.531
.735
(continued)
3/8/07 12:57:08 PM
Table A.5
(continued)

x
p
n
.05
.10
.20
.30
.40
.50
.60
.70
.80
.90
.95
.698
.478
.210
.082
.028
.008
.002
.000
.000
.000
.000
.257
.372
.367
.247
.131
.055
.017
.004
.000
.000
.000
.041
.124
.275
.318
.261
.164
.077
.025
.004
.000
.000
.004
.023
.115
.227
.290
.273
.194
.097
.029
.003
.000
.000
.003
.029
.097
.194
.273
.290
.227
.115
.023
.004
.000
.000
.004
.025
.077
.164
.261
.318
.275
.124
.041
.000
.000
.000
.004
.017
.055
.131
.247
.367
.372
.257
.000
.000
.000
.000
.002
.008
.028
.082
.210
.478
.698
10
.663
.430
.168
.058
.017
.004
.001
.000
.000
.000
.000
.279
.383
.335
.198
.089
.031
.008
.001
.000
.000
.000
.052
.149
.294
.296
.209
.109
.041
.010
.001
.000
.000
.005
.033
.147
.254
.279
.219
.124
.048
.009
.000
.000
.000
.005
.046
.136
.232
.273
.232
.136
.046
.005
.000
.000
.000
.009
.047
.124
.219
.279
.254
.147
.033
.005
.000
.000
.001
.010
.041
.110
.209
.296
.294
.149
.052
.000
.000
.000
.001
.008
.031
.089
.198
.335
.383
.279
.000
.000
.000
.000
.001
.004
.017
.057
.168
.430
.664
.630
.387
.134
.040
.010
.002
.000
.000
.000
.000
.000
.298
.387
.302
.156
.061
.018
.004
.000
.000
.000
.000
.063
.172
.302
.267
.161
.070
.021
.004
.000
.000
.000
.008
.045
.176
.267
.251
.164
.074
.021
.003
.000
.000
.001
.007
.066
.172
.251
.246
.167
.073
.017
.001
.000
.000
.001
.017
.073
.167
.246
.251
.172
.066
.007
.001
.000
.000
.003
.021
.074
.164
.251
.267
.176
.045
.008
.000
.000
.000
.004
.021
.070
.161
.267
.302
.172
.063
.000
.000
.000
.000
.004
.018
.060
.156
.302
.387
.298
.000
.000
.000
.000
.000
.002
.010
.040
.134
.387
.630
.599
.349
.107
.028
.006
.001
.000
.000
.000
.000
.000
.315
.387
.268
.121
.040
.010
.002
.000
.000
.000
.000
.075
.194
.302
.234
.121
.044
.011
.001
.000
.000
.000
.010
.057
.201
.267
.215
.117
.042
.009
.001
.000
.000
.001
.011
.088
.200
.251
.205
.111
.037
.006
.000
.000
(continued)
(continued)
3/8/07 12:57:09 PM
306
Appendix
Table A.5
(continued)

x
p
n
.05
.10
.20
.30
.40
.50
.60
.70
.80
.90
.95
.000
.002
.026
.103
.201
.246
.201
.103
.026
.002
.000
.000
.000
.006
.037
.111
.205
.251
.200
.088
.011
.001
.000
.000
.001
.009
.042
.117
.215
.267
.201
.057
.011
.000
.000
.000
.001
.011
.044
.121
.234
.302
.194
.075
.000
.000
.000
.000
.002
.010
.040
.121
.268
.387
.315
10
.000
.000
.000
.000
.000
.001
.006
.028
.107
.349
.599
.569
.314
.086
.020
.004
.001
.000
.000
.000
.000
.000
.329
.384
.236
.093
.027
.005
.001
.000
.000
.000
.000
.087
.213
.295
.200
.089
.027
.005
.001
.000
.000
.000
.014
.071
.222
.257
.177
.081
.023
.004
.000
.000
.000
.001
.016
.111
.220
.237
.161
.070
.017
.002
.000
.000
.000
.003
.039
.132
.221
.226
.147
.057
.010
.000
.000
.000
.000
.010
.057
.147
.226
.221
.132
.039
.003
.000
.000
.000
.002
.017
.070
.161
.237
.220
.111
.016
.001
.000
.000
.000
.004
.023
.081
.177
.257
.222
.071
.014
.000
.000
.000
.001
.005
.027
.089
.200
.295
.213
.087
10
.000
.000
.000
.000
.001
.005
.027
.093
.236
.384
.329
11
.000
.000
.000
.000
.000
.001
.004
.020
.086
.314
.569
.540
.282
.069
.014
.002
.000
.000
.000
.000
.000
.000
.341
.377
.206
.071
.017
.003
.000
.000
.000
.000
.000
.099
.230
.283
.168
.064
.016
.003
.000
.000
.000
.000
:017
.085
.236
.240
.142
.054
.012
.002
.000
.000
.000
.002
.021
.133
.231
.213
.121
.042
.008
.001
.000
.000
.000
.004
.053
.159
.227
.193
.101
.030
.003
.000
.000
.000
.001
.016
.079
.177
.226
.177
.079
.016
.001
.000
.000
.000
.003
.029
.101
.193
.227
.159
.053
.004
.000
.000
.000
.001
.008
.042
.121
.213
.231
.133
.021
.002
.000
.000
.000
.001
.013
.054
.142
.240
.236
.085
.017
10
.000
.000
.000
.000
.003
.016
.064
.168
.283
.230
.099
11
.000
.000
.000
.000
.000
.003
.017
.071
.206
.377
.341
12
.000
.000
.000
.000
.000
.000
.002
.014
.069
.282 .540
(continued)
11
12
3/8/07 12:57:09 PM
Table A.5
(continued)

x
p
n
.05
.10
.20
.30
.40
.50
.60
.70
.80
.90
.95
13
.513
.254
.055
.010
.001
.000
.000
.000
.000
.000
.000
.351
.367
.179
.054
.011
.002
.000
.000
.000
.000
.000
.111
.245
.268
.139
.045
.010
.001
.000
.000
.000
.000
.021
.010
.246
.218
.111
.035
.007
.001
.000
.000
.000
.003
.028
.154
.234
.185
.087
.024
.003
.000
.000
.000
.000
.006
.069
.180
.221
.157
.066
.014
.001
.000
.000
.000
.001
.023
.103
.197
.210
.131
.044
.006
.000
.000
.000
.000
.006
.044
.131
.210
.197
.103
.023
.001
.000
.000
.000
.001
.014
.066
.157
.221
.180
.069
.006
.000
.000
.000
.000
.003
.024
.087
.184
.234
.154
.028
.003
10
.000
.000
.000
.001
.007
.035
.111
.218
.246
.100
.021
11
.000
.000
.000
.000
.001
.010
.045
.139
.268
.245
.111
12
.000
.000
.000
.000
.000
.000
.011
.054
.179
.367
.351
13
.000
.000
.000
.000
.000
.000
.001
.0100
.055
.254
.513
.488
.229
.044
.007
.001
.000
.000
.000
.000
.000
.000
.359
.356
.154
.041
.007
.001
.000
.000
.000
.000
.000
.123
.257
.250
.113
.032
.006
.001
.000
.000
.000
.000
.026
.114
.250
.194
.085
.022
.003
.000
.000
.000
.000
.004
.035
.172
.229
.155
.061
.014
.001
.000
.000
.000
.000
.008
.086
.196
.207
.122
.041
.007
.000
.000
.000
.000
.001
.032
.126
.207
.183
.092
.023
.002
.000
.000
.000
.000
.009
.062
.157
.210
.157
.062
.010
.000
.000
.000
.000
.002
.023
.092
.183
.207
.126
.032
.001
.000
14
.000
.000
.0003
.0066
.0408
.1222
.2066
.1963
.0860
.0078 .000
10
.000
.000
.000
.001
.014
.061
.155
.229
.172
.035
.004
11
.000
.000
.000
.000
.003
.022
.085
.194
.250
.114
.026
12
.000
.000
.000
.000
.001
.006
.032
.113
.250
.257
.123
13
.000
.000
.000
.000
.000
.001
.007
.041
.154
.356
.359
14
.000
.000
.000
.000
.000
.000
.001
.007
.044
.229
.488
(continued)
3/8/07 12:57:10 PM
308
Appendix
Table A.5
(continued)

x
p
n
.05
.10
.20
.30
.40
.50
.60
.70
.80
.90
.95
15
.463
.206
.035
.005
.001
.000
.000
.000
.000
.000
.000
.366
.343
.132
.031
.005
.001
.000
.000
.000
.000
.000
.135
.267
.231
.092
.022
.003
.000
.000
.000
.000
.000
.031
.129
.250
.170
.063
.014
.002
.000
.000
.000
.000
.005
.043
.188
.219
.127
.042
.007
.001
.000
.000
.000
.001
.011
.103
.206
.186
.092
.025
.003
.000
.000
.000
.000
.002
.043
.147
.207
.153
.061
.012
.001
.000
.000
.000
.000
.014
.081
.177
.196
.118
.035
.004
.000
.000
.000
.000
.004
.035
.118
.196
.177
.081
.014
.000
.000
.000
.000
.001
.012
.061
.153
.207
.147
.043
.002
.000
10
.000
.000
.000
.003
.025
.092
.186
.206
.103
.011
.001
11
.000
.000
.000
.001
.007
.042
.127
.219
.188
.043
.005
12
.000
.000
.000
.000
.002
.014
.063
.170
.250
.129
.031
13
.000
.000
.000
.000
.000
.003
.022
.092
.231
.267
.135
14
.000
.000
.000
.000
.000
.001
.005
.031
.132
.343
.366
15
.000
.000
.000
.000
.000
.000
.001
.005
.035
.206
.463
3/8/07 12:57:11 PM
Table A.6
Poisson probabilities.
Tabulated values are P (X = x ) =
e x
.
x!
k
x
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
.905
.819
.741
.670
.607
.549
.497
.449
.407
.368
.091
.164
.222
.268
.303
.329
.348
.360
.366
.368
.005
.016
.033
.054
.076
.099
.122
.144
.165
.184
.000
.001
.003
.007
.013
.020
.028
.038
.049
.061
.000
.000
.000
.000
.002
.003
.005
.008
.011
.015
.000
.000
.000
.000
.000
.000
.001
.001
.002
.003
.000
.000
.000
.000
.000
.000
.000
.000
.000
.001
.000
.000
.000
.000
.000
.000
.000
.000
.000
.000
k
x
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1.9
2.0
.333
.301
.273
.247
.223
.202
.183
.165
.150
.135
.366
.361
.354
.345
.335
.323
.311
.298
.284
.271
.201
.217
.230
.242
.251
.258
.264
.268
.270
.271
.074
.087
.100
.113
.126
.138
.150
.161
.171
.180
.020
.026
.032
.040
.047
.055
.064
.072
.081
.090
.005
.006
.008
.011
.014
.018
.022
.026
.031
.036
.001
.001
.002
.003
.004
.005
.006
.008
.010
.012
.000
.000
.000
.001
.001
.001
.002
.002
.003
.003
.000
.000
.000
.000
.000
.000
.000
.001
.001
.001
.000
.000
.000
.000
.000
.000
.000
.000
.000
.000
k
x
2.1
2.2
2.3
2.4
2.5
2.6
2.7
2.8
2.9
3.0
.123
.111
.100
.091
.082
.074
.067
.061
.055
.050
.257
.244
.231
.218
.205
.193
.182
.170
.160
.149
.270
.268
.265
.261
.257
.251
.245
.238
.231
.224
.189
.197
.203
.209
.214
.218
.221
.223
.224
.224
.099
.108
.117
.125
.134
.141
.149
.156
.162
.168
.042
.048
.054
.060
.067
.074
.080
.087
.094
.101
.015
.017
.021
.024
.028
.032
.036
.041
.046
.050
.004
.006
.007
.008
.010
.012
.014
.016
.019
.022
.001
.002
.002
.003
.003
.004
.005
.006
.007
.008
(continued)
3/8/07 12:57:11 PM
310
Appendix
Table A.6
(continued)
e x
.
x!
k
x
2.1
2.2
2.3
2.4
2.5
2.6
2.7
2.8
2.9
3.0
.000
.000
.001
.001
.001
.001
.001
.002
.002
.003
10
.000
.000
.000
.000
.000
.000
.000
.001
.001
.001
11
.000
.000
.000
.000
.000
.000
.000
.000
.000
.000
12
.000
.000
.000
.000
.000
.000
.000
.000
.000
.000
3.1
3.2
3.3
3.4
3.5
3.6
3.7
3.8
3.9
4.0
.045
.041
.037
.033
.030
.027
.025
.022
.020
.018
.140
.130
.122
.114
.106
.098
.092
.085
.079
.073
.217
.209
.201
.193
.185
.177
.169
.162
.154
.147
.224
.223
.221
.219
.213
.209
.205
.200
.195
.195
.173
.178
.182
.186
.191
.193
.194
.195
.195
.195
.107
.114
.120
.132
.138
.143
.148
.152
.156
.156
.056
.061
.066
.077
.083
.088
.094
.099
.104
.104
.025
.028
.031
.039
.043
.047
.051
.055
.060
.060
.010
.011
.013
.017
.019
.022
.024
.027
.030
.030
.003
.004
.005
.007
.008
.009
.010
.012
.013
.013
10
.001
.001
.002
.002
.002
.003
.003
.004
.005
.005
11
.000
.000
.001
.001
.001
.001
.001
.001
.002
.002
12
.000
.000
.000
.000
.000
.000
.000
.000
.001
.001
13
.000
.000
.0000
.000
.000
.000
.000
.000
.000
.000
14
.000
.000
.000
.000
.000
.000
.000
.000
.000
.000
4.1
4.2
4.3
4.4
4.5
4.6
4.7
4.8
4.9
5.0
.017
.015
.014
.012
.011
.010
.009
.008
.007
.007
.068
.063
.058
.054
.050
.046
.043
.040
.037
.034
.139
.132
.125
.119
.113
.106
.101
.095
.089
.084
.190
.185
.180
.174
.169
.163
.157
.152
.146
.140
.195
.194
.193
.192
.190
.188
.185
.182
.179
.176
.160
.163
.166
.169
.171
.173
.174
.175
.175
.176
.109
.114
.119
.124
.128
.132
.136
.140
.143
.146
.064
.069
.073
.078
.082
.087
.091
.096
.100
.104
(continued)
3/8/07 12:57:12 PM
Table A.6
(continued)
e x
.
x!
k
x
4.1
4.2
4.3
4.4
4.5
4.6
4.7
4.8
4.9
5.0
.033
.036
.039
.043
.046
.050
.054
.058
.061
.065
.015
.017
.019
.021
.023
.026
.028
.031
.033
.036
10
.006
.007
.008
.009
.010
.012
.013
.015
.016
.018
11
.002
.003
.003
.004
.004
.005
.006
.006
.007
.008
12
.009
.001
.001
.001
.002
.002
.002
.003
.003
.003
13
.000
.000
.000
.001
.001
.001
.001
.001
.001
.001
14
.000
.000
.000
.000
.000
.000
.000
.000
.000
.000
15
.000
.000
.000
.000
.000
.000
.000
.000
.000
.000
k
x
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
5.9
6.0
.006
.006
.005
.005
.004
.004
.003
.003
.003
.002
.031
.029
.027
.024
.022
.021
.019
.018
.016
.015
.079
.075
.070
.066
.062
.058
.054
.051
.048
.045
.135
.129
.124
.119
.113
.108
.103
.099
.094
.089
.172
.168
.164
.160
.156
.152
.147
.143
.138
.134
.175
.175
.174
.173
.171
.170
.168
.166
.163
.161
.149
.151
.154
.156
.157
.158
.159
.160
.161
.161
.109
.113
.116
.120
.123
.127
.130
.133
.135
.138
.069
.073
.077
.081
.085
.089
.093
.096
.100
.103
.039
.042
.045
.049
.052
.055
.059
.062
.065
.069
10
.020
.022
.024
.026
.029
.031
.033
.036
.039
.041
11
.009
.010
.012
.013
.014
.016
.017
.019
.021
.023
12
.004
.005
.005
.006
.007
.007
.008
.009
.010
.011
13
.002
.002
.002
.002
.003
.003
.004
.004
.005
.005
14
.001
.001
.001
.001
.001
.001
.002
.002
.002
.002
15
.000
.000
.000
.000
.000
.000
.001
.001
.001
.001
16
.000
.000
.000
.000
.000
.000
.000
.000
.000
.000
17
.000
.000
.000
.000
.000
.000
.000
.000
.000
.000
(continued)
3/8/07 12:57:12 PM
312
Appendix
Table A.6
(continued)
e x
.
x!
6.1
6.2
6.3
6.4
6.5
6.6
6.7
6.8
6.9
7.0
.002
.002
.002
.002
.002
.001
.001
.001
.001
.001
.014
.013
.012
.011
.010
.010
.008
.008
.007
.007
.042
.040
.036
.034
.032
.029
.028
.026
.024
.022
.085
.081
.077
.073
.069
.065
.062
.058
.055
.052
.129
.125
.121
.116
.112
.108
.103
.099
.095
.091
.158
.155
.152
.149
.145
.142
.139
.135
.131
.128
.160
.160
.159
.159
.158
.156
.155
.153
.151
.149
.140
.142
.144
.145
.146
.147
.148
.149
.149
.149
.107
.110
.113
.116
.119
.122
.124
.126
.128
.130
.072
.076
.079
.083
.086
.089
.092
.095
.098
.101
10
.044
.047
.050
.053
.056
.059
.062
.065
.068
.071
11
.024
.026
.029
.031
.033
.035
.038
.040
.043
.045
12
.012
.014
.015
.016
.018
.019
.021
.023
.025
.026
13
.006
.007
.007
.008
.009
.010
.011
.012
.013
.014
14
.003
.003
.003
.004
.004
.005
.005
.006
.006
.007
15
.001
.001
.001
.002
.002
.002
.002
.003
.003
.003
16
.000
.001
.001
.001
.001
.001
.001
.001
.001
.001
17
.000
.000
.000
.000
.000
.000
.000
.000
.001
.001
18
.000
.000
.000
.000
.000
.000
.000
.000
.000
.000
19
.000
.000
.000
.000
.000
.000
.000
.000
.000
.000
3/8/07 12:57:13 PM
Table A.7
Standard normal distribution.
Tabulated values are P(0 Z z) = shaded area under the standard normal
curve.
.00
.01
.02
.03
.04
.05
.06
.07
.08
.09
0.0
.0000 .0040 .0080 .0120 .0160 .0199 .0239 .0279 .0319 .0359
0.1
.0398 .0438 .0478 .0517 .0557 .0596 .0636 .0675 .0714 .0753
0.2
.0793 .0832 .0871 .0910 .0948 .0987 .1026 .1064 .1103 .1141
0.3
.1179 .1217 .1255 .1293 .1331 .1368 .1406 .1443 .1480 .1517
0.4
.1554 .1591 .1628 .1664 .1700 .1736 .1772 .1808 .1844 .1879
0.5
.1915 .1950 .1985 .2019 .2054 .2088 .2123 .2157 .2190 .2224
0.6
.2257 .2291 .2324 .2357 .2389 .2422 .2454 .2486 .2517 .2549
0.7
.2580 .2611 .2642 .2673 .2704 .2734 .2764 .2794 .2823 .2852
0.8
.2881 .2910 .2939 .2967 .2995 .3023 .3051 .3078 .3106 .3133
0.9
.3159 .3186 .3212 .3238 .3264 .3289 .3315 .3340 .3365 .3389
1.0
.3413 .3438 .3461 .3485 .3508 .3531 .3554 .3577 .3599 .3621
1.1
.3643 .3665 .3686 .3708 .3729 .3749 .3770 .3790 .3810 .3830
1.2
.3849 .3869 .3888 .3907 .3925 .3944 .3962 .3980 .3997 .4015
1.3
.4032 .4049 .4066 .4082 .4099 .4115 .4131 .4147 .4162 .4177
1.4
.4192 .4207 .4222 .4236 .4251 .4265 .4279 .4292 .4306 .4319
1.5
.4332 .4345 .4357 .4370 .4382 .4394 .4406 .4418 .4429 .4441
1.6
.4452 .4463 .4474 .4484 .4495 .4505 .4515 .4525 .4535 .4545
1.7
.4554 .4564 .4573 .4582 .4591 .4599 .4608 .4616 .4625 .4633
1.8
.4641 .4649 .4656 .4664 .4671 .4678 .4686 .4693 .4699 .4706
1.9
.4713 .4719 .4726 .4732 .4738 .4744 .4750 .4756 .4761 .4767
2.0
.4772 .4778 .4783 .4788 .4793 .4798 .4803 .4808 .4812 .4817
2.1
.4821 .4826 .4830 .4834 .4838 .4842 .4846 .4850 .4854 .4857
2.2
.4861 .4864 .4868 .4871 .4875 .4878 .4881 .4884 .4887 .4890
2.3
.4893 .4896 .4898 .4901 .4904 .4906 .4909 .4911 .4913 .4916
2.4
.4918 .4920 .4922 .4925 .4927 .4929 .4931 .4932 .4934 .4936
2.5
.4938 .4940 .4941 .4943 .4945 .4946 .4948 .4949 .4951 .4952
2.6
.4953 .4955 .4956 .4957 .4959 .4960 .4961 .4962 .4963 .4964
2.7
.4965 .4966 .4967 .4968 .4969 .4970 .4971 .4972 .4973 .4974
2.8
.4974 .4975 .4976 .4977 .4977 .4978 .4979 .4979 .4980 .4981
2.9
.4981 .4982 .4982 .4983 .4984 .4984 .4985 .4985 .4986 .4986
3.0
.4987 .4987 .4987 .4988 .4988 .4989 .4989 .4989 .4990 .4990
For negative values of z, the probabilities are found by using the symmetric
property.
3/8/07 12:57:13 PM
314
Appendix
Table A.8
Critical values of with degrees of freedom.

2
2
G
20.995
20.990
20.975
20.950
20.900
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
40
50
60
0.00004
0.0100
0.0717
0.2070
0.4117
0.6757
0.9893
1.3444
1.7349
2.1559
2.6032
3.0738
3.5650
4.0747
4.6009
5.1422
5.6972
6.2648
6.8440
7.4339
8.0337
8.6427
9.2604
9.8862
10.5197
11.1603
11.8076
12.4613
13.1211
13.7867
20.7065
27.9907
35.5346
0.00016
0.0201
0.1148
0.2971
0.5543
0.8720
1.2390
1.6465
2.0879
2.5582
3.0535
3.5706
4.1069
4.6604
5.2294
5.8122
6.4078
7.0149
7.6327
8.2604
8.8972
9.5425
10.1957
10.8564
11.5240
12.1981
12.8786
13.5648
14.2565
14.9535
22.1643
29.7067
37.4848
0.00098
0.0506
0.2158
0.4844
0.8312
1.2373
1.6899
2.1797
2.7004
3.2470
3.8158
4.4038
5.0087
5.6287
6.2621
6.9077
7.5642
8.2308
8.9066
9.5908
10.2829
10.9823
11.6885
12.4011
13.1197
13.8439
14.5733
15.3079
16.0471
16.7908
24.4331
32.3574
40.4817
0.00393
0.1026
0.3518
0.7107
1.1455
1.6354
2.1674
2.7326
3.3251
3.9403
4.5748
5.2260
5.8919
6.5706
7.2609
7.9616
8.6718
9.3905
10.1170
10.8508
11.5913
12.3380
13.0905
13.8484
14.6114
15.3791
16.1513
16.9279
17.7083
18.4926
26.5093
34.7642
43.1879
0.01589
0.2107
0.5844
1.0636
1.6103
2.2041
2.8331
3.4895
4.1682
4.8652
5.5778
6.3038
7.0415
7.7895
8.5468
9.3122
10.085
10.865
11.6509
12.4426
13.2396
14.0415
14.8479
15.6587
16.4734
17.2919
18.1138
18.9392
19.7677
20.5992
29.0505
37.6886
46.4589
70
80
90
100
43.2752
51.1720
59.1963
67.3276
45.4418
53.5400
61.7541
70.0648
48.7576
57.1532
65.6466
74.2219
51.7393
60.3915
69.1260
77.9295
55.3290
64.2778
73.2912
82.3581
(continued)
3/8/07 12:57:14 PM
Table A.8
Critical values of 2 with degrees of freedom.
(continued)
2
G
20.100
2
0.050
2
0.025
2
0.010
2
0.005
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
40
50
60
70
80
90
100
2.7055
4.6052
6.2514
7.7794
9.2364
10.6446
12.0170
13.3616
14.6837
15.9871
17.2750
18.5494
19.8119
21.0642
22.3072
23.5418
24.7690
25.9894
27.2036
28.4120
29.6151
30.8133
32.0069
33.1963
34.3816
35.5631
36.7412
37.9159
39.0875
40.2560
51.8050
63.1671
74.3970
85.5271
96.5782
107.5650
118.4980
3.8415
5.9915
7.8147
9.4877
11.0705
12.5916
14.0671
15.5073
16.9190
18.3070
19.6751
21.0261
22.3621
23.6848
24.9958
26.2962
27.5871
28.8693
30.1435
31.4104
32.6705
33.9244
35.1725
36.4151
37.6525
38.8852
40.1133
41.3372
42.5569
43.7729
55.7585
67.5048
79.0819
90.5312
101.8795
113.1452
124.3421
5.0239
7.3778
9.3484
11.1433
12.8325
14.4494
16.0128
17.5346
19.0228
20.4831
21.9200
23.3367
24.7356
26.1190
27.4884
28.8454
30.1910
31.5264
32.8523
34.1696
35.4789
36.7807
38.0757
39.3641
40.6465
41.9232
43.1944
44.4607
45.7222
46.9792
59.3417
71.4202
83.2976
95.0231
106.6285
118.1360
129.5613
6.6349
9.2103
11.3449
13.2767
15.0863
16.8119
18.4753
20.0902
21.6660
23.2093
24.7250
26.2170
27.6883
29.1413
30.5779
31.9999
33.4087
34.8053
36.1908
37.5662
38.9321
40.2894
41.6384
42.9798
44.3141
45.6417
46.9630
48.2782
49.5879
50.8922
63.6907
76.1539
88.3794
100.4251
112.3288
124.1162
135.8070
7.8794
10.5966
12.8381
14.8602
16.7496
18.5476
20.2777
21.9550
23.5893
25.1882
26.7569
28.2995
29.8194
31.3193
32.8013
34.2672
35.7185
37.1564
38.5822
39.9968
41.4010
42.7956
44.1813
45.5585
46.9278
48.2899
49.6449
50.9933
52.3356
53.6720
66.7659
79.4900
91.9517
104.2148
116.3210
128.2290
140.1697
3/8/07 12:57:14 PM
316
Appendix
Table A.9
Critical values of t with degrees of freedom.

A
t ,A
t.100
t.050
t.025
t.010
t.005
t.0005
3.078
6.314
12.706
31.821
63.657
636.619
1.886
2.920
4.303
6.965
9.925
31.599
1.638
2.353
3.182
4.541
5.841
12.924
1.533
2.132
2.776
3.747
4.604
8.610
1.476
2.015
2.571
3.365
4.032
6.869
1.440
1.943
2.447
3.143
3.707
5.959
1.415
1.895
2.365
2.998
3.499
5.408
1.397
1.860
2.306
2.896
3.355
5.041
1.383
1.833
2.262
2.821
3.250
4.781
10
1.372
1.812
2.228
2.764
3.169
4.587
11
1.363
1.796
2.201
2.718
3.106
4.437
12
1.356
1.782
2.179
2.681
3.055
4.318
13
1.350
1.771
2.160
2.650
3.012
4.221
14
1.345
1.761
2.145
2.624
2.977
4.140
15
1.341
1.753
2.131
2.602
2.947
4.073
16
1.337
1.746
2.120
2.583
2.921
4.015
17
1.333
1.740
2.110
2.567
2.898
3.965
18
1.330
1.734
2.101
2.552
2.878
3.922
19
1.328
1.729
2.093
2.539
2.861
3.883
20
1.325
1.725
2.086
2.528
2.845
3.850
21
1.323
1.721
2.080
2.518
2.831
3.819
22
1.321
1.717
2.074
2.508
2.819
3.792
23
1.319
1.714
2.069
2.500
2.807
3.768
24
1.318
1.711
2.064
2.492
2.797
3.745
25
1.316
1.708
2.060
2.485
2.787
3.725
26
1.315
1.706
2.056
2.479
2.779
3.707
27
1.314
1.703
2.052
2.473
2.771
3.690
28
1.313
1.701
2.048
2.467
2.763
3.674
29
1.311
1.699
2.045
2.462
2.756
3.659
30
1.310
1.697
2.042
2.457
2.750
3.646
40
1.303
1.684
2.021
2.423
2.704
3.551
(continued)
3/8/07 12:57:15 PM
Table A.9
Critical values of t with degrees of freedom.
(continued)
t ,A
t.100
t.050
t.025
t.010
t.005
t.0005
60
1.296
1.671
2.000
2.390
2.660
3.460
80
1.292
1.664
1.990
2.374
2.639
3.416
100
1.290
1.660
1.984
2.364
2.626
3.390
120
1.289
1.658
1.980
2.358
2.617
3.373
1.282
1.645
1.960
2.326
2.576
3.291
Critical points of t for lower tail areas are found by using the symmetric property.
3/8/07 12:57:16 PM
318
Appendix
Table A.10
Critical values of F with numerator and denominator degrees of freedom

1,2, respectively ( = 0.10).

F 1, 2,
m1
m2
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
25
30
35
40
45
50
60
70
80
90
100
10
39.86 49.50 53.59 55.83 57.24 58.20 58.91 59.44 59.86 60.19
8.53 9.00 9.16 9.24 9.29 9.33 9.35 9.37 9.38 9.39
5.54 5.46 5.39 5.34 5.31 5.28 5.27 5.25 5.24 5.23
4.54 4.32 4.19 4.11 4.05 4.01 3.98 3.95 3.94 3.92
4.06 3.78 3.62 3.52 3.45 3.40 3.37 3.34 3.32 3.30
3.78 3.46 3.29 3.18 3.11 3.05 3.01 2.98 2.96 2.94
3.59 3.26 3.07 2.96 2.88 2.83 2.78 2.75 2.72 2.70
3.46 3.11 2.92 2.81 2.73 2.67 2.62 2.59 2.56 2.54
3.36 3.01 2.81 2.69 2.61 2.55 2.51 2.47 2.44 2.42
3.29 2.92 2.73 2.61 2.52 2.46 2.41 2.38 2.35 2.32
3.23 2.86 2.66 2.54 2.45 2.39 2.34 2.30 2.27 2.25
3.18 2.81 2.61 2.48 2.39 2.33 2.28 2.24 2.21 2.19
3.14 2.76 2.56 2.43 2.35 2.28 2.23 2.20 2.16 2.14
3.10 2.73 2.52 2.39 2.31 2.24 2.19 2.15 2.12 2.10
3.07 2.70 2.49 2.36 2.27 2.21 2.16 2.12 2.09 2.06
3.05 2.67 2.46 2.33 2.24 2.18 2.13 2.09 2.06 2.03
3.03 2.64 2.44 2.31 2.22 2.15 2.10 2.06 2.03 2.00
3.01 2.62 2.42 2.29 2.20 2.13 2.08 2.04 2.00 1.98
2.99 2.61 2.40 2.27 2.18 2.11 2.06 2.02 1.98 1.96
2.97 2.59 2.38 2.25 2.16 2.09 2.04 2.00 1.96 1.94
2.92 2.53 2.32 2.18 2.09 2.02 1.97 1.93 1.89 1.87
2.88 2.49 2.28 2.14 2.05 1.98 1.93 1.88 1.85 1.82
2.85 2.46 2.25 2.11 2.02 1.95 1.90 1.85 1.82 1.79
2.84 2.44 2.23 2.09 2.00 1.93 1.87 1.83 1.79 1.76
2.82 2.42 2.21 2.07 1.98 1.91 1.85 1.81 1.77 1.74
2.81 2.41 2.20 2.06 1.97 1.90 1.84 1.80 1.76 1.73
2.79 2.39 2.18 2.04 1.95 1.87 1.82 1.77 1.74 1.71
2.78 2.38 2.16 2.03 1.93 1.86 1.80 1.76 1.72 1.69
2.77 2.37 2.15 2.02 1.92 1.85 1.79 1.75 1.71 1.68
2.76 2.36 2.15 2.01 1.91 1.84 1.78 1.74 1.70 1.67
2.76 2.36 2.14 2.00 1.91 1.83 1.78 1.73 1.69 1.66
2.71 2.30 2.08 1.94 1.85 1.77 1.72 1.67 1.63 1.60
To find the critical value of F when is under the lower tail denoted by F1,2,1, we
use the following formula:
F , ,1 = 1/F , ,. Example: F , ,1 .10 = 1/F , ,.10.
1 2
2 1
1 2
2 1
(continued)
3/8/07 12:57:16 PM
Table A.10

(continued)
F 1, 2,
m1
m2
11
12
13
14
15
20
25
30
40
50
75
100
1 60.47 60.71 60.90 61.07 61.22 61.74 62.05 62.26 62.53 62.69 62.90 63.01 63.33
2
9.40 9.41 9.41 9.42 9.42 9.44 9.45 9.46 9.47 9.47 9.48 9.48 9.49
3
5.22 5.22 5.21 5.20 5.20 5.18 5.17 5.17 5.16 5.15 5.15 5.14 5.13
4
3.91 3.90 3.89 3.88 3.87 3.84 3.83 3.82 3.80 3.80 3.78 3.78 3.76
5
3.28 3.27 3.26 3.25 3.24 3.21 3.19 3.17 3.16 3.15 3.13 3.13 3.11
6
2.92 2.90 2.89 2.88 2.87 2.84 2.81 2.80 2.78 2.77 2.75 2.75 2.72
7
2.68 2.67 2.65 2.64 2.63 2.59 2.57 2.56 2.54 2.52 2.51 2.50 2.47
8
2.52 2.50 2.49 2.48 2.46 2.42 2.40 2.38 2.36 2.35 2.33 2.32 2.30
9
2.40 2.38 2.36 2.35 2.34 2.30 2.27 2.25 2.23 2.22 2.20 2.19 2.16
10
2.30 2.28 2.27 2.26 2.24 2.20 2.17 2.16 2.13 2.12 2.10 2.09 2.06
11
2.23 2.21 2.19 2.18 2.17 2.12 2.10 2.08 2.05 2.04 2.02 2.01 1.97
12
2.17 2.15 2.13 2.12 2.10 2.06 2.03 2.01 1.99 1.97 1.95 1.94 1.90
13
2.12 2.10 2.08 2.07 2.05 2.01 1.98 1.96 1.93 1.92 1.89 1.88 1.85
14
2.07 2.05 2.04 2.02 2.01 1.96 1.93 1.91 1.89 1.87 1.85 1.83 1.80
15
2.04 2.02 2.00 1.99 1.97 1.92 1.89 1.87 1.85 1.83 1.80 1.79 1.76
16
2.01 1.99 1.97 1.95 1.94 1.89 1.86 1.84 1.81 1.79 1.77 1.76 1.72
17
1.98 1.96 1.94 1.93 1.91 1.86 1.83 1.81 1.78 1.76 1.74 1.73 1.69
18
1.95 1.93 1.92 1.90 1.89 1.84 1.80 1.78 1.75 1.74 1.71 1.70 1.66
19
1.93 1.91 1.89 1.88 1.86 1.81 1.78 1.76 1.73 1.71 1.69 1.67 1.63
20
1.91 1.89 1.87 1.86 1.84 1.79 1.76 1.74 1.71 1.69 1.66 1.65 1.61
25
1.84 1.82 1.80 1.79 1.77 1.72 1.68 1.66 1.63 1.61 1.58 1.56 1.52
30
1.79 1.77 1.75 1.74 1.72 1.67 1.63 1.61 1.57 1.55 1.52 1.51 1.46
35
1.76 1.74 1.72 1.70 1.69 1.63 1.60 1.57 1.53 1.51 1.48 1.47 1.41
40
1.74 1.71 1.70 1.68 1.66 1.61 1.57 1.54 1.51 1.48 1.45 1.43 1.38
45
1.72 1.70 1.68 1.66 1.64 1.58 1.55 1.52 1.48 1.46 1.43 1.41 1.35
50
1.70 1.68 1.66 1.64 1.63 1.57 1.53 1.50 1.46 1.44 1.41 1.39 1.33
60
1.68 1.66 1.64 1.62 1.60 1.54 1.50 1.48 1.44 1.41 1.38 1.36 1.29
70
1.66 1.64 1.62 1.60 1.59 1.53 1.49 1.46 1.42 1.39 1.36 1.34 1.27
80
1.65 1.63 1.61 1.59 1.57 1.51 1.47 1.44 1.40 1.38 1.34 1.32 1.24
90
1.64 1.62 1.60 1.58 1.56 1.50 1.46 1.43 1.39 1.36 1.33 1.30 1.23
100 1.64 1.61 1.59 1.57 1.56 1.49 1.45 1.42 1.38 1.35 1.32 1.29 1.21
1.57 1.55 1.52 1.50 1.49 1.42 1.38 1.34 1.30 1.26 1.21 1.18 1.00
(continued)
3/8/07 12:57:16 PM
320
Appendix
Table A.10

(continued)
( = 0.05)

F 1, 2,
m1
m2
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
25
30
35
40
45
50
60
70
80
90
100
10
161.45
18.51
10.13
7.71
6.61
5.99
5.59
5.32
5.12
4.97
4.84
4.75
4.67
4.60
4.54
4.49
4.45
4.41
4.38
4.35
4.24
4.17
4.12
4.09
4.06
4.03
4.00
3.98
3.96
3.95
3.94
3.84
199.50
19.00
9.55
6.94
5.79
5.14
4.74
4.46
4.26
4.10
3.98
3.89
3.81
3.74
3.68
3.63
3.59
3.55
3.52
3.49
3.39
3.32
3.27
3.23
3.20
3.18
3.15
3.13
3.11
3.10
3.09
3.00
215.71
19.16
9.28
6.59
5.41
4.76
4.35
4.07
3.86
3.71
3.59
3.49
3.41
3.34
3.29
3.24
3.20
3.16
3.13
3.10
2.99
2.92
2.87
2.84
2.81
2.79
2.76
2.74
2.72
2.71
2.70
2.60
224.58
19.25
9.12
6.39
5.19
4.53
4.12
3.84
3.63
3.48
3.36
3.26
3.18
3.11
3.06
3.01
2.96
2.93
2.90
2.87
2.76
2.69
2.64
2.61
2.58
2.56
2.53
2.50
2.49
2.47
2.46
2.37
230.16
19.30
9.01
6.26
5.05
4.39
3.97
3.69
3.48
3.33
3.20
3.11
3.03
2.96
2.90
2.85
2.81
2.77
2.74
2.71
2.60
2.53
2.49
2.45
2.42
2.40
2.37
2.35
2.33
2.32
2.31
2.21
233.99
19.33
8.94
6.16
4.95
4.28
3.87
3.58
3.37
3.22
3.09
3.00
2.92
2.85
2.79
2.74
2.70
2.66
2.63
2.60
2.49
2.42
2.37
2.34
2.31
2.29
2.25
2.23
2.21
2.20
2.19
2.10
236.77
19.35
8.89
6.09
4.88
4.21
3.79
3.50
3.29
3.14
3.01
2.91
2.83
2.76
2.71
2.66
2.61
2.58
2.54
2.51
2.40
2.33
2.29
2.25
2.22
2.20
2.17
2.14
2.13
2.11
2.10
2.01
238.88
19.37
8.85
6.04
4.82
4.15
3.73
3.44
3.23
3.07
2.95
2.85
2.77
2.70
2.64
2.59
2.55
2.51
2.48
2.45
2.34
2.27
2.22
2.18
2.15
2.13
2.10
2.07
2.06
2.04
2.03
1.94
240.54
19.38
8.81
6.00
4.77
4.10
3.68
3.39
3.18
3.02
2.90
2.80
2.71
2.65
2.59
2.54
2.49
2.46
2.42
2.39
2.28
2.21
2.16
2.12
2.10
2.07
2.04
2.02
2.00
1.99
1.97
1.88
241.88
19.40
8.79
5.96
4.74
4.06
3.64
3.35
3.14
2.98
2.85
2.75
2.67
2.60
2.54
2.49
2.45
2.41
2.38
2.35
2.24
2.16
2.11
2.08
2.05
2.03
1.99
1.97
1.95
1.94
1.93
1.83
To find the critical value of F when is under the lower tail denoted by F1,2,1, we use the
following formula:
F , ,1 = 1/F , ,.
1 2
2 1
(continued)
3/8/07 12:57:17 PM
Table A.10 Critical values of F with numerator and denominator degrees of freedom
(continued)
( = 0.05)

F 1, 2,
m1
m2
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
25
30
35
40
45
50
60
70
80
90
100
11
12
13
14
15
20
25
30
40
50
75
100
243.0
19.40
8.76
5.94
4.70
4.03
3.60
3.31
3.10
2.94
2.82
2.72
2.63
2.57
2.51
2.46
2.41
2.37
2.34
2.31
2.20
2.13
2.07
2.04
2.01
1.99
1.95
1.93
1.91
1.90
1.89
1.79
243.9
19.41
8.74
5.91
4.68
4.00
3.57
3.28
3.07
2.91
2.79
2.69
2.60
2.53
2.48
2.42
2.38
2.34
2.31
2.28
2.16
2.09
2.04
2.00
1.97
1.95
1.92
1.89
1.88
1.86
1.85
1.75
244.7
19.42
8.73
5.89
4.66
3.98
3.55
3.26
3.05
2.89
2.76
2.66
2.58
2.51
2.45
2.40
2.35
2.31
2.28
2.25
2.14
2.06
2.01
1.97
1.94
1.92
1.89
1.86
1.84
1.83
1.82
1.72
245.4
19.42
8.71
5.87
4.64
3.96
3.53
3.24
3.03
2.86
2.74
2.64
2.55
2.48
2.42
2.37
2.33
2.29
2.26
2.22
2.11
2.04
1.99
1.95
1.92
1.89
1.86
1.84
1.82
1.80
1.79
1.69
246.0
19.43
8.70
5.86
4.62
3.94
3.51
3.22
3.01
2.85
2.72
2.62
2.53
2.46
2.40
2.35
2.31
2.27
2.23
2.20
2.09
2.01
1.96
1.92
1.89
1.87
1.84
1.81
1.79
1.78
1.77
1.67
248.0
19.45
8.66
5.80
4.56
3.87
3.44
3.15
2.94
2.77
2.65
2.54
2.46
2.39
2.33
2.28
2.23
2.19
2.16
2.12
2.01
1.93
1.88
1.84
1.81
1.78
1.75
1.72
1.70
1.69
1.68
1.57
249.3
19.46
8.63
5.77
4.52
3.83
3.40
3.11
2.89
2.73
2.60
2.50
2.41
2.34
2.28
2.23
2.18
2.14
2.11
2.07
1.96
1.88
1.82
1.78
1.75
1.73
1.69
1.66
1.64
1.63
1.62
1.51
250.1
19.46
8.62
5.75
4.50
3.81
3.38
3.08
2.86
2.70
2.57
2.47
2.38
2.31
2.25
2.19
2.15
2.11
2.07
2.04
1.92
1.84
1.79
1.74
1.71
1.69
1.65
1.62
1.60
1.59
1.57
1.46
251.1
19.47
8.59
5.72
4.46
3.77
3.34
3.04
2.83
2.66
2.53
2.43
2.34
2.27
2.20
2.15
2.10
2.06
2.03
1.99
1.87
1.79
1.74
1.69
1.66
1.63
1.59
1.57
1.54
1.53
1.52
1.39
251.8
19.48
8.58
5.70
4.44
3.75
3.32
3.02
2.80
2.64
2.51
2.40
2.31
2.24
2.18
2.12
2.08
2.04
2.00
1.97
1.84
1.76
1.70
1.66
1.63
1.60
1.56
1.53
1.51
1.49
1.48
1.35
252.6
19.48
8.56
5.68
4.42
3.73
3.29
2.99
2.77
2.60
2.47
2.37
2.28
2.21
2.14
2.09
2.04
2.00
1.96
1.93
1.80
1.72
1.66
1.61
1.58
1.55
1.51
1.48
1.45
1.44
1.42
1.28
253.0
19.49
8.55
5.66
4.41
3.71
3.27
2.97
2.76
2.59
2.46
2.35
2.26
2.19
2.12
2.07
2.02
1.98
1.94
1.91
1.78
1.70
1.63
1.59
1.55
1.52
1.48
1.45
1.43
1.41
1.39
1.24
254.3
19.50
8.53
5.63
4.37
3.67
3.23
2.93
2.71
2.54
2.40
2.30
2.21
2.13
2.07
2.01
1.96
1.92
1.88
1.84
1.71
1.62
1.56
1.51
1.47
1.44
1.39
1.35
1.32
1.30
1.28
1.00
(continued)
3/8/07 12:57:18 PM
322
Appendix
Table A.10

(continued)
( = 0.025)

F 1, 2,
m1
m2
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
25
30
35
40
45
50
60
70
80
90
100
10
647.79
38.51
17.44
12.22
10.01
8.81
8.07
7.57
7.21
6.94
6.72
6.55
6.41
6.30
6.20
6.12
6.04
5.98
5.92
5.87
5.69
5.57
5.49
5.42
5.38
5.34
5.29
5.25
5.22
5.20
5.18
5.02
799.50
39.00
16.04
10.65
8.43
7.26
6.54
6.06
5.71
5.46
5.26
5.10
4.97
4.86
4.77
4.69
4.62
4.56
4.51
4.46
4.29
4.18
4.11
4.05
4.01
3.97
3.93
3.89
3.86
3.84
3.83
3.69
864.16
39.17
15.44
9.98
7.76
6.60
5.89
5.42
5.08
4.83
4.63
4.47
4.35
4.24
4.15
4.08
4.01
3.95
3.90
3.86
3.69
3.59
3.52
3.46
3.42
3.39
3.34
3.31
3.28
3.26
3.25
3.12
899.58
39.25
15.10
9.60
7.39
6.23
5.52
5.05
4.72
4.47
4.28
4.12
4.00
3.89
3.80
3.73
3.66
3.61
3.56
3.51
3.35
3.25
3.18
3.13
3.09
3.05
3.01
2.97
2.95
2.93
2.92
2.79
921.85
39.30
14.88
9.36
7.15
5.99
5.29
4.82
4.48
4.24
4.04
3.89
3.77
3.66
3.58
3.50
3.44
3.38
3.33
3.29
3.13
3.03
2.96
2.90
2.86
2.83
2.79
2.75
2.73
2.71
2.70
2.57
937.11
39.33
14.73
9.20
6.98
5.82
5.12
4.65
4.32
4.07
3.88
3.73
3.60
3.50
3.41
3.34
3.28
3.22
3.17
3.13
2.97
2.87
2.80
2.74
2.70
2.67
2.63
2.59
2.57
2.55
2.54
2.41
948.22
39.36
14.62
9.07
6.85
5.70
4.99
4.53
4.20
3.95
3.76
3.61
3.48
3.38
3.29
3.22
3.16
3.10
3.05
3.01
2.85
2.75
2.68
2.62
2.58
2.55
2.51
2.47
2.45
2.43
2.42
2.29
956.66
39.37
14.54
8.98
6.76
5.60
4.90
4.43
4.10
3.85
3.66
3.51
3.39
3.29
3.20
3.12
3.06
3.01
2.96
2.91
2.75
2.65
2.58
2.53
2.49
2.46
2.41
2.38
2.35
2.34
2.32
2.19
963.28
39.39
14.47
8.90
6.68
5.52
4.82
4.36
4.03
3.78
3.59
3.44
3.31
3.21
3.12
3.05
2.98
2.93
2.88
2.84
2.68
2.57
2.50
2.45
2.41
2.38
2.33
2.30
2.28
2.26
2.24
2.11
968.63
39.40
14.42
8.84
6.62
5.46
4.76
4.30
3.96
3.72
3.53
3.37
3.25
3.15
3.06
2.99
2.92
2.87
2.82
2.77
2.61
2.51
2.44
2.39
2.35
2.32
2.27
2.24
2.21
2.19
2.18
2.05
To find the critical value of F when is under the lower tail denoted by F1,2,1, we use the
following formula:
F , ,1 = 1/F , ,.
1 2
2 1
(continued)
3/8/07 12:57:19 PM
Table A.10 Critical values of F with numerator and denominator degrees of freedom
(continued)
( = 0.025)

F 1, 2,
m1
m2
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
25
30
35
40
45
50
60
70
80
90
100
11
12
13
14
15
20
25
973.0
39.41
14.37
8.79
6.57
5.41
4.71
4.24
3.91
3.66
3.47
3.32
3.20
3.09
3.01
2.93
2.87
2.81
2.76
2.72
2.56
2.46
2.39
2.33
2.29
2.26
2.22
2.18
2.16
2.14
2.12
1.99
976.7
39.41
14.34
8.75
6.52
5.37
4.67
4.20
3.87
3.62
3.43
3.28
3.15
3.05
2.96
2.89
2.82
2.77
2.72
2.68
2.51
2.41
2.34
2.29
2.25
2.22
2.17
2.14
2.11
2.09
2.08
1.94
979.8
39.42
14.30
8.71
6.49
5.33
4.63
4.16
3.83
3.58
3.39
3.24
3.12
3.01
2.92
2.85
2.79
2.73
2.68
2.64
2.48
2.37
2.30
2.25
2.21
2.18
2.13
2.10
2.07
2.05
2.04
1.90
982.5
39.43
14.28
8.68
6.46
5.30
4.60
4.13
3.80
3.55
3.36
3.21
3.08
2.98
2.89
2.82
2.75
2.70
2.65
2.60
2.44
2.34
2.27
2.21
2.17
2.14
2.09
2.06
2.03
2.02
2.00
1.87
984.9
39.43
14.25
8.66
6.43
5.27
4.57
4.10
3.77
3.52
3.33
3.18
3.05
2.95
2.86
2.79
2.72
2.67
2.62
2.57
2.41
2.31
2.23
2.18
2.14
2.11
2.06
2.03
2.00
1.98
1.97
1.83
993.1
39.45
14.17
8.56
6.33
5.17
4.47
4.00
3.67
3.42
3.23
3.07
2.95
2.84
2.76
2.68
2.62
2.56
2.51
2.46
2.30
2.20
2.12
2.07
2.03
1.99
1.94
1.91
1.88
1.86
1.85
1.71
998.1
39.46
14.12
8.50
6.27
5.11
4.40
3.94
3.60
3.35
3.16
3.01
2.88
2.78
2.69
2.61
2.55
2.49
2.44
2.40
2.23
2.12
2.05
1.99
1.95
1.92
1.87
1.83
1.81
1.79
1.77
1.63
30
40
50
75
100
1001.4 1005.6 1008.1 1011.5 1013.2

39.46 39.47 39.48 39.48 39.49
14.08 14.04 14.01 13.97 13.96
8.46
8.41
8.38
8.34
8.32
6.23
6.18
6.14
6.10
6.08
5.07
5.01
4.98
4.94
4.92
4.36
4.31
4.28
4.23
4.21
3.89
3.84
3.81
3.76
3.74
3.56
3.51
3.47
3.43
3.40
3.31
3.26
3.22
3.18
3.15
3.12
3.06
3.03
2.98
2.96
2.96
2.91
2.87
2.82
2.80
2.84
2.78
2.74
2.70
2.67
2.73
2.67
2.64
2.59
2.56
2.64
2.59
2.55
2.50
2.47
2.57
2.51
2.47
2.42
2.40
2.50
2.44
2.41
2.35
2.33
2.44
2.38
2.35
2.30
2.27
2.39
2.33
2.30
2.24
2.22
2.35
2.29
2.25
2.20
2.17
2.18
2.12
2.08
2.02
2.00
2.07
2.01
1.97
1.91
1.88
2.00
1.93
1.89
1.83
1.80
1.94
1.88
1.83
1.77
1.74
1.90
1.83
1.79
1.73
1.69
1.87
1.80
1.75
1.69
1.66
1.82
1.74
1.70
1.63
1.60
1.78
1.71
1.66
1.59
1.56
1.75
1.68
1.63
1.56
1.53
1.73
1.66
1.61
1.54
1.50
1.71
1.64
1.59
1.52
1.48
1.57
1.48
1.43
1.34
1.30
(continued)
3/8/07 12:57:19 PM
324
Appendix
Table A.10
Critical values of F with numerator and denominator

degrees of freedom 1,2, respectively ( = 0.10).
(continued)
( = 0.01)

F 1, 2,
m1
m2
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
25
30
35
40
45
50
60
70
80
90
100
10
4052
98.50
34.12
21.20
16.26
13.75
12.25
11.26
10.56
10.04
9.65
9.33
9.07
8.86
8.68
8.53
8.40
8.29
8.18
8.10
7.77
7.56
7.42
7.31
7.23
7.17
7.08
7.01
6.96
6.93
6.90
6.63
5000
99.00
30.82
18.00
13.27
10.92
9.55
8.65
8.02
7.56
7.21
6.93
6.70
6.51
6.36
6.23
6.11
6.01
5.93
5.85
5.57
5.39
5.27
5.18
5.11
5.06
4.98
4.92
4.88
4.85
4.82
4.61
5403
99.17
29.46
16.69
12.06
9.78
8.45
7.59
6.99
6.55
6.22
5.95
5.74
5.56
5.42
5.29
5.18
5.09
5.01
4.94
4.68
4.51
4.40
4.31
4.25
4.20
4.13
4.07
4.04
4.01
3.98
3.78
5625
99.25
28.71
15.98
11.39
9.15
7.85
7.01
6.42
5.99
5.67
5.41
5.21
5.04
4.89
4.77
4.67
4.58
4.50
4.43
4.18
4.02
3.91
3.83
3.77
3.72
3.65
3.60
3.56
3.53
3.51
3.32
5764
99.30
28.24
15.52
10.97
8.75
7.46
6.63
6.06
5.64
5.32
5.06
4.86
4.69
4.56
4.44
4.34
4.25
4.17
4.10
3.85
3.70
3.59
3.51
3.45
3.41
3.34
3.29
3.26
3.23
3.21
3.02
5859
99.33
27.91
15.21
10.67
8.47
7.19
6.37
5.80
5.39
5.07
4.82
4.62
4.46
4.32
4.20
4.10
4.01
3.94
3.87
3.63
3.47
3.37
3.29
3.23
3.19
3.12
3.07
3.04
3.01
2.99
2.80
5928
99.36
27.67
14.98
10.46
8.26
6.99
6.18
5.61
5.20
4.89
4.64
4.44
4.28
4.14
4.03
3.93
3.84
3.77
3.70
3.46
3.30
3.20
3.12
3.07
3.02
2.95
2.91
2.87
2.84
2.82
2.64
5981
99.37
27.49
14.80
10.29
8.10
6.84
6.03
5.47
5.06
4.74
4.50
4.30
4.14
4.00
3.89
3.79
3.71
3.63
3.56
3.32
3.17
3.07
2.99
2.94
2.89
2.82
2.78
2.74
2.72
2.69
2.51
6022
99.39
27.35
14.66
10.16
7.98
6.72
5.91
5.35
4.94
4.63
4.39
4.19
4.03
3.89
3.78
3.68
3.60
3.52
3.46
3.22
3.07
2.96
2.89
2.83
2.78
2.72
2.67
2.64
2.61
2.59
2.41
6056
99.40
27.23
14.55
10.05
7.87
6.62
5.81
5.26
4.85
4.54
4.30
4.10
3.94
3.80
3.69
3.59
3.51
3.43
3.37
3.13
2.98
2.88
2.80
2.74
2.70
2.63
2.59
2.55
2.52
2.50
2.32
To find the critical value of F when is under the lower tail denoted by F1,2,1, we
use the following formula:
F , ,1 = 1/F , ,.
1 2
2 1
(continued)
3/8/07 12:57:20 PM
Table A.10

(continued)
( = 0.01)

F 1, 2,
m1
m2
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
25
30
35
40
45
50
60
70
80
90
100
11
12
13
14
15
20
25
30
40
50
75
100
6056
99.41
27.13
14.45
9.96
7.79
6.54
5.73
5.18
4.77
4.46
4.22
4.02
3.86
3.73
3.62
3.52
3.43
3.36
3.29
3.06
2.91
2.80
2.73
2.67
2.63
2.56
2.51
2.48
2.45
2.43
2.25
6106
99.42
27.05
14.37
9.89
7.72
6.47
5.67
5.11
4.71
4.40
4.16
3.96
3.80
3.67
3.55
3.46
3.37
3.30
3.23
2.99
2.84
2.74
2.66
2.61
2.56
2.34
2.45
2.42
2.39
2.37
2.18
6130
99.42
26.98
14.31
9.82
7.66
6.41
5.61
5.05
4.65
4.34
4.10
3.91
3.75
3.61
3.50
3.40
3.32
3.24
3.18
2.94
2.79
2.69
2.61
2.55
2.51
2.44
2.40
2.36
2.33
2.31
2.12
6140
99.43
26.92
14.25
9.77
7.61
6.36
5.56
5.01
4.60
4.29
4.05
3.86
3.70
3.56
3.45
3.35
3.27
3.19
3.13
2.89
2.74
2.64
2.56
2.51
2.46
2.39
2.35
2.31
2.27
2.27
2.08
6157
99.43
26.87
14.20
9.72
7.56
6.31
5.52
4.96
4.56
4.25
4.01
3.82
3.66
3.52
3.41
3.31
3.23
3.15
3.09
2.85
2.70
2.60
2.52
2.46
2.42
2.19
2.31
2.27
2.24
2.22
2.04
6209
99.45
26.69
14.02
9.55
7.40
6.16
5.36
4.81
4.41
4.10
3.86
3.66
3.51
3.37
3.26
3.16
3.08
3.00
2.94
2.70
2.55
2.44
2.3 7
2.31
2.27
2.03
2.15
2.12
2.09
2.07
1.88
6240
99.46
2658
13.91
9.45
7.30
6.06
5.26
4.71
4.31
4.01
3.76
3.57
3.41
3.28
3.16
3.07
2.98
2.91
2.84
2.60
2.45
2.35
2.27
2.21
2.17
2.10
2.05
2.01
1.99
1.97
1.77
6261
99.47
26.50
13.84
9.38
7.23
5.99
5.20
4.65
4.25
3.94
3.70
3.51
3.35
3.21
3.10
3.00
2.92
2.84
2.78
2.54
2.39
2.28
2.20
2.14
2.10
1.86
1.98
1.94
1.92
1.89
1.70
6287
99.47
26.41
13.75
9.29
7.14
5.91
5.12
4.57
4.17
3.86
3.62
3.43
3.27
3.13
3.02
2.92
2.84
2.76
2.69
2.45
2.30
2.19
2.11
2.05
2.01
1.76
1.87
1.85
1.82
1.80
1.59
6303
99.48
26.35
13.69
9.24
7.09
5.86
5.07
4.52
4.12
3.81
3.57
3.38
3.22
3.08
2.97
2.87
2.78
2.71
2.64
2.40
2.25
2.13
2.06
2.00
1.95
1.88
1.83
1.79
1.76
1.74
1.52
6320
99.49
26.28
13.61
9.17
7.02
5.79
5.00
4.45
4.05
3.74
3.50
3.31
3.15
3.01
2.90
2.80
2.71
2.64
2.57
2.33
2.17
2.06
1.98
1.92
1.87
1.79
1.74
1.70
1.67
1.65
1.42
6334
99.49
26.24
13.58
9.13
6.99
5.75
4.96
4.41
4.01
3.71
3.47
3.27
3.11
2.98
2.86
2.76
2.68
2.60
2.54
2.29
2.13
2.02
1.94
1.88
1.82
1.75
1.70
1.65
1.62
1.60
1.36
(continued)
3/8/07 12:57:21 PM
3/8/07 12:57:21 PM
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3/8/07 12:57:48 PM
Index
Form 2 for, 195
structure and organization of,
195f
AOQ. See average outgoing quality
(AOQ)
AOQL. See average outgoing quality
limit (AOQL)
applied statistics, SQC and, 23, 3f
AQL. See acceptable quality limit
(AQL)
ARL. See average run length
(ARL)
ASN. See average sample number
(ASN)
assignable causes, of variation. See
special causes, of variation
asymptotically normal, 139
attributes
acceptance sampling by, 177
control charts for, 8384, 85t
c charts, 9396
np charts, 9293
p charts, 8590
u charts, 96100
defined, 83
attribute sampling plans. See also
sampling plans
ANSI/ASQ Z1.4-2003 and, 189
double, 184185
multiple, 186
single, 182184
vs. variables sampling plans,
193194
Page numbers followed by f or t refer

to figures or tables, respectively.
A
acceptable quality limit (AQL), 178, 194
acceptance number, sampling plans
and, 180182
acceptance sampling, 2. See also
sampling
by attributes, 177
double sampling plans, 184
intent of, 173174
multiple sampling plans, 186
standards, 188193
switching procedures, 190191, 190f
by variables, 193194
accuracy, vs. precision, 151, 151f
accuracy of measurement system,
defined, 151
action on output, 5152
action on process, 51
actions on system, for variation, 53
alpha () risk, 79
ANOVA, MSA based on, 156162
ANSI/ASQ Z1.4-2003, 188189, 205f,
206f, 207f, 208f, 209210f
levels of inspection in, 189191
types of sampling and, 191193
ANSI/ASQ Z1.9-2003, 194198, 211f,
212f, 213221f, 222f
AQL levels in, 195
Form 1 for, 195
331
H1277 ch14_IDX.indd 331
3/8/07 1:37:58 PM
332
Index
average outgoing quality (AOQ),

178179
for double/multiple sampling plans,
186
average outgoing quality limit
(AOQL), 179180
for double/multiple sampling plans,
186
average quality protection, 175
average run length (ARL), 5758
of two-sided control chart, 106
average sample number (ASN),
186188
B
bad decisions, risk associated with
making, 79
beta () risk, 79
binomial distribution, 85, 86, 175, 176
C
calibration, 45, 60
capability analysis, 2
cause-and-effect diagram, 43, 4748, 48f
c control charts, 9396
JMP for creating, 282283
MINITAB for, 240
center line (CL), for control charts, 54
central limit theorem (CLT), 148, 148f
check sheets, 4345, 44f
cluster random sampling, 15, 3237.
See also sampling
advantages of, 33
confidence interval for population
mean for, 3437
total for, 3437
determination of sample size for, 37
estimation of population mean for,
3334
estimation of population total for,
3334
one-stage, 33
two-stage, 33
combined Shewhart-CUSUM control

charts, 115116
common causes, of variation, 52
confidence coefficients, 15
confidence intervals, 15
conforming, use of term, 83
consumer risk, 178
defined, 8
continuous sampling plans, 201
types of, 201203
control charts, 43, 54f
action on output for, 5152
action on process for, 51
for attributes, 8384, 85t
c charts, 9396
np charts, 9293
p charts, 8590
u charts, 96100
benefits of, 56
center line for, 54
exponentially weighted moving
average (see exponentially
weighted moving average
(EWMA) control charts)
lower control limit for, 54
moving average (see moving average
(MA) control charts)
preparation for use of, 5556
process evaluation for, 51
rational samples for, 57
for separating separate causes from
common causes, 53
Shewhart (see Shewhart control
charts)
upper control limit for, 54
uses of, 54
variation and, 5253
control limits (CL)
calculation of, for Shewhart X bar
and R control charts, 6164
calculation of, for Shewhart X bar
and S control charts, 7375
for np control charts, 9293
correlation between characteristics,
determining, 55
critical defects, 189
3/8/07 1:37:59 PM
Index 333
cumulative sum (CUSUM) control

charts, 101102. See also
combined Shewhart-CUSUM
control charts
basic assumptions of, 102
for controlling process variability,
116117
designing, 104106
detecting small shifts and, 101
FIR feature for, 112115, 245
MINITAB for, 243245
one-sided, 104106, 115
two-sided, 104106
two-sided, using numerical
procedure, 106112
vs. Shewhart X bar-R control charts,
102104, 105f
CUSUM control charts. See
cumulative sum (CUSUM)
control charts
D
decision making, on quantitative
data, 5
defect concentration diagram, 43,
4849, 49f
defect rate, 167
defects
critical, 189
major, 189
minor, 189
Deming, W. Edwards, 3940
design of experiments (DOE), SQC
and, 23
distinct categories, determining
number of, 158159
Dodge-Romig tables, 193
Dodges continuous sampling plans,
201202
double sampling, 191192,
193f
double sampling plans
AOQ curve for, 186
AOQL for, 186
double, 184
OC curve for, 184185
downward shift, 102, 106, 115, 243,
286
E
Economic Control of Quality
of Manufactured Product
(Shewhart), 39
environment
as a category in a cause-and-effect
diagram, 48, 48f, 49f
as cause of part-to-part variation,
149
as part of a process, 41, 55, 127
in preparing control charts, 55
error of estimation, 15
estimate, 15
estimator, 15
EWMA control charts. See
average (EWMA) control
charts
average (EWMA) control charts,
101102, 120125
MINITAB for, 247249
F
fast initial response (FIR) feature,
for CUSUM control charts,
112115, 245
fieldworkers, 13
finite populations, 12
FIR feature. See fast initial response
(FIR) feature, for CUSUM
control charts
fishbone. See cause-and-effect
diagram
Form 1, for ANSI/ASQ Z1.9-2003,
195
Form 2, for ANSI/ASQ Z1.9-2003,
195
3/8/07 1:37:59 PM
334
Index
for creating UWMA chart, 288290,

289f, 290f
for Gage R&R study, 293298
getting started with, 263264
for measurement system capability
analysis, 292298, 295f, 296f,
297f, 298f
normal quantile plot, 279f
opening existing files, 265
print options, 266
for process capability analysis,
275277, 278f, 279f
saving files, 265266
Starter, 261262
for Shewhart control chart for
individual observations,
273275
for Shewhart Xbar and R control
charts, 268270
for Shewhart Xbar and S control
charts
with equal sample size, 270272
with sample size variable,
272273
using, 261263
using images for reporting, 267268
Gage repeatability and reproducibility

(Gage R&R) study, 147. See
also measurement system
analysis (MSA); measurement
system performance
ANOVA method for, 156159
graphical representation of, 159162,
256259
JMP for, 293298, 295f, 296f, 297f,
298f
MINITAB for, 250259
total, 152
geometric series, 121122
H
histograms, 43
I
individual observations, Shewhart
control charts for, 69
infinite populations, 12
inspection
levels of, 189191
sampling vs. 100 percent, 174175
interaction between instruments and
operators, 149, 152
Ishikawa diagram. See cause-andeffect diagram
J
JMP software package
for capability analysis, 275277
for creating c control charts,
282283, 282f, 283f
for creating CUSUM control charts,
286288, 287f, 288f
for creating EWMA control charts,
290292, 291f, 292f
creating new data table for, 264265
for creating p control charts,
277281, 280f
for creating u control charts,
284286, 284f, 285f
L
linearity, 151, 151f
line graphs. See run charts
local actions, for variation, 53
lot-by-lot sampling, 175
lot size, sampling plans and,
180182
lot tolerance percent defective (LTPD),
178
lower control limit (LCL), for control
charts, 54
LTPD. See lot tolerance percent
defective (LTPD)
M
MA control charts. See moving
average (MA) control charts
major defects, 189
margin of error, 15
3/8/07 1:37:59 PM
Index 335
MCI. See measurement capability

index (MCI)
measurement
defined, 147
volume of operations and, 7
measurement capability index (MCI),
150, 162
as percentage of process
specification, 163
as percentage of process variation,
162163
measurement system, defined, 147
measurement system analysis (MSA),
147
based on ANOVA, 156162
based on range, 150156
measurement system capability
analysis
computer resources for, 249259
JMP for, 292298, 295f, 296f, 297f,
298f
MINITAB for, 249259
measurement system performance,
evaluating, 149162. See
also Gage repeatability and
reproducibility (Gage R&R)
study
measurement system variation, 249,
292293
MIL-STD-1235B, 202203
MINITAB
for c control charts, 240
creating new worksheet, 226227
for CUSUM control charts,
243245
for EWMA control charts, 247249
getting starting with, 226
for MA control charts, 245247
for measurement system capability
analysis, 249259
for np control charts, 239
for p control charts, 238239
print options for, 228
for process capability analysis,
235237
retrieving saved MINITAB data file,
227
saving data file, 227
saving project, 227228

for Shewhart control chart for
individual observations,
230231
for Shewhart Xbar and R control
charts, 228229
for Shewhart Xbar and S control
charts
equal sample size, 231233
sample size variable, 233235
for u control charts, 241243
using, 225226
minor defects, 189
moving average (MA) control charts,
101102, 117120
MINITAB for, 245247
moving range (MR), 69
MSA. See measurement system
analysis (MSA)
multiple sampling, 191192, 193f
multiple sampling plans, 186
AOQ curve for, 186
AOQL for, 186
N
near zero, 167
nonconforming, use of term, 83
normal inspection to reduced
inspection, 190191
normal inspection to tightened
inspection, 190
np control charts, 9293
MINITAB for, 239
O
OC curve. See operating characteristic
(OC) curve
100 percent inspection, 174175
one-sided CUSUM control charts,
104106, 115
one-stage cluster random sampling, 33
operating characteristic (OC) curve,
57, 5960, 175176
for double sampling plans, 184185
plotting, 176177
3/8/07 1:37:59 PM
336
Index
P
Pareto charts, 43, 4546, 45f, 47f
part-to-part variation, 149, 249,
292293
patterns
of defects, 45, 4849
of nonrandomness, 64, 66
presence of unusual, 87
of random variation, 54, 55
using run charts to identify, 5051,
Western Electric criteria, 64
p control charts, 8590
control chart for fraction
nonconforming with variable
samples, 8990
control limits for, 8587
interpreting, for fraction
nonconforming, 8789
JMP for creating, 277281, 280f
MINITAB for, 238239
point estimate. See estimate
Poisson distribution, 94, 175, 176
population, sampled, 13
population mean, confidence interval
for, 20
for cluster random sampling, 3437
for simple random sampling, 20
for systematic random sampling, 30
population mean, estimation of,
1619
for stratified random sampling,
2224
for systematic random sampling,
2830
populations
defined, 12
finite, 12
infinite, 12
target, 12
population total
confidence interval for, 20
for systematic random sampling, 30
estimation of, 1619

2224
2830
practical versus theoretical difference,
56
precision, vs. accuracy, 151, 151f
PRE-control, 2
advantages of, 170171
background of, 165166
color-coding scheme for, 167168
disadvantages of, 171172
goals of, 166
mechanics of, 168169
necessary conditions for valid,
166167
statistical basis for, 170
pretests, 13
probability, defined, 8
process
defined, 1, 41
flowchart of, 41f
variation and, 52
process capability, 7981, 80f
process capability analysis, 128129
implementing, 129
MINITAB for, 235237
ways of using results of, 129
process capability indices (PCIs),
127145, 166
Cp, 130134
Cpk, 135136
Cpm, 136138
Cpmk, 138139
Cpnst, 139144
defined, 128
development of, 127130
first-generation, 130
flowchart of, 128f
Pp and Ppk, 144145
process evaluation, 1
process Six Sigma, order of topics in,
34, 4f
3/8/07 1:37:59 PM
Index 337
process variability, CUSUM control

charts for controlling, 116117
producer risk, 178
defined, 8
Q
qualitative data, defined, 5
quality
benefits of better, 4041
defined, 40
quality characteristics, 7, 56, 79, 83
behavior of, 42
examples of attributes, 84
reducing variation of, 43
using a p chart to study, 85
quality control charts, 39, 42
categories of, 42
quantitative data, decision-making
and, 5
R
random causes. See common causes,
of variation
range method, 150
rational samples, for control charts,
57
reduced inspection to normal
inspection, 191
repeatability, 149
defined, 150151, 152153
reproducibility, 149
defined, 151, 153
risks
bad decisions and, 79
consumer, 8, 178
producer, 8, 178
run, defined, 57
run charts, 43, 49f, 5051
S
sample, defined, 12
sample designs, 11
cluster random sampling, 15
simple random sampling, 13
stratified random sampling, 13, 14

systematic random sampling, 13, 14
sampled population, defined, 13
sample mean, defined, 17
samples, 5f, 7
determining size of, 5760
sample size
average run length and, 5758
determination of, 2021
average run length for, 5758
operating characteristic curve for,
57, 5960
2627
3032
operating characteristic curve and,
57, 5960
sampling plans and, 180182
variable, for Shewhart X bar and S
control charts, 7679
sample statistics, calculation of, for
Shewhart X bar and R control
charts, 6061
sample variance, defined, 17
sampling
acceptance (see acceptance
sampling)
advantages of, 174
basic concepts of, 1115
cluster random (see cluster random
sampling)
concepts of, 175182
double, 191192, 193f
multiple, 191192, 193f
simple random (see simple random
sampling)
single, 191192, 193f
standards, 188193
stratified random (see stratified
random sampling)
systematic random (see systematic
random sampling)
types of, ASI/ASQ Z1.4-2003 and,
191193
3/8/07 1:37:59 PM
338
Index
sampling frame, defined, 13

sampling inspection, 174175
sampling plans. See also attribute
sampling plans
acceptance number and, 180182
continuous, 201203
lot size and, 180182
sample size and, 180182
sequential, 199201
standards for, 188193
variables, 193198
scatter diagram, 43
sequential sampling plans, 199201
decision areas for, 199f
Shainin, Dorian, 165
Shewhart, Walter A., 39, 42
Shewhart control charts. See also
combined Shewhart-CUSUM
control charts
for individual observations,
MINITAB for, 230231
individual observations for, 6972
Shewhart Xbar and R control charts
calculation of control limits for,
6164
calculation of sample statistics for,
6061
constructing, with known process
mean and process standard
deviation, 230
constructing, with MINITAB,
228229
extending current control limits for
future control for, 6668
interpretation of, 6466
JMP software package for, 268270
rules for preparing, 60
vs. CUSUM control charts, 102104
when process mean and process
standard deviation are known,
6869
Shewhart Xbar and S control charts
calculation of control limits for,
7375
constructing, with MINITAB
for equal sample size, 231233
for variable sample size, 233235
vs. R charts, 7273

when sample size is variable, 7679
simple random sample, defined, 1516
simple random sampling, 13, 14,
1521. See also sampling
mean for, 20
total for, 20
determination of sample size for,
2021
1619
1619
single sampling plans, 182184,
191192, 193f
Six Sigma
order of topics in process of, 3
transactional, 34, 4f
Six Sigma Green Belt, statistical
quality control and, 1
SPC. See statistical process control
(SPC)
special causes, of variation, 52
SQC. See statistical quality control
(SQC)
stability, defined, 151
stable process, 79
standard normal distribution, 167,
170
statistical control, defined, 166
statistical process control (SPC), 12,
4151
tools of, 4351
statistical quality control (SQC), 2
applied statistics and, 24
defined, 1
design of experiments and, 24
relationships among tools of, 165f
role of statistics in, 45
Six Sigma Green Belt and, 1
tool types of, 2, 2f
understanding variability with,
148149
use of modern, 39
statistical significance, 56
3/8/07 1:37:59 PM
Index 339
statistics
applied, SQC and, 24
role of, in SQC, 45
stem-and-leaf diagram, 43
stratified random sampling, 13, 14,
2127. See also sampling;
stratified random sampling
advantages of, 2122
mean for, 2427
total for, 2427
2627
2224
2224
process of, 22
systematic random sampling, 13, 14,
2732
advantages of, 2728
mean for, 30
total for, 30
3032
2830
2830
T
target populations, 12
test significance (), level of, 56
tightened inspection to normal
inspection, 190
time series graphs. See run charts
total Gage R&R variability, 152
total process variation, 149. See also
variation
measurement system variation, 249
part-to-part variation source, 249
total variability, components of,
151152
transactional Six Sigma, order of

topics in, 34, 4f
two-sided CUSUM control charts,
104106
using numerical procedure, 106112
two-stage cluster random sampling, 33
Type I error, 79
Type II error, 79
U
u control charts, 96100
MINITAB for, 241243
uniformly weighted moving average
(UWMA) chart, JMP for
creating, 288290
upper control line (UCL), for control
charts, 54
upward shift, 102, 106, 115, 243, 286
UWMA. See uniformly weighted
moving average (UWMA) chart,
JMP for creating
V
variability
in measurement process, 148149
in production/service delivery
process, 148
total, components of, 151152
variable, defined, 42
variables sampling plans, 193198
ANSI/ASQ Z1.9-2003 and, 194198
benefits of, over attribute plans,
193194
when standard deviation is known,
203204
variation. See also total process
variation
actions on system for, 53
causes of, 42, 127
common causes of, 52
controlling, 42
defined, 42
due to measurement instruments, 149
due to operators, 149
3/8/07 1:37:59 PM
340
Index
local actions for, 53

minimizing unnecessary, 56
part-to-part, 149
special causes of, 52
vendor certification, 174
vendor qualification, 174
V-mask, 106, 244
W
Western Electric criteria
for detecting small shifts, 101102
for determining nonrandom patterns
on control charts, 64
3/8/07 1:37:59 PM

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Statistical Quality

Control for the Six

Also available from ASQ Quality Press:

ASQ Quality Press

H1277 CH00_FM.indd iii

American Society for Quality, Quality Press, Milwaukee 53203

Printed on acid-free paper

In loving memory of my parents, Roshan Lal and Sodhan Devi.

H1277 CH00_FM.indd vii

2.4.2 Confidence Interval for a Population Mean

Phase I (Detecting Large Shifts)SPC: Control

H1277 CH00_FM.indd viii

Phase I (Detecting Large Shifts)SPC: Control

4.2.1 The p Chart: Control Chart for Fraction

Phase II (Detecting Small Shifts)SPC:

CUSUM Control Chart versus Shewhart X-R Control

Chapter 6 Process Capability Indices . . . . . . . . . . . . . . . . . . . . . . .

Chapter 7 Measurement Systems Analysis . . . . . . . . . . . . . . . . . . .

Variables Sampling Plans . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Chapter 10 Computer Resources to Support SQC: MINITAB . . .

Chapter 11 Computer Resources to Support SQC: JMP . . . . . . .

The Shewhart XBar and R Control Chart . . . . . . . . . . . . . . .

Statistical Factors and Tables . . . . . . . . . . . . . . . . . . . . . 299

H1277 CH00_FM.indd xii

The five tool types of SQC. . . . . . . . . . . . . . . . . . . . . . . . . . . .

The X and R control charts, constructed using MINITAB,

H1277 CH00_FM.indd xiii

H1277 CH00_FM.indd xiv

MINITAB printout of the np chart for nonconforming

X-R control chart for the data in Table 5.1. . . . . . . . . . . . . . . .

MINITAB printout of the X control chart for individual

X with sample size five. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

OC curves for sampling plans having the sample size equal

Figure 10.14 MINITAB window showing the CUSUM Chart - Options

H1277 CH00_FM.indd xvi

H1277 CH00_FM.indd xvii

Completed Gage R&R dialog box. . . . . . . . . . . . . . . . . . . . . .

H1277 CH00_FM.indd xviii

Check sheet summarizing the data of a study over a period

H1277 CH00_FM.indd xix

MA chart (Mis) for data in Table 5.4 with = 20, = 2. . . . .

H1277 CH00_FM.indd xxi

H1277 CH00_FM.indd xxii

e would like to thank Professors John Brunette, Cheng Peng, Merle

H1277 CH00_FM.indd xxiii

H1277 CH00_FM.indd xxiv

tatistical quality control (SQC) refers to a set of interrelated tools used

Definition 1.1 A process, for the purposes of this book, is a set of

our understanding of process capability and to enable the use of acceptance

1.1 Identifying the Tools of SQC

1.2 Relating SQC to Applied Statistics and to DOE

The five tool types of SQC.

Introduction to Statistical Quality Control 3

Relationship among applied statistics, SQC, and DOE.

Order of SQC topics in process or transactional Six Sigma.

type called PRE-control. The very name PRE-control counterintuitively and

1.3 Understanding the Role of Statistics in SQC

Introduction to Statistical Quality Control 5

1.4 Making Decisions Based on Quantitative Data